JP2015028933A5 - - Google Patents

Download PDF

Info

Publication number
JP2015028933A5
JP2015028933A5 JP2014138331A JP2014138331A JP2015028933A5 JP 2015028933 A5 JP2015028933 A5 JP 2015028933A5 JP 2014138331 A JP2014138331 A JP 2014138331A JP 2014138331 A JP2014138331 A JP 2014138331A JP 2015028933 A5 JP2015028933 A5 JP 2015028933A5
Authority
JP
Japan
Prior art keywords
optical system
electrons
camera
transmission electron
electron diffraction
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
JP2014138331A
Other languages
English (en)
Japanese (ja)
Other versions
JP2015028933A (ja
Filing date
Publication date
Application filed filed Critical
Priority to JP2014138331A priority Critical patent/JP2015028933A/ja
Priority claimed from JP2014138331A external-priority patent/JP2015028933A/ja
Publication of JP2015028933A publication Critical patent/JP2015028933A/ja
Publication of JP2015028933A5 publication Critical patent/JP2015028933A5/ja
Withdrawn legal-status Critical Current

Links

JP2014138331A 2013-07-05 2014-07-04 透過電子回折測定装置および透過電子回折パターンの測定方法 Withdrawn JP2015028933A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2014138331A JP2015028933A (ja) 2013-07-05 2014-07-04 透過電子回折測定装置および透過電子回折パターンの測定方法

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2013141217 2013-07-05
JP2013141217 2013-07-05
JP2014138331A JP2015028933A (ja) 2013-07-05 2014-07-04 透過電子回折測定装置および透過電子回折パターンの測定方法

Publications (2)

Publication Number Publication Date
JP2015028933A JP2015028933A (ja) 2015-02-12
JP2015028933A5 true JP2015028933A5 (enExample) 2017-07-20

Family

ID=52132139

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2014138331A Withdrawn JP2015028933A (ja) 2013-07-05 2014-07-04 透過電子回折測定装置および透過電子回折パターンの測定方法

Country Status (2)

Country Link
US (1) US9244025B2 (enExample)
JP (1) JP2015028933A (enExample)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9496330B2 (en) 2013-08-02 2016-11-15 Semiconductor Energy Laboratory Co., Ltd. Oxide semiconductor film and semiconductor device
CN113906536B (zh) 2019-05-20 2024-04-19 埃尔迪科科学股份有限公司 用于带电粒子晶体学的衍射仪

Family Cites Families (24)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61243649A (ja) * 1985-04-19 1986-10-29 Hitachi Ltd 回析像同時表示電子顕微鏡
US5140352A (en) * 1990-10-31 1992-08-18 Occipital, Inc. Ccd camera and method for fundus imaging
JPH05128991A (ja) * 1991-08-09 1993-05-25 Hikari Gijutsu Kenkyu Kaihatsu Kk 実時間表面モニター装置
US5898177A (en) * 1996-08-08 1999-04-27 Hitachi, Ltd. Electron microscope
US6061085A (en) 1997-02-07 2000-05-09 Soft Imaging System Gmbh Camera system for a transmission electron microscope
JPH11111208A (ja) * 1997-09-30 1999-04-23 Ulvac Corp 反射電子回折装置
JPH11250850A (ja) 1998-03-02 1999-09-17 Hitachi Ltd 走査電子顕微鏡及び顕微方法並びに対話型入力装置
TWI258583B (en) * 2003-01-30 2006-07-21 Test Research Inc Device and method for optical detection of printed circuit board
EP1665321B1 (en) * 2003-09-02 2009-11-11 Nanomegas SPRL A method for measuring diffraction patterns from a transmission electron microscopy to determine crystal structures and a device therefor
US7164462B2 (en) * 2004-03-03 2007-01-16 Louise Lamarre Filming using rear-projection screen and image projector
JP4262184B2 (ja) * 2004-10-12 2009-05-13 株式会社日立ハイテクノロジーズ 透過型電子顕微鏡およびそれを用いた像観察方法
JP4596881B2 (ja) * 2004-10-26 2010-12-15 株式会社日立ハイテクノロジーズ 透過型電子顕微鏡装置
JP5126729B2 (ja) 2004-11-10 2013-01-23 キヤノン株式会社 画像表示装置
US7791072B2 (en) 2004-11-10 2010-09-07 Canon Kabushiki Kaisha Display
JP2006196236A (ja) 2005-01-12 2006-07-27 Hitachi High-Technologies Corp 電子顕微鏡及び観察方法
JP4850654B2 (ja) * 2006-10-23 2012-01-11 株式会社日立ハイテクノロジーズ 荷電粒子線装置および荷電粒子線装置用試料保持装置
JP2009152087A (ja) * 2007-12-21 2009-07-09 Jeol Ltd 透過電子顕微鏡
JP5226378B2 (ja) * 2008-04-28 2013-07-03 株式会社日立ハイテクノロジーズ 透過型電子顕微鏡、及び試料観察方法
JP2010117705A (ja) * 2008-10-14 2010-05-27 Olympus Corp バーチャルスライド作成システム用顕微鏡
JP2010214847A (ja) * 2009-03-18 2010-09-30 Fujifilm Corp 液滴吐出ヘッドおよび画像形成装置
DE102010003056B9 (de) * 2010-03-19 2014-07-31 Carl Zeiss Microscopy Gmbh Verfahren zur Erzeugung von Bildern einer Probe
US9496138B2 (en) * 2011-07-08 2016-11-15 Semiconductor Energy Laboratory Co., Ltd. Method for manufacturing oxide semiconductor film, method for manufacturing semiconductor device, and semiconductor device
KR20220150439A (ko) * 2012-11-08 2022-11-10 가부시키가이샤 한도오따이 에네루기 켄큐쇼 디스플레이 장치
US9293544B2 (en) * 2013-02-26 2016-03-22 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device having buried channel structure

Similar Documents

Publication Publication Date Title
JP2015136095A5 (enExample)
JP2016081929A5 (enExample)
BR112014028135A2 (pt) aparelho de caracterização de profundidade portátil para caracterizar uma profundidade de uma superfície de um objeto alvo; método de caracterizar uma profundidade de uma superfície de um objeto alvo utilizando um aparelho portátil; e meio de armazenamento legível por computador
PH12011000369A1 (en) Image processing apparatus, image processing method, and non-transitory storage medium
JP2014095863A5 (ja) 光照射装置、顕微鏡装置及びレーザ加工装置
JP2011041795A5 (enExample)
WO2015132391A3 (en) Imaging device for a microscope
JP2017517761A5 (enExample)
WO2016024158A3 (en) Confocal imaging apparatus with curved focal surface or target reference element and field compensator
EP4354162A3 (en) Apparatus, method and computer program product for defect detection in work pieces
TW201614226A (en) X-ray thin film inspection apparatus
WO2014172269A3 (en) Fluorescence imager on a mobile device
WO2015128801A3 (en) Large field of view multi-camera endoscopic apparatus with omni-directional illumination
JP2015135659A5 (enExample)
PH12018502032A1 (en) Image processing apparatus, imaging apparatus, and control methods thereof
RU2013157371A (ru) Устройство рентгеновской томографии
JP2013220218A5 (enExample)
MX373653B (es) Aparato y métodos de inspección de cuerpos de panal de cerámica.
JP2015084212A5 (ja) 携帯情報端末
JP2015161776A5 (ja) 撮像装置、撮像システム、発光装置及び焦点検出方法
JP2016042929A5 (enExample)
WO2015042529A3 (en) Methods, systems, and devices for imaging microscopic tumors
TW201614386A (en) Illumination system
JP2015028933A5 (enExample)
JP2018163240A5 (enExample)