JP2016081929A5 - - Google Patents

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Publication number
JP2016081929A5
JP2016081929A5 JP2015203388A JP2015203388A JP2016081929A5 JP 2016081929 A5 JP2016081929 A5 JP 2016081929A5 JP 2015203388 A JP2015203388 A JP 2015203388A JP 2015203388 A JP2015203388 A JP 2015203388A JP 2016081929 A5 JP2016081929 A5 JP 2016081929A5
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JP
Japan
Prior art keywords
sample
diaphragm
microscope
charged particle
plate
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JP2015203388A
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English (en)
Japanese (ja)
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JP2016081929A (ja
JP6294280B2 (ja
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Priority claimed from EP14189135.8A external-priority patent/EP3010031B1/en
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Publication of JP2016081929A publication Critical patent/JP2016081929A/ja
Publication of JP2016081929A5 publication Critical patent/JP2016081929A5/ja
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Publication of JP6294280B2 publication Critical patent/JP6294280B2/ja
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JP2015203388A 2014-10-16 2015-10-15 特殊な絞り板を備える荷電粒子顕微鏡 Active JP6294280B2 (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
EP14189135.8 2014-10-16
EP14189135.8A EP3010031B1 (en) 2014-10-16 2014-10-16 Charged Particle Microscope with special aperture plate

Related Child Applications (1)

Application Number Title Priority Date Filing Date
JP2017222942A Division JP2018026369A (ja) 2014-10-16 2017-11-20 特殊な絞り板を備える荷電粒子顕微鏡

Publications (3)

Publication Number Publication Date
JP2016081929A JP2016081929A (ja) 2016-05-16
JP2016081929A5 true JP2016081929A5 (enExample) 2017-02-16
JP6294280B2 JP6294280B2 (ja) 2018-03-14

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JP2015203388A Active JP6294280B2 (ja) 2014-10-16 2015-10-15 特殊な絞り板を備える荷電粒子顕微鏡
JP2017222942A Pending JP2018026369A (ja) 2014-10-16 2017-11-20 特殊な絞り板を備える荷電粒子顕微鏡

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JP2017222942A Pending JP2018026369A (ja) 2014-10-16 2017-11-20 特殊な絞り板を備える荷電粒子顕微鏡

Country Status (4)

Country Link
US (1) US9934936B2 (enExample)
EP (1) EP3010031B1 (enExample)
JP (2) JP6294280B2 (enExample)
CN (1) CN105529235B (enExample)

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EP3010031B1 (en) * 2014-10-16 2017-03-22 Fei Company Charged Particle Microscope with special aperture plate
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US10109453B2 (en) * 2015-03-18 2018-10-23 Battelle Memorial Institute Electron beam masks for compressive sensors
EP3171163B1 (en) 2015-11-18 2022-05-04 FEI Company X-ray imaging technique
KR101815850B1 (ko) * 2016-03-23 2018-01-30 한국표준과학연구원 모노크로미터 및 이를 구비한 하전입자선 장치
US10580614B2 (en) 2016-04-29 2020-03-03 Battelle Memorial Institute Compressive scanning spectroscopy
KR101773861B1 (ko) * 2016-05-20 2017-09-01 한국표준과학연구원 모노크로미터를 구비한 전자선장치
KR101787379B1 (ko) * 2016-05-25 2017-10-18 한국표준과학연구원 모노크로미터의 제조방법
US10541109B2 (en) * 2016-07-27 2020-01-21 Battelle Memorial Institute Sensing analytical instrument parameters, specimen characteristics, or both from sparse datasets
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US10295677B2 (en) 2017-05-08 2019-05-21 Battelle Memorial Institute Systems and methods for data storage and retrieval
WO2019014561A1 (en) * 2017-07-14 2019-01-17 Thermo Electron Scientific Instruments Llc DEVICE FOR PROVIDING A VARIABLE SIZE OPENING FOR A SAMPLE IN A SPECTROMETER
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EP3550585B1 (en) * 2018-04-05 2021-06-23 FEI Company Studying dynamic specimens in a transmission charged particle microscope
US10522323B2 (en) * 2018-04-05 2019-12-31 Fei Company Electron energy loss spectroscopy with adjustable energy resolution
US10607811B1 (en) * 2019-02-28 2020-03-31 Fei Company Multi-beam scanning transmission charged particle microscope
EP3716312A1 (en) * 2019-03-28 2020-09-30 FEI Company Charged particle beam device for inspection of a specimen with a plurality of charged particle beamlets
EP3745442A1 (en) * 2019-05-29 2020-12-02 FEI Company Method of examining a sample using a charged particle microscope
US11698336B2 (en) * 2019-09-30 2023-07-11 Jeol Ltd. Analysis method and analysis apparatus
JP7354037B2 (ja) * 2020-03-23 2023-10-02 株式会社日立ハイテクサイエンス 集束イオンビーム加工装置
EP3901902B1 (en) * 2020-04-20 2025-05-07 FEI Company Method implemented by a data processing apparatus, and charged particle beam device for inspecting a specimen using such a method
US11615939B2 (en) * 2021-03-24 2023-03-28 Kla Corporation Shaped aperture set for multi-beam array configurations
KR102716276B1 (ko) * 2022-02-14 2024-10-15 한국전자통신연구원 광 정렬 장치

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US8907280B1 (en) * 2012-09-19 2014-12-09 Sandia Corporation Fast electron microscopy via compressive sensing
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EP3010031B1 (en) * 2014-10-16 2017-03-22 Fei Company Charged Particle Microscope with special aperture plate

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