JP2014513312A5 - - Google Patents

Download PDF

Info

Publication number
JP2014513312A5
JP2014513312A5 JP2013553041A JP2013553041A JP2014513312A5 JP 2014513312 A5 JP2014513312 A5 JP 2014513312A5 JP 2013553041 A JP2013553041 A JP 2013553041A JP 2013553041 A JP2013553041 A JP 2013553041A JP 2014513312 A5 JP2014513312 A5 JP 2014513312A5
Authority
JP
Japan
Prior art keywords
alkyl
moiety
iodo
fluoro
fluoroalkyl
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2013553041A
Other languages
English (en)
Japanese (ja)
Other versions
JP6109750B2 (ja
JP2014513312A (ja
Filing date
Publication date
Priority claimed from US13/023,291 external-priority patent/US8465902B2/en
Application filed filed Critical
Publication of JP2014513312A publication Critical patent/JP2014513312A/ja
Publication of JP2014513312A5 publication Critical patent/JP2014513312A5/ja
Application granted granted Critical
Publication of JP6109750B2 publication Critical patent/JP6109750B2/ja
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

JP2013553041A 2011-02-08 2012-02-07 下層コーティング組成物および微細電子デバイスを製造するための方法 Active JP6109750B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US13/023,291 2011-02-08
US13/023,291 US8465902B2 (en) 2011-02-08 2011-02-08 Underlayer coating composition and processes thereof
PCT/IB2012/000213 WO2012107823A1 (en) 2011-02-08 2012-02-07 Underlayer coating composition and process for manufacturing a microelectronic device

Publications (3)

Publication Number Publication Date
JP2014513312A JP2014513312A (ja) 2014-05-29
JP2014513312A5 true JP2014513312A5 (enExample) 2016-11-04
JP6109750B2 JP6109750B2 (ja) 2017-04-05

Family

ID=45815912

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2013553041A Active JP6109750B2 (ja) 2011-02-08 2012-02-07 下層コーティング組成物および微細電子デバイスを製造するための方法

Country Status (8)

Country Link
US (1) US8465902B2 (enExample)
EP (1) EP2673675B1 (enExample)
JP (1) JP6109750B2 (enExample)
KR (1) KR101824759B1 (enExample)
CN (1) CN103370653B (enExample)
SG (1) SG190992A1 (enExample)
TW (1) TWI545161B (enExample)
WO (1) WO2012107823A1 (enExample)

Families Citing this family (19)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8906590B2 (en) * 2011-03-30 2014-12-09 Az Electronic Materials Usa Corp. Antireflective coating composition and process thereof
US8906592B2 (en) 2012-08-01 2014-12-09 Az Electronic Materials (Luxembourg) S.A.R.L. Antireflective coating composition and process thereof
US9152051B2 (en) 2013-06-13 2015-10-06 Az Electronics Materials (Luxembourg) S.A.R.L. Antireflective coating composition and process thereof
KR102364126B1 (ko) * 2014-03-24 2022-02-18 제이에스알 가부시끼가이샤 패턴 형성 방법, 수지 및 레지스트 하층막 형성 조성물
TWI659991B (zh) * 2015-08-31 2019-05-21 Rohm And Haas Electronic Materials Llc 與外塗佈光致抗蝕劑一起使用的塗料組合物
TWI646397B (zh) * 2015-10-31 2019-01-01 南韓商羅門哈斯電子材料韓國公司 與外塗佈光致抗蝕劑一起使用的塗料組合物
KR102328436B1 (ko) * 2016-04-28 2021-11-18 닛산 가가쿠 가부시키가이샤 레지스트 하층막 형성 조성물
JP6531723B2 (ja) * 2016-06-29 2019-06-19 信越化学工業株式会社 レジスト材料及びパターン形成方法
US10203602B2 (en) * 2016-09-30 2019-02-12 Rohm And Haas Electronic Materials Korea Ltd. Coating compositions for use with an overcoated photoresist
JP7103347B2 (ja) * 2017-03-30 2022-07-20 Jsr株式会社 感放射線性組成物及びレジストパターン形成方法
CN112166379B (zh) * 2018-05-25 2025-04-01 日产化学株式会社 使用了环式羰基化合物的抗蚀剂下层膜形成用组合物
KR102288386B1 (ko) * 2018-09-06 2021-08-10 삼성에스디아이 주식회사 레지스트 하층막용 조성물 및 이를 이용한 패턴 형성 방법
CN109638156B (zh) * 2018-12-10 2020-09-01 武汉华星光电半导体显示技术有限公司 柔性显示面板及其制作方法
KR102260811B1 (ko) 2018-12-26 2021-06-03 삼성에스디아이 주식회사 하드마스크 조성물, 하드마스크 층 및 패턴 형성 방법
KR102808973B1 (ko) * 2019-06-17 2025-05-16 닛산 가가쿠 가부시키가이샤 디시아노스티릴기를 갖는 복소환 화합물을 포함하는 웨트에칭가능한 레지스트 하층막 형성 조성물
TWI837443B (zh) * 2019-12-31 2024-04-01 南韓商羅門哈斯電子材料韓國公司 塗料組成物、經塗覆的基底及形成電子裝置的方法
JPWO2024070786A1 (enExample) * 2022-09-30 2024-04-04
EP4657158A4 (en) * 2023-02-27 2026-04-29 Nissan Chemical Corp PHOTOSENSITIVE RESIN UNDERCOAT FILM FORMING COMPOSITION
TW202501160A (zh) * 2023-03-27 2025-01-01 日商日產化學股份有限公司 阻劑下層膜形成組成物

Family Cites Families (33)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3474054A (en) 1966-09-13 1969-10-21 Permalac Corp The Surface coating compositions containing pyridine salts or aromatic sulfonic acids
US4200729A (en) 1978-05-22 1980-04-29 King Industries, Inc Curing amino resins with aromatic sulfonic acid oxa-azacyclopentane adducts
US4251665A (en) 1978-05-22 1981-02-17 King Industries, Inc. Aromatic sulfonic acid oxa-azacyclopentane adducts
US4491628A (en) 1982-08-23 1985-01-01 International Business Machines Corporation Positive- and negative-working resist compositions with acid generating photoinitiator and polymer with acid labile groups pendant from polymer backbone
EP0440374B1 (en) 1990-01-30 1997-04-16 Wako Pure Chemical Industries Ltd Chemical amplified resist material
US5187019A (en) 1991-09-06 1993-02-16 King Industries, Inc. Latent catalysts
US5843624A (en) 1996-03-08 1998-12-01 Lucent Technologies Inc. Energy-sensitive resist material and a process for device fabrication using an energy-sensitive resist material
US6808859B1 (en) 1996-12-31 2004-10-26 Hyundai Electronics Industries Co., Ltd. ArF photoresist copolymers
US6849377B2 (en) 1998-09-23 2005-02-01 E. I. Du Pont De Nemours And Company Photoresists, polymers and processes for microlithography
US6790587B1 (en) 1999-05-04 2004-09-14 E. I. Du Pont De Nemours And Company Fluorinated polymers, photoresists and processes for microlithography
JP4425405B2 (ja) * 2000-02-04 2010-03-03 Jsr株式会社 ポジ型感放射線性樹脂組成物
AU2001274579A1 (en) 2000-06-21 2002-01-02 Asahi Glass Company, Limited Resist composition
US6447980B1 (en) 2000-07-19 2002-09-10 Clariant Finance (Bvi) Limited Photoresist composition for deep UV and process thereof
DE60223654T2 (de) 2001-02-09 2008-10-30 Asahi Glass Co., Ltd. Resistzusammensetzung
US6723488B2 (en) 2001-11-07 2004-04-20 Clariant Finance (Bvi) Ltd Photoresist composition for deep UV radiation containing an additive
JP4084597B2 (ja) * 2002-05-07 2008-04-30 群栄化学工業株式会社 アミノ基含有フェノール誘導体
KR101026127B1 (ko) * 2002-10-09 2011-04-05 닛산 가가쿠 고교 가부시키 가이샤 리소그라피용 반사방지막 형성 조성물
US7264913B2 (en) 2002-11-21 2007-09-04 Az Electronic Materials Usa Corp. Antireflective compositions for photoresists
JP4105036B2 (ja) * 2003-05-28 2008-06-18 信越化学工業株式会社 レジスト下層膜材料ならびにパターン形成方法
JP4069025B2 (ja) * 2003-06-18 2008-03-26 信越化学工業株式会社 レジスト下層膜材料ならびにパターン形成方法
JP2005321752A (ja) * 2004-04-09 2005-11-17 Nissan Chem Ind Ltd イソシアヌル酸化合物と安息香酸化合物との反応生成物を含む反射防止膜形成組成物
US7691556B2 (en) * 2004-09-15 2010-04-06 Az Electronic Materials Usa Corp. Antireflective compositions for photoresists
JP4575220B2 (ja) * 2005-04-14 2010-11-04 信越化学工業株式会社 レジスト下層膜材料およびパターン形成方法
US7875556B2 (en) 2005-05-16 2011-01-25 Air Products And Chemicals, Inc. Precursors for CVD silicon carbo-nitride and silicon nitride films
KR101226050B1 (ko) 2005-09-27 2013-01-24 닛산 가가쿠 고교 가부시키 가이샤 이소시아눌산 화합물과 안식향산 화합물의 반응 생성물을 포함하는 반사방지막 형성 조성물
US7736822B2 (en) * 2006-02-13 2010-06-15 Hoya Corporation Resist underlayer coating forming composition for mask blank, mask blank and mask
US7638262B2 (en) 2006-08-10 2009-12-29 Az Electronic Materials Usa Corp. Antireflective composition for photoresists
US20080286689A1 (en) 2007-05-14 2008-11-20 Hong Zhuang Antireflective Coating Compositions
US20090035704A1 (en) * 2007-08-03 2009-02-05 Hong Zhuang Underlayer Coating Composition Based on a Crosslinkable Polymer
US20090042133A1 (en) 2007-08-10 2009-02-12 Zhong Xiang Antireflective Coating Composition
US8329387B2 (en) * 2008-07-08 2012-12-11 Az Electronic Materials Usa Corp. Antireflective coating compositions
US20100119980A1 (en) * 2008-11-13 2010-05-13 Rahman M Dalil Antireflective Coating Composition Comprising Fused Aromatic Rings
US8551686B2 (en) 2009-10-30 2013-10-08 Az Electronic Materials Usa Corp. Antireflective composition for photoresists

Similar Documents

Publication Publication Date Title
JP6845851B2 (ja) 硬化性ポリマー
WO2015080240A1 (ja) 化合物又は樹脂の精製方法
TW200829545A (en) Monomers comprising superacidic groups, and polymers therefrom
CN103274908B (zh) 一种含双叔丁基和芴基结构的双酚单体及其制备方法和应用
WO2009101898A1 (ja) ベンズアルデヒド化合物の製造方法
US20170321007A1 (en) Phthalonitrile resin
JP2014525409A5 (enExample)
JP6922890B2 (ja) モノエーテル化体を含む溶液組成物の製造方法、溶液組成物、及び重合性化合物の製造方法
CN102675075B (zh) 3,5-二羟基苯乙酮的制备方法
CN102344345A (zh) 一种芳醚化合物的制备方法
JP2015140302A (ja) エーテル化合物の製造方法、および重合性化合物の製造方法
WO2015140818A4 (en) Pendant furyl containing bisphenols, polymers therefrom and a process for the preparation thereof
CN104447850A (zh) 一种双夹板型二乙烯基低聚倍半硅氧烷的制备方法
JP2016515992A5 (enExample)
JP5481017B2 (ja) ラダーポリマー誘導体の製造方法
JP2010536996A5 (enExample)
RU2012107453A (ru) Олигомеры простого арильного эфира и способы получения олигомеров простого арильного эфира
CN110078922B (zh) 一种利用钯催化的均相烯丙基取代反应合成聚砜的方法
JP2009067902A (ja) テトラヒドロピランを溶媒とするカチオン重合方法
CN104262616A (zh) 一种含1h-1,2,3-三唑基团的全氟环丁基聚芳醚聚合物及制备方法与应用
CN104262617B (zh) 一种用于原子转移自由基聚合的新型含全氟环丁基的大分子引发剂及其制备方法和用途
KR20260006548A (ko) 화합물, 조성물, 증감 효과를 발현하는 방법 및 제조방법
JP5824963B2 (ja) フルオロアルキルビニルエーテルの精製法
RU2536474C1 (ru) Галогенсодержащие полиариленэфиркетоны
JP5108590B2 (ja) 新規な含フッ素化合物および含フッ素架橋性化合物