JP2014506012A - ガスフラックス媒体を用いるレーザ半田付けにより2つの基板の端子面を電気的に接触させるための方法および装置 - Google Patents
ガスフラックス媒体を用いるレーザ半田付けにより2つの基板の端子面を電気的に接触させるための方法および装置 Download PDFInfo
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- 239000000758 substrate Substances 0.000 title claims abstract description 49
- 238000000034 method Methods 0.000 title claims abstract description 27
- 230000004907 flux Effects 0.000 title claims abstract description 14
- 238000005476 soldering Methods 0.000 title claims description 15
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 claims description 18
- BDAGIHXWWSANSR-UHFFFAOYSA-N methanoic acid Natural products OC=O BDAGIHXWWSANSR-UHFFFAOYSA-N 0.000 claims description 18
- 239000003795 chemical substances by application Substances 0.000 claims description 12
- OSWFIVFLDKOXQC-UHFFFAOYSA-N 4-(3-methoxyphenyl)aniline Chemical compound COC1=CC=CC(C=2C=CC(N)=CC=2)=C1 OSWFIVFLDKOXQC-UHFFFAOYSA-N 0.000 claims description 9
- 239000011248 coating agent Substances 0.000 claims description 9
- 238000000576 coating method Methods 0.000 claims description 9
- 235000019253 formic acid Nutrition 0.000 claims description 9
- 229910052757 nitrogen Inorganic materials 0.000 claims description 9
- 239000007789 gas Substances 0.000 claims description 6
- 238000004140 cleaning Methods 0.000 claims description 4
- 239000000203 mixture Substances 0.000 claims description 4
- 230000001681 protective effect Effects 0.000 claims description 4
- 230000001678 irradiating effect Effects 0.000 claims description 2
- 230000008021 deposition Effects 0.000 description 2
- 239000004065 semiconductor Substances 0.000 description 2
- 229910000679 solder Inorganic materials 0.000 description 2
- 235000012431 wafers Nutrition 0.000 description 2
- 238000010586 diagram Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 239000011521 glass Substances 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 230000008018 melting Effects 0.000 description 1
- 238000002844 melting Methods 0.000 description 1
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Abstract
Description
Claims (10)
- 2つの基板(6,7)の端子面を電気的に接触させるための方法であって、
第2基板(7)に面する端子面を有する第1基板(6)は、前記第2基板(7)の端子面と電気的かつ機械的に直接接続され、前記第1基板(6)の前記端子面には、半田付け剤塗膜(10)が塗布され、前記方法は、第1段階と第2段階とを含む連続する二段階で行われ、
前記第1段階において、
前記第1基板(6)を、その端子面が前記第2基板(7)の前記端子面と対向するように配置し、
少なくとも前記第2基板(7)上における前記第1基板(6)の機械的固定、および、互いに面している前記端子面の電気的接触を可能にする程度まで、前記半田付け剤(10)を溶融させるように、レーザエネルギ(5)を裏側から前記第1基板(6)に照射し、
前記第2段階において、
ハウジング内部に配置されている、前記基板(6,7)により形成された部品配置に、フラックス媒体を与え、
同時に裏側から前記第1基板(6)に照射されたレーザエネルギ(5)により、前記半田付け剤(10)が再溶融され、
その後、前記ハウジング内部を洗浄する処理が行われる、方法。 - 前記フラックス媒体は、気体状態である、請求項1に記載の方法。
- 前記気体状態のフラックス媒体は、窒素とギ酸との混合物からなる、請求項2に記載の方法。
- 前記気体状態のフラックス媒体を形成するために、前記部品配置に与えられる前に、前記ハウジング内部の外側でギ酸槽の表面上に窒素フローを流通させ、それによって運ばれたギ酸蒸気が前記窒素と混合される、請求項3に記載の方法。
- 前記洗浄処理は、純粋な保護ガスフローを用いて行われる、請求項1から4のいずれか1項に記載の方法。
- 前記純粋な保護ガスフローは、窒素フローである、請求項5に記載の方法。
- 請求項1に記載の方法の第2段階を行うための装置であって、
前記基板(6,7)により形成された前記部品配置を支持するためのキャリアテーブル(1)と、
前記部品配置を囲むとともに、前記キャリアテーブル(1)の上面と前記部品配置が配置されるハウジング内部を形成するハウジング(3)と、
裏側からレーザ照射が前記第1基板(6)に与えるように方向を合わせたレーザ光源(5)とを含む、装置。 - 前記ハウジング(3)には、前記キャリアテーブル(1)の前記上面と密接する周方向シール(2)が設けられる、請求項7に記載の装置。
- 前記ハウジング(3)は、前記ハウジング内部にフラックス媒体または洗浄媒体を流通させることを可能にするための流入開口(8)と流出開口(9)とを有する、請求項7または8に記載の装置。
- 前記第1基板(6)の裏面と実質的に平行に配置された前記ハウジング(3)のハウジング壁(4)が、裏側から前記第1基板(6)にレーザエネルギ(5)を照射できるようにするために、透明板(4)として形成される、請求項7から9のいずれか1項に記載の装置。
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EP (1) | EP2671251A2 (ja) |
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FR3061801A1 (fr) * | 2017-01-12 | 2018-07-13 | Commissariat Energie Atomique | Procede de connexion electrique entre au moins deux elements |
KR102052904B1 (ko) | 2018-03-27 | 2019-12-06 | 순천향대학교 산학협력단 | 인지 기능 검사가 가능한 주사위 게임 장치 |
DE102018114013A1 (de) * | 2018-06-12 | 2019-12-12 | Osram Opto Semiconductors Gmbh | Verfahren zum fixieren eines halbleiterchips auf einer oberfläche, verfahren zur herstellung eines halbleiterbauelements und halbleiterbauelement |
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EP2671251A2 (de) | 2013-12-11 |
US20140027418A1 (en) | 2014-01-30 |
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US9649711B2 (en) | 2017-05-16 |
WO2012103868A3 (de) | 2012-09-27 |
CN103477424B (zh) | 2016-12-14 |
CN103477424A (zh) | 2013-12-25 |
KR20140014156A (ko) | 2014-02-05 |
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