JP2014202650A5 - - Google Patents

Download PDF

Info

Publication number
JP2014202650A5
JP2014202650A5 JP2013080164A JP2013080164A JP2014202650A5 JP 2014202650 A5 JP2014202650 A5 JP 2014202650A5 JP 2013080164 A JP2013080164 A JP 2013080164A JP 2013080164 A JP2013080164 A JP 2013080164A JP 2014202650 A5 JP2014202650 A5 JP 2014202650A5
Authority
JP
Japan
Prior art keywords
light
measuring device
convex structure
structure layer
fine concavo
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2013080164A
Other languages
English (en)
Japanese (ja)
Other versions
JP2014202650A (ja
JP6134975B2 (ja
Filing date
Publication date
Application filed filed Critical
Priority to JP2013080164A priority Critical patent/JP6134975B2/ja
Priority claimed from JP2013080164A external-priority patent/JP6134975B2/ja
Priority to PCT/JP2014/001985 priority patent/WO2014167828A1/ja
Publication of JP2014202650A publication Critical patent/JP2014202650A/ja
Priority to US14/875,129 priority patent/US9728388B2/en
Publication of JP2014202650A5 publication Critical patent/JP2014202650A5/ja
Application granted granted Critical
Publication of JP6134975B2 publication Critical patent/JP6134975B2/ja
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

Links

JP2013080164A 2013-04-08 2013-04-08 測定用デバイス、測定装置および方法 Expired - Fee Related JP6134975B2 (ja)

Priority Applications (3)

Application Number Priority Date Filing Date Title
JP2013080164A JP6134975B2 (ja) 2013-04-08 2013-04-08 測定用デバイス、測定装置および方法
PCT/JP2014/001985 WO2014167828A1 (ja) 2013-04-08 2014-04-07 測定用デバイス、測定装置および方法
US14/875,129 US9728388B2 (en) 2013-04-08 2015-10-05 Measurement device, measurement apparatus, and method

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2013080164A JP6134975B2 (ja) 2013-04-08 2013-04-08 測定用デバイス、測定装置および方法

Publications (3)

Publication Number Publication Date
JP2014202650A JP2014202650A (ja) 2014-10-27
JP2014202650A5 true JP2014202650A5 (https=) 2016-01-21
JP6134975B2 JP6134975B2 (ja) 2017-05-31

Family

ID=51689250

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2013080164A Expired - Fee Related JP6134975B2 (ja) 2013-04-08 2013-04-08 測定用デバイス、測定装置および方法

Country Status (3)

Country Link
US (1) US9728388B2 (https=)
JP (1) JP6134975B2 (https=)
WO (1) WO2014167828A1 (https=)

Families Citing this family (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB2554206B (en) 2015-03-06 2021-03-24 Micromass Ltd Spectrometric analysis of microbes
WO2016142692A1 (en) 2015-03-06 2016-09-15 Micromass Uk Limited Spectrometric analysis
CN112964625B (zh) 2015-03-06 2024-06-07 英国质谱公司 细胞群体分析
CA2978042A1 (en) 2015-03-06 2016-09-15 Micromass Uk Limited Tissue analysis by mass spectrometry or ion mobility spectrometry
JP6717298B2 (ja) * 2015-05-08 2020-07-01 Agc株式会社 質量分析用試料プレート、質量分析方法および質量分析装置
GB201517195D0 (en) * 2015-09-29 2015-11-11 Micromass Ltd Capacitively coupled reims technique and optically transparent counter electrode
JP6534215B2 (ja) * 2016-01-05 2019-06-26 日本電子株式会社 測定方法
JP6549309B2 (ja) 2016-03-18 2019-07-24 シチズンファインデバイス株式会社 試料積載プレート及びその製造方法
EP3443354B1 (en) 2016-04-14 2025-08-20 Micromass UK Limited Spectrometric analysis of plants
US11075065B2 (en) * 2016-12-13 2021-07-27 University-Industry Foundation (Uif), Yonsei University Sample plate, method of fabricating the same and mass spectrometer analysis by using the same
JP7205271B2 (ja) * 2019-02-08 2023-01-17 株式会社デンソー センシングシステム
CN113092374B (zh) * 2021-04-12 2022-11-15 青岛科技大学 小型真空光电测试系统

Family Cites Families (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB9518429D0 (en) 1995-09-08 1995-11-08 Pharmacia Biosensor A rapid method for providing kinetic and structural data in molecular interaction analysis
JP2007171003A (ja) 2005-12-22 2007-07-05 Fujifilm Corp 質量分析用基板並びに分析方法および装置
JP5049549B2 (ja) 2006-10-25 2012-10-17 キヤノン株式会社 質量分析用基板、その製造方法および質量分析測定装置
JP5069497B2 (ja) 2007-05-24 2012-11-07 富士フイルム株式会社 質量分析用デバイス及びそれを用いた質量分析装置
JP4993360B2 (ja) 2007-06-08 2012-08-08 富士フイルム株式会社 微細構造体及びその製造方法、光電場増強デバイス
US8071938B2 (en) * 2008-03-20 2011-12-06 The Mitre Corporation Multi-modal particle detector
US20120038926A1 (en) * 2008-10-17 2012-02-16 Tatsuro Endo Optical sensor, method for manufacturing same and detection method using optical sensor
JP5521177B2 (ja) * 2010-04-28 2014-06-11 株式会社島津製作所 質量分析装置
JP2011246307A (ja) * 2010-05-26 2011-12-08 Panasonic Electric Works Co Ltd 膜硬度計測方法及び成膜装置
JP5553717B2 (ja) * 2010-09-17 2014-07-16 富士フイルム株式会社 光電場増強デバイスを用いた光の測定方法および測定装置
JP5763910B2 (ja) 2010-11-30 2015-08-12 パナソニック株式会社 排水構造
JP5709582B2 (ja) * 2011-02-28 2015-04-30 キヤノン株式会社 ラマン振動の強度分布情報と質量分布情報とを位置合わせする方法
JP5947182B2 (ja) * 2012-09-28 2016-07-06 富士フイルム株式会社 光電場増強デバイスを用いた測定装置

Similar Documents

Publication Publication Date Title
JP2014202650A5 (https=)
Cultrera et al. Mapping the conductivity of graphene with Electrical Resistance Tomography
JP2015130477A5 (ja) 酸化物半導体薄膜の評価方法、及び酸化物半導体薄膜の品質管理方法、並びに上記評価方法に用いられる評価装置
JP6134975B2 (ja) 測定用デバイス、測定装置および方法
ATE438095T1 (de) Vorrichtung zur röntgen-tomosynthese
RU2015118169A (ru) Датчик для текучих сред с широким динамическим диапазоном на основе нанопроводной платформы
KR20140140886A (ko) 대면적 금속 나노 구조물 및 투명전극층을 포함하는 표면증강라만산란 기판, 이의 제조방법 및 이를 이용한 표면증강라만 분광방법
JP2012069519A5 (https=)
KR101225124B1 (ko) 표면증강라만산란 분광용 기판 및 이를 이용한 표면증강라만산란 분광법
WO2012157254A1 (ja) ラマン分光測定方法および装置
JP2014142339A5 (https=)
JP2014232055A (ja) Maldi質量分析用測定基板
EP2793016A3 (en) Analysis device, analysis method, optical element and electronic apparatus for analysis device and analysis method, and method of designing optical element
EP2105945A3 (en) Mass spectroscope
JP2013242302A5 (https=)
CN205015299U (zh) X射线衍射装置
Choi et al. Wearable Multifunctional Health Monitoring Systems Enabled by Ultrafast Flash‐Induced 3D Porous Graphene
JP2013113655A (ja) センシング装置およびこれを用いたセンシング方法
BR112016002005A2 (pt) método para detectar ou quantificar um analito alvo, circuito de sensor de analito conformal, dispositivo portátil para medir um analito alvo, método para calibração de um dispositivo de medição portátil e kit
JP2020514108A5 (https=)
WO2015025756A1 (ja) 表面増強ラマン散乱分光測定用基板及びそれを用いた装置
JP2007027691A5 (https=)
RU2012151935A (ru) Электрический сенсор на пары гидразина
JP2013234977A5 (https=)
CN105588829A (zh) 可连续调制基底表面等离子体共振的sers测量方法