JP2013242302A5 - - Google Patents

Download PDF

Info

Publication number
JP2013242302A5
JP2013242302A5 JP2013089059A JP2013089059A JP2013242302A5 JP 2013242302 A5 JP2013242302 A5 JP 2013242302A5 JP 2013089059 A JP2013089059 A JP 2013089059A JP 2013089059 A JP2013089059 A JP 2013089059A JP 2013242302 A5 JP2013242302 A5 JP 2013242302A5
Authority
JP
Japan
Prior art keywords
sample
primary
ion
irradiated
spectral data
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2013089059A
Other languages
English (en)
Japanese (ja)
Other versions
JP2013242302A (ja
JP6180779B2 (ja
Filing date
Publication date
Application filed filed Critical
Priority to JP2013089059A priority Critical patent/JP6180779B2/ja
Priority claimed from JP2013089059A external-priority patent/JP6180779B2/ja
Publication of JP2013242302A publication Critical patent/JP2013242302A/ja
Publication of JP2013242302A5 publication Critical patent/JP2013242302A5/ja
Application granted granted Critical
Publication of JP6180779B2 publication Critical patent/JP6180779B2/ja
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

Links

JP2013089059A 2012-04-24 2013-04-22 分析方法 Expired - Fee Related JP6180779B2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2013089059A JP6180779B2 (ja) 2012-04-24 2013-04-22 分析方法

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2012099032 2012-04-24
JP2012099032 2012-04-24
JP2013089059A JP6180779B2 (ja) 2012-04-24 2013-04-22 分析方法

Publications (3)

Publication Number Publication Date
JP2013242302A JP2013242302A (ja) 2013-12-05
JP2013242302A5 true JP2013242302A5 (https=) 2016-03-10
JP6180779B2 JP6180779B2 (ja) 2017-08-16

Family

ID=49379228

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2013089059A Expired - Fee Related JP6180779B2 (ja) 2012-04-24 2013-04-22 分析方法

Country Status (2)

Country Link
US (1) US8772712B2 (https=)
JP (1) JP6180779B2 (https=)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB201308505D0 (en) * 2013-05-13 2013-06-19 Ionoptika Ltd Use of a gas cluster ion beam containing hydrocarbon for sample analysis
EP3347912A1 (de) * 2015-09-11 2018-07-18 ION-TOF Technologies GmbH Sekundärionen-massenspektrometer und sekundärionen-massenspektrometrisches verfahren
JP6645379B2 (ja) * 2016-08-09 2020-02-14 住友電気工業株式会社 質量分析方法
EP3290913B1 (de) * 2016-09-02 2022-07-27 ION-TOF Technologies GmbH Sekundärionenmassenspektrokopisches verfahren, system und verwendungen hiervon
US10262850B2 (en) * 2016-12-19 2019-04-16 Perkinelmer Health Sciences Canada, Inc. Inorganic and organic mass spectrometry systems and methods of using them
WO2018185599A1 (ja) * 2017-04-04 2018-10-11 株式会社半導体エネルギー研究所 有機半導体素子の分析方法

Family Cites Families (20)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5887743A (ja) * 1981-11-17 1983-05-25 Shimadzu Corp 二次イオン質量分析計
US4851669A (en) * 1988-06-02 1989-07-25 The Regents Of The University Of California Surface-induced dissociation for mass spectrometry
US5087815A (en) * 1989-11-08 1992-02-11 Schultz J Albert High resolution mass spectrometry of recoiled ions for isotopic and trace elemental analysis
US5527731A (en) * 1992-11-13 1996-06-18 Hitachi, Ltd. Surface treating method and apparatus therefor
JP3658397B2 (ja) * 2002-06-28 2005-06-08 キヤノン株式会社 飛行時間型二次イオン質量分析法による素子の情報取得方法、および、情報取得装置
EP1648595B1 (en) * 2003-06-06 2016-05-04 Ionwerks Gold implantation/deposition on biological samples for laser desorption three dimensional depth profiling of tissues
DE102005027937B3 (de) * 2005-06-16 2006-12-07 Ion-Tof Gmbh Verfahren zur Analyse einer Festkörperprobe
US7687771B2 (en) * 2006-01-12 2010-03-30 Ionics Mass Spectrometry Group High sensitivity mass spectrometer interface for multiple ion sources
JP5142580B2 (ja) * 2006-06-29 2013-02-13 キヤノン株式会社 表面解析方法および表面解析装置
JP2008175654A (ja) 2007-01-17 2008-07-31 Asahi Kasei Corp Ｔｏｆ−ｓｉｍｓを用いた混合有機化合物の組成割合の特定方法
EP2056333B1 (de) * 2007-10-29 2016-08-24 ION-TOF Technologies GmbH Flüssigmetallionenquelle, Sekundärionenmassenspektrometer, sekundärionenmassenspektrometisches Analyseverfahren sowie deren Verwendungen
US7825389B2 (en) * 2007-12-04 2010-11-02 Tel Epion Inc. Method and apparatus for controlling a gas cluster ion beam formed from a gas mixture
JPWO2009131022A1 (ja) * 2008-04-23 2011-08-18 株式会社アルバック 分析方法
GB2460855B (en) * 2008-06-11 2013-02-27 Kratos Analytical Ltd Electron spectroscopy
KR101708064B1 (ko) 2008-08-13 2017-02-17 미쓰비시 가가꾸 가부시키가이샤 유기 전계 발광 소자, 유기 ｅｌ 표시 장치 및 유기 ｅｌ 조명
JP2011029043A (ja) 2009-07-27 2011-02-10 Hyogo Prefecture 質量分析器および質量分析方法
US8651048B2 (en) * 2010-04-21 2014-02-18 University Of North Texas Controlled deposition of metal and metal cluster ions by surface field patterning in soft-landing devices
CA2797110C (en) * 2010-04-22 2020-07-21 Micell Technologies, Inc. Stents and other devices having extracellular matrix coating
JP5031066B2 (ja) * 2010-05-26 2012-09-19 兵庫県 クラスタービーム発生装置、基板処理装置、クラスタービーム発生方法及び基板処理方法
EP2580773B1 (en) * 2010-06-08 2019-12-25 Ionwerks, Inc. Nanoparticulate assisted nanoscale molecular imaging by mass spectrometry

Similar Documents

Publication Publication Date Title
JP2013242302A5 (https=)
Tobiasz et al. Solid-phase-extraction procedures for atomic spectrometry determination of copper
Mohr et al. Elastic alpha scattering experiments and the alpha-nucleus optical potential at low energies
EP2797104A3 (en) Imaging mass analysis data processing method and imaging mass spectrometer
WO2014164026A3 (en) Preparation enhancements and methods of use for maldi mass spectrometry
GB2534477A (en) Mass spectrometer
BR112015019326A2 (pt) dispositivo de registro de amostragem e armazenamento para análise de gás respiratório
UA115271C2 (uk) Спосіб визначення вологовмісту шару смоли на несучій плиті
EP3493894A4 (en) MANIPULATION OF CATEGORIZATION DATA USING A TIME-OF-FLIGHT MASS SPECTROMETER AND MATRIX-AIDED LASER DESORPTION / LASER IONIZATION SPECTROMETER
BR112015026548A2 (pt) processo para fornecer um componente de redução de contaminação a um aparelho elétrico
SG10201901587VA (en) Application testing
MX2019007247A (es) Carga de moleculas en pocillos para muestra para su analisis.
Doté et al. Comprehensive application of a coupled-channel complex scaling method to the K¯ N–πY system
EP3494382A4 (en) DATABASE MANAGEMENT USING A MATRIX-AIDED LASER-DESORPTION / LASER TIME-OF-FLIGHT MASS SPECTROMETER
JP2019537435A5 (https=)
EP3073259A3 (en) Absorption mode ft-ims
BR112016003004A8 (pt) Método espectroscópico de capacitância e eletrodo
EA201691168A1 (ru) Способы исследования бета-глюкана
Rozenblum et al. Toeplitz operators defined by sesquilinear forms: Fock space case
EP3457395A4 (en) MUSICAL STRUCTURE ANALYSIS DEVICE, STRUCTURE AND PROGRAM
WO2012135858A3 (en) Systems and methods for topographic analysis
JP2016001137A5 (https=)
FENG et al. Ion mobility spectrometry and its applications in pharmaceutical research and development
Kachanovska Fast, parallel techniques for time-domain boundary integral equations
CN205223247U8 (zh) 一种等温pcr检测仪