JP2014149266A5 - - Google Patents

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Publication number
JP2014149266A5
JP2014149266A5 JP2013019406A JP2013019406A JP2014149266A5 JP 2014149266 A5 JP2014149266 A5 JP 2014149266A5 JP 2013019406 A JP2013019406 A JP 2013019406A JP 2013019406 A JP2013019406 A JP 2013019406A JP 2014149266 A5 JP2014149266 A5 JP 2014149266A5
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absorption rate
light absorption
area
light
excitation
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JP2013019406A
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English (en)
Japanese (ja)
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JP2014149266A (ja
JP5944843B2 (ja
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Priority claimed from JP2013019406A external-priority patent/JP5944843B2/ja
Priority to JP2013019406A priority Critical patent/JP5944843B2/ja
Priority to CN201380072223.2A priority patent/CN104981687B/zh
Priority to US14/764,805 priority patent/US9423339B2/en
Priority to KR1020157017813A priority patent/KR102052786B1/ko
Priority to EP13873653.3A priority patent/EP2952882B1/en
Priority to PCT/JP2013/075032 priority patent/WO2014119037A1/ja
Priority to TW102135401A priority patent/TWI591323B/zh
Publication of JP2014149266A publication Critical patent/JP2014149266A/ja
Publication of JP2014149266A5 publication Critical patent/JP2014149266A5/ja
Publication of JP5944843B2 publication Critical patent/JP5944843B2/ja
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JP2013019406A 2013-02-04 2013-02-04 分光測定装置及び分光測定方法 Active JP5944843B2 (ja)

Priority Applications (7)

Application Number Priority Date Filing Date Title
JP2013019406A JP5944843B2 (ja) 2013-02-04 2013-02-04 分光測定装置及び分光測定方法
EP13873653.3A EP2952882B1 (en) 2013-02-04 2013-09-17 Spectrum measuring device and spectrum measuring method
US14/764,805 US9423339B2 (en) 2013-02-04 2013-09-17 Spectrum measuring device and spectrum measuring method
KR1020157017813A KR102052786B1 (ko) 2013-02-04 2013-09-17 분광 측정 장치 및 분광 측정 방법
CN201380072223.2A CN104981687B (zh) 2013-02-04 2013-09-17 分光测定装置及分光测定方法
PCT/JP2013/075032 WO2014119037A1 (ja) 2013-02-04 2013-09-17 分光測定装置及び分光測定方法
TW102135401A TWI591323B (zh) 2013-02-04 2013-09-30 Spectrophotometer and spectrophotometer

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2013019406A JP5944843B2 (ja) 2013-02-04 2013-02-04 分光測定装置及び分光測定方法

Publications (3)

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JP2014149266A JP2014149266A (ja) 2014-08-21
JP2014149266A5 true JP2014149266A5 (enExample) 2015-09-17
JP5944843B2 JP5944843B2 (ja) 2016-07-05

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ID=51261775

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JP2013019406A Active JP5944843B2 (ja) 2013-02-04 2013-02-04 分光測定装置及び分光測定方法

Country Status (7)

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US (1) US9423339B2 (enExample)
EP (1) EP2952882B1 (enExample)
JP (1) JP5944843B2 (enExample)
KR (1) KR102052786B1 (enExample)
CN (1) CN104981687B (enExample)
TW (1) TWI591323B (enExample)
WO (1) WO2014119037A1 (enExample)

Families Citing this family (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5529305B1 (ja) * 2013-02-04 2014-06-25 浜松ホトニクス株式会社 分光測定装置、及び分光測定方法
JP6279399B2 (ja) * 2014-05-23 2018-02-14 浜松ホトニクス株式会社 光計測装置及び光計測方法
CN107003183B (zh) * 2014-12-02 2018-11-16 浜松光子学株式会社 分光测定装置及分光测定方法
TWI560432B (en) * 2015-12-31 2016-12-01 Mpi Corp Integrating sphere cover and integrating sphere module
JP6248244B1 (ja) * 2016-08-09 2017-12-20 ナルックス株式会社 位置測定部を備えた部品
AU2017343368B2 (en) 2016-10-11 2022-10-27 Marama Labs Limited A spectrometer apparatus for measuring spectra of a liquid sample using an integrating cavity
JP6943618B2 (ja) * 2017-05-17 2021-10-06 浜松ホトニクス株式会社 分光測定装置及び分光測定方法
CN108613932B (zh) * 2018-07-18 2023-08-22 无锡迅杰光远科技有限公司 一种新型侧照式混样装置
JP6492220B1 (ja) * 2018-09-26 2019-03-27 大塚電子株式会社 測定システムおよび測定方法
JP6931730B1 (ja) * 2020-04-01 2021-09-08 浜松ホトニクス株式会社 光学測定装置及び光学測定方法
US11965828B2 (en) * 2020-08-11 2024-04-23 Chapman University Variable light diffuser for plant leaf gas exchange measurements
CN112087527B (zh) * 2020-09-22 2024-01-09 中国科学技术大学 一种远程自动化相机测试平台和方法
CN117480378A (zh) * 2021-06-18 2024-01-30 浜松光子学株式会社 测量装置
CN118654859B (zh) * 2024-06-11 2025-11-28 厦门大学 光致发光检测的micro-LED检测方法、系统和电子设备

Family Cites Families (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4583860A (en) * 1983-11-30 1986-04-22 The United States Of America As Represented By The Administrator Of The National Aeronautics And Space Administration Optical multiple sample vacuum integrating sphere
JP3287775B2 (ja) 1996-02-29 2002-06-04 松下電器産業株式会社 蛍光体の量子効率測定方法および測定装置
JP3682528B2 (ja) 2002-01-24 2005-08-10 独立行政法人産業技術総合研究所 固体試料の絶対蛍光量子効率測定方法及び装置
JP3773499B2 (ja) * 2003-04-08 2006-05-10 住友重機械アドバンストマシナリー株式会社 発光素子の外部量子効率測定方法及び装置
JP4708139B2 (ja) * 2005-09-26 2011-06-22 浜松ホトニクス株式会社 光検出装置
KR101359148B1 (ko) * 2007-03-01 2014-02-05 하마마츠 포토닉스 가부시키가이샤 광 검출 장치 및 시료 홀더용 지그
WO2009050536A1 (en) * 2007-10-15 2009-04-23 Ecole Polytechnique Federale De Lausanne (Epfl) Integrating sphere for the optical analysis of luminescent materials
JP4452737B2 (ja) 2007-10-25 2010-04-21 大塚電子株式会社 光束計および測定方法
JP5148387B2 (ja) * 2008-06-30 2013-02-20 浜松ホトニクス株式会社 分光測定装置、分光測定方法、及び分光測定プログラム
JP4835730B2 (ja) * 2009-08-06 2011-12-14 横河電機株式会社 蛍光量または吸光量の測定方法および測定装置
JP5491368B2 (ja) * 2010-11-29 2014-05-14 浜松ホトニクス株式会社 量子収率測定装置及び量子収率測定方法
CN102507491B (zh) * 2011-10-18 2013-05-29 江苏中兴药业有限公司 一种水飞蓟籽品质的检测装置和检测方法
JP5529305B1 (ja) * 2013-02-04 2014-06-25 浜松ホトニクス株式会社 分光測定装置、及び分光測定方法

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