JP2015222215A5 - - Google Patents

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JP2015222215A5
JP2015222215A5 JP2014106816A JP2014106816A JP2015222215A5 JP 2015222215 A5 JP2015222215 A5 JP 2015222215A5 JP 2014106816 A JP2014106816 A JP 2014106816A JP 2014106816 A JP2014106816 A JP 2014106816A JP 2015222215 A5 JP2015222215 A5 JP 2015222215A5
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Japan
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JP2014106816A
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Japanese (ja)
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JP2015222215A (ja
JP6279399B2 (ja
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Priority claimed from JP2014106816A external-priority patent/JP6279399B2/ja
Priority to JP2014106816A priority Critical patent/JP6279399B2/ja
Priority to PCT/JP2015/060876 priority patent/WO2015178113A1/ja
Priority to EP15796210.1A priority patent/EP3147638B1/en
Priority to CN201580025951.7A priority patent/CN106461463B/zh
Priority to KR1020167035821A priority patent/KR102314935B1/ko
Priority to US15/312,771 priority patent/US10094779B2/en
Priority to TW104112121A priority patent/TWI653443B/zh
Publication of JP2015222215A publication Critical patent/JP2015222215A/ja
Publication of JP2015222215A5 publication Critical patent/JP2015222215A5/ja
Publication of JP6279399B2 publication Critical patent/JP6279399B2/ja
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JP2014106816A 2014-05-23 2014-05-23 光計測装置及び光計測方法 Active JP6279399B2 (ja)

Priority Applications (7)

Application Number Priority Date Filing Date Title
JP2014106816A JP6279399B2 (ja) 2014-05-23 2014-05-23 光計測装置及び光計測方法
KR1020167035821A KR102314935B1 (ko) 2014-05-23 2015-04-07 광 계측 장치 및 광 계측 방법
EP15796210.1A EP3147638B1 (en) 2014-05-23 2015-04-07 Optical measurement device and optical measurement method
CN201580025951.7A CN106461463B (zh) 2014-05-23 2015-04-07 光测量装置及光测量方法
PCT/JP2015/060876 WO2015178113A1 (ja) 2014-05-23 2015-04-07 光計測装置及び光計測方法
US15/312,771 US10094779B2 (en) 2014-05-23 2015-04-07 Optical measurement device and optical measurement method
TW104112121A TWI653443B (zh) 2014-05-23 2015-04-15 Light measuring device and light measuring method

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2014106816A JP6279399B2 (ja) 2014-05-23 2014-05-23 光計測装置及び光計測方法

Publications (3)

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JP2015222215A JP2015222215A (ja) 2015-12-10
JP2015222215A5 true JP2015222215A5 (enExample) 2017-06-01
JP6279399B2 JP6279399B2 (ja) 2018-02-14

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Family Applications (1)

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JP2014106816A Active JP6279399B2 (ja) 2014-05-23 2014-05-23 光計測装置及び光計測方法

Country Status (7)

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US (1) US10094779B2 (enExample)
EP (1) EP3147638B1 (enExample)
JP (1) JP6279399B2 (enExample)
KR (1) KR102314935B1 (enExample)
CN (1) CN106461463B (enExample)
TW (1) TWI653443B (enExample)
WO (1) WO2015178113A1 (enExample)

Families Citing this family (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP6227067B1 (ja) * 2016-07-25 2017-11-08 浜松ホトニクス株式会社 光計測装置
JP6227068B1 (ja) * 2016-07-27 2017-11-08 浜松ホトニクス株式会社 試料容器保持部材、光計測装置及び試料容器配置方法
AU2017307222B2 (en) * 2016-08-02 2021-12-23 Newport Corporation Multi-junction detector device and method of use
DE102017200356A1 (de) * 2017-01-11 2018-07-12 Robert Bosch Gmbh Verfahren zur Analyse eines Messbereichs und Miniaturspektrometer
JP6760494B2 (ja) * 2017-04-28 2020-09-23 株式会社島津製作所 分光蛍光光度計、分光測定方法、及び分光蛍光光度計用制御ソフトウェア
JP6943618B2 (ja) * 2017-05-17 2021-10-06 浜松ホトニクス株式会社 分光測定装置及び分光測定方法
EP3633351B1 (en) * 2017-05-23 2023-03-29 Hamamatsu Photonics K.K. Orientation characteristic measurement method, orientation characteristic measurement program, and orientation characteristic measurement device
JP6356372B1 (ja) 2017-05-23 2018-07-11 浜松ホトニクス株式会社 配向特性測定方法、配向特性測定プログラム、及び配向特性測定装置
KR102082801B1 (ko) * 2018-02-07 2020-02-28 (주)유니버셜스탠다드테크놀러지 양자 수율과 발광 수명 동시 측정장치
CN109164773B (zh) * 2018-09-29 2020-03-27 厦门大学 一种基于LabVIEW的多功能光学测试系统及方法
CN111214209B (zh) * 2018-11-27 2024-01-09 晶元光电股份有限公司 光学感测模块
KR102256845B1 (ko) * 2019-09-26 2021-05-27 한국광기술원 적분구를 이용한 형광 측정 장치 및 방법
CN110954508B (zh) * 2019-12-17 2022-06-10 中国计量科学研究院 积分球开口处反射比测量方法和漫反射比的绝对测量方法
US20230082052A1 (en) * 2020-02-20 2023-03-16 Shimadzu Corporation Photoreaction evaluation device and photon count calculation method
JP7374937B2 (ja) * 2021-01-13 2023-11-07 株式会社アドバンテスト 試験装置、試験方法およびプログラム

Family Cites Families (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4583860A (en) * 1983-11-30 1986-04-22 The United States Of America As Represented By The Administrator Of The National Aeronautics And Space Administration Optical multiple sample vacuum integrating sphere
JPS6276433A (ja) 1985-09-30 1987-04-08 Shimadzu Corp 分光光度計における積分球測定装置
JP3287775B2 (ja) 1996-02-29 2002-06-04 松下電器産業株式会社 蛍光体の量子効率測定方法および測定装置
JP2001059812A (ja) 1999-08-23 2001-03-06 Hamamatsu Photonics Kk 微弱光測定装置
JP3682528B2 (ja) 2002-01-24 2005-08-10 独立行政法人産業技術総合研究所 固体試料の絶対蛍光量子効率測定方法及び装置
JP3773499B2 (ja) * 2003-04-08 2006-05-10 住友重機械アドバンストマシナリー株式会社 発光素子の外部量子効率測定方法及び装置
JP2005140546A (ja) 2003-11-04 2005-06-02 Keiichiro Ogawa 低温拡散反射測定装置及びそれに用いる試料ホルダ、低温拡散反射スペクトル測定方法
JP4400448B2 (ja) * 2004-12-22 2010-01-20 コニカミノルタセンシング株式会社 分光輝度計の校正方法、及び校正システムの動作プログラム
WO2009050536A1 (en) * 2007-10-15 2009-04-23 Ecole Polytechnique Federale De Lausanne (Epfl) Integrating sphere for the optical analysis of luminescent materials
JP5225829B2 (ja) * 2008-12-24 2013-07-03 浜松ホトニクス株式会社 分光測定装置
CN101932926B (zh) 2009-01-20 2013-07-24 大塚电子株式会社 量子效率测量装置以及量子效率测量方法
JP5640257B2 (ja) 2010-03-18 2014-12-17 大塚電子株式会社 量子効率測定方法および量子効率測定装置
JP5491368B2 (ja) * 2010-11-29 2014-05-14 浜松ホトニクス株式会社 量子収率測定装置及び量子収率測定方法
JP5944843B2 (ja) 2013-02-04 2016-07-05 浜松ホトニクス株式会社 分光測定装置及び分光測定方法
CN103344621B (zh) 2013-07-03 2015-12-02 重庆大学 一种荧光量子效率测量装置及其测量方法

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