JP2013541176A5 - - Google Patents
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- Publication number
- JP2013541176A5 JP2013541176A5 JP2013521130A JP2013521130A JP2013541176A5 JP 2013541176 A5 JP2013541176 A5 JP 2013541176A5 JP 2013521130 A JP2013521130 A JP 2013521130A JP 2013521130 A JP2013521130 A JP 2013521130A JP 2013541176 A5 JP2013541176 A5 JP 2013541176A5
- Authority
- JP
- Japan
- Prior art keywords
- substrate
- heating
- processing system
- vacuum processing
- motomeko
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
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Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US36791010P | 2010-07-27 | 2010-07-27 | |
| US61/367,910 | 2010-07-27 | ||
| PCT/EP2011/062912 WO2012013707A1 (en) | 2010-07-27 | 2011-07-27 | Heating arrangement and method for heating substrates |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2013541176A JP2013541176A (ja) | 2013-11-07 |
| JP2013541176A5 true JP2013541176A5 (enExample) | 2014-09-18 |
| JP6088970B2 JP6088970B2 (ja) | 2017-03-01 |
Family
ID=44681074
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2013521130A Expired - Fee Related JP6088970B2 (ja) | 2010-07-27 | 2011-07-27 | 加熱配置構成及び基板を加熱するための方法 |
Country Status (6)
| Country | Link |
|---|---|
| US (1) | US10276412B2 (enExample) |
| EP (1) | EP2599115B1 (enExample) |
| JP (1) | JP6088970B2 (enExample) |
| KR (2) | KR102121794B1 (enExample) |
| CN (1) | CN103222041B (enExample) |
| WO (1) | WO2012013707A1 (enExample) |
Families Citing this family (11)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20130074358A1 (en) * | 2011-09-24 | 2013-03-28 | Quantum Technology Holdings Limited | Heated body with high heat transfer rate material and its use |
| EP2896065A1 (en) * | 2012-08-27 | 2015-07-22 | Oerlikon Advanced Technologies AG | Processing arrangement with temperature conditioning arrangement and method of processing a substrate |
| US10208381B2 (en) | 2014-12-23 | 2019-02-19 | Rec Silicon Inc | Apparatus and method for managing a temperature profile using reflective energy in a thermal decomposition reactor |
| WO2016106337A1 (en) * | 2014-12-23 | 2016-06-30 | Rec Silicon Inc | Apparatus and method for managing a temperature profile using reflective energy in a thermal decomposition reactor |
| KR102592972B1 (ko) * | 2016-02-12 | 2023-10-24 | 삼성전자주식회사 | 센싱 모듈 기판 및 이를 포함하는 센싱 모듈 |
| DE102016015502A1 (de) * | 2016-12-23 | 2018-06-28 | Singulus Technologies Ag | Verfahren und Vorrichtung zur thermischen Behandlung beschichteter Substrate, insbesondere von Dünnschicht-Solarsubstraten |
| DE102018128243A1 (de) * | 2018-11-12 | 2020-05-14 | AM Metals GmbH | Herstellvorrichtung zur additiven Fertigung dreidimensionaler Bauteile |
| JP7398935B2 (ja) * | 2019-11-25 | 2023-12-15 | 東京エレクトロン株式会社 | 載置台、及び、検査装置 |
| CN115461491B (zh) * | 2020-07-01 | 2024-08-23 | 应用材料公司 | 用于操作腔室的方法、用于处理基板的装置和基板处理系统 |
| DE102020130339A1 (de) * | 2020-11-17 | 2022-05-19 | Aixtron Se | Heizeinrichtung für einen CVD-Reaktor |
| WO2024201683A1 (ja) * | 2023-03-27 | 2024-10-03 | 株式会社日立ハイテク | プラズマ処理装置 |
Family Cites Families (30)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4470369A (en) * | 1982-07-12 | 1984-09-11 | Energy Conversion Devices, Inc. | Apparatus for uniformly heating a substrate |
| JPS63274714A (ja) * | 1987-04-28 | 1988-11-11 | Michio Sugiyama | 真空熱処理炉用ラジアントチユ−ブヒ−タ |
| US4832778A (en) * | 1987-07-16 | 1989-05-23 | Texas Instruments Inc. | Processing apparatus for wafers |
| US5108570A (en) | 1990-03-30 | 1992-04-28 | Applied Materials, Inc. | Multistep sputtering process for forming aluminum layer over stepped semiconductor wafer |
| US5700992A (en) * | 1993-10-08 | 1997-12-23 | Toshiba Machine Co., Ltd. | Zigzag heating device with downward directed connecting portions |
| JPH07221037A (ja) | 1994-02-03 | 1995-08-18 | Dainippon Screen Mfg Co Ltd | 熱処理装置 |
| JPH0820868A (ja) * | 1994-07-06 | 1996-01-23 | Noboru Naruo | 真空加熱均熱ヒーター |
| JPH08191074A (ja) * | 1995-01-10 | 1996-07-23 | Touyoko Kagaku Kk | 高速熱処理装置 |
| JPH08222360A (ja) * | 1995-02-10 | 1996-08-30 | Noboru Naruo | 真空加熱兼冷却均熱ヒータ |
| JPH10208855A (ja) * | 1997-01-23 | 1998-08-07 | Toshiba Ceramics Co Ltd | 面状ヒータ |
| JPH1197448A (ja) * | 1997-09-18 | 1999-04-09 | Kemitoronikusu:Kk | 熱処理装置とこれを用いた半導体結晶の熱処理法 |
| EP1155437B1 (en) * | 1999-02-04 | 2008-08-20 | STEAG RTP Systems GmbH | Cooled showerhead for rapid thermal processing (rtp) system |
| JP3170573B2 (ja) * | 1999-06-23 | 2001-05-28 | 助川電気工業株式会社 | 縦型加熱炉用円板状ヒータ |
| US6342691B1 (en) | 1999-11-12 | 2002-01-29 | Mattson Technology, Inc. | Apparatus and method for thermal processing of semiconductor substrates |
| JP2001332560A (ja) | 2000-05-23 | 2001-11-30 | Ibiden Co Ltd | 半導体製造・検査装置 |
| JP2004146570A (ja) * | 2002-10-24 | 2004-05-20 | Sumitomo Electric Ind Ltd | 半導体製造装置用セラミックスヒーター |
| JP4227578B2 (ja) * | 2003-09-30 | 2009-02-18 | キヤノン株式会社 | 加熱方法および画像表示装置の製造方法 |
| JP4710255B2 (ja) * | 2004-03-26 | 2011-06-29 | ウシオ電機株式会社 | 加熱ステージ |
| JP4377296B2 (ja) * | 2004-07-30 | 2009-12-02 | エア・ウォーター株式会社 | 成膜装置 |
| US20060127067A1 (en) | 2004-12-13 | 2006-06-15 | General Electric Company | Fast heating and cooling wafer handling assembly and method of manufacturing thereof |
| TWI295816B (en) * | 2005-07-19 | 2008-04-11 | Applied Materials Inc | Hybrid pvd-cvd system |
| US7842135B2 (en) * | 2006-01-09 | 2010-11-30 | Aixtron Ag | Equipment innovations for nano-technology aquipment, especially for plasma growth chambers of carbon nanotube and nanowire |
| JP5041736B2 (ja) * | 2006-06-09 | 2012-10-03 | キヤノントッキ株式会社 | 基板加熱装置及び基板加熱方法 |
| JP4142706B2 (ja) | 2006-09-28 | 2008-09-03 | 富士フイルム株式会社 | 成膜装置、成膜方法、絶縁膜、誘電体膜、圧電膜、強誘電体膜、圧電素子および液体吐出装置 |
| US8057601B2 (en) * | 2007-05-09 | 2011-11-15 | Applied Materials, Inc. | Apparatus and method for supporting, positioning and rotating a substrate in a processing chamber |
| US8548311B2 (en) * | 2008-04-09 | 2013-10-01 | Applied Materials, Inc. | Apparatus and method for improved control of heating and cooling of substrates |
| US8961691B2 (en) * | 2008-09-04 | 2015-02-24 | Tokyo Electron Limited | Film deposition apparatus, film deposition method, computer readable storage medium for storing a program causing the apparatus to perform the method |
| US8294068B2 (en) * | 2008-09-10 | 2012-10-23 | Applied Materials, Inc. | Rapid thermal processing lamphead with improved cooling |
| JP5003663B2 (ja) * | 2008-12-04 | 2012-08-15 | 株式会社島津製作所 | 真空加熱装置 |
| US20100151680A1 (en) * | 2008-12-17 | 2010-06-17 | Optisolar Inc. | Substrate carrier with enhanced temperature uniformity |
-
2011
- 2011-07-27 US US13/812,289 patent/US10276412B2/en active Active
- 2011-07-27 JP JP2013521130A patent/JP6088970B2/ja not_active Expired - Fee Related
- 2011-07-27 CN CN201180036622.4A patent/CN103222041B/zh not_active Expired - Fee Related
- 2011-07-27 EP EP11761291.1A patent/EP2599115B1/en not_active Not-in-force
- 2011-07-27 WO PCT/EP2011/062912 patent/WO2012013707A1/en not_active Ceased
- 2011-07-27 KR KR1020177027060A patent/KR102121794B1/ko not_active Expired - Fee Related
- 2011-07-27 KR KR1020137004891A patent/KR101783819B1/ko not_active Expired - Fee Related
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