JP2013524012A5 - - Google Patents
Download PDFInfo
- Publication number
- JP2013524012A5 JP2013524012A5 JP2013502704A JP2013502704A JP2013524012A5 JP 2013524012 A5 JP2013524012 A5 JP 2013524012A5 JP 2013502704 A JP2013502704 A JP 2013502704A JP 2013502704 A JP2013502704 A JP 2013502704A JP 2013524012 A5 JP2013524012 A5 JP 2013524012A5
- Authority
- JP
- Japan
- Prior art keywords
- slot
- coupled
- energy
- feed
- ground
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Applications Claiming Priority (11)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US31937710P | 2010-03-31 | 2010-03-31 | |
| US61/319,377 | 2010-03-31 | ||
| US32872510P | 2010-04-28 | 2010-04-28 | |
| US61/328,725 | 2010-04-28 | ||
| US37177410P | 2010-08-09 | 2010-08-09 | |
| US61/371,774 | 2010-08-09 | ||
| US39330910P | 2010-10-14 | 2010-10-14 | |
| US61/393,309 | 2010-10-14 | ||
| US13/048,440 | 2011-03-15 | ||
| US13/048,440 US8795488B2 (en) | 2010-03-31 | 2011-03-15 | Apparatus for physical vapor deposition having centrally fed RF energy |
| PCT/US2011/030226 WO2011123399A2 (en) | 2010-03-31 | 2011-03-28 | Apparatus for physical vapor deposition having centrally fed rf energy |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2013524012A JP2013524012A (ja) | 2013-06-17 |
| JP2013524012A5 true JP2013524012A5 (enExample) | 2014-05-15 |
| JP5722428B2 JP5722428B2 (ja) | 2015-05-20 |
Family
ID=44708340
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2013502704A Active JP5722428B2 (ja) | 2010-03-31 | 2011-03-28 | Ｒｆエネルギが中心に給送される物理蒸着のための装置 |
Country Status (6)
| Country | Link |
|---|---|
| US (1) | US8795488B2 (enExample) |
| JP (1) | JP5722428B2 (enExample) |
| KR (1) | KR101801760B1 (enExample) |
| CN (1) | CN102859029B (enExample) |
| TW (1) | TWI521081B (enExample) |
| WO (1) | WO2011123399A2 (enExample) |
Families Citing this family (38)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2914833B2 (ja) | 1992-09-14 | 1999-07-05 | シャープ株式会社 | 半導体レーザ |
| CN102439697B (zh) * | 2009-04-03 | 2015-08-19 | 应用材料公司 | 高压rf-dc溅射及改善此工艺的膜均匀性和阶梯覆盖率的方法 |
| US11615941B2 (en) | 2009-05-01 | 2023-03-28 | Advanced Energy Industries, Inc. | System, method, and apparatus for controlling ion energy distribution in plasma processing systems |
| CN103348446B (zh) | 2011-02-09 | 2016-08-24 | 应用材料公司 | 用于rf pvd腔室且能均匀调整的esc接地套件 |
| US8702918B2 (en) | 2011-12-15 | 2014-04-22 | Applied Materials, Inc. | Apparatus for enabling concentricity of plasma dark space |
| US9404174B2 (en) | 2011-12-15 | 2016-08-02 | Applied Materials, Inc. | Pinned target design for RF capacitive coupled plasma |
| US9685297B2 (en) | 2012-08-28 | 2017-06-20 | Advanced Energy Industries, Inc. | Systems and methods for monitoring faults, anomalies, and other characteristics of a switched mode ion energy distribution system |
| US20140061039A1 (en) * | 2012-09-05 | 2014-03-06 | Applied Materials, Inc. | Target cooling for physical vapor deposition (pvd) processing systems |
| CN103849848B (zh) * | 2012-11-28 | 2016-08-31 | 北京北方微电子基地设备工艺研究中心有限责任公司 | 物理气相沉积装置 |
| CN105706212B (zh) | 2013-11-05 | 2018-11-20 | 应用材料公司 | 溅射沉积源、溅射沉积的设备及其组装方法 |
| US9960021B2 (en) * | 2013-12-18 | 2018-05-01 | Applied Materials, Inc. | Physical vapor deposition (PVD) target having low friction pads |
| KR102311740B1 (ko) * | 2016-03-05 | 2021-10-08 | 어플라이드 머티어리얼스, 인코포레이티드 | 물리 기상 증착 프로세스들에서 이온 프랙션을 제어하기 위한 방법들 및 장치 |
| US10224224B2 (en) | 2017-03-10 | 2019-03-05 | Micromaterials, LLC | High pressure wafer processing systems and related methods |
| US10622214B2 (en) | 2017-05-25 | 2020-04-14 | Applied Materials, Inc. | Tungsten defluorination by high pressure treatment |
| KR102405723B1 (ko) | 2017-08-18 | 2022-06-07 | 어플라이드 머티어리얼스, 인코포레이티드 | 고압 및 고온 어닐링 챔버 |
| US10276411B2 (en) | 2017-08-18 | 2019-04-30 | Applied Materials, Inc. | High pressure and high temperature anneal chamber |
| JP7112490B2 (ja) | 2017-11-11 | 2022-08-03 | マイクロマテリアルズ エルエルシー | 高圧処理チャンバのためのガス供給システム |
| US12505986B2 (en) | 2017-11-17 | 2025-12-23 | Advanced Energy Industries, Inc. | Synchronization of plasma processing components |
| JP7235761B2 (ja) * | 2017-11-17 | 2023-03-08 | エーイーエス グローバル ホールディングス， プライベート リミテッド | プラズマ処理源および基板バイアスの同期パルス化 |
| JP2021503714A (ja) | 2017-11-17 | 2021-02-12 | アプライド マテリアルズ インコーポレイテッドＡｐｐｌｉｅｄ Ｍａｔｅｒｉａｌｓ，Ｉｎｃｏｒｐｏｒａｔｅｄ | 高圧処理システムのためのコンデンサシステム |
| US11437221B2 (en) | 2017-11-17 | 2022-09-06 | Advanced Energy Industries, Inc. | Spatial monitoring and control of plasma processing environments |
| US12230476B2 (en) | 2017-11-17 | 2025-02-18 | Advanced Energy Industries, Inc. | Integrated control of a plasma processing system |
| TWI872423B (zh) | 2017-11-17 | 2025-02-11 | 新加坡商Aes 全球公司 | 用於在空間域和時間域上控制基板上的電漿處理之系統和方法，及相關的電腦可讀取媒體 |
| KR20250153883A (ko) | 2017-11-17 | 2025-10-27 | 에이이에스 글로벌 홀딩스 피티이 리미티드 | 플라즈마 프로세싱 시스템에서 변조 공급기들의 개선된 적용 |
| WO2019173006A1 (en) | 2018-03-09 | 2019-09-12 | Applied Materials, Inc. | High pressure annealing process for metal containing materials |
| US10950429B2 (en) * | 2018-05-08 | 2021-03-16 | Applied Materials, Inc. | Methods of forming amorphous carbon hard mask layers and hard mask layers formed therefrom |
| US10748783B2 (en) | 2018-07-25 | 2020-08-18 | Applied Materials, Inc. | Gas delivery module |
| WO2020117462A1 (en) | 2018-12-07 | 2020-06-11 | Applied Materials, Inc. | Semiconductor processing system |
| US11887812B2 (en) | 2019-07-12 | 2024-01-30 | Advanced Energy Industries, Inc. | Bias supply with a single controlled switch |
| US11901222B2 (en) | 2020-02-17 | 2024-02-13 | Applied Materials, Inc. | Multi-step process for flowable gap-fill film |
| US12125674B2 (en) | 2020-05-11 | 2024-10-22 | Advanced Energy Industries, Inc. | Surface charge and power feedback and control using a switch mode bias system |
| TWI787823B (zh) * | 2021-05-17 | 2022-12-21 | 天虹科技股份有限公司 | 可減少微塵的基板處理腔室及其遮擋機構 |
| JP7805737B2 (ja) * | 2021-09-28 | 2026-01-26 | 芝浦メカトロニクス株式会社 | 成膜装置 |
| US12046448B2 (en) | 2022-01-26 | 2024-07-23 | Advanced Energy Industries, Inc. | Active switch on time control for bias supply |
| US11670487B1 (en) | 2022-01-26 | 2023-06-06 | Advanced Energy Industries, Inc. | Bias supply control and data processing |
| US11942309B2 (en) | 2022-01-26 | 2024-03-26 | Advanced Energy Industries, Inc. | Bias supply with resonant switching |
| US11978613B2 (en) | 2022-09-01 | 2024-05-07 | Advanced Energy Industries, Inc. | Transition control in a bias supply |
| US12567572B2 (en) | 2023-07-11 | 2026-03-03 | Advanced Energy Industries, Inc. | Plasma behaviors predicted by current measurements during asymmetric bias waveform application |
Family Cites Families (14)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH01309965A (ja) | 1988-06-08 | 1989-12-14 | Matsushita Electric Ind Co Ltd | マグネトロンスパッタ装置 |
| US5482610A (en) * | 1991-11-14 | 1996-01-09 | Leybold Aktiengesellschaft | Cathode for coating a substrate |
| JP2001220671A (ja) | 1999-12-02 | 2001-08-14 | Anelva Corp | スパッタ成膜応用のためのプラズマ処理装置 |
| US6451177B1 (en) | 2000-01-21 | 2002-09-17 | Applied Materials, Inc. | Vault shaped target and magnetron operable in two sputtering modes |
| EP1254970A1 (de) * | 2001-05-03 | 2002-11-06 | Unaxis Balzers Aktiengesellschaft | Magnetronsputterquelle mit mehrteiligem Target |
| JP4614578B2 (ja) | 2001-06-01 | 2011-01-19 | キヤノンアネルバ株式会社 | スパッタ成膜応用のためのプラズマ処理装置 |
| US7504006B2 (en) | 2002-08-01 | 2009-03-17 | Applied Materials, Inc. | Self-ionized and capacitively-coupled plasma for sputtering and resputtering |
| US7179351B1 (en) | 2003-12-15 | 2007-02-20 | Novellus Systems, Inc. | Methods and apparatus for magnetron sputtering |
| US7820020B2 (en) | 2005-02-03 | 2010-10-26 | Applied Materials, Inc. | Apparatus for plasma-enhanced physical vapor deposition of copper with RF source power applied through the workpiece with a lighter-than-copper carrier gas |
| US8557094B2 (en) | 2006-10-05 | 2013-10-15 | Applied Materials, Inc. | Sputtering chamber having auxiliary backside magnet to improve etch uniformity and magnetron producing sustained self sputtering of ruthenium and tantalum |
| JP5178832B2 (ja) | 2007-07-25 | 2013-04-10 | ジーエス ナノテク カンパニー リミテッド | 非電導性ターゲットを使用するスパッタリングによるセラミック薄膜の成膜方法 |
| US8070925B2 (en) | 2008-10-17 | 2011-12-06 | Applied Materials, Inc. | Physical vapor deposition reactor with circularly symmetric RF feed and DC feed to the sputter target |
| US9834840B2 (en) * | 2010-05-14 | 2017-12-05 | Applied Materials, Inc. | Process kit shield for improved particle reduction |
| TWI554630B (zh) * | 2010-07-02 | 2016-10-21 | 應用材料股份有限公司 | 減少沉積不對稱性的沉積設備及方法 |
-
2011
- 2011-03-15 US US13/048,440 patent/US8795488B2/en active Active
- 2011-03-17 TW TW100109194A patent/TWI521081B/zh active
- 2011-03-28 JP JP2013502704A patent/JP5722428B2/ja active Active
- 2011-03-28 CN CN201180020863.XA patent/CN102859029B/zh active Active
- 2011-03-28 WO PCT/US2011/030226 patent/WO2011123399A2/en not_active Ceased
- 2011-03-28 KR KR1020127027934A patent/KR101801760B1/ko active Active
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| TW202121619A (zh) | 用於基板支撐件的整合電極和接地平面 | |
| JP2003517197A5 (enExample) | ||
| JP2013543269A5 (enExample) | ||
| WO2012054689A3 (en) | Substrate support with symmetrical feed structure | |
| JP2010529621A5 (enExample) | ||
| TW201204858A (en) | Deposition apparatus and methods to reduce deposition asymmetry | |
| WO2010071785A3 (en) | Plasma confinement structures in plasma processing systems | |
| WO2012033922A3 (en) | High conductivity electrostatic chuck | |
| JP2015536566A5 (enExample) | ||
| WO2013039972A3 (en) | Composite conductor insulation | |
| JP2015515252A (ja) | スイッチギヤを備えた２つのパネルを電気的に接続するためのコネクタ | |
| WO2012138580A3 (en) | Initiator with molded esd dissipater | |
| CN103388124A (zh) | 溅射设备以及使用该溅射设备沉积薄膜的方法 | |
| JP5771466B2 (ja) | ダイボンダ及びダイボンダの接合材供給方法 | |
| TW200644031A (en) | Flat or substantially flat luminous structure | |
| CN209435522U (zh) | 一种等离子体发生装置 | |
| CN201788780U (zh) | 一种贴片电感器 | |
| CN106229063B (zh) | 电源线及电器设备 | |
| JP5322961B2 (ja) | プラズマｃｖｄ装置 | |
| CN106229065B (zh) | 电源线及电器设备 | |
| RU2012136022A (ru) | Переход высокочастотный | |
| CN104885163A (zh) | 电缆 | |
| GB2465322A (en) | Retractor apparatus for electrical cord | |
| CN104577278B (zh) | 滤波器 | |
| JP2013114964A5 (enExample) |