JP2013195208A - 微小粒子測定装置 - Google Patents

微小粒子測定装置 Download PDF

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Publication number
JP2013195208A
JP2013195208A JP2012062192A JP2012062192A JP2013195208A JP 2013195208 A JP2013195208 A JP 2013195208A JP 2012062192 A JP2012062192 A JP 2012062192A JP 2012062192 A JP2012062192 A JP 2012062192A JP 2013195208 A JP2013195208 A JP 2013195208A
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Japan
Prior art keywords
lens
relay lens
beam spot
imaging lens
relay
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Pending
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JP2012062192A
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English (en)
Japanese (ja)
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JP2013195208A5 (enExample
Inventor
Katsuhiro Seo
勝弘 瀬尾
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Sony Corp
Original Assignee
Sony Corp
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Publication date
Application filed by Sony Corp filed Critical Sony Corp
Priority to JP2012062192A priority Critical patent/JP2013195208A/ja
Priority to CN201310078580.1A priority patent/CN103323384B/zh
Priority to US13/828,054 priority patent/US8913242B2/en
Publication of JP2013195208A publication Critical patent/JP2013195208A/ja
Publication of JP2013195208A5 publication Critical patent/JP2013195208A5/ja
Pending legal-status Critical Current

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
    • G01N15/02—Investigating particle size or size distribution
    • G01N15/0205—Investigating particle size or size distribution by optical means

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  • Chemical & Material Sciences (AREA)
  • Dispersion Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
JP2012062192A 2012-03-19 2012-03-19 微小粒子測定装置 Pending JP2013195208A (ja)

Priority Applications (3)

Application Number Priority Date Filing Date Title
JP2012062192A JP2013195208A (ja) 2012-03-19 2012-03-19 微小粒子測定装置
CN201310078580.1A CN103323384B (zh) 2012-03-19 2013-03-12 微粒测量装置
US13/828,054 US8913242B2 (en) 2012-03-19 2013-03-14 Fine particle measurement device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2012062192A JP2013195208A (ja) 2012-03-19 2012-03-19 微小粒子測定装置

Related Child Applications (1)

Application Number Title Priority Date Filing Date
JP2016117856A Division JP6249049B2 (ja) 2016-06-14 2016-06-14 微小粒子測定装置

Publications (2)

Publication Number Publication Date
JP2013195208A true JP2013195208A (ja) 2013-09-30
JP2013195208A5 JP2013195208A5 (enExample) 2015-03-26

Family

ID=49157324

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2012062192A Pending JP2013195208A (ja) 2012-03-19 2012-03-19 微小粒子測定装置

Country Status (3)

Country Link
US (1) US8913242B2 (enExample)
JP (1) JP2013195208A (enExample)
CN (1) CN103323384B (enExample)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2016024024A (ja) * 2014-07-18 2016-02-08 株式会社堀場製作所 粒子分析装置
JP2019040527A (ja) * 2017-08-28 2019-03-14 株式会社オービック Ｋｐｉ策定用データ収集装置、ｋｐｉ策定用データ収集方法、および、ｋｐｉ策定用データ収集プログラム
JP2022172075A (ja) * 2017-09-21 2022-11-15 ビーアイティー グループ フランス 落射蛍光測定用の光学フローサイトメータ

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN105717035B (zh) * 2016-04-08 2019-04-23 清华大学 流式细胞术检测装置和方法
CN106226224A (zh) * 2016-08-18 2016-12-14 重庆玖润隆科技有限公司 一种粒子分析仪用光学系统

Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS63241336A (ja) * 1987-03-28 1988-10-06 Toshiba Corp 粒径測定装置
JPH04110639A (ja) * 1990-08-30 1992-04-13 Canon Inc 粒子分別装置
JPH04335135A (ja) * 1991-05-11 1992-11-24 Horiba Ltd 微粒子カウンター
JP2009113293A (ja) * 2007-11-05 2009-05-28 Sony Corp 光造形装置及び光造形方法
JP2010216873A (ja) * 2009-03-13 2010-09-30 Omron Corp 変位センサ
JP2011095181A (ja) * 2009-10-30 2011-05-12 Sysmex Corp 粒子分析装置
JP2012026837A (ja) * 2010-07-22 2012-02-09 Sony Corp 微小粒子測定装置
JP2012026754A (ja) * 2010-07-20 2012-02-09 Sony Corp 微小粒子測定装置及び光照射装置

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3102935B2 (ja) * 1991-11-20 2000-10-23 シスメックス株式会社 イメージングフローサイトメータ
JP5239915B2 (ja) * 2009-02-02 2013-07-17 ソニー株式会社 投射型表示装置
JP5487638B2 (ja) 2009-02-17 2014-05-07 ソニー株式会社 微小粒子分取のための装置及びマイクロチップ
CN101629903B (zh) * 2009-08-19 2011-01-05 南京信息工程大学 散射式云粒子探测器光学系统

Patent Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS63241336A (ja) * 1987-03-28 1988-10-06 Toshiba Corp 粒径測定装置
JPH04110639A (ja) * 1990-08-30 1992-04-13 Canon Inc 粒子分別装置
JPH04335135A (ja) * 1991-05-11 1992-11-24 Horiba Ltd 微粒子カウンター
JP2009113293A (ja) * 2007-11-05 2009-05-28 Sony Corp 光造形装置及び光造形方法
JP2010216873A (ja) * 2009-03-13 2010-09-30 Omron Corp 変位センサ
JP2011095181A (ja) * 2009-10-30 2011-05-12 Sysmex Corp 粒子分析装置
JP2012026754A (ja) * 2010-07-20 2012-02-09 Sony Corp 微小粒子測定装置及び光照射装置
JP2012026837A (ja) * 2010-07-22 2012-02-09 Sony Corp 微小粒子測定装置

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2016024024A (ja) * 2014-07-18 2016-02-08 株式会社堀場製作所 粒子分析装置
US10254213B2 (en) 2014-07-18 2019-04-09 Horiba, Ltd. Particle analysis apparatus
JP2019040527A (ja) * 2017-08-28 2019-03-14 株式会社オービック Ｋｐｉ策定用データ収集装置、ｋｐｉ策定用データ収集方法、および、ｋｐｉ策定用データ収集プログラム
JP2022172075A (ja) * 2017-09-21 2022-11-15 ビーアイティー グループ フランス 落射蛍光測定用の光学フローサイトメータ

Also Published As

Publication number Publication date
CN103323384A (zh) 2013-09-25
US20130242302A1 (en) 2013-09-19
CN103323384B (zh) 2017-08-11
US8913242B2 (en) 2014-12-16

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