JP2013030755A - 多部品出力構造体及びその形成方法 - Google Patents
多部品出力構造体及びその形成方法 Download PDFInfo
- Publication number
- JP2013030755A JP2013030755A JP2012125792A JP2012125792A JP2013030755A JP 2013030755 A JP2013030755 A JP 2013030755A JP 2012125792 A JP2012125792 A JP 2012125792A JP 2012125792 A JP2012125792 A JP 2012125792A JP 2013030755 A JP2013030755 A JP 2013030755A
- Authority
- JP
- Japan
- Prior art keywords
- temperature material
- layer
- matrix
- high temperature
- melting point
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- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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Classifications
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W40/00—Arrangements for thermal protection or thermal control
- H10W40/20—Arrangements for cooling
- H10W40/25—Arrangements for cooling characterised by their materials
- H10W40/255—Arrangements for cooling characterised by their materials having a laminate or multilayered structure, e.g. direct bond copper [DBC] ceramic substrates
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W40/00—Arrangements for thermal protection or thermal control
- H10W40/10—Arrangements for heating
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W40/00—Arrangements for thermal protection or thermal control
- H10W40/40—Arrangements for thermal protection or thermal control involving heat exchange by flowing fluids
- H10W40/47—Arrangements for thermal protection or thermal control involving heat exchange by flowing fluids by flowing liquids, e.g. forced water cooling
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/071—Connecting or disconnecting
- H10W72/073—Connecting or disconnecting of die-attach connectors
- H10W72/07331—Connecting techniques
- H10W72/07336—Soldering or alloying
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/071—Connecting or disconnecting
- H10W72/076—Connecting or disconnecting of strap connectors
- H10W72/07631—Techniques
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/071—Connecting or disconnecting
- H10W72/076—Connecting or disconnecting of strap connectors
- H10W72/07651—Connecting or disconnecting of strap connectors characterised by changes in properties of the strap connectors during connecting
- H10W72/07653—Connecting or disconnecting of strap connectors characterised by changes in properties of the strap connectors during connecting changes in shapes
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/30—Die-attach connectors
- H10W72/321—Structures or relative sizes of die-attach connectors
- H10W72/322—Multilayered die-attach connectors, e.g. a coating on a top surface of a core
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/30—Die-attach connectors
- H10W72/351—Materials of die-attach connectors
- H10W72/352—Materials of die-attach connectors comprising metals or metalloids, e.g. solders
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/50—Bond wires
- H10W72/531—Shapes of wire connectors
- H10W72/533—Cross-sectional shape
- H10W72/534—Cross-sectional shape being rectangular
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/50—Bond wires
- H10W72/531—Shapes of wire connectors
- H10W72/5363—Shapes of wire connectors the connected ends being wedge-shaped
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/50—Bond wires
- H10W72/551—Materials of bond wires
- H10W72/552—Materials of bond wires comprising metals or metalloids, e.g. silver
- H10W72/5524—Materials of bond wires comprising metals or metalloids, e.g. silver comprising aluminium [Al]
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/60—Strap connectors, e.g. thick copper clips for grounding of power devices
- H10W72/651—Materials of strap connectors
- H10W72/652—Materials of strap connectors comprising metals or metalloids, e.g. silver
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/851—Dispositions of multiple connectors or interconnections
- H10W72/853—On the same surface
- H10W72/871—Bond wires and strap connectors
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/851—Dispositions of multiple connectors or interconnections
- H10W72/874—On different surfaces
- H10W72/884—Die-attach connectors and bond wires
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/851—Dispositions of multiple connectors or interconnections
- H10W72/874—On different surfaces
- H10W72/886—Die-attach connectors and strap connectors
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/90—Bond pads, in general
- H10W72/951—Materials of bond pads
- H10W72/952—Materials of bond pads comprising metals or metalloids, e.g. PbSn, Ag or Cu
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W90/00—Package configurations
- H10W90/701—Package configurations characterised by the relative positions of pads or connectors relative to package parts
- H10W90/731—Package configurations characterised by the relative positions of pads or connectors relative to package parts of die-attach connectors
- H10W90/734—Package configurations characterised by the relative positions of pads or connectors relative to package parts of die-attach connectors between a chip and a stacked insulating package substrate, interposer or RDL
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W90/00—Package configurations
- H10W90/701—Package configurations characterised by the relative positions of pads or connectors relative to package parts
- H10W90/751—Package configurations characterised by the relative positions of pads or connectors relative to package parts of bond wires
- H10W90/754—Package configurations characterised by the relative positions of pads or connectors relative to package parts of bond wires between a chip and a stacked insulating package substrate, interposer or RDL
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W90/00—Package configurations
- H10W90/701—Package configurations characterised by the relative positions of pads or connectors relative to package parts
- H10W90/761—Package configurations characterised by the relative positions of pads or connectors relative to package parts of strap connectors
- H10W90/764—Package configurations characterised by the relative positions of pads or connectors relative to package parts of strap connectors between a chip and a stacked insulating package substrate, interposer or RDL
Landscapes
- Cooling Or The Like Of Semiconductors Or Solid State Devices (AREA)
- Pressure Welding/Diffusion-Bonding (AREA)
- Cooling Or The Like Of Electrical Apparatus (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US13/150,645 | 2011-06-01 | ||
| US13/150,645 US8431445B2 (en) | 2011-06-01 | 2011-06-01 | Multi-component power structures and methods for forming the same |
Related Child Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2015223076A Division JP6034472B2 (ja) | 2011-06-01 | 2015-11-13 | 多部品出力構造体及びその形成方法 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JP2013030755A true JP2013030755A (ja) | 2013-02-07 |
| JP2013030755A5 JP2013030755A5 (https=) | 2013-08-01 |
Family
ID=47261062
Family Applications (2)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2012125792A Withdrawn JP2013030755A (ja) | 2011-06-01 | 2012-06-01 | 多部品出力構造体及びその形成方法 |
| JP2015223076A Expired - Fee Related JP6034472B2 (ja) | 2011-06-01 | 2015-11-13 | 多部品出力構造体及びその形成方法 |
Family Applications After (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2015223076A Expired - Fee Related JP6034472B2 (ja) | 2011-06-01 | 2015-11-13 | 多部品出力構造体及びその形成方法 |
Country Status (2)
| Country | Link |
|---|---|
| US (1) | US8431445B2 (https=) |
| JP (2) | JP2013030755A (https=) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2015024443A (ja) * | 2013-07-05 | 2015-02-05 | トヨタ モーター エンジニアリング アンド マニュファクチャリング ノース アメリカ,インコーポレイティド | 両面パワーモジュールのための液相拡散接合プロセス |
Families Citing this family (20)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US8872328B2 (en) | 2012-12-19 | 2014-10-28 | General Electric Company | Integrated power module package |
| EP3019300B1 (en) * | 2013-07-09 | 2023-12-20 | RTX Corporation | Transient liquid phase bonding of metal-covered materials |
| KR102208961B1 (ko) | 2013-10-29 | 2021-01-28 | 삼성전자주식회사 | 반도체소자 패키지 및 그 제조방법 |
| DE102014218426A1 (de) | 2014-09-15 | 2016-03-17 | Siemens Aktiengesellschaft | Baugruppe mit mindestens zwei Tragkörpern und einen Lotverbund |
| DE102014219759A1 (de) * | 2014-09-30 | 2016-03-31 | Siemens Aktiengesellschaft | Leistungsmodul |
| US20160339538A1 (en) * | 2015-05-18 | 2016-11-24 | Toyota Motor Engineering & Manufacturing North America, Inc. | High temperature bonding processes incorporating traces |
| US10426037B2 (en) | 2015-07-15 | 2019-09-24 | International Business Machines Corporation | Circuitized structure with 3-dimensional configuration |
| US9847310B2 (en) * | 2015-07-18 | 2017-12-19 | Semiconductor Components Industries, Llc | Flip chip bonding alloys |
| US10115716B2 (en) | 2015-07-18 | 2018-10-30 | Semiconductor Components Industries, Llc | Die bonding to a board |
| DE102015114086B4 (de) * | 2015-08-25 | 2022-01-27 | OSRAM Opto Semiconductors Gesellschaft mit beschränkter Haftung | Bauelement und Verfahren zur Herstellung eines Bauelements |
| CN110431662A (zh) * | 2017-04-06 | 2019-11-08 | 陶瓷技术有限责任公司 | 在两侧冷却的电路 |
| US10886251B2 (en) * | 2017-04-21 | 2021-01-05 | Toyota Motor Engineering & Manufacturing North America, Inc. | Multi-layered composite bonding materials and power electronics assemblies incorporating the same |
| DE102017206930A1 (de) * | 2017-04-25 | 2018-10-25 | Siemens Aktiengesellschaft | Lotformteil zum Diffusionslöten, Verfahren zu dessen Herstellung und Verfahren zu dessen Montage |
| DE102019217061A1 (de) * | 2019-11-06 | 2021-05-06 | Zf Friedrichshafen Ag | Anordnung mit einem Substrat für eine Aufnahme von wenigstens einem Halbleiterbauelement für einen Stromrichter und Verfahren zum Diffusionsverlöten wenigstens eines Halbleiterbauelements mit einem Substrat für einen Stromrichter |
| CN111584346B (zh) * | 2020-05-28 | 2021-02-12 | 浙江大学 | 具有热沉结构的GaN器件及其制备方法 |
| KR102580589B1 (ko) * | 2020-12-28 | 2023-09-20 | 주식회사 아모센스 | 전력반도체 모듈의 제조방법 및 이에 의해 제조된 전력반도체 모듈 |
| US12540216B2 (en) | 2021-12-10 | 2026-02-03 | Uniseal, Inc. | Two-component moisture curable thermal interface material for thermal management systems |
| US12550406B2 (en) * | 2022-03-29 | 2026-02-10 | Wolfspeed, Inc. | Packaged electronic devices having transient liquid phase solder joints and methods of forming same |
| CN116786933B (zh) * | 2023-06-27 | 2025-07-01 | 北京科技大学 | 一种异向单晶高温合金连接方法 |
| US20250275099A1 (en) * | 2024-02-28 | 2025-08-28 | Lenovo (Singapore) Pte. Ltd. | Liquid metal based thermal interface material |
Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2001230351A (ja) * | 2000-02-14 | 2001-08-24 | Shibafu Engineering Corp | 電子モジュール用接合材料、モジュール型半導体装置及びその製造方法 |
| JP2002224882A (ja) * | 2001-01-29 | 2002-08-13 | Hitachi Metals Ltd | Au/Sn複合箔及びAu/Sn合金箔並びにそれを用いてなるロウ材、Au/Sn複合箔の製造方法及びAu/Sn合金箔の製造方法、ロウ材の接合方法 |
| US20060151871A1 (en) * | 2005-01-07 | 2006-07-13 | Rockwell Scientific Licensing, Llc | High temperature, stable SiC device interconnects and packages having low thermal resistance |
| JP2010179336A (ja) * | 2009-02-05 | 2010-08-19 | Toyota Central R&D Labs Inc | 接合体、半導体モジュール、及び接合体の製造方法 |
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| DE2937049A1 (de) | 1979-09-13 | 1981-04-02 | Brown, Boveri & Cie Ag, 6800 Mannheim | Leistungs-halbleiterbauelement |
| US4482418A (en) | 1983-08-17 | 1984-11-13 | International Business Machines Corporation | Bonding method for producing very thin bond lines |
| JPS63194879A (ja) * | 1987-02-09 | 1988-08-12 | Hitachi Ltd | インサ−ト材を用いる接合方法 |
| JPH01206575A (ja) | 1988-02-15 | 1989-08-18 | Shin Etsu Polymer Co Ltd | 接着性熱融着形コネクタ |
| JPH10135634A (ja) | 1990-03-19 | 1998-05-22 | Hitachi Ltd | 多層配線基板及びその製造方法 |
| US5590460A (en) | 1994-07-19 | 1997-01-07 | Tessera, Inc. | Method of making multilayer circuit |
| US5542602A (en) | 1994-12-30 | 1996-08-06 | International Business Machines Corporation | Stabilization of conductive adhesive by metallurgical bonding |
| US5574630A (en) | 1995-05-11 | 1996-11-12 | International Business Machines Corporation | Laminated electronic package including a power/ground assembly |
| US6002177A (en) | 1995-12-27 | 1999-12-14 | International Business Machines Corporation | High density integrated circuit packaging with chip stacking and via interconnections |
| US5829124A (en) | 1995-12-29 | 1998-11-03 | International Business Machines Corporation | Method for forming metallized patterns on the top surface of a printed circuit board |
| US5759737A (en) | 1996-09-06 | 1998-06-02 | International Business Machines Corporation | Method of making a component carrier |
| US5897341A (en) | 1998-07-02 | 1999-04-27 | Fujitsu Limited | Diffusion bonded interconnect |
| TW536794B (en) | 1999-02-26 | 2003-06-11 | Hitachi Ltd | Wiring board and its manufacturing method, semiconductor apparatus and its manufacturing method, and circuit board |
| US6465879B1 (en) | 1999-10-19 | 2002-10-15 | Citizen Watch Co., Ltd. | Structure for mounting semiconductor device, method of mounting same, semiconductor device, and method of fabricating same |
| US6495771B2 (en) | 2001-03-29 | 2002-12-17 | International Business Machines Corporation | Compliant multi-layered circuit board for PBGA applications |
| JP2003086747A (ja) * | 2001-09-10 | 2003-03-20 | Hitachi Ltd | 絶縁回路基板とその製法およびそれを用いた半導体パワー素子 |
| US6634543B2 (en) | 2002-01-07 | 2003-10-21 | International Business Machines Corporation | Method of forming metallic z-interconnects for laminate chip packages and boards |
| US6624003B1 (en) | 2002-02-06 | 2003-09-23 | Teravicta Technologies, Inc. | Integrated MEMS device and package |
| US7211103B2 (en) | 2002-04-11 | 2007-05-01 | Second Sight Medical Products, Inc. | Biocompatible bonding method and electronics package suitable for implantation |
| US20050029109A1 (en) | 2002-05-07 | 2005-02-10 | Gang Zhang | Method of electrochemically fabricating multilayer structures having improved interlayer adhesion |
| US20050045585A1 (en) | 2002-05-07 | 2005-03-03 | Gang Zhang | Method of electrochemically fabricating multilayer structures having improved interlayer adhesion |
| AU2003303439A1 (en) | 2002-12-20 | 2004-07-22 | Applied Materials, Inc. | Micromachined intergrated fluid delivery system |
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| US7023089B1 (en) * | 2004-03-31 | 2006-04-04 | Intel Corporation | Low temperature packaging apparatus and method |
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| US20090004500A1 (en) | 2007-06-26 | 2009-01-01 | Daewoong Suh | Multilayer preform for fast transient liquid phase bonding |
| US8716805B2 (en) | 2008-06-10 | 2014-05-06 | Toshiba America Research, Inc. | CMOS integrated circuits with bonded layers containing functional electronic devices |
| US8023269B2 (en) | 2008-08-15 | 2011-09-20 | Siemens Energy, Inc. | Wireless telemetry electronic circuit board for high temperature environments |
| JP2010283169A (ja) * | 2009-06-04 | 2010-12-16 | Honda Motor Co Ltd | 半導体装置の製造方法 |
| US8348139B2 (en) * | 2010-03-09 | 2013-01-08 | Indium Corporation | Composite solder alloy preform |
| US8592986B2 (en) * | 2010-11-09 | 2013-11-26 | Rohm Co., Ltd. | High melting point soldering layer alloyed by transient liquid phase and fabrication method for the same, and semiconductor device |
-
2011
- 2011-06-01 US US13/150,645 patent/US8431445B2/en not_active Expired - Fee Related
-
2012
- 2012-06-01 JP JP2012125792A patent/JP2013030755A/ja not_active Withdrawn
-
2015
- 2015-11-13 JP JP2015223076A patent/JP6034472B2/ja not_active Expired - Fee Related
Patent Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2001230351A (ja) * | 2000-02-14 | 2001-08-24 | Shibafu Engineering Corp | 電子モジュール用接合材料、モジュール型半導体装置及びその製造方法 |
| JP2002224882A (ja) * | 2001-01-29 | 2002-08-13 | Hitachi Metals Ltd | Au/Sn複合箔及びAu/Sn合金箔並びにそれを用いてなるロウ材、Au/Sn複合箔の製造方法及びAu/Sn合金箔の製造方法、ロウ材の接合方法 |
| US20060151871A1 (en) * | 2005-01-07 | 2006-07-13 | Rockwell Scientific Licensing, Llc | High temperature, stable SiC device interconnects and packages having low thermal resistance |
| JP2010179336A (ja) * | 2009-02-05 | 2010-08-19 | Toyota Central R&D Labs Inc | 接合体、半導体モジュール、及び接合体の製造方法 |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2015024443A (ja) * | 2013-07-05 | 2015-02-05 | トヨタ モーター エンジニアリング アンド マニュファクチャリング ノース アメリカ,インコーポレイティド | 両面パワーモジュールのための液相拡散接合プロセス |
Also Published As
| Publication number | Publication date |
|---|---|
| US8431445B2 (en) | 2013-04-30 |
| JP2016066806A (ja) | 2016-04-28 |
| JP6034472B2 (ja) | 2016-11-30 |
| US20120306105A1 (en) | 2012-12-06 |
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