JP2012519839A - 粒子特性の測定 - Google Patents

粒子特性の測定 Download PDF

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Publication number
JP2012519839A
JP2012519839A JP2011552527A JP2011552527A JP2012519839A JP 2012519839 A JP2012519839 A JP 2012519839A JP 2011552527 A JP2011552527 A JP 2011552527A JP 2011552527 A JP2011552527 A JP 2011552527A JP 2012519839 A JP2012519839 A JP 2012519839A
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JP
Japan
Prior art keywords
light
particle
liquid sample
sample
wicking
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Ceased
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JP2011552527A
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English (en)
Japanese (ja)
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JP2012519839A5 (https=
Inventor
セシル ウィリアム コーベット，ジェイソン
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Malvern Panalytical Ltd
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Malvern Instruments Ltd
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Publication date
Application filed by Malvern Instruments Ltd filed Critical Malvern Instruments Ltd
Publication of JP2012519839A publication Critical patent/JP2012519839A/ja
Publication of JP2012519839A5 publication Critical patent/JP2012519839A5/ja
Ceased legal-status Critical Current

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
    • G01N15/02—Investigating particle size or size distribution
    • G01N15/0205—Investigating particle size or size distribution by optical means
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47—Scattering, i.e. diffuse reflection
    • G01N21/49—Scattering, i.e. diffuse reflection within a body or fluid
    • G01N21/51—Scattering, i.e. diffuse reflection within a body or fluid inside a container, e.g. in an ampoule
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/01—Arrangements or apparatus for facilitating the optical investigation
    • G01N21/03—Cuvette constructions
    • G01N2021/0346—Capillary cells; Microcells
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/01—Arrangements or apparatus for facilitating the optical investigation
    • G01N21/03—Cuvette constructions
    • G01N2021/0346—Capillary cells; Microcells
    • G01N2021/035—Supports for sample drops
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47—Scattering, i.e. diffuse reflection
    • G01N2021/4704—Angular selective
    • G01N2021/4707—Forward scatter; Low angle scatter
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47—Scattering, i.e. diffuse reflection
    • G01N2021/4704—Angular selective
    • G01N2021/4709—Backscatter
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47—Scattering, i.e. diffuse reflection
    • G01N2021/4704—Angular selective
    • G01N2021/4726—Detecting scatter at 90°

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  • Chemical & Material Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Dispersion Chemistry (AREA)
  • Optical Measuring Cells (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
JP2011552527A 2009-03-04 2010-03-04 粒子特性の測定 Ceased JP2012519839A (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US20913909P 2009-03-04 2009-03-04
US61/209,139 2009-03-04
PCT/GB2010/050383 WO2010100502A1 (en) 2009-03-04 2010-03-04 Particle characterization

Related Child Applications (1)

Application Number Title Priority Date Filing Date
JP2014139417A Division JP5945568B2 (ja) 2009-03-04 2014-07-07 粒子特性の測定

Publications (2)

Publication Number Publication Date
JP2012519839A true JP2012519839A (ja) 2012-08-30
JP2012519839A5 JP2012519839A5 (https=) 2013-04-18

Family

ID=42174646

Family Applications (2)

Application Number Title Priority Date Filing Date
JP2011552527A Ceased JP2012519839A (ja) 2009-03-04 2010-03-04 粒子特性の測定
JP2014139417A Active JP5945568B2 (ja) 2009-03-04 2014-07-07 粒子特性の測定

Family Applications After (1)

Application Number Title Priority Date Filing Date
JP2014139417A Active JP5945568B2 (ja) 2009-03-04 2014-07-07 粒子特性の測定

Country Status (4)

Country Link
EP (1) EP2404154B1 (https=)
JP (2) JP2012519839A (https=)
CN (1) CN102341690B (https=)
WO (1) WO2010100502A1 (https=)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2018535393A (ja) * 2015-09-16 2018-11-29 サーモ エレクトロン サイエンティフィック インストルメンツ リミテッド ライアビリティ カンパニー 画像分析システム及び方法
JPWO2018110468A1 (ja) * 2016-12-14 2019-10-24 株式会社堀場製作所 粒子物性測定装置

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB2480596A (en) * 2010-01-29 2011-11-30 Kenneth John Cunningham Disposable light scattering cuvette for liquid sample held by surface tension
US9164047B2 (en) 2010-10-08 2015-10-20 Bruker Axs Gmbh Apparatus and method for supporting a liquid sample for measuring scattering of electromagnetic radiation
JP6592765B2 (ja) * 2015-04-30 2019-10-23 トライボテックス株式会社 粒子計数装置
JP6373486B2 (ja) * 2015-12-28 2018-08-15 株式会社プロジェクトＫｂｆ ゲル粒子測定方法及びその装置
EP3309536A1 (en) 2016-10-11 2018-04-18 Malvern Panalytical Limited Particle characterisation instrument

Citations (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5973753A (ja) * 1982-10-21 1984-04-26 Toshiba Corp 超微量分光光度計
JPS60140143A (ja) * 1983-12-08 1985-07-25 ヘキスト・アクチエンゲゼルシヤフト 僅かな検査量のための光度計のヘッド
JPH0448245A (ja) * 1990-06-15 1992-02-18 Canon Inc 粒子測定装置
JPH05340885A (ja) * 1992-06-08 1993-12-24 Matsushita Electric Ind Co Ltd パーティクル検査方法
JPH08178825A (ja) * 1994-12-27 1996-07-12 Shimadzu Corp 粒度分布測定装置
US6628382B2 (en) * 1999-08-20 2003-09-30 Charles William Robertson Liquid photometer using surface tension to contain sample
US20060077390A1 (en) * 2004-10-12 2006-04-13 Kralik John C Optical devices, systems and method for producing a collimated light path
JP2007170984A (ja) * 2005-12-22 2007-07-05 Shimadzu Corp 試料セル及び該試料セルを用いた分光光度計
WO2007131945A2 (en) * 2006-05-12 2007-11-22 Carl Stuart Limited Microvolume analysis system
JP2008039539A (ja) * 2006-08-04 2008-02-21 Shimadzu Corp 光散乱検出装置
WO2008044329A1 (en) * 2006-10-06 2008-04-17 Shimadzu Corporation Spectrophotometer
JP2008116314A (ja) * 2006-11-02 2008-05-22 Seikoh Giken Co Ltd 微少量液体測定装置

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE19725211C1 (de) 1997-06-15 1998-06-04 Alv Laser Vertriebsgesellschaf Faserdetektor zur Detektion des Streulichtes oder des Fluoreszenzlichtes einer flüssigen Suspension
KR19990011927A (ko) * 1997-07-25 1999-02-18 윤종용 광학적 입자 농도 측정기 및 그의 측정 방법
JP3475097B2 (ja) * 1998-11-06 2003-12-08 株式会社堀場製作所 粒径分布測定装置
JP4002173B2 (ja) * 2002-12-13 2007-10-31 株式会社栃木ニコン テラヘルツ分光装置
US20070224087A1 (en) * 2004-07-08 2007-09-27 Zhong Ding Airborne material collection and detection method and apparatus
US7201879B2 (en) * 2004-11-19 2007-04-10 The United States Of America As Represented By The Secretary Of The Army Aerosol into liquid collector for depositing particles from a large volume of gas into a small volume of liquid
US20060109468A1 (en) * 2004-11-24 2006-05-25 Evans Richard W Devices, methods, and systems for measuring an optical property of a sample
US20100128265A1 (en) * 2005-02-11 2010-05-27 Nanodrop Technologies, Inc. Apparatus and method for measuring the signal from a fluorescing nanodrop contained by surface tension

Patent Citations (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5973753A (ja) * 1982-10-21 1984-04-26 Toshiba Corp 超微量分光光度計
JPS60140143A (ja) * 1983-12-08 1985-07-25 ヘキスト・アクチエンゲゼルシヤフト 僅かな検査量のための光度計のヘッド
JPH0448245A (ja) * 1990-06-15 1992-02-18 Canon Inc 粒子測定装置
JPH05340885A (ja) * 1992-06-08 1993-12-24 Matsushita Electric Ind Co Ltd パーティクル検査方法
JPH08178825A (ja) * 1994-12-27 1996-07-12 Shimadzu Corp 粒度分布測定装置
US6628382B2 (en) * 1999-08-20 2003-09-30 Charles William Robertson Liquid photometer using surface tension to contain sample
US20060077390A1 (en) * 2004-10-12 2006-04-13 Kralik John C Optical devices, systems and method for producing a collimated light path
JP2007170984A (ja) * 2005-12-22 2007-07-05 Shimadzu Corp 試料セル及び該試料セルを用いた分光光度計
WO2007131945A2 (en) * 2006-05-12 2007-11-22 Carl Stuart Limited Microvolume analysis system
JP2008039539A (ja) * 2006-08-04 2008-02-21 Shimadzu Corp 光散乱検出装置
WO2008044329A1 (en) * 2006-10-06 2008-04-17 Shimadzu Corporation Spectrophotometer
JP2008116314A (ja) * 2006-11-02 2008-05-22 Seikoh Giken Co Ltd 微少量液体測定装置

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2018535393A (ja) * 2015-09-16 2018-11-29 サーモ エレクトロン サイエンティフィック インストルメンツ リミテッド ライアビリティ カンパニー 画像分析システム及び方法
US11057599B2 (en) 2015-09-16 2021-07-06 Thermo Electron Scientific Instruments Llc Image analysis system and method
JP7139243B2 (ja) 2015-09-16 2022-09-20 サーモ エレクトロン サイエンティフィック インストルメンツ リミテッド ライアビリティ カンパニー 画像分析システム及び方法
JPWO2018110468A1 (ja) * 2016-12-14 2019-10-24 株式会社堀場製作所 粒子物性測定装置

Also Published As

Publication number Publication date
JP2014186039A (ja) 2014-10-02
JP5945568B2 (ja) 2016-07-05
CN102341690B (zh) 2013-10-09
CN102341690A (zh) 2012-02-01
EP2404154A1 (en) 2012-01-11
WO2010100502A1 (en) 2010-09-10
EP2404154B1 (en) 2020-11-11

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