JP2014186039A - 粒子特性の測定 - Google Patents
粒子特性の測定 Download PDFInfo
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- JP2014186039A JP2014186039A JP2014139417A JP2014139417A JP2014186039A JP 2014186039 A JP2014186039 A JP 2014186039A JP 2014139417 A JP2014139417 A JP 2014139417A JP 2014139417 A JP2014139417 A JP 2014139417A JP 2014186039 A JP2014186039 A JP 2014186039A
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- 238000011192 particle characterization Methods 0.000 title description 10
- 239000007788 liquid Substances 0.000 claims abstract description 99
- 238000001514 detection method Methods 0.000 claims abstract description 47
- 239000002245 particle Substances 0.000 claims abstract description 45
- 238000000034 method Methods 0.000 claims abstract description 30
- 238000005286 illumination Methods 0.000 claims abstract description 14
- 230000001427 coherent effect Effects 0.000 claims abstract description 10
- 230000001678 irradiating effect Effects 0.000 claims description 10
- 238000000691 measurement method Methods 0.000 claims description 9
- 238000005259 measurement Methods 0.000 abstract description 23
- 238000002296 dynamic light scattering Methods 0.000 abstract description 20
- 238000001370 static light scattering Methods 0.000 abstract description 14
- 239000000523 sample Substances 0.000 description 158
- 230000003287 optical effect Effects 0.000 description 58
- 239000012530 fluid Substances 0.000 description 11
- 238000000149 argon plasma sintering Methods 0.000 description 6
- 230000007246 mechanism Effects 0.000 description 6
- 239000002105 nanoparticle Substances 0.000 description 6
- 230000008569 process Effects 0.000 description 6
- 239000011521 glass Substances 0.000 description 5
- 239000000463 material Substances 0.000 description 4
- 230000003068 static effect Effects 0.000 description 4
- 230000009471 action Effects 0.000 description 3
- 238000012512 characterization method Methods 0.000 description 3
- 230000009467 reduction Effects 0.000 description 3
- 238000004458 analytical method Methods 0.000 description 2
- 238000004891 communication Methods 0.000 description 2
- 238000010586 diagram Methods 0.000 description 2
- 238000009792 diffusion process Methods 0.000 description 2
- 102000004169 proteins and genes Human genes 0.000 description 2
- 108090000623 proteins and genes Proteins 0.000 description 2
- 238000005086 pumping Methods 0.000 description 2
- 239000012488 sample solution Substances 0.000 description 2
- 238000007789 sealing Methods 0.000 description 2
- 239000000725 suspension Substances 0.000 description 2
- 238000004364 calculation method Methods 0.000 description 1
- 238000004140 cleaning Methods 0.000 description 1
- 238000005314 correlation function Methods 0.000 description 1
- 230000008878 coupling Effects 0.000 description 1
- 238000010168 coupling process Methods 0.000 description 1
- 238000005859 coupling reaction Methods 0.000 description 1
- 239000002270 dispersing agent Substances 0.000 description 1
- 239000006185 dispersion Substances 0.000 description 1
- 230000009969 flowable effect Effects 0.000 description 1
- 230000002452 interceptive effect Effects 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 238000012360 testing method Methods 0.000 description 1
- 230000036962 time dependent Effects 0.000 description 1
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
- G01N15/02—Investigating particle size or size distribution
- G01N15/0205—Investigating particle size or size distribution by optical means
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/47—Scattering, i.e. diffuse reflection
- G01N21/49—Scattering, i.e. diffuse reflection within a body or fluid
- G01N21/51—Scattering, i.e. diffuse reflection within a body or fluid inside a container, e.g. in an ampoule
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/01—Arrangements or apparatus for facilitating the optical investigation
- G01N21/03—Cuvette constructions
- G01N2021/0346—Capillary cells; Microcells
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/01—Arrangements or apparatus for facilitating the optical investigation
- G01N21/03—Cuvette constructions
- G01N2021/0346—Capillary cells; Microcells
- G01N2021/035—Supports for sample drops
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/47—Scattering, i.e. diffuse reflection
- G01N2021/4704—Angular selective
- G01N2021/4707—Forward scatter; Low angle scatter
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/47—Scattering, i.e. diffuse reflection
- G01N2021/4704—Angular selective
- G01N2021/4709—Backscatter
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/47—Scattering, i.e. diffuse reflection
- G01N2021/4704—Angular selective
- G01N2021/4726—Detecting scatter at 90°
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- Chemical & Material Sciences (AREA)
- General Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Health & Medical Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Dispersion Chemistry (AREA)
- Optical Measuring Cells (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
Abstract
【解決手段】 液体サンプル(10)中の粒子の特性を測定するための粒子特性測定方法であって、液体サンプルを表面張力によって支持する工程と、空間的に干渉性をもつ光を散乱帯域を横切って散乱させるように該支持された液体サンプルを照射軸線に沿って該可干渉光で照射する工程と、光が前記支持された液体サンプル中の粒子によって散乱された後、該散乱光の少なくとも一部分を所定の第1散乱光検出軸線(18)に沿って検出する工程とから成り、前記照射軸線(16)と検出軸線(18)とは、互いに所定の角度に方向づけし、該所定の角度は、検出すべき前記散乱帯域を横切って該所定の角度で散乱された光の実質的にすべてを検出することを可能にする角度とすることを特徴とする粒子特性測定方法を提供する。
【選択図】 図1
Description
12:下側光学部品
14:上側光学部品
16:入射光ビーム(照射軸線)
18:被検出光ビーム(検出軸線)
18B:後方散乱光
18F:前方散乱光
18S:側方散乱光
22、24:光学部品
30:測定器
42:毛管キャリヤー
44:毛管カッター(毛管切断機)
12:下側光学部品
14:上側光学部品
16:入射光ビーム(照射軸線)
18:被検出光ビーム(検出軸線)
18B:後方散乱光
18F:前方散乱光
18S:側方散乱光
22、24:光学部品
30:サンプルキャリヤー
42:毛管キャリヤー
44:毛管カッター(毛管切断機)
Claims (1)
- 液体サンプル中の粒子の特性を測定するための粒子特性測定方法であって、
液体サンプルを表面張力によって支持する工程と、
空間的に干渉性をもつ光を散乱帯域を横切って散乱させるように該支持された液体サンプルを照射軸線に沿って該可干渉光で照射する工程と、
光が前記支持された液体サンプル中の粒子によって散乱された後、該散乱光の少なくとも一部分を所定の第1散乱光検出軸線に沿って検出する工程とから成り、
前記照射軸線と前記検出軸線とは、互いに所定の角度に方向づけし、該所定の角度は、検出すべき前記散乱帯域を横切って該所定の角度で散乱された光の実質的にすべてを検出することを可能にする角度とすることを特徴とする粒子特性測定方法。
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US20913909P | 2009-03-04 | 2009-03-04 | |
US61/209,139 | 2009-03-04 |
Related Parent Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2011552527A Division JP2012519839A (ja) | 2009-03-04 | 2010-03-04 | 粒子特性の測定 |
Publications (2)
Publication Number | Publication Date |
---|---|
JP2014186039A true JP2014186039A (ja) | 2014-10-02 |
JP5945568B2 JP5945568B2 (ja) | 2016-07-05 |
Family
ID=42174646
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Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2011552527A Ceased JP2012519839A (ja) | 2009-03-04 | 2010-03-04 | 粒子特性の測定 |
JP2014139417A Active JP5945568B2 (ja) | 2009-03-04 | 2014-07-07 | 粒子特性の測定 |
Family Applications Before (1)
Application Number | Title | Priority Date | Filing Date |
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JP2011552527A Ceased JP2012519839A (ja) | 2009-03-04 | 2010-03-04 | 粒子特性の測定 |
Country Status (4)
Country | Link |
---|---|
EP (1) | EP2404154B1 (ja) |
JP (2) | JP2012519839A (ja) |
CN (1) | CN102341690B (ja) |
WO (1) | WO2010100502A1 (ja) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2016211892A (ja) * | 2015-04-30 | 2016-12-15 | トライボテックス株式会社 | 粒子計数装置 |
Families Citing this family (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
GB2480596A (en) * | 2010-01-29 | 2011-11-30 | Kenneth John Cunningham | Disposable light scattering cuvette for liquid sample held by surface tension |
WO2012045846A1 (en) * | 2010-10-08 | 2012-04-12 | Hecus X-Ray Systems Gmbh | Apparatus and method for supporting a liquid sample for measuring scattering of electromagnetic radiation |
EP3350574B1 (en) * | 2015-09-16 | 2021-12-15 | Thermo Electron Scientific Instruments LLC | Image analysis system and method |
US10753843B2 (en) * | 2015-12-28 | 2020-08-25 | Project Kbf Co., Ltd. | Method and apparatus for measuring gel particle |
EP3309536A1 (en) | 2016-10-11 | 2018-04-18 | Malvern Panalytical Limited | Particle characterisation instrument |
JPWO2018110468A1 (ja) * | 2016-12-14 | 2019-10-24 | 株式会社堀場製作所 | 粒子物性測定装置 |
Citations (5)
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JPS5973753A (ja) * | 1982-10-21 | 1984-04-26 | Toshiba Corp | 超微量分光光度計 |
JPH1151844A (ja) * | 1997-07-25 | 1999-02-26 | Samsung Electron Co Ltd | 光学的粒子濃度測定方法及び光学的粒子濃度測定装置 |
JP2000146813A (ja) * | 1998-11-06 | 2000-05-26 | Horiba Ltd | 粒径分布測定装置 |
JP2004191302A (ja) * | 2002-12-13 | 2004-07-08 | Tochigi Nikon Corp | テラヘルツ分光装置 |
WO2008044329A1 (fr) * | 2006-10-06 | 2008-04-17 | Shimadzu Corporation | Spectrophotomètre |
Family Cites Families (15)
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DE3344387A1 (de) * | 1983-12-08 | 1985-06-20 | Hoechst Ag, 6230 Frankfurt | Photometerkopf fuer kleine messvolumina |
JPH0448245A (ja) * | 1990-06-15 | 1992-02-18 | Canon Inc | 粒子測定装置 |
JPH05340885A (ja) * | 1992-06-08 | 1993-12-24 | Matsushita Electric Ind Co Ltd | パーティクル検査方法 |
JP2910596B2 (ja) * | 1994-12-27 | 1999-06-23 | 株式会社島津製作所 | 粒度分布測定装置 |
DE19725211C1 (de) | 1997-06-15 | 1998-06-04 | Alv Laser Vertriebsgesellschaf | Faserdetektor zur Detektion des Streulichtes oder des Fluoreszenzlichtes einer flüssigen Suspension |
DE60039117D1 (de) * | 1999-08-20 | 2008-07-17 | Nanodrop Technologies Llc | Flüssigkeitsfotometer, das oberflächenspannung zur probenkontaktierung benutzt |
US20070224087A1 (en) * | 2004-07-08 | 2007-09-27 | Zhong Ding | Airborne material collection and detection method and apparatus |
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US7201879B2 (en) * | 2004-11-19 | 2007-04-10 | The United States Of America As Represented By The Secretary Of The Army | Aerosol into liquid collector for depositing particles from a large volume of gas into a small volume of liquid |
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CA2597612C (en) * | 2005-02-11 | 2010-11-02 | Nanodrop Technologies, Inc. | Apparatus and method for measuring the signal from a fluorescing nanodrop contained by surface tension |
JP2007170984A (ja) * | 2005-12-22 | 2007-07-05 | Shimadzu Corp | 試料セル及び該試料セルを用いた分光光度計 |
EP2027452B1 (en) * | 2006-05-12 | 2017-06-28 | Carl Stuart Limited | Microvolume analysis system |
JP2008039539A (ja) * | 2006-08-04 | 2008-02-21 | Shimadzu Corp | 光散乱検出装置 |
JP2008116314A (ja) * | 2006-11-02 | 2008-05-22 | Seikoh Giken Co Ltd | 微少量液体測定装置 |
-
2010
- 2010-03-04 JP JP2011552527A patent/JP2012519839A/ja not_active Ceased
- 2010-03-04 CN CN2010800107028A patent/CN102341690B/zh active Active
- 2010-03-04 WO PCT/GB2010/050383 patent/WO2010100502A1/en active Application Filing
- 2010-03-04 EP EP10707345.4A patent/EP2404154B1/en active Active
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2014
- 2014-07-07 JP JP2014139417A patent/JP5945568B2/ja active Active
Patent Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
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JPS5973753A (ja) * | 1982-10-21 | 1984-04-26 | Toshiba Corp | 超微量分光光度計 |
JPH1151844A (ja) * | 1997-07-25 | 1999-02-26 | Samsung Electron Co Ltd | 光学的粒子濃度測定方法及び光学的粒子濃度測定装置 |
JP2000146813A (ja) * | 1998-11-06 | 2000-05-26 | Horiba Ltd | 粒径分布測定装置 |
JP2004191302A (ja) * | 2002-12-13 | 2004-07-08 | Tochigi Nikon Corp | テラヘルツ分光装置 |
WO2008044329A1 (fr) * | 2006-10-06 | 2008-04-17 | Shimadzu Corporation | Spectrophotomètre |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2016211892A (ja) * | 2015-04-30 | 2016-12-15 | トライボテックス株式会社 | 粒子計数装置 |
Also Published As
Publication number | Publication date |
---|---|
JP2012519839A (ja) | 2012-08-30 |
EP2404154A1 (en) | 2012-01-11 |
JP5945568B2 (ja) | 2016-07-05 |
WO2010100502A1 (en) | 2010-09-10 |
CN102341690A (zh) | 2012-02-01 |
EP2404154B1 (en) | 2020-11-11 |
CN102341690B (zh) | 2013-10-09 |
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