JP2012518878A5 - - Google Patents
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- Publication number
- JP2012518878A5 JP2012518878A5 JP2011550593A JP2011550593A JP2012518878A5 JP 2012518878 A5 JP2012518878 A5 JP 2012518878A5 JP 2011550593 A JP2011550593 A JP 2011550593A JP 2011550593 A JP2011550593 A JP 2011550593A JP 2012518878 A5 JP2012518878 A5 JP 2012518878A5
- Authority
- JP
- Japan
- Prior art keywords
- pump
- vacuum chamber
- vacuum
- turbomolecular
- chamber
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000000034 method Methods 0.000 claims 12
- 230000003213 activating effect Effects 0.000 claims 5
- 238000001816 cooling Methods 0.000 claims 5
- 239000002826 coolant Substances 0.000 claims 3
- 238000001459 lithography Methods 0.000 claims 3
- 238000005086 pumping Methods 0.000 claims 2
- 230000005855 radiation Effects 0.000 claims 2
- 238000004891 communication Methods 0.000 claims 1
- 230000008878 coupling Effects 0.000 claims 1
- 238000010168 coupling process Methods 0.000 claims 1
- 238000005859 coupling reaction Methods 0.000 claims 1
- 238000002211 ultraviolet spectrum Methods 0.000 claims 1
Applications Claiming Priority (7)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US15441509P | 2009-02-22 | 2009-02-22 | |
| US61/154,415 | 2009-02-22 | ||
| US28940709P | 2009-12-23 | 2009-12-23 | |
| US61/289,407 | 2009-12-23 | ||
| US30633310P | 2010-02-19 | 2010-02-19 | |
| US61/306,333 | 2010-02-19 | ||
| PCT/EP2010/052218 WO2010094801A1 (en) | 2009-02-22 | 2010-02-22 | A method and arrangement for realizing a vacuum in a vacuum chamber |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2012518878A JP2012518878A (ja) | 2012-08-16 |
| JP2012518878A5 true JP2012518878A5 (https=) | 2013-04-11 |
| JP5653941B2 JP5653941B2 (ja) | 2015-01-14 |
Family
ID=42124236
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2011550593A Expired - Fee Related JP5653941B2 (ja) | 2009-02-22 | 2010-02-22 | 真空チャンバー内の真空を実現する方法および設備 |
Country Status (7)
| Country | Link |
|---|---|
| US (2) | US8366423B2 (https=) |
| EP (1) | EP2399272A1 (https=) |
| JP (1) | JP5653941B2 (https=) |
| KR (1) | KR101553802B1 (https=) |
| CN (1) | CN102414775A (https=) |
| TW (1) | TW201100973A (https=) |
| WO (1) | WO2010094801A1 (https=) |
Families Citing this family (18)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR101553802B1 (ko) * | 2009-02-22 | 2015-09-17 | 마퍼 리쏘그라피 아이피 비.브이. | 진공 챔버에서 진공을 실현하기 위한 장치 및 방법 |
| CN103187231A (zh) * | 2011-12-30 | 2013-07-03 | 北京中科信电子装备有限公司 | 一种离子注入机自动建立束线与靶室高真空的方法 |
| CN106933063B (zh) * | 2012-03-20 | 2019-01-18 | 迈普尔平版印刷Ip有限公司 | 电子射束光刻系统 |
| CN104428866A (zh) * | 2012-05-14 | 2015-03-18 | 迈普尔平版印刷Ip有限公司 | 带电粒子光刻系统和射束产生器 |
| US11348756B2 (en) | 2012-05-14 | 2022-05-31 | Asml Netherlands B.V. | Aberration correction in charged particle system |
| US9575494B2 (en) * | 2013-11-14 | 2017-02-21 | Taiwan Semiconductor Manufacturing Co., Ltd. | Mechanisms for processing wafer |
| CN103727036B (zh) * | 2014-01-18 | 2015-04-15 | 淄博水环真空泵厂有限公司 | 巨型真空室真空度的精确调节系统 |
| CN103727051B (zh) * | 2014-01-18 | 2015-05-13 | 淄博水环真空泵厂有限公司 | 大抽气量多支路流量精确控制系统 |
| US10180248B2 (en) | 2015-09-02 | 2019-01-15 | ProPhotonix Limited | LED lamp with sensing capabilities |
| CN105931694B (zh) * | 2016-05-06 | 2018-05-22 | 东莞中子科学中心 | 一种高性能中子准直器及其组装方法 |
| CN206332060U (zh) * | 2016-10-28 | 2017-07-14 | 应用材料公司 | 热学腔室 |
| CN106586282A (zh) * | 2016-12-09 | 2017-04-26 | 安徽亿瑞深冷能源科技有限公司 | 一种可独立控制的多真空腔体高温存储设备 |
| US10794536B2 (en) * | 2017-11-30 | 2020-10-06 | Cryogenic Fuels Inc. | Vacuum acquisition systems and methods |
| US20220065727A1 (en) * | 2020-08-28 | 2022-03-03 | Kla Corporation | Coolant Microleak Sensor for a Vacuum System |
| CN115110040B (zh) * | 2022-06-20 | 2024-05-14 | 北京维开科技有限公司 | 一种独立双腔室电子束蒸发镀膜设备 |
| US20240337265A1 (en) * | 2023-04-06 | 2024-10-10 | Taiwan Semiconductor Manufacturing Company, Ltd. | Cryogenic pump for semiconductor processing |
| FR3164314A1 (fr) * | 2024-07-03 | 2026-01-09 | Pfeiffer Vacuum | Equipement et procédé de fabrication |
| CN119781255A (zh) * | 2025-01-24 | 2025-04-08 | 中国科学院微电子研究所 | 光刻机及光刻机污染控制方法 |
Family Cites Families (34)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3157308A (en) | 1961-09-05 | 1964-11-17 | Clark Mfg Co J L | Canister type container and method of making the same |
| US3159408A (en) | 1961-10-05 | 1964-12-01 | Grace W R & Co | Chuck |
| JPS59174286A (ja) * | 1983-03-25 | 1984-10-02 | Hitachi Seiko Ltd | 電子ビ−ム加工装置 |
| US4524308A (en) | 1984-06-01 | 1985-06-18 | Sony Corporation | Circuits for accomplishing electron beam convergence in color cathode ray tubes |
| US4725204A (en) | 1986-11-05 | 1988-02-16 | Pennwalt Corporation | Vacuum manifold pumping system |
| JPS63274446A (ja) * | 1987-05-01 | 1988-11-11 | Nec Corp | 真空装置ベ−キング方法およびその装置 |
| US4911103A (en) * | 1987-07-17 | 1990-03-27 | Texas Instruments Incorporated | Processing apparatus and method |
| US5088895A (en) * | 1990-09-04 | 1992-02-18 | The Hilliard Corporation | Vacuum pumping apparatus |
| JP2993126B2 (ja) * | 1990-12-07 | 1999-12-20 | 富士通株式会社 | クライオポンプのヘリウム供給方法及びクライオポンプへのヘリウム供給装置 |
| WO1994025880A1 (en) | 1993-04-30 | 1994-11-10 | Board Of Regents, The University Of Texas System | Megavoltage scanning imager and method for its use |
| FI95421C (fi) * | 1993-12-23 | 1996-01-25 | Heikki Ihantola | Puolijohteen, kuten piikiekon, prosessoinnissa käytettävä laitteisto ja menetelmä |
| JPH07282993A (ja) * | 1994-04-14 | 1995-10-27 | Kawasaki Heavy Ind Ltd | 電子ビーム励起プラズマ発生用電子ビーム発生装置 |
| US5685963A (en) * | 1994-10-31 | 1997-11-11 | Saes Pure Gas, Inc. | In situ getter pump system and method |
| EP0766405A1 (en) | 1995-09-29 | 1997-04-02 | STMicroelectronics S.r.l. | Successive approximation register without redundancy |
| US5971711A (en) * | 1996-05-21 | 1999-10-26 | Ebara Corporation | Vacuum pump control system |
| US6337102B1 (en) * | 1997-11-17 | 2002-01-08 | The Trustees Of Princeton University | Low pressure vapor phase deposition of organic thin films |
| JPH11204508A (ja) * | 1998-01-09 | 1999-07-30 | Toshiba Corp | 半導体装置の製造方法及び半導体製造装置 |
| JPH11230036A (ja) * | 1998-02-18 | 1999-08-24 | Ebara Corp | 真空排気システム |
| US7077159B1 (en) * | 1998-12-23 | 2006-07-18 | Applied Materials, Inc. | Processing apparatus having integrated pumping system |
| JP2004218648A (ja) | 1999-03-05 | 2004-08-05 | Tadahiro Omi | 真空装置 |
| JP3019260B1 (ja) * | 1999-03-26 | 2000-03-13 | 株式会社日立製作所 | 電子ビ―ム描画装置 |
| JP2001057153A (ja) * | 1999-08-20 | 2001-02-27 | Sanyo Electric Works Ltd | 平面形放電管の製造方法及びその装置 |
| US7257987B2 (en) * | 2000-01-25 | 2007-08-21 | State Of Oregon Acting By And Through The State Board Of Higher Education On Behalf Of Portland State University | Method and apparatus for sample analysis |
| ATE538412T1 (de) | 2002-10-25 | 2012-01-15 | Mapper Lithography Ip Bv | Lithographisches system |
| AU2003276779A1 (en) | 2002-10-30 | 2004-05-25 | Mapper Lithography Ip B.V. | Electron beam exposure system |
| KR101068607B1 (ko) | 2003-03-10 | 2011-09-30 | 마퍼 리쏘그라피 아이피 비.브이. | 복수 개의 빔렛 발생 장치 |
| ATE524822T1 (de) | 2003-05-28 | 2011-09-15 | Mapper Lithography Ip Bv | Belichtungsverfahren für strahlen aus geladenen teilchen |
| ATE381728T1 (de) | 2003-07-30 | 2008-01-15 | Mapper Lithography Ip Bv | Modulator-schaltkreise |
| JP4370924B2 (ja) * | 2003-08-27 | 2009-11-25 | 株式会社ニコン | 真空装置、真空装置の運転方法、露光装置、及び露光装置の運転方法 |
| US7709815B2 (en) | 2005-09-16 | 2010-05-04 | Mapper Lithography Ip B.V. | Lithography system and projection method |
| US8192547B2 (en) * | 2006-09-25 | 2012-06-05 | Veeco Instruments Inc. | Thermally isolated cryopanel for vacuum deposition systems |
| US8089055B2 (en) * | 2008-02-05 | 2012-01-03 | Adam Alexander Brailove | Ion beam processing apparatus |
| KR101553802B1 (ko) * | 2009-02-22 | 2015-09-17 | 마퍼 리쏘그라피 아이피 비.브이. | 진공 챔버에서 진공을 실현하기 위한 장치 및 방법 |
| WO2016158421A1 (ja) | 2015-04-03 | 2016-10-06 | 株式会社日立ハイテクノロジーズ | 光量検出装置、それを用いた免疫分析装置および荷電粒子線装置 |
-
2010
- 2010-02-22 KR KR1020117022029A patent/KR101553802B1/ko not_active Expired - Fee Related
- 2010-02-22 EP EP10708159A patent/EP2399272A1/en not_active Withdrawn
- 2010-02-22 CN CN2010800176511A patent/CN102414775A/zh active Pending
- 2010-02-22 TW TW99105116A patent/TW201100973A/zh unknown
- 2010-02-22 WO PCT/EP2010/052218 patent/WO2010094801A1/en not_active Ceased
- 2010-02-22 JP JP2011550593A patent/JP5653941B2/ja not_active Expired - Fee Related
- 2010-02-22 US US12/709,643 patent/US8366423B2/en not_active Expired - Fee Related
-
2013
- 2013-01-02 US US13/732,529 patent/US8857465B2/en active Active
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