JP2012516650A5 - - Google Patents
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- JP2012516650A5 JP2012516650A5 JP2011548143A JP2011548143A JP2012516650A5 JP 2012516650 A5 JP2012516650 A5 JP 2012516650A5 JP 2011548143 A JP2011548143 A JP 2011548143A JP 2011548143 A JP2011548143 A JP 2011548143A JP 2012516650 A5 JP2012516650 A5 JP 2012516650A5
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- Prior art keywords
- gates
- clock cycle
- gate delays
- series connection
- clock
- Prior art date
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- 230000001934 delay Effects 0.000 description 5
- 238000005259 measurement Methods 0.000 description 2
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US12/361,405 | 2009-01-28 | ||
| US12/361,405 US7915910B2 (en) | 2009-01-28 | 2009-01-28 | Dynamic voltage and frequency management |
| PCT/US2010/021840 WO2010088155A2 (en) | 2009-01-28 | 2010-01-22 | Dynamic voltage and frequency management |
Related Child Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2012200727A Division JP5499123B2 (ja) | 2009-01-28 | 2012-09-12 | 動的な電圧及び周波数管理 |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2012516650A JP2012516650A (ja) | 2012-07-19 |
| JP2012516650A5 true JP2012516650A5 (enExample) | 2013-09-05 |
| JP5389190B2 JP5389190B2 (ja) | 2014-01-15 |
Family
ID=42109805
Family Applications (2)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2011548143A Active JP5389190B2 (ja) | 2009-01-28 | 2010-01-22 | 動的な電圧及び周波数管理 |
| JP2012200727A Active JP5499123B2 (ja) | 2009-01-28 | 2012-09-12 | 動的な電圧及び周波数管理 |
Family Applications After (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2012200727A Active JP5499123B2 (ja) | 2009-01-28 | 2012-09-12 | 動的な電圧及び周波数管理 |
Country Status (9)
| Country | Link |
|---|---|
| US (5) | US7915910B2 (enExample) |
| EP (2) | EP2405324B1 (enExample) |
| JP (2) | JP5389190B2 (enExample) |
| KR (2) | KR101335830B1 (enExample) |
| CN (2) | CN102360245B (enExample) |
| AU (1) | AU2010208458B2 (enExample) |
| BR (2) | BR122012027851B1 (enExample) |
| RU (2) | RU2486574C2 (enExample) |
| WO (1) | WO2010088155A2 (enExample) |
Families Citing this family (59)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US7915910B2 (en) | 2009-01-28 | 2011-03-29 | Apple Inc. | Dynamic voltage and frequency management |
| KR101402178B1 (ko) | 2009-03-30 | 2014-05-30 | 퀄컴 인코포레이티드 | 적응형 전압 스케일링 |
| US8260708B2 (en) * | 2009-04-17 | 2012-09-04 | Empire Technology Development Llc | Usage metering based upon hardware aging |
| US20110099423A1 (en) * | 2009-10-27 | 2011-04-28 | Chih-Ang Chen | Unified Boot Code with Signature |
| US8717093B2 (en) * | 2010-01-08 | 2014-05-06 | Mindspeed Technologies, Inc. | System on chip power management through package configuration |
| US8549339B2 (en) * | 2010-02-26 | 2013-10-01 | Empire Technology Development Llc | Processor core communication in multi-core processor |
| CN102213967A (zh) * | 2010-04-12 | 2011-10-12 | 辉达公司 | 具有电压调节功能的gpu芯片及其制作方法 |
| US8572426B2 (en) | 2010-05-27 | 2013-10-29 | National Semiconductor Corporation | Hardware performance monitor (HPM) with extended resolution for adaptive voltage scaling (AVS) systems |
| WO2012015433A1 (en) | 2010-07-30 | 2012-02-02 | Empire Technology Development, Llc. | Aging-based usage metering of components |
| US8734006B2 (en) * | 2011-03-02 | 2014-05-27 | International Business Machines Corporation | Calibration of an on-die thermal sensor |
| CN102931655B (zh) | 2011-08-12 | 2014-12-10 | 珠海全志科技股份有限公司 | 一种动态调节电压和频率的电路控制系统和方法 |
| US8970234B2 (en) | 2011-09-26 | 2015-03-03 | Apple Inc. | Threshold-based temperature-dependent power/thermal management with temperature sensor calibration |
| US20130117582A1 (en) * | 2011-11-04 | 2013-05-09 | Anand Satyamoorthy | Offline communication in a voltage scaling system |
| US20130311792A1 (en) * | 2012-05-18 | 2013-11-21 | Prahallada PONNATHOTA | Voltage scaling architecture on system-on-chip platform |
| CN102759702B (zh) * | 2012-06-29 | 2014-06-18 | 福州瑞芯微电子有限公司 | 用于检测芯片内工作电路的电压与频率关系的电路及方法 |
| US20140210503A1 (en) * | 2012-08-31 | 2014-07-31 | Apple Inc. | Startup boot cycle testing of a mobile device at diminished power supply current |
| US8766704B2 (en) | 2012-09-05 | 2014-07-01 | Apple Inc. | Adaptive voltage adjustment based on temperature value |
| KR101832821B1 (ko) | 2012-09-10 | 2018-02-27 | 삼성전자주식회사 | 동적 전압 주파수 스케일링 방법, 어플리케이션 프로세서 및 이를 구비하는 모바일 기기 |
| KR102001414B1 (ko) | 2012-09-27 | 2019-07-18 | 삼성전자주식회사 | 데이터 트랜잭션에 따라 전력공급을 제어하는 시스템-온-칩 및 그 동작방법 |
| CN104995841B (zh) | 2013-01-06 | 2018-02-09 | 英派尔科技开发有限公司 | 基于老化的泄漏能量减小方法和系统 |
| CN103197717B (zh) * | 2013-02-28 | 2015-11-25 | 华为技术有限公司 | 自适应电压调整方法、芯片以及系统 |
| US8988139B2 (en) * | 2013-05-28 | 2015-03-24 | International Business Machines Corporation | Self-selected variable power integrated circuit |
| GB2515618B (en) * | 2013-05-30 | 2017-10-11 | Electronics & Telecommunications Res Inst | Method and apparatus for controlling operation voltage of processor core, and processor system including the same |
| US9195291B2 (en) | 2013-06-21 | 2015-11-24 | Apple Inc. | Digital power estimator to control processor power consumption |
| US9304573B2 (en) | 2013-06-21 | 2016-04-05 | Apple Inc. | Dynamic voltage and frequency management based on active processors |
| US10145896B2 (en) | 2013-08-06 | 2018-12-04 | Global Unichip Corporation | Electronic device, performance binning system and method, voltage automatic calibration system |
| US9500705B2 (en) * | 2013-08-28 | 2016-11-22 | Wisconsin Alumni Research Foundation | Integrated circuit providing fault prediction |
| US9432033B2 (en) * | 2013-09-27 | 2016-08-30 | Freescale Semiconductor, Inc. | System and method for enabling maximum performance operation within an extended ambient temperature range |
| US9625290B1 (en) * | 2013-11-26 | 2017-04-18 | Google Inc. | Dynamic calibration of MEMS sensors |
| FR3017467A1 (fr) * | 2014-02-07 | 2015-08-14 | Commissariat Energie Atomique | Procede de caracterisation du fonctionnement d’un circuit electronique numerique et circuit electronique numerique |
| WO2015118145A1 (fr) * | 2014-02-07 | 2015-08-13 | Commissariat A L'energie Atomique Et Aux Energies Alternatives | Procédé de caractérisation du fonctionnement d'un circuit électronique numérique et circuit électronique numérique |
| US9606605B2 (en) * | 2014-03-07 | 2017-03-28 | Apple Inc. | Dynamic voltage margin recovery |
| WO2016004986A1 (en) * | 2014-07-09 | 2016-01-14 | Telefonaktiebolaget L M Ericsson (Publ) | A method for diagnosing power supply failure in a wireless communication device |
| KR20160032529A (ko) * | 2014-09-16 | 2016-03-24 | 삼성전자주식회사 | 시스템 온 칩과 이의 dvfs 검증 방법 |
| US10114437B2 (en) * | 2015-07-29 | 2018-10-30 | Mediatek Inc. | Portable device and calibration method thereof |
| US10001800B1 (en) | 2015-09-10 | 2018-06-19 | Apple Inc. | Systems and methods for determining temperatures of integrated circuits |
| US9825620B2 (en) * | 2016-01-21 | 2017-11-21 | Apple Inc. | Method and apparatus for digital undervoltage detection and control |
| US10635159B2 (en) * | 2016-05-27 | 2020-04-28 | Qualcomm Incorporated | Adaptive voltage modulation circuits for adjusting supply voltage to reduce supply voltage droops and minimize power consumption |
| US10248186B2 (en) * | 2016-06-10 | 2019-04-02 | Microsoft Technology Licensing, Llc | Processor device voltage characterization |
| US10209726B2 (en) | 2016-06-10 | 2019-02-19 | Microsoft Technology Licensing, Llc | Secure input voltage adjustment in processing devices |
| US10310572B2 (en) | 2016-06-10 | 2019-06-04 | Microsoft Technology Licensing, Llc | Voltage based thermal control of processing device |
| US10338670B2 (en) * | 2016-06-10 | 2019-07-02 | Microsoft Technology Licensing, Llc | Input voltage reduction for processing devices |
| FR3054885B1 (fr) | 2016-08-03 | 2018-09-07 | Stmicroelectronics (Crolles 2) Sas | Procede d'estimation d'un profil d'exploitation d'un circuit integre d'un systeme sur puce, et systeme sur puce correspondant |
| FR3054949A1 (fr) | 2016-08-03 | 2018-02-09 | Stmicroelectronics (Crolles 2) Sas | Procede de reglage d'au moins un point de fonctionnement d'au moins un circuit integre d'un systeme sur puce, et systeme sur puce correspondant |
| CN108664066B (zh) * | 2017-03-31 | 2020-05-19 | 深圳市中兴微电子技术有限公司 | 一种芯片及其电压调节方法 |
| US10840157B2 (en) * | 2017-06-02 | 2020-11-17 | University of Viriginia Patent Foundation | Methods for reducing chip testing time using trans-threshold correlations |
| CN107908509A (zh) * | 2017-11-07 | 2018-04-13 | 晶晨半导体(上海)股份有限公司 | 一种针对处理器的自动化测试方法 |
| CN110581743B (zh) | 2018-06-11 | 2021-01-22 | 京东方科技集团股份有限公司 | 电子设备、时间同步系统及时间同步方法 |
| KR102794916B1 (ko) * | 2018-07-31 | 2025-04-15 | 삼성전자주식회사 | 팩토리 데이터 리셋 기능에 의해 제거된 어플리케이션을 복원하는 장치 및 방법 |
| US12379767B2 (en) | 2018-09-03 | 2025-08-05 | Drexel University | On-chip voltage assignment through particle swarm optimization |
| DE112019005149T5 (de) * | 2018-10-15 | 2021-07-01 | Nvidia Corporation | Verbesserte in-system-testabdeckung basierend auf detektieren von komponentendegradation |
| US11543872B2 (en) * | 2019-07-02 | 2023-01-03 | Microsoft Technology Licensing, Llc | Dynamically adjusting device operating voltage based on device performance |
| US10948957B1 (en) | 2019-09-26 | 2021-03-16 | Apple Inc. | Adaptive on-chip digital power estimator |
| US11435806B2 (en) * | 2019-12-16 | 2022-09-06 | Advanced Micro Devices, Inc. | Automatic voltage reconfiguration |
| KR102400977B1 (ko) * | 2020-05-29 | 2022-05-25 | 성균관대학교산학협력단 | 프로세서를 통한 페이지 폴트 처리 방법 |
| CN111966409B (zh) * | 2020-07-30 | 2021-04-02 | 深圳比特微电子科技有限公司 | 矿机快速搜频方法和装置以及矿机 |
| US12340857B2 (en) | 2021-11-02 | 2025-06-24 | Samsung Electronics Co., Ltd. | Electronic device for adjusting driving voltage of volatile memory and method for operating the same |
| US12266414B2 (en) | 2022-06-14 | 2025-04-01 | Samsung Electronics Co., Ltd. | Memory device and test method of memory device |
| CN119125851A (zh) * | 2024-11-08 | 2024-12-13 | 湖南进芯电子科技有限公司 | 基于ate设备的集成电路拉偏测试方法及系统 |
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| JPH0658929B2 (ja) * | 1983-10-13 | 1994-08-03 | セイコーエプソン株式会社 | プロセスモニタパターン |
| JPH0691141B2 (ja) * | 1986-11-25 | 1994-11-14 | 日本電気株式会社 | Lsi動作速度制御方式 |
| JPH02199851A (ja) * | 1989-01-30 | 1990-08-08 | Hitachi Ltd | 半導体装置 |
| JPH058950U (ja) * | 1991-07-16 | 1993-02-05 | 日本電気株式会社 | 半導体集積回路 |
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-
2009
- 2009-01-28 US US12/361,405 patent/US7915910B2/en active Active
-
2010
- 2010-01-22 JP JP2011548143A patent/JP5389190B2/ja active Active
- 2010-01-22 RU RU2011135836/08A patent/RU2486574C2/ru active
- 2010-01-22 KR KR1020117019203A patent/KR101335830B1/ko active Active
- 2010-01-22 BR BR122012027851-3A patent/BR122012027851B1/pt active IP Right Grant
- 2010-01-22 EP EP11184178.9A patent/EP2405324B1/en active Active
- 2010-01-22 AU AU2010208458A patent/AU2010208458B2/en active Active
- 2010-01-22 BR BRPI1007455-4A2A patent/BRPI1007455A2/pt not_active Application Discontinuation
- 2010-01-22 RU RU2011140312/08A patent/RU2488875C2/ru active
- 2010-01-22 KR KR1020117023422A patent/KR101167477B1/ko active Active
- 2010-01-22 WO PCT/US2010/021840 patent/WO2010088155A2/en not_active Ceased
- 2010-01-22 CN CN201110308981.2A patent/CN102360245B/zh active Active
- 2010-01-22 EP EP10705681.4A patent/EP2391931B1/en active Active
- 2010-01-22 CN CN201080005677.4A patent/CN102301308B/zh active Active
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2011
- 2011-02-22 US US13/032,052 patent/US8130009B2/en active Active
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2012
- 2012-01-27 US US13/360,038 patent/US8493088B2/en active Active
- 2012-09-12 JP JP2012200727A patent/JP5499123B2/ja active Active
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2013
- 2013-06-12 US US13/915,850 patent/US9218049B2/en active Active
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2015
- 2015-11-16 US US14/942,375 patent/US9407262B2/en active Active
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