JP2012503797A - 自動ダイナミック画素マップ補正および駆動信号較正 - Google Patents

自動ダイナミック画素マップ補正および駆動信号較正 Download PDF

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Publication number
JP2012503797A
JP2012503797A JP2011529230A JP2011529230A JP2012503797A JP 2012503797 A JP2012503797 A JP 2012503797A JP 2011529230 A JP2011529230 A JP 2011529230A JP 2011529230 A JP2011529230 A JP 2011529230A JP 2012503797 A JP2012503797 A JP 2012503797A
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Japan
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image
template
panel
pixel
difference
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JP2011529230A
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English (en)
Japanese (ja)
Inventor
ジョン，サム・ス
チャオ，ダンファ
イ，ジョンホ
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フォトン・ダイナミクス・インコーポレーテッド
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    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
    • G09G3/006—Electronic inspection or testing of displays and display drivers, e.g. of LED or LCD displays

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  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Liquid Crystal (AREA)
  • Computer Hardware Design (AREA)
  • Theoretical Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Health & Medical Sciences (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Electromagnetism (AREA)
  • Toxicology (AREA)
  • Devices For Indicating Variable Information By Combining Individual Elements (AREA)
  • Control Of Indicators Other Than Cathode Ray Tubes (AREA)
JP2011529230A 2008-09-25 2009-09-24 自動ダイナミック画素マップ補正および駆動信号較正 Withdrawn JP2012503797A (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US10024108P 2008-09-25 2008-09-25
US61/100,241 2008-09-25
PCT/US2009/058254 WO2010036818A1 (en) 2008-09-25 2009-09-24 Automatic dynamic pixel map correction and drive signal calibration

Publications (1)

Publication Number Publication Date
JP2012503797A true JP2012503797A (ja) 2012-02-09

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Family Applications (1)

Application Number Title Priority Date Filing Date
JP2011529230A Withdrawn JP2012503797A (ja) 2008-09-25 2009-09-24 自動ダイナミック画素マップ補正および駆動信号較正

Country Status (5)

Country Link
JP (1) JP2012503797A (zh)
KR (3) KR20140108694A (zh)
CN (1) CN102203625B (zh)
TW (1) TWI484159B (zh)
WO (1) WO2010036818A1 (zh)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2020502825A (ja) * 2016-12-16 2020-01-23 テソロ・サイエンティフィック・インコーポレーテッド 発光ダイオード（ｌｅｄ）検査装置及び製造方法

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI407801B (zh) * 2010-08-11 2013-09-01 Silicon Motion Inc 用來進行壞像素補償之方法與用來進行壞像素補償之裝置
US8866899B2 (en) * 2011-06-07 2014-10-21 Photon Dynamics Inc. Systems and methods for defect detection using a whole raw image
TWI496091B (zh) * 2012-04-06 2015-08-11 Benq Materials Corp 薄膜檢測方法及檢測裝置
WO2016162930A1 (ja) * 2015-04-06 2016-10-13 三菱電機株式会社 非破壊検査システム及び特異点検出システム
CN108303640B (zh) * 2016-01-25 2020-06-05 深圳睿晟自动化技术有限公司 一种线路检测的方法和装置
CN113906491A (zh) * 2019-06-05 2022-01-07 应用材料公司 用于识别基板上的缺陷的方法和用于识别基板上的有缺陷驱动器电路的设备
US20230153977A1 (en) * 2021-11-17 2023-05-18 Orbotech Ltd. Panel design to improve accurate defect location report

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4805123B1 (en) * 1986-07-14 1998-10-13 Kla Instr Corp Automatic photomask and reticle inspection method and apparatus including improved defect detector and alignment sub-systems
IL99823A0 (en) * 1990-11-16 1992-08-18 Orbot Instr Ltd Optical inspection method and apparatus
US5235272A (en) * 1991-06-17 1993-08-10 Photon Dynamics, Inc. Method and apparatus for automatically inspecting and repairing an active matrix LCD panel
US5337151A (en) * 1992-07-28 1994-08-09 Optical Radiation Corporation Double-sided circuit board exposure machine and method with optical registration and material variation compensation
KR100189178B1 (ko) * 1995-05-19 1999-06-01 오우라 히로시 패널 화질 검사 장치 및 화질 보정 방법
JP4275345B2 (ja) 2002-01-30 2009-06-10 株式会社日立製作所 パターン検査方法及びパターン検査装置
US20060045383A1 (en) * 2004-08-31 2006-03-02 Picciotto Carl E Displacement estimation system and method
JP3918854B2 (ja) * 2004-09-06 2007-05-23 オムロン株式会社 基板検査方法および基板検査装置
US7468611B2 (en) * 2006-10-20 2008-12-23 Photon Dynamics, Inc. Continuous linear scanning of large flat panel media

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2020502825A (ja) * 2016-12-16 2020-01-23 テソロ・サイエンティフィック・インコーポレーテッド 発光ダイオード（ｌｅｄ）検査装置及び製造方法
JP7232193B2 (ja) 2016-12-16 2023-03-02 アップル インコーポレイテッド 発光ダイオード（ｌｅｄ）検査装置及び製造方法

Also Published As

Publication number Publication date
TWI484159B (zh) 2015-05-11
KR20140108694A (ko) 2014-09-12
CN102203625B (zh) 2014-04-09
CN102203625A (zh) 2011-09-28
WO2010036818A1 (en) 2010-04-01
KR101451352B1 (ko) 2014-10-15
KR20160142412A (ko) 2016-12-12
KR20110070886A (ko) 2011-06-24
TW201017155A (en) 2010-05-01

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