JP2012503797A - 自動ダイナミック画素マップ補正および駆動信号較正 - Google Patents
自動ダイナミック画素マップ補正および駆動信号較正 Download PDFInfo
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- JP2012503797A JP2012503797A JP2011529230A JP2011529230A JP2012503797A JP 2012503797 A JP2012503797 A JP 2012503797A JP 2011529230 A JP2011529230 A JP 2011529230A JP 2011529230 A JP2011529230 A JP 2011529230A JP 2012503797 A JP2012503797 A JP 2012503797A
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Images
Classifications
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- G—PHYSICS
- G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
- G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
- G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
- G09G3/006—Electronic inspection or testing of displays and display drivers, e.g. of LED or LCD displays
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/302—Contactless testing
- G01R31/308—Contactless testing using non-ionising electromagnetic radiation, e.g. optical radiation
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/3183—Generation of test inputs, e.g. test vectors, patterns or sequences
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
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- Computer Hardware Design (AREA)
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- Control Of Indicators Other Than Cathode Ray Tubes (AREA)
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US10024108P | 2008-09-25 | 2008-09-25 | |
| US61/100,241 | 2008-09-25 | ||
| PCT/US2009/058254 WO2010036818A1 (en) | 2008-09-25 | 2009-09-24 | Automatic dynamic pixel map correction and drive signal calibration |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JP2012503797A true JP2012503797A (ja) | 2012-02-09 |
Family
ID=42060090
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2011529230A Withdrawn JP2012503797A (ja) | 2008-09-25 | 2009-09-24 | 自動ダイナミック画素マップ補正および駆動信号較正 |
Country Status (5)
| Country | Link |
|---|---|
| JP (1) | JP2012503797A (zh) |
| KR (3) | KR101451352B1 (zh) |
| CN (1) | CN102203625B (zh) |
| TW (1) | TWI484159B (zh) |
| WO (1) | WO2010036818A1 (zh) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2020502825A (ja) * | 2016-12-16 | 2020-01-23 | テソロ・サイエンティフィック・インコーポレーテッド | 発光ダイオード（ｌｅｄ）検査装置及び製造方法 |
Families Citing this family (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TWI407801B (zh) * | 2010-08-11 | 2013-09-01 | Silicon Motion Inc | 用來進行壞像素補償之方法與用來進行壞像素補償之裝置 |
| US8866899B2 (en) * | 2011-06-07 | 2014-10-21 | Photon Dynamics Inc. | Systems and methods for defect detection using a whole raw image |
| TWI496091B (zh) * | 2012-04-06 | 2015-08-11 | Benq Materials Corp | 薄膜檢測方法及檢測裝置 |
| JP6161852B2 (ja) * | 2015-04-06 | 2017-07-12 | 三菱電機株式会社 | 非破壊検査システム及び特異点検出システム |
| CN108303640B (zh) * | 2016-01-25 | 2020-06-05 | 深圳睿晟自动化技术有限公司 | 一种线路检测的方法和装置 |
| KR102632426B1 (ko) * | 2019-06-05 | 2024-01-31 | 어플라이드 머티어리얼스, 인코포레이티드 | 기판 상의 결함을 식별하기 위한 방법, 및 기판 상의 결함 있는 드라이버 회로를 식별하기 위한 장치 |
| US20230153977A1 (en) * | 2021-11-17 | 2023-05-18 | Orbotech Ltd. | Panel design to improve accurate defect location report |
Family Cites Families (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4805123B1 (en) * | 1986-07-14 | 1998-10-13 | Kla Instr Corp | Automatic photomask and reticle inspection method and apparatus including improved defect detector and alignment sub-systems |
| IL99823A0 (en) * | 1990-11-16 | 1992-08-18 | Orbot Instr Ltd | Optical inspection method and apparatus |
| US5235272A (en) * | 1991-06-17 | 1993-08-10 | Photon Dynamics, Inc. | Method and apparatus for automatically inspecting and repairing an active matrix LCD panel |
| US5337151A (en) * | 1992-07-28 | 1994-08-09 | Optical Radiation Corporation | Double-sided circuit board exposure machine and method with optical registration and material variation compensation |
| KR100189178B1 (ko) * | 1995-05-19 | 1999-06-01 | 오우라 히로시 | 패널 화질 검사 장치 및 화질 보정 방법 |
| JP4275345B2 (ja) | 2002-01-30 | 2009-06-10 | 株式会社日立製作所 | パターン検査方法及びパターン検査装置 |
| US20060045383A1 (en) * | 2004-08-31 | 2006-03-02 | Picciotto Carl E | Displacement estimation system and method |
| JP3918854B2 (ja) * | 2004-09-06 | 2007-05-23 | オムロン株式会社 | 基板検査方法および基板検査装置 |
| US7468611B2 (en) * | 2006-10-20 | 2008-12-23 | Photon Dynamics, Inc. | Continuous linear scanning of large flat panel media |
-
2009
- 2009-09-24 KR KR1020117009439A patent/KR101451352B1/ko active IP Right Grant
- 2009-09-24 TW TW098132274A patent/TWI484159B/zh active
- 2009-09-24 JP JP2011529230A patent/JP2012503797A/ja not_active Withdrawn
- 2009-09-24 CN CN200980142437.6A patent/CN102203625B/zh active Active
- 2009-09-24 KR KR1020147020200A patent/KR20140108694A/ko not_active Application Discontinuation
- 2009-09-24 WO PCT/US2009/058254 patent/WO2010036818A1/en active Application Filing
- 2009-09-24 KR KR1020167033669A patent/KR20160142412A/ko not_active Application Discontinuation
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2020502825A (ja) * | 2016-12-16 | 2020-01-23 | テソロ・サイエンティフィック・インコーポレーテッド | 発光ダイオード（ｌｅｄ）検査装置及び製造方法 |
| JP7232193B2 (ja) | 2016-12-16 | 2023-03-02 | アップル インコーポレイテッド | 発光ダイオード（ｌｅｄ）検査装置及び製造方法 |
Also Published As
| Publication number | Publication date |
|---|---|
| CN102203625B (zh) | 2014-04-09 |
| KR20140108694A (ko) | 2014-09-12 |
| TW201017155A (en) | 2010-05-01 |
| KR20110070886A (ko) | 2011-06-24 |
| WO2010036818A1 (en) | 2010-04-01 |
| KR20160142412A (ko) | 2016-12-12 |
| TWI484159B (zh) | 2015-05-11 |
| CN102203625A (zh) | 2011-09-28 |
| KR101451352B1 (ko) | 2014-10-15 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| A300 | Application deemed to be withdrawn because no request for examination was validly filed |
Free format text: JAPANESE INTERMEDIATE CODE: A300 Effective date: 20121204 |