KR101451352B1 - 자동 동적 픽셀 맵 정정 및 구동 신호 교정 - Google Patents

자동 동적 픽셀 맵 정정 및 구동 신호 교정 Download PDF

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Publication number
KR101451352B1
KR101451352B1 KR1020117009439A KR20117009439A KR101451352B1 KR 101451352 B1 KR101451352 B1 KR 101451352B1 KR 1020117009439 A KR1020117009439 A KR 1020117009439A KR 20117009439 A KR20117009439 A KR 20117009439A KR 101451352 B1 KR101451352 B1 KR 101451352B1
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KR
South Korea
Prior art keywords
image
template
flat panel
pixel
panel display
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KR1020117009439A
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English (en)
Korean (ko)
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KR20110070886A (ko
Inventor
삼수 정
단후아 차오
종호 이
Original Assignee
포톤 다이나믹스, 인코포레이티드
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Publication of KR20110070886A publication Critical patent/KR20110070886A/ko
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Publication of KR101451352B1 publication Critical patent/KR101451352B1/ko

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    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
    • G09G3/006—Electronic inspection or testing of displays and display drivers, e.g. of LED or LCD displays

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  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Liquid Crystal (AREA)
  • Computer Hardware Design (AREA)
  • Theoretical Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Health & Medical Sciences (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Electromagnetism (AREA)
  • Toxicology (AREA)
  • Control Of Indicators Other Than Cathode Ray Tubes (AREA)
  • Devices For Indicating Variable Information By Combining Individual Elements (AREA)
KR1020117009439A 2008-09-25 2009-09-24 자동 동적 픽셀 맵 정정 및 구동 신호 교정 KR101451352B1 (ko)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US10024108P 2008-09-25 2008-09-25
US61/100,241 2008-09-25
PCT/US2009/058254 WO2010036818A1 (en) 2008-09-25 2009-09-24 Automatic dynamic pixel map correction and drive signal calibration

Related Child Applications (1)

Application Number Title Priority Date Filing Date
KR1020147020200A Division KR20140108694A (ko) 2008-09-25 2009-09-24 자동 동적 픽셀 맵 정정 및 구동 신호 교정

Publications (2)

Publication Number Publication Date
KR20110070886A KR20110070886A (ko) 2011-06-24
KR101451352B1 true KR101451352B1 (ko) 2014-10-15

Family

ID=42060090

Family Applications (3)

Application Number Title Priority Date Filing Date
KR1020117009439A KR101451352B1 (ko) 2008-09-25 2009-09-24 자동 동적 픽셀 맵 정정 및 구동 신호 교정
KR1020147020200A KR20140108694A (ko) 2008-09-25 2009-09-24 자동 동적 픽셀 맵 정정 및 구동 신호 교정
KR1020167033669A KR20160142412A (ko) 2008-09-25 2009-09-24 자동 동적 픽셀 맵 정정 및 구동 신호 교정

Family Applications After (2)

Application Number Title Priority Date Filing Date
KR1020147020200A KR20140108694A (ko) 2008-09-25 2009-09-24 자동 동적 픽셀 맵 정정 및 구동 신호 교정
KR1020167033669A KR20160142412A (ko) 2008-09-25 2009-09-24 자동 동적 픽셀 맵 정정 및 구동 신호 교정

Country Status (5)

Country Link
JP (1) JP2012503797A (zh)
KR (3) KR101451352B1 (zh)
CN (1) CN102203625B (zh)
TW (1) TWI484159B (zh)
WO (1) WO2010036818A1 (zh)

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI407801B (zh) * 2010-08-11 2013-09-01 Silicon Motion Inc 用來進行壞像素補償之方法與用來進行壞像素補償之裝置
US8866899B2 (en) * 2011-06-07 2014-10-21 Photon Dynamics Inc. Systems and methods for defect detection using a whole raw image
TWI496091B (zh) * 2012-04-06 2015-08-11 Benq Materials Corp 薄膜檢測方法及檢測裝置
CN107533024B (zh) * 2015-04-06 2020-01-03 三菱电机株式会社 非破坏检查系统及临界点检测系统
CN108303640B (zh) * 2016-01-25 2020-06-05 深圳睿晟自动化技术有限公司 一种线路检测的方法和装置
CN110337712B (zh) * 2016-12-16 2023-11-07 苹果公司 发光二极管(led)测试设备和制造方法
WO2020244756A1 (en) * 2019-06-05 2020-12-10 Applied Materials, Inc. Method for identifying a defect on a substrate, and apparatus for identifying a defective driver circuit on a substrate
US20230153977A1 (en) * 2021-11-17 2023-05-18 Orbotech Ltd. Panel design to improve accurate defect location report

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4805123A (en) * 1986-07-14 1989-02-14 Kla Instruments Corporation Automatic photomask and reticle inspection method and apparatus including improved defect detector and alignment sub-systems
US5337151A (en) * 1992-07-28 1994-08-09 Optical Radiation Corporation Double-sided circuit board exposure machine and method with optical registration and material variation compensation
US5459410A (en) * 1991-06-17 1995-10-17 Photon Dynamics, Inc. Method and apparatus for automatically inspecting and repairing an active matrix LCD panel
US20030179921A1 (en) 2002-01-30 2003-09-25 Kaoru Sakai Pattern inspection method and its apparatus

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
IL99823A0 (en) * 1990-11-16 1992-08-18 Orbot Instr Ltd Optical inspection method and apparatus
KR100189178B1 (ko) * 1995-05-19 1999-06-01 오우라 히로시 패널 화질 검사 장치 및 화질 보정 방법
US20060045383A1 (en) * 2004-08-31 2006-03-02 Picciotto Carl E Displacement estimation system and method
US7512260B2 (en) * 2004-09-06 2009-03-31 Omron Corporation Substrate inspection method and apparatus
US7468611B2 (en) * 2006-10-20 2008-12-23 Photon Dynamics, Inc. Continuous linear scanning of large flat panel media

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4805123A (en) * 1986-07-14 1989-02-14 Kla Instruments Corporation Automatic photomask and reticle inspection method and apparatus including improved defect detector and alignment sub-systems
US4805123B1 (en) * 1986-07-14 1998-10-13 Kla Instr Corp Automatic photomask and reticle inspection method and apparatus including improved defect detector and alignment sub-systems
US5459410A (en) * 1991-06-17 1995-10-17 Photon Dynamics, Inc. Method and apparatus for automatically inspecting and repairing an active matrix LCD panel
US5337151A (en) * 1992-07-28 1994-08-09 Optical Radiation Corporation Double-sided circuit board exposure machine and method with optical registration and material variation compensation
US20030179921A1 (en) 2002-01-30 2003-09-25 Kaoru Sakai Pattern inspection method and its apparatus

Also Published As

Publication number Publication date
CN102203625B (zh) 2014-04-09
WO2010036818A1 (en) 2010-04-01
JP2012503797A (ja) 2012-02-09
KR20160142412A (ko) 2016-12-12
KR20140108694A (ko) 2014-09-12
TW201017155A (en) 2010-05-01
CN102203625A (zh) 2011-09-28
KR20110070886A (ko) 2011-06-24
TWI484159B (zh) 2015-05-11

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