JP2012127005A - 分割スパッタリングターゲット及びその製造方法 - Google Patents
分割スパッタリングターゲット及びその製造方法 Download PDFInfo
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- JP2012127005A JP2012127005A JP2012066787A JP2012066787A JP2012127005A JP 2012127005 A JP2012127005 A JP 2012127005A JP 2012066787 A JP2012066787 A JP 2012066787A JP 2012066787 A JP2012066787 A JP 2012066787A JP 2012127005 A JP2012127005 A JP 2012127005A
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- 238000005477 sputtering target Methods 0.000 title claims abstract description 34
- 238000004519 manufacturing process Methods 0.000 title claims description 6
- 239000004065 semiconductor Substances 0.000 claims abstract description 33
- 229910000679 solder Inorganic materials 0.000 claims abstract description 32
- 238000002844 melting Methods 0.000 claims abstract description 30
- 230000008018 melting Effects 0.000 claims abstract description 30
- 229920000642 polymer Polymers 0.000 claims abstract description 8
- 230000001012 protector Effects 0.000 claims description 18
- 230000001681 protective effect Effects 0.000 abstract description 101
- 238000004544 sputter deposition Methods 0.000 abstract description 27
- 239000000463 material Substances 0.000 abstract description 24
- 239000010409 thin film Substances 0.000 abstract description 20
- 238000005304 joining Methods 0.000 abstract description 10
- 238000000034 method Methods 0.000 abstract description 5
- 238000002156 mixing Methods 0.000 abstract description 3
- 239000002184 metal Substances 0.000 description 25
- 229910052751 metal Inorganic materials 0.000 description 25
- 239000010949 copper Substances 0.000 description 19
- 239000011888 foil Substances 0.000 description 18
- 229910052738 indium Inorganic materials 0.000 description 12
- 229910052718 tin Inorganic materials 0.000 description 12
- 229910052725 zinc Inorganic materials 0.000 description 12
- 229910045601 alloy Inorganic materials 0.000 description 11
- 239000000956 alloy Substances 0.000 description 11
- 239000010410 layer Substances 0.000 description 11
- 229910052719 titanium Inorganic materials 0.000 description 11
- 239000000126 substance Substances 0.000 description 10
- 239000000919 ceramic Substances 0.000 description 9
- 239000000203 mixture Substances 0.000 description 9
- 229910010293 ceramic material Inorganic materials 0.000 description 8
- 229910052782 aluminium Inorganic materials 0.000 description 7
- 229910018072 Al 2 O 3 Inorganic materials 0.000 description 6
- 239000010408 film Substances 0.000 description 6
- APFVFJFRJDLVQX-UHFFFAOYSA-N indium atom Chemical compound [In] APFVFJFRJDLVQX-UHFFFAOYSA-N 0.000 description 6
- 229910052733 gallium Inorganic materials 0.000 description 5
- -1 polyethylene Polymers 0.000 description 5
- 239000002356 single layer Substances 0.000 description 5
- 239000000758 substrate Substances 0.000 description 5
- 229910007541 Zn O Inorganic materials 0.000 description 4
- 230000002411 adverse Effects 0.000 description 4
- 239000000470 constituent Substances 0.000 description 4
- 229910052802 copper Inorganic materials 0.000 description 4
- 230000000694 effects Effects 0.000 description 4
- 238000011156 evaluation Methods 0.000 description 4
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 3
- 238000010030 laminating Methods 0.000 description 3
- 238000007750 plasma spraying Methods 0.000 description 3
- 239000000843 powder Substances 0.000 description 3
- 229910019092 Mg-O Inorganic materials 0.000 description 2
- 229910019395 Mg—O Inorganic materials 0.000 description 2
- 239000004698 Polyethylene Substances 0.000 description 2
- 239000004743 Polypropylene Substances 0.000 description 2
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 2
- 229910010413 TiO 2 Inorganic materials 0.000 description 2
- 238000010521 absorption reaction Methods 0.000 description 2
- 229910052804 chromium Inorganic materials 0.000 description 2
- 229920006351 engineering plastic Polymers 0.000 description 2
- 239000011521 glass Substances 0.000 description 2
- 229910052742 iron Inorganic materials 0.000 description 2
- 229910052746 lanthanum Inorganic materials 0.000 description 2
- 229910052749 magnesium Inorganic materials 0.000 description 2
- 229910052759 nickel Inorganic materials 0.000 description 2
- 229920003023 plastic Polymers 0.000 description 2
- 239000004033 plastic Substances 0.000 description 2
- 229920000573 polyethylene Polymers 0.000 description 2
- 229920001721 polyimide Polymers 0.000 description 2
- 239000009719 polyimide resin Substances 0.000 description 2
- 229920001955 polyphenylene ether Polymers 0.000 description 2
- 229920001155 polypropylene Polymers 0.000 description 2
- 239000002994 raw material Substances 0.000 description 2
- 239000011347 resin Substances 0.000 description 2
- 229920005989 resin Polymers 0.000 description 2
- 230000011218 segmentation Effects 0.000 description 2
- 229910052710 silicon Inorganic materials 0.000 description 2
- 229910052727 yttrium Inorganic materials 0.000 description 2
- 229910052726 zirconium Inorganic materials 0.000 description 2
- 229920000178 Acrylic resin Polymers 0.000 description 1
- 239000004925 Acrylic resin Substances 0.000 description 1
- 229910014472 Ca—O Inorganic materials 0.000 description 1
- 229910005191 Ga 2 O 3 Inorganic materials 0.000 description 1
- 239000004640 Melamine resin Substances 0.000 description 1
- 229920000877 Melamine resin Polymers 0.000 description 1
- 239000004696 Poly ether ether ketone Substances 0.000 description 1
- 229930182556 Polyacetal Natural products 0.000 description 1
- 239000004734 Polyphenylene sulfide Substances 0.000 description 1
- 239000004793 Polystyrene Substances 0.000 description 1
- 239000004372 Polyvinyl alcohol Substances 0.000 description 1
- ATJFFYVFTNAWJD-UHFFFAOYSA-N Tin Chemical compound [Sn] ATJFFYVFTNAWJD-UHFFFAOYSA-N 0.000 description 1
- 229910003077 Ti−O Inorganic materials 0.000 description 1
- 229920001807 Urea-formaldehyde Polymers 0.000 description 1
- BZHJMEDXRYGGRV-UHFFFAOYSA-N Vinyl chloride Chemical compound ClC=C BZHJMEDXRYGGRV-UHFFFAOYSA-N 0.000 description 1
- 229910009378 Zn Ca Inorganic materials 0.000 description 1
- 229920000122 acrylonitrile butadiene styrene Polymers 0.000 description 1
- 238000005275 alloying Methods 0.000 description 1
- PNEYBMLMFCGWSK-UHFFFAOYSA-N aluminium oxide Inorganic materials [O-2].[O-2].[O-2].[Al+3].[Al+3] PNEYBMLMFCGWSK-UHFFFAOYSA-N 0.000 description 1
- 229910021417 amorphous silicon Inorganic materials 0.000 description 1
- 239000007864 aqueous solution Substances 0.000 description 1
- 229910052788 barium Inorganic materials 0.000 description 1
- 239000011230 binding agent Substances 0.000 description 1
- 230000015572 biosynthetic process Effects 0.000 description 1
- 229910052791 calcium Inorganic materials 0.000 description 1
- 238000000576 coating method Methods 0.000 description 1
- 238000001816 cooling Methods 0.000 description 1
- 238000001514 detection method Methods 0.000 description 1
- 239000003822 epoxy resin Substances 0.000 description 1
- 230000005669 field effect Effects 0.000 description 1
- 238000010304 firing Methods 0.000 description 1
- 238000000227 grinding Methods 0.000 description 1
- 238000010438 heat treatment Methods 0.000 description 1
- 239000012535 impurity Substances 0.000 description 1
- 238000009413 insulation Methods 0.000 description 1
- 239000004973 liquid crystal related substance Substances 0.000 description 1
- 150000002739 metals Chemical class 0.000 description 1
- 150000004767 nitrides Chemical class 0.000 description 1
- 230000003647 oxidation Effects 0.000 description 1
- 238000007254 oxidation reaction Methods 0.000 description 1
- 239000002245 particle Substances 0.000 description 1
- 239000005011 phenolic resin Substances 0.000 description 1
- 238000007747 plating Methods 0.000 description 1
- 229920002492 poly(sulfone) Polymers 0.000 description 1
- 229920001230 polyarylate Polymers 0.000 description 1
- 229920001707 polybutylene terephthalate Polymers 0.000 description 1
- 239000004417 polycarbonate Substances 0.000 description 1
- 229920000515 polycarbonate Polymers 0.000 description 1
- 229920000647 polyepoxide Polymers 0.000 description 1
- 229920002530 polyetherether ketone Polymers 0.000 description 1
- 229920006324 polyoxymethylene Polymers 0.000 description 1
- 229920000069 polyphenylene sulfide Polymers 0.000 description 1
- 229920002223 polystyrene Polymers 0.000 description 1
- 229920002689 polyvinyl acetate Polymers 0.000 description 1
- 239000011118 polyvinyl acetate Substances 0.000 description 1
- 229920002451 polyvinyl alcohol Polymers 0.000 description 1
- 229920000915 polyvinyl chloride Polymers 0.000 description 1
- 239000004800 polyvinyl chloride Substances 0.000 description 1
- 230000009257 reactivity Effects 0.000 description 1
- 239000000377 silicon dioxide Substances 0.000 description 1
- 238000005507 spraying Methods 0.000 description 1
- 229920003002 synthetic resin Polymers 0.000 description 1
- 239000000057 synthetic resin Substances 0.000 description 1
- 238000007740 vapor deposition Methods 0.000 description 1
Images
Classifications
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- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/22—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
- C23C14/34—Sputtering
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/22—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
- C23C14/34—Sputtering
- C23C14/3407—Cathode assembly for sputtering apparatus, e.g. Target
- C23C14/3414—Metallurgical or chemical aspects of target preparation, e.g. casting, powder metallurgy
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/34—Gas-filled discharge tubes operating with cathodic sputtering
- H01J37/3411—Constructional aspects of the reactor
- H01J37/3414—Targets
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/34—Gas-filled discharge tubes operating with cathodic sputtering
- H01J37/3411—Constructional aspects of the reactor
- H01J37/3414—Targets
- H01J37/3417—Arrangements
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/34—Gas-filled discharge tubes operating with cathodic sputtering
- H01J37/3411—Constructional aspects of the reactor
- H01J37/3435—Target holders (includes backing plates and endblocks)
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02365—Forming inorganic semiconducting materials on a substrate
- H01L21/02518—Deposited layers
- H01L21/02521—Materials
- H01L21/02551—Group 12/16 materials
- H01L21/02554—Oxides
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02365—Forming inorganic semiconducting materials on a substrate
- H01L21/02518—Deposited layers
- H01L21/02521—Materials
- H01L21/02565—Oxide semiconducting materials not being Group 12/16 materials, e.g. ternary compounds
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02365—Forming inorganic semiconducting materials on a substrate
- H01L21/02612—Formation types
- H01L21/02617—Deposition types
- H01L21/02631—Physical deposition at reduced pressure, e.g. MBE, sputtering, evaporation
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- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Plasma & Fusion (AREA)
- Analytical Chemistry (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Materials Engineering (AREA)
- Mechanical Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- Physical Vapour Deposition (AREA)
- Physical Deposition Of Substances That Are Components Of Semiconductor Devices (AREA)
Abstract
【解決手段】本発明は、バッキングプレート上に、複数のターゲット部材を低融点ハンダにより接合して形成される分割スパッタリングターゲットにおいて、接合されたターゲット部材間に形成される間隙に沿って、バッキングプレートに保護体を設けたものであり、
ターゲット部材が酸化物半導体であり、保護体が高分子シートであることを特徴とする分割スパッタリングターゲットとした。
【選択図】図3
Description
20 ターゲット部材
30 間隙
50 保護体
51 第1保護部材
52 第2保護部材
60 低融点ハンダ
Claims (2)
- バッキングプレート上に、複数のターゲット部材を低融点ハンダにより接合して形成される分割スパッタリングターゲットにおいて、
接合されたターゲット部材間に形成される間隙に沿って、バッキングプレートに保護体を設けたものであり、
ターゲット部材が酸化物半導体であり、保護体が高分子シートであることを特徴とする分割スパッタリングターゲット。 - 複数のターゲット部材を低融点ハンダによりバッキングプレート上に接合して形成する、請求項1に記載の分割スパッタリングターゲットの製造方法において、
接合される酸化物半導体のターゲット部材間に形成された間隙に沿って、バッキングプレートに高分子シートの保護体を設け、
複数のターゲット部材を低融点ハンダによりバッキングプレート上に接合することを特徴とする分割スパッタリングターゲットの製造方法。
Priority Applications (1)
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JP2012066787A JP5711172B2 (ja) | 2010-11-08 | 2012-03-23 | 分割スパッタリングターゲット及びその製造方法 |
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JP2010249780 | 2010-11-08 | ||
JP2010249780 | 2010-11-08 | ||
JP2012066787A JP5711172B2 (ja) | 2010-11-08 | 2012-03-23 | 分割スパッタリングターゲット及びその製造方法 |
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JP2012503151A Division JP4961514B1 (ja) | 2010-11-08 | 2011-07-13 | 分割スパッタリングターゲット及びその製造方法 |
Publications (2)
Publication Number | Publication Date |
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JP2012127005A true JP2012127005A (ja) | 2012-07-05 |
JP5711172B2 JP5711172B2 (ja) | 2015-04-30 |
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JP2012503151A Active JP4961514B1 (ja) | 2010-11-08 | 2011-07-13 | 分割スパッタリングターゲット及びその製造方法 |
JP2012066787A Active JP5711172B2 (ja) | 2010-11-08 | 2012-03-23 | 分割スパッタリングターゲット及びその製造方法 |
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JP2012503151A Active JP4961514B1 (ja) | 2010-11-08 | 2011-07-13 | 分割スパッタリングターゲット及びその製造方法 |
Country Status (5)
Country | Link |
---|---|
JP (2) | JP4961514B1 (ja) |
KR (1) | KR101227607B1 (ja) |
CN (1) | CN102712997B (ja) |
TW (1) | TWI403605B (ja) |
WO (1) | WO2012063524A1 (ja) |
Cited By (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2016188164A (ja) * | 2015-03-30 | 2016-11-04 | 東ソー株式会社 | 酸化物焼結体及びその製造方法 |
WO2017002445A1 (ja) * | 2015-06-30 | 2017-01-05 | 株式会社コベルコ科研 | スパッタリングターゲット組立体 |
JP2020158854A (ja) * | 2019-03-27 | 2020-10-01 | Jx金属株式会社 | 分割スパッタリングターゲット及びその製造方法 |
CN113490763A (zh) * | 2019-06-10 | 2021-10-08 | 株式会社爱发科 | 溅射靶及溅射靶的制造方法 |
CN113544308A (zh) * | 2019-06-10 | 2021-10-22 | 株式会社爱发科 | 溅射靶及溅射靶的制造方法 |
Families Citing this family (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2013185160A (ja) * | 2012-03-06 | 2013-09-19 | Jx Nippon Mining & Metals Corp | スパッタリングターゲット |
JP6059460B2 (ja) * | 2012-07-20 | 2017-01-11 | 株式会社コベルコ科研 | ターゲット組立体 |
JP5759425B2 (ja) * | 2012-07-20 | 2015-08-05 | 株式会社神戸製鋼所 | 薄膜トランジスタの半導体層用薄膜の形成に用いられるターゲット組立体の品質評価方法 |
JP6079228B2 (ja) * | 2012-12-28 | 2017-02-15 | 東ソー株式会社 | 多分割スパッタリングターゲットおよびその製造方法 |
CN106711196B (zh) * | 2016-10-20 | 2019-11-19 | 浙江大学 | 一种p型ZnGeSnO非晶氧化物半导体薄膜及其制备方法 |
JP6960989B2 (ja) * | 2017-03-31 | 2021-11-05 | 三井金属鉱業株式会社 | 分割スパッタリングターゲット |
AT16261U1 (de) * | 2018-04-20 | 2019-05-15 | Plansee Se | Verbundkörper und Verfahren zur Herstellung eines Verbundkörpers |
CN113811633A (zh) * | 2019-08-08 | 2021-12-17 | 三井金属矿业株式会社 | 分割溅射靶 |
CN114630921A (zh) * | 2019-11-01 | 2022-06-14 | 三井金属矿业株式会社 | 间隙配置部件 |
WO2021157112A1 (ja) * | 2020-02-06 | 2021-08-12 | 三井金属鉱業株式会社 | スパッタリングターゲット |
Citations (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH02254164A (ja) * | 1989-03-28 | 1990-10-12 | Koujiyundo Kagaku Kenkyusho:Kk | 分割スパッタリングターゲット |
JPH0860351A (ja) * | 1994-08-23 | 1996-03-05 | Mitsui Mining & Smelting Co Ltd | 回転カソード用スパッタリングターゲットの製造方法 |
JPH10121232A (ja) * | 1996-10-14 | 1998-05-12 | Mitsubishi Chem Corp | スパッタリングターゲット |
JPH11200028A (ja) * | 1998-01-12 | 1999-07-27 | Mitsui Mining & Smelting Co Ltd | スパッタリングターゲットおよびその製造方法 |
JP2000144400A (ja) * | 1998-06-08 | 2000-05-26 | Tosoh Corp | スパッタリングターゲットおよびその製造方法 |
JP2006263504A (ja) * | 2005-03-22 | 2006-10-05 | Hitachinaka Techno Center:Kk | 酸化タンタル系光触媒およびその製造方法 |
JP2009084657A (ja) * | 2007-10-02 | 2009-04-23 | Mitsubishi Materials Corp | スパッタリングターゲット及びターゲット組み立て体 |
JP2009161819A (ja) * | 2008-01-08 | 2009-07-23 | Fuji Electric Holdings Co Ltd | スパッタリング装置 |
Family Cites Families (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN2280717Y (zh) * | 1996-08-27 | 1998-05-06 | 深圳市创益科技发展有限公司 | 透明导电膜平面磁控溅射靶板 |
JP2004270019A (ja) * | 2003-03-10 | 2004-09-30 | Kojundo Chem Lab Co Ltd | 分割スパッタリングターゲット |
US7316763B2 (en) * | 2005-05-24 | 2008-01-08 | Applied Materials, Inc. | Multiple target tiles with complementary beveled edges forming a slanted gap therebetween |
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2011
- 2011-07-13 CN CN201180005295.6A patent/CN102712997B/zh active Active
- 2011-07-13 WO PCT/JP2011/065951 patent/WO2012063524A1/ja active Application Filing
- 2011-07-13 JP JP2012503151A patent/JP4961514B1/ja active Active
- 2011-07-13 KR KR1020127015965A patent/KR101227607B1/ko active IP Right Grant
- 2011-08-01 TW TW100127169A patent/TWI403605B/zh active
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2012
- 2012-03-23 JP JP2012066787A patent/JP5711172B2/ja active Active
Patent Citations (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH02254164A (ja) * | 1989-03-28 | 1990-10-12 | Koujiyundo Kagaku Kenkyusho:Kk | 分割スパッタリングターゲット |
JPH0860351A (ja) * | 1994-08-23 | 1996-03-05 | Mitsui Mining & Smelting Co Ltd | 回転カソード用スパッタリングターゲットの製造方法 |
JPH10121232A (ja) * | 1996-10-14 | 1998-05-12 | Mitsubishi Chem Corp | スパッタリングターゲット |
JPH11200028A (ja) * | 1998-01-12 | 1999-07-27 | Mitsui Mining & Smelting Co Ltd | スパッタリングターゲットおよびその製造方法 |
JP2000144400A (ja) * | 1998-06-08 | 2000-05-26 | Tosoh Corp | スパッタリングターゲットおよびその製造方法 |
JP2006263504A (ja) * | 2005-03-22 | 2006-10-05 | Hitachinaka Techno Center:Kk | 酸化タンタル系光触媒およびその製造方法 |
JP2009084657A (ja) * | 2007-10-02 | 2009-04-23 | Mitsubishi Materials Corp | スパッタリングターゲット及びターゲット組み立て体 |
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CN102712997A (zh) | 2012-10-03 |
TW201237203A (en) | 2012-09-16 |
KR20120094057A (ko) | 2012-08-23 |
JP4961514B1 (ja) | 2012-06-27 |
JPWO2012063524A1 (ja) | 2014-05-12 |
KR101227607B1 (ko) | 2013-01-30 |
TWI403605B (zh) | 2013-08-01 |
WO2012063524A1 (ja) | 2012-05-18 |
JP5711172B2 (ja) | 2015-04-30 |
CN102712997B (zh) | 2014-03-19 |
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