JP2012119678A5 - - Google Patents

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Publication number
JP2012119678A5
JP2012119678A5 JP2011253263A JP2011253263A JP2012119678A5 JP 2012119678 A5 JP2012119678 A5 JP 2012119678A5 JP 2011253263 A JP2011253263 A JP 2011253263A JP 2011253263 A JP2011253263 A JP 2011253263A JP 2012119678 A5 JP2012119678 A5 JP 2012119678A5
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JP
Japan
Prior art keywords
dielectric material
dielectric
low
poly
substrate
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2011253263A
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English (en)
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JP2012119678A (ja
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Publication date
Priority claimed from US12/957,461 external-priority patent/US8821962B2/en
Application filed filed Critical
Publication of JP2012119678A publication Critical patent/JP2012119678A/ja
Publication of JP2012119678A5 publication Critical patent/JP2012119678A5/ja
Pending legal-status Critical Current

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Claims (3)

  1. 基板の上に、誘電性材料と、低表面張力添加剤とを含む誘電性組成物を堆積させることと;
    前記誘電性組成物を加熱し、前記基板の上に誘電層を作成することとを含み、
    前記低表面張力添加剤は、ポリアクリレートで改質されたヒドロキシル官能化ポリシロキサンであることを特徴とする電子機器を製造するプロセス。
  2. 前記誘電性組成物は架橋剤を更に含むことを特徴とする請求項1記載の電子機器を製造するプロセス
  3. 前記誘電性材料は、低k誘電性材料と、高k誘電性材料とを含み、前記低k誘電性材料は、ポリ(メチルシルセスキオキサン)であり、前記高k誘電性材料は、ポリ(ビニルフェノール)であることを特徴とする請求項1記載の電子機器を製造するプロセス
JP2011253263A 2010-12-01 2011-11-18 誘電性組成物 Pending JP2012119678A (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US12/957,461 2010-12-01
US12/957,461 US8821962B2 (en) 2010-12-01 2010-12-01 Method of forming dielectric layer with a dielectric composition

Publications (2)

Publication Number Publication Date
JP2012119678A JP2012119678A (ja) 2012-06-21
JP2012119678A5 true JP2012119678A5 (ja) 2014-12-25

Family

ID=46152595

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2011253263A Pending JP2012119678A (ja) 2010-12-01 2011-11-18 誘電性組成物

Country Status (3)

Country Link
US (1) US8821962B2 (ja)
JP (1) JP2012119678A (ja)
CN (1) CN102487125B (ja)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP6647780B2 (ja) * 2014-10-27 2020-02-14 ローム アンド ハース エレクトロニック マテリアルズ エルエルシーRohm and Haas Electronic Materials LLC 有機金属材料および方法
GB2534600A (en) * 2015-01-29 2016-08-03 Cambridge Display Tech Ltd Organic thin film transistors
WO2018060015A1 (en) 2016-09-27 2018-04-05 Basf Se Star-shaped styrene polymers with enhanced glass transition temperature
CN107915910A (zh) * 2017-11-15 2018-04-17 苏州科茂电子材料科技有限公司 添加聚异丁烯的介电材料制备方法
US20200031040A1 (en) 2018-07-24 2020-01-30 Xerox Corporation Printing process and system
CN113410384B (zh) * 2021-06-28 2023-04-07 西南大学 一种用于柔性场效应晶体管的聚合物介电层的制备方法

Family Cites Families (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB8418591D0 (en) * 1984-07-20 1984-08-22 Bp Chem Int Ltd Polymer composition
JPH0618986B2 (ja) * 1987-10-19 1994-03-16 信越化学工業株式会社 硬化性エポキシ樹脂組成物
EP0461185A1 (en) * 1989-03-01 1991-12-18 Raychem Corporation Method of curing organopolysiloxane compositions and compositions and articles therefrom
EP0695116B1 (en) * 1994-07-29 2004-01-28 World Properties, Inc. Fluoropolymer composites containing two or more ceramic fillers to achieve independent control of dielectric constant and dimensional stability
DE19535603A1 (de) * 1995-09-25 1997-03-27 Basf Lacke & Farben 3-Komponenten-Beschichtungsmittel mit hoher Lösemittelbeständigkeit und hoher Abklebfestigkeit
US6440642B1 (en) * 1999-09-15 2002-08-27 Shipley Company, L.L.C. Dielectric composition
DE102004005247A1 (de) * 2004-01-28 2005-09-01 Infineon Technologies Ag Imprint-Lithographieverfahren
WO2006009942A1 (en) * 2004-06-21 2006-01-26 Exxonmobil Chemical Patents Inc. Polymerization process
US7754510B2 (en) * 2007-04-02 2010-07-13 Xerox Corporation Phase-separated dielectric structure fabrication process
CN101525511B (zh) * 2008-03-07 2011-06-22 财团法人工业技术研究院 可硬化交联型的墨水组合物及介电薄膜
US8154080B2 (en) * 2008-12-05 2012-04-10 Xerox Corporation Dielectric structure having lower-k and higher-k materials
JP2010245379A (ja) * 2009-04-08 2010-10-28 Hitachi Chem Co Ltd 絶縁体インク、絶縁被覆層の作製方法及び半導体装置

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