JP2012068249A - 積層構造に少なくとも部分的に埋設された微細ばね、および、その製造方法 - Google Patents
積層構造に少なくとも部分的に埋設された微細ばね、および、その製造方法 Download PDFInfo
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- JP2012068249A JP2012068249A JP2011207768A JP2011207768A JP2012068249A JP 2012068249 A JP2012068249 A JP 2012068249A JP 2011207768 A JP2011207768 A JP 2011207768A JP 2011207768 A JP2011207768 A JP 2011207768A JP 2012068249 A JP2012068249 A JP 2012068249A
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- fine spring
- fine
- spring
- laminated structure
- microspring
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
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- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
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- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K3/00—Apparatus or processes for manufacturing printed circuits
- H05K3/30—Assembling printed circuits with electric components, e.g. with resistor
- H05K3/32—Assembling printed circuits with electric components, e.g. with resistor electrically connecting electric components or wires to printed circuits
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- H01L2924/01024—Chromium [Cr]
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- H01L2924/01—Chemical elements
- H01L2924/01029—Copper [Cu]
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01033—Arsenic [As]
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- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/0104—Zirconium [Zr]
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01042—Molybdenum [Mo]
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01074—Tungsten [W]
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01082—Lead [Pb]
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
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- H01L2924/01—Chemical elements
- H01L2924/01093—Neptunium [Np]
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- H—ELECTRICITY
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- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/013—Alloys
- H01L2924/014—Solder alloys
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/10—Details of semiconductor or other solid state devices to be connected
- H01L2924/11—Device type
- H01L2924/14—Integrated circuits
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T29/00—Metal working
- Y10T29/49—Method of mechanical manufacture
- Y10T29/49002—Electrical device making
- Y10T29/49117—Conductor or circuit manufacturing
- Y10T29/49124—On flat or curved insulated base, e.g., printed circuit, etc.
- Y10T29/49147—Assembling terminal to base
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- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Computer Hardware Design (AREA)
- Power Engineering (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Manufacturing & Machinery (AREA)
- Measuring Leads Or Probes (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US12/887,775 | 2010-09-22 | ||
| US12/887,775 US8519534B2 (en) | 2010-09-22 | 2010-09-22 | Microsprings partially embedded in a laminate structure and methods for producing same |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JP2012068249A true JP2012068249A (ja) | 2012-04-05 |
| JP2012068249A5 JP2012068249A5 (enExample) | 2014-11-06 |
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Family Applications (1)
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| JP2011207768A Pending JP2012068249A (ja) | 2010-09-22 | 2011-09-22 | 積層構造に少なくとも部分的に埋設された微細ばね、および、その製造方法 |
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| Country | Link |
|---|---|
| US (1) | US8519534B2 (enExample) |
| JP (1) | JP2012068249A (enExample) |
| KR (1) | KR20120031141A (enExample) |
| TW (1) | TWI553800B (enExample) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR101877861B1 (ko) * | 2017-01-23 | 2018-08-09 | (주)다람기술 | 검사프로브 제조방법 및 제조장치, 그리고 이에 의해 제조된 검사프로브 |
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| US8441808B2 (en) * | 2010-09-22 | 2013-05-14 | Palo Alto Research Center Incorporated | Interposer with microspring contacts |
| US8686552B1 (en) | 2013-03-14 | 2014-04-01 | Palo Alto Research Center Incorporated | Multilevel IC package using interconnect springs |
| WO2015053638A1 (en) * | 2013-10-10 | 2015-04-16 | Stretchsense Limited | A method of fabrication of laminates of elastic material suitable for dielectric elastomer sensing |
| US10514391B2 (en) * | 2016-08-22 | 2019-12-24 | Kla-Tencor Corporation | Resistivity probe having movable needle bodies |
| US11289443B2 (en) | 2017-04-20 | 2022-03-29 | Palo Alto Research Center Incorporated | Microspring structure for hardware trusted platform module |
| TWI706139B (zh) * | 2019-10-25 | 2020-10-01 | 巨擘科技股份有限公司 | 金屬探針結構及其製造方法 |
| US11054593B1 (en) | 2020-03-11 | 2021-07-06 | Palo Alto Research Center Incorporated | Chip-scale optoelectronic transceiver with microspringed interposer |
| KR102409029B1 (ko) * | 2022-04-12 | 2022-06-14 | 이시훈 | 프로브 핀 |
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| KR101877861B1 (ko) * | 2017-01-23 | 2018-08-09 | (주)다람기술 | 검사프로브 제조방법 및 제조장치, 그리고 이에 의해 제조된 검사프로브 |
Also Published As
| Publication number | Publication date |
|---|---|
| TW201304093A (zh) | 2013-01-16 |
| TWI553800B (zh) | 2016-10-11 |
| US20120068331A1 (en) | 2012-03-22 |
| US8519534B2 (en) | 2013-08-27 |
| KR20120031141A (ko) | 2012-03-30 |
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