JP2012042313A5 - - Google Patents

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Publication number
JP2012042313A5
JP2012042313A5 JP2010183392A JP2010183392A JP2012042313A5 JP 2012042313 A5 JP2012042313 A5 JP 2012042313A5 JP 2010183392 A JP2010183392 A JP 2010183392A JP 2010183392 A JP2010183392 A JP 2010183392A JP 2012042313 A5 JP2012042313 A5 JP 2012042313A5
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JP
Japan
Prior art keywords
fluorescence
spectral reflectance
sample
measurement
difference
Prior art date
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Application number
JP2010183392A
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English (en)
Japanese (ja)
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JP2012042313A (ja
JP5643571B2 (ja
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Priority to JP2010183392A priority Critical patent/JP5643571B2/ja
Priority claimed from JP2010183392A external-priority patent/JP5643571B2/ja
Priority to US13/196,191 priority patent/US8481973B2/en
Publication of JP2012042313A publication Critical patent/JP2012042313A/ja
Publication of JP2012042313A5 publication Critical patent/JP2012042313A5/ja
Application granted granted Critical
Publication of JP5643571B2 publication Critical patent/JP5643571B2/ja
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

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JP2010183392A 2010-08-18 2010-08-18 蛍光推定装置および蛍光推定方法、および蛍光測定装置 Expired - Fee Related JP5643571B2 (ja)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP2010183392A JP5643571B2 (ja) 2010-08-18 2010-08-18 蛍光推定装置および蛍光推定方法、および蛍光測定装置
US13/196,191 US8481973B2 (en) 2010-08-18 2011-08-02 Fluorescent estimating apparatus, fluorescent estimating method, and fluorescent measuring apparatus

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2010183392A JP5643571B2 (ja) 2010-08-18 2010-08-18 蛍光推定装置および蛍光推定方法、および蛍光測定装置

Publications (3)

Publication Number Publication Date
JP2012042313A JP2012042313A (ja) 2012-03-01
JP2012042313A5 true JP2012042313A5 (enExample) 2013-09-12
JP5643571B2 JP5643571B2 (ja) 2014-12-17

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ID=45593318

Family Applications (1)

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JP2010183392A Expired - Fee Related JP5643571B2 (ja) 2010-08-18 2010-08-18 蛍光推定装置および蛍光推定方法、および蛍光測定装置

Country Status (2)

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US (1) US8481973B2 (enExample)
JP (1) JP5643571B2 (enExample)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102829872A (zh) * 2012-08-14 2012-12-19 北京印刷学院 一种用接触式图像传感器测量颜色的方法及装置
US10354366B2 (en) 2015-01-16 2019-07-16 Nec Corporation Image processing device, image processing method, and recording medium
WO2018220636A1 (en) * 2017-05-31 2018-12-06 M/S Kothari Infotech Pvt. Limited A method that uses the measured ink combination data/training set to compute the errors that can be universally applied to correct the output of a prediction model
CN111860987B (zh) * 2020-07-08 2024-05-31 江苏科慧半导体研究院有限公司 混合荧光材料发射光谱预测方法和装置

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4061765B2 (ja) * 1999-02-09 2008-03-19 コニカミノルタセンシング株式会社 蛍光試料の分光特性測定装置及びその測定方法
JP2001235371A (ja) * 2000-02-23 2001-08-31 Jasco Corp 蛍光物体色測定方法および装置
US6671050B2 (en) * 2000-11-06 2003-12-30 Dai Nippon Printing Co., Ltd. Color measuring method and device for printed matter
JP4174707B2 (ja) * 2002-05-16 2008-11-05 独立行政法人情報通信研究機構 分光測定システム、色再現システム
JP4483496B2 (ja) * 2004-09-16 2010-06-16 凸版印刷株式会社 分光反射率予測装置及び分光反射率予測方法
JP4501634B2 (ja) * 2004-10-29 2010-07-14 富士フイルム株式会社 マトリクス係数決定方法及び画像入力装置
EP1694049B1 (de) * 2005-02-16 2009-07-01 X-Rite Europe GmbH Farbmessgerät und zugehöriger Messkopf
JP4660691B2 (ja) * 2005-04-08 2011-03-30 コニカミノルタセンシング株式会社 蛍光試料の光学特性測定方法及びこれを用いた光学特性測定装置
EP1775565B1 (de) * 2005-10-17 2008-05-07 X-Rite Europe AG Verfahren zur Farbmessung von gedruckten Proben mit Aufhellern
EP2003431B1 (de) * 2007-06-13 2012-01-25 X-Rite Europe GmbH Verfahren zur Farbmessung von gedruckten Proben mit Aufhellern

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