JP2012008066A5 - - Google Patents

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Publication number
JP2012008066A5
JP2012008066A5 JP2010145876A JP2010145876A JP2012008066A5 JP 2012008066 A5 JP2012008066 A5 JP 2012008066A5 JP 2010145876 A JP2010145876 A JP 2010145876A JP 2010145876 A JP2010145876 A JP 2010145876A JP 2012008066 A5 JP2012008066 A5 JP 2012008066A5
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JP
Japan
Prior art keywords
gas
supplied
helium
plasma
dilution
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JP2010145876A
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English (en)
Japanese (ja)
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JP2012008066A (ja
JP5445353B2 (ja
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Priority to JP2010145876A priority Critical patent/JP5445353B2/ja
Priority claimed from JP2010145876A external-priority patent/JP5445353B2/ja
Priority to US13/167,634 priority patent/US8773138B2/en
Priority to CN201110179412.2A priority patent/CN102368060B/zh
Publication of JP2012008066A publication Critical patent/JP2012008066A/ja
Publication of JP2012008066A5 publication Critical patent/JP2012008066A5/ja
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Publication of JP5445353B2 publication Critical patent/JP5445353B2/ja
Expired - Fee Related legal-status Critical Current
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JP2010145876A 2010-06-28 2010-06-28 放電イオン化電流検出器 Expired - Fee Related JP5445353B2 (ja)

Priority Applications (3)

Application Number Priority Date Filing Date Title
JP2010145876A JP5445353B2 (ja) 2010-06-28 2010-06-28 放電イオン化電流検出器
US13/167,634 US8773138B2 (en) 2010-06-28 2011-06-23 Discharge ionization current detector
CN201110179412.2A CN102368060B (zh) 2010-06-28 2011-06-28 放电离子化电流检测器

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2010145876A JP5445353B2 (ja) 2010-06-28 2010-06-28 放電イオン化電流検出器

Publications (3)

Publication Number Publication Date
JP2012008066A JP2012008066A (ja) 2012-01-12
JP2012008066A5 true JP2012008066A5 (enExample) 2012-11-22
JP5445353B2 JP5445353B2 (ja) 2014-03-19

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Family Applications (1)

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JP2010145876A Expired - Fee Related JP5445353B2 (ja) 2010-06-28 2010-06-28 放電イオン化電流検出器

Country Status (3)

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US (1) US8773138B2 (enExample)
JP (1) JP5445353B2 (enExample)
CN (1) CN102368060B (enExample)

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Publication number Priority date Publication date Assignee Title
EP2737291B1 (en) * 2011-07-26 2019-01-23 MKS Instruments, Inc. Cold cathode gauge fast response signal circuit
US8970840B2 (en) * 2011-12-09 2015-03-03 The United States of America, as represented by the Secretary of the Department of Health and Human Services, Centers for Disease Control and Prevention Method and apparatus for aerosol analysis using optical spectroscopy
WO2013140920A1 (ja) * 2012-03-21 2013-09-26 株式会社島津製作所 放電イオン化電流検出器を備えた分析装置
US10840073B2 (en) 2012-05-18 2020-11-17 Thermo Fisher Scientific (Bremen) Gmbh Methods and apparatus for obtaining enhanced mass spectrometric data
CN102709147B (zh) * 2012-06-21 2014-11-26 清华大学深圳研究生院 一种电喷雾离子源及质谱仪
US9784714B2 (en) * 2013-02-15 2017-10-10 Shimadzu Corporation Discharge ionization current detector and tuning method for the same
JP6303610B2 (ja) * 2014-03-04 2018-04-04 株式会社島津製作所 誘電体バリア放電イオン化検出器及びその調整方法
US9533909B2 (en) 2014-03-31 2017-01-03 Corning Incorporated Methods and apparatus for material processing using atmospheric thermal plasma reactor
US9550694B2 (en) 2014-03-31 2017-01-24 Corning Incorporated Methods and apparatus for material processing using plasma thermal source
US20160200618A1 (en) 2015-01-08 2016-07-14 Corning Incorporated Method and apparatus for adding thermal energy to a glass melt
US11340173B2 (en) * 2015-07-15 2022-05-24 Mecanique Analytique Inc. Emission-based detector for capillary gas chromatography
CN105606695B (zh) * 2016-03-28 2019-01-22 青岛佳明测控科技股份有限公司 Dbd离子化检测器及其检测方法
US10327319B1 (en) * 2016-05-25 2019-06-18 Perkinelmer Health Sciences, Inc. Counterflow sample introduction and devices, systems and methods using it
JP6775141B2 (ja) 2016-09-08 2020-10-28 株式会社島津製作所 誘電体バリア放電イオン化検出器
JP6747198B2 (ja) * 2016-09-08 2020-08-26 株式会社島津製作所 誘電体バリア放電イオン化検出器
JP6743599B2 (ja) 2016-09-08 2020-08-19 株式会社島津製作所 誘電体バリア放電イオン化検出器
JP6747197B2 (ja) * 2016-09-08 2020-08-26 株式会社島津製作所 誘電体バリア放電イオン化検出器
JP6675709B2 (ja) 2016-09-08 2020-04-01 株式会社島津製作所 誘電体バリア放電イオン化検出器
EP3639289A2 (de) 2017-06-16 2020-04-22 Plasmion Gmbh Vorrichtung und verfahren zur ionisation eines analyten sowie vorrichtung und verfahren zur analyse eines ionisierten analyten
JP7318608B2 (ja) * 2020-07-31 2023-08-01 株式会社島津製作所 放電イオン化検出器
JP2023077708A (ja) * 2021-11-25 2023-06-06 株式会社島津製作所 放電イオン化検出器およびガスクロマトグラフ分析装置
US12313580B2 (en) 2022-07-07 2025-05-27 Ge Infrastructure Technology Llc System and method for gas sensor that corrects for sensor poison level

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5594346A (en) * 1991-02-28 1997-01-14 Valco Instruments Co., Inc. Apparatus and methods for identifying and quantifying compounds using a plurality of pulsed rare gas photoionization detectors
US5394092A (en) 1991-02-28 1995-02-28 Valco Instruments Co., Inc. System for identifying and quantifying selected constituents of gas samples using selective photoionization
JPH0915223A (ja) * 1995-06-27 1997-01-17 Shimadzu Corp 水素炎を利用した検出器
US5892364A (en) * 1997-09-11 1999-04-06 Monagle; Matthew Trace constituent detection in inert gases
US6448777B1 (en) * 2001-08-20 2002-09-10 Agilent Technologies, Inc. Hermetically-sealed miniaturized discharge ionization detector
CN101981441B (zh) * 2008-03-25 2013-03-13 国立大学法人大阪大学 放电电离电流检测器
CN101281165B (zh) * 2008-05-15 2012-07-04 复旦大学 一种质谱分析样品的离子化装置
JP5136300B2 (ja) * 2008-09-02 2013-02-06 株式会社島津製作所 放電イオン化電流検出器

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