JP2010538468A5 - - Google Patents
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- Publication number
- JP2010538468A5 JP2010538468A5 JP2010523043A JP2010523043A JP2010538468A5 JP 2010538468 A5 JP2010538468 A5 JP 2010538468A5 JP 2010523043 A JP2010523043 A JP 2010523043A JP 2010523043 A JP2010523043 A JP 2010523043A JP 2010538468 A5 JP2010538468 A5 JP 2010538468A5
- Authority
- JP
- Japan
- Prior art keywords
- fluorine
- coating layer
- polymer coating
- containing polymer
- applying
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000000034 method Methods 0.000 claims 8
- YCKRFDGAMUMZLT-UHFFFAOYSA-N Fluorine atom Chemical compound [F] YCKRFDGAMUMZLT-UHFFFAOYSA-N 0.000 claims 7
- 229910052731 fluorine Inorganic materials 0.000 claims 7
- 239000011737 fluorine Substances 0.000 claims 7
- 239000011247 coating layer Substances 0.000 claims 6
- 229920000642 polymer Polymers 0.000 claims 6
- 239000004065 semiconductor Substances 0.000 claims 3
- 239000003795 chemical substances by application Substances 0.000 claims 2
- 238000004140 cleaning Methods 0.000 claims 1
- 238000005238 degreasing Methods 0.000 claims 1
- 238000007598 dipping method Methods 0.000 claims 1
- 238000004519 manufacturing process Methods 0.000 claims 1
- 239000002904 solvent Substances 0.000 claims 1
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| KR1020070086787A KR101413380B1 (ko) | 2007-08-28 | 2007-08-28 | 반도체 다이의 제조방법, 상기 방법으로 제조된 반도체다이를 포함하는 반도체 소자 |
| KR10-2007-0086787 | 2007-08-28 | ||
| PCT/US2008/073797 WO2009032536A2 (en) | 2007-08-28 | 2008-08-21 | Method for manufacturing a semiconductor die and a semiconductor device comprising the semiconductor die obtained thereby |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2010538468A JP2010538468A (ja) | 2010-12-09 |
| JP2010538468A5 true JP2010538468A5 (OSRAM) | 2011-10-06 |
| JP5587778B2 JP5587778B2 (ja) | 2014-09-10 |
Family
ID=40429633
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2010523043A Expired - Fee Related JP5587778B2 (ja) | 2007-08-28 | 2008-08-21 | 半導体ダイの製造方法及びこれにより得られる半導体ダイを含む半導体デバイス |
Country Status (7)
| Country | Link |
|---|---|
| US (1) | US8518805B2 (OSRAM) |
| EP (1) | EP2186129A4 (OSRAM) |
| JP (1) | JP5587778B2 (OSRAM) |
| KR (1) | KR101413380B1 (OSRAM) |
| CN (1) | CN101796629B (OSRAM) |
| TW (1) | TWI458002B (OSRAM) |
| WO (1) | WO2009032536A2 (OSRAM) |
Families Citing this family (17)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2012198477A (ja) * | 2011-03-23 | 2012-10-18 | Fujifilm Corp | レンズの製造方法 |
| US9236837B2 (en) | 2011-08-25 | 2016-01-12 | Infineon Technologies Ag | System and method for low distortion capacitive signal source amplifier |
| US8995690B2 (en) | 2011-11-28 | 2015-03-31 | Infineon Technologies Ag | Microphone and method for calibrating a microphone |
| US8638249B2 (en) | 2012-04-16 | 2014-01-28 | Infineon Technologies Ag | System and method for high input capacitive signal amplifier |
| US9281744B2 (en) | 2012-04-30 | 2016-03-08 | Infineon Technologies Ag | System and method for a programmable voltage source |
| US9214911B2 (en) | 2012-08-30 | 2015-12-15 | Infineon Technologies Ag | System and method for adjusting the sensitivity of a capacitive signal source |
| US8916453B2 (en) | 2012-11-21 | 2014-12-23 | Infineon Technologies Ag | Method for manufacturing an electronic component |
| US9332369B2 (en) | 2013-10-22 | 2016-05-03 | Infineon Technologies Ag | System and method for automatic calibration of a transducer |
| KR101709689B1 (ko) | 2013-12-19 | 2017-02-23 | 주식회사 엘지화학 | 다이싱 필름 점착층 형성용 조성물 및 다이싱 필름 |
| JP6887722B2 (ja) * | 2016-10-25 | 2021-06-16 | 株式会社ディスコ | ウェーハの加工方法及び切削装置 |
| JP6837859B2 (ja) * | 2017-02-14 | 2021-03-03 | 株式会社ディスコ | ウエーハの加工方法 |
| US10269756B2 (en) | 2017-04-21 | 2019-04-23 | Invensas Bonding Technologies, Inc. | Die processing |
| WO2019143202A1 (ko) * | 2018-01-19 | 2019-07-25 | 주식회사 엠티아이 | 다이싱 공정용 보호코팅제 박리용 박리제 |
| JP6862028B2 (ja) * | 2018-01-19 | 2021-04-21 | エムティーアイ カンパニー, リミテッドMti Co., Ltd. | ダイシング工程用保護コーティング剤 |
| US10727219B2 (en) | 2018-02-15 | 2020-07-28 | Invensas Bonding Technologies, Inc. | Techniques for processing devices |
| WO2021184374A1 (en) * | 2020-03-20 | 2021-09-23 | Genesense Technology Inc | High throughput analytical system for molecule detection and sensing |
| US11742314B2 (en) | 2020-03-31 | 2023-08-29 | Adeia Semiconductor Bonding Technologies Inc. | Reliable hybrid bonded apparatus |
Family Cites Families (15)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS63117445A (ja) * | 1986-11-05 | 1988-05-21 | Citizen Watch Co Ltd | 半導体ウエハ−の加工方法 |
| JPH05144938A (ja) * | 1991-09-26 | 1993-06-11 | Toshiba Corp | 固体撮像装置の製造方法 |
| JPH1046062A (ja) * | 1996-08-08 | 1998-02-17 | Daikin Ind Ltd | 可剥離性塗料組成物 |
| KR100283192B1 (ko) * | 1998-06-09 | 2001-04-02 | 윤종용 | 반구형결정가입자들을갖는캐패시터의제조방법 |
| JP4318353B2 (ja) * | 1999-10-01 | 2009-08-19 | パナソニック株式会社 | 基板の製造方法 |
| JP2003273043A (ja) * | 2002-03-19 | 2003-09-26 | Iwate Toshiba Electronics Co Ltd | 半導体装置の製造方法 |
| JP4368093B2 (ja) * | 2002-06-24 | 2009-11-18 | スリーエム イノベイティブ プロパティズ カンパニー | フィルム接着剤、半導体装置及びその製造方法 |
| WO2004000966A1 (en) * | 2002-06-24 | 2003-12-31 | 3M Innovative Properties Company | Heat curable adhesive composition, article, semiconductor apparatus and method |
| JP2004099833A (ja) * | 2002-09-12 | 2004-04-02 | Three M Innovative Properties Co | 熱硬化性接着剤組成物、フィルム接着剤及び半導体装置 |
| JP3595323B2 (ja) | 2002-11-22 | 2004-12-02 | 沖電気工業株式会社 | 半導体装置及びその製造方法 |
| CN100433294C (zh) * | 2004-01-13 | 2008-11-12 | 东京毅力科创株式会社 | 半导体装置的制造方法以及成膜系统 |
| JP4704017B2 (ja) * | 2004-12-09 | 2011-06-15 | 日東電工株式会社 | 被着物の加熱剥離方法及び被着物加熱剥離装置 |
| JP4482760B2 (ja) * | 2005-04-26 | 2010-06-16 | 信越化学工業株式会社 | レジスト保護膜材料及びパターン形成方法 |
| JP2007056134A (ja) * | 2005-08-24 | 2007-03-08 | Asahi Glass Co Ltd | レジスト保護膜 |
| KR100652442B1 (ko) | 2005-11-09 | 2006-12-01 | 삼성전자주식회사 | 반도체 칩 및 그 제조 방법 |
-
2007
- 2007-08-28 KR KR1020070086787A patent/KR101413380B1/ko active Active
-
2008
- 2008-08-21 US US12/672,899 patent/US8518805B2/en not_active Expired - Fee Related
- 2008-08-21 EP EP08798328A patent/EP2186129A4/en not_active Withdrawn
- 2008-08-21 WO PCT/US2008/073797 patent/WO2009032536A2/en not_active Ceased
- 2008-08-21 JP JP2010523043A patent/JP5587778B2/ja not_active Expired - Fee Related
- 2008-08-21 CN CN200880104976.6A patent/CN101796629B/zh not_active Expired - Fee Related
- 2008-08-27 TW TW097132738A patent/TWI458002B/zh active
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