JP2010511162A - 調整可能なスペクトル感度を備えたビーム検出器 - Google Patents

調整可能なスペクトル感度を備えたビーム検出器 Download PDF

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Publication number
JP2010511162A
JP2010511162A JP2009538716A JP2009538716A JP2010511162A JP 2010511162 A JP2010511162 A JP 2010511162A JP 2009538716 A JP2009538716 A JP 2009538716A JP 2009538716 A JP2009538716 A JP 2009538716A JP 2010511162 A JP2010511162 A JP 2010511162A
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Prior art keywords
detector
sensitivity
beam detector
channel
members
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JP2009538716A
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English (en)
Japanese (ja)
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JP2010511162A5 (enExample
Inventor
イェーガー アルント
シュタウス ペーター
シュトロイベル クラウス
クールマン ヴェルナー
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Ams Osram International GmbH
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Osram Opto Semiconductors GmbH
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Publication of JP2010511162A publication Critical patent/JP2010511162A/ja
Publication of JP2010511162A5 publication Critical patent/JP2010511162A5/ja
Pending legal-status Critical Current

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/42—Photometry, e.g. photographic exposure meter using electric radiation detectors
    • G01J1/4228—Photometry, e.g. photographic exposure meter using electric radiation detectors arrangements with two or more detectors, e.g. for sensitivity compensation
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F99/00—Subject matter not provided for in other groups of this subclass
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/42—Photometry, e.g. photographic exposure meter using electric radiation detectors
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/28—Investigating the spectrum
    • G01J3/30—Measuring the intensity of spectral lines directly on the spectrum itself
    • G01J3/36—Investigating two or more bands of a spectrum by separate detectors
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/46—Measurement of colour; Colour measuring devices, e.g. colorimeters
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/46—Measurement of colour; Colour measuring devices, e.g. colorimeters
    • G01J3/465—Measurement of colour; Colour measuring devices, e.g. colorimeters taking into account the colour perception of the eye; using tristimulus detection
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/46—Measurement of colour; Colour measuring devices, e.g. colorimeters
    • G01J3/50—Measurement of colour; Colour measuring devices, e.g. colorimeters using electric radiation detectors
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/46—Measurement of colour; Colour measuring devices, e.g. colorimeters
    • G01J3/50—Measurement of colour; Colour measuring devices, e.g. colorimeters using electric radiation detectors
    • G01J3/51—Measurement of colour; Colour measuring devices, e.g. colorimeters using electric radiation detectors using colour filters
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/46—Measurement of colour; Colour measuring devices, e.g. colorimeters
    • G01J3/50—Measurement of colour; Colour measuring devices, e.g. colorimeters using electric radiation detectors
    • G01J3/51—Measurement of colour; Colour measuring devices, e.g. colorimeters using electric radiation detectors using colour filters
    • G01J3/513—Measurement of colour; Colour measuring devices, e.g. colorimeters using electric radiation detectors using colour filters having fixed filter-detector pairs
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F30/00—Individual radiation-sensitive semiconductor devices in which radiation controls the flow of current through the devices, e.g. photodetectors
    • H10F30/20—Individual radiation-sensitive semiconductor devices in which radiation controls the flow of current through the devices, e.g. photodetectors the devices having potential barriers, e.g. phototransistors
    • H10F30/21—Individual radiation-sensitive semiconductor devices in which radiation controls the flow of current through the devices, e.g. photodetectors the devices having potential barriers, e.g. phototransistors the devices being sensitive to infrared, visible or ultraviolet radiation
    • H10F30/22—Individual radiation-sensitive semiconductor devices in which radiation controls the flow of current through the devices, e.g. photodetectors the devices having potential barriers, e.g. phototransistors the devices being sensitive to infrared, visible or ultraviolet radiation the devices having only one potential barrier, e.g. photodiodes
    • H10F30/223—Individual radiation-sensitive semiconductor devices in which radiation controls the flow of current through the devices, e.g. photodetectors the devices having potential barriers, e.g. phototransistors the devices being sensitive to infrared, visible or ultraviolet radiation the devices having only one potential barrier, e.g. photodiodes the potential barrier being a PIN barrier
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/02—Details
    • G01J1/04—Optical or mechanical part supplementary adjustable parts
    • G01J1/0488—Optical or mechanical part supplementary adjustable parts with spectral filtering
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/46—Measurement of colour; Colour measuring devices, e.g. colorimeters
    • G01J3/50—Measurement of colour; Colour measuring devices, e.g. colorimeters using electric radiation detectors
    • G01J2003/507—Measurement of colour; Colour measuring devices, e.g. colorimeters using electric radiation detectors the detectors being physically selective

Landscapes

  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • General Physics & Mathematics (AREA)
  • Light Receiving Elements (AREA)
  • Spectrometry And Color Measurement (AREA)
  • Photometry And Measurement Of Optical Pulse Characteristics (AREA)
JP2009538716A 2006-11-30 2007-11-29 調整可能なスペクトル感度を備えたビーム検出器 Pending JP2010511162A (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
DE102006056579 2006-11-30
DE102007012115A DE102007012115A1 (de) 2006-11-30 2007-03-13 Strahlungsdetektor
PCT/EP2007/063007 WO2008065170A1 (de) 2006-11-30 2007-11-29 Strahlungsdetektor mit einstellbarer spektraler empfindlichkeit

Publications (2)

Publication Number Publication Date
JP2010511162A true JP2010511162A (ja) 2010-04-08
JP2010511162A5 JP2010511162A5 (enExample) 2011-10-13

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JP2009538716A Pending JP2010511162A (ja) 2006-11-30 2007-11-29 調整可能なスペクトル感度を備えたビーム検出器

Country Status (8)

Country Link
US (1) US8274657B2 (enExample)
EP (1) EP2054705A1 (enExample)
JP (1) JP2010511162A (enExample)
KR (1) KR101430030B1 (enExample)
CN (1) CN101535785B (enExample)
DE (1) DE102007012115A1 (enExample)
TW (1) TWI365976B (enExample)
WO (1) WO2008065170A1 (enExample)

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WO2022003813A1 (ja) * 2020-06-30 2022-01-06 シャープ株式会社 電磁波センサ装置および表示装置

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US7442629B2 (en) 2004-09-24 2008-10-28 President & Fellows Of Harvard College Femtosecond laser-induced formation of submicrometer spikes on a semiconductor substrate
US7890055B1 (en) * 2007-07-09 2011-02-15 Everlokt Corporation Touch field compound field detector personal ID
JP2010112808A (ja) * 2008-11-05 2010-05-20 Hioki Ee Corp 光パワーメータ
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US8008613B2 (en) 2009-05-05 2011-08-30 Apple Inc. Light sensing device having a color sensor and a clear sensor for infrared rejection
DE102009024069A1 (de) * 2009-06-05 2010-12-09 Osram Opto Semiconductors Gmbh Optisches Beleuchtungsgerät und optisches Aufzeichnungsgerät
US9911781B2 (en) 2009-09-17 2018-03-06 Sionyx, Llc Photosensitive imaging devices and associated methods
EP2478560A4 (en) * 2009-09-17 2014-06-18 Sionyx Inc LIGHT-SENSITIVE IMAGING DEVICES AND CORRESPONDING METHODS
US9673243B2 (en) 2009-09-17 2017-06-06 Sionyx, Llc Photosensitive imaging devices and associated methods
JP5333596B2 (ja) * 2009-10-05 2013-11-06 株式会社島津製作所 放射線検出器
US8692198B2 (en) 2010-04-21 2014-04-08 Sionyx, Inc. Photosensitive imaging devices and associated methods
CN106449684B (zh) 2010-06-18 2019-09-27 西奥尼克斯公司 高速光敏设备及相关方法
EP2684221A4 (en) 2011-03-10 2014-08-20 Sionyx Inc THREE-DIMENSIONAL SENSORS, SYSTEMS AND RELATED METHODS
WO2012130280A1 (de) 2011-03-29 2012-10-04 Osram Opto Semiconductors Gmbh Einheit zur bestimmung der art einer dominierenden lichtquelle mittels zweier fotodioden
US9496308B2 (en) 2011-06-09 2016-11-15 Sionyx, Llc Process module for increasing the response of backside illuminated photosensitive imagers and associated methods
CN103946867A (zh) 2011-07-13 2014-07-23 西奥尼克斯公司 生物计量成像装置和相关方法
US8865507B2 (en) 2011-09-16 2014-10-21 Sionyx, Inc. Integrated visible and infrared imager devices and associated methods
US9064764B2 (en) 2012-03-22 2015-06-23 Sionyx, Inc. Pixel isolation elements, devices, and associated methods
JP6466346B2 (ja) 2013-02-15 2019-02-06 サイオニクス、エルエルシー アンチブルーミング特性を有するハイダイナミックレンジｃｍｏｓ画像センサおよび関連づけられた方法
WO2014151093A1 (en) 2013-03-15 2014-09-25 Sionyx, Inc. Three dimensional imaging utilizing stacked imager devices and associated methods
US9209345B2 (en) 2013-06-29 2015-12-08 Sionyx, Inc. Shallow trench textured regions and associated methods
US10281329B2 (en) * 2017-06-14 2019-05-07 Simmonds Precision Products, Inc. Method and system for fast determination of the wavelength of a light beam
CN109556710B (zh) * 2018-12-28 2024-04-16 浙江智慧照明技术有限公司 照明环境光传感器
DE102019114537A1 (de) * 2019-05-29 2020-12-03 OSRAM Opto Semiconductors Gesellschaft mit beschränkter Haftung Optoelektronisches sensorbauelement zur lichtmessung mit eingebauter redundanz
KR102774244B1 (ko) * 2019-11-19 2025-03-05 삼성전자주식회사 스펙트럼을 분할하는 발광 소자 측정 장치, 및 이의 동작 방법

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DE2920773A1 (de) * 1979-05-22 1980-12-04 Siemens Ag Optoelektronischer sensor
JPS6336121A (ja) * 1986-07-29 1988-02-16 Minolta Camera Co Ltd 測色センサ
JPH01233328A (ja) * 1988-03-14 1989-09-19 Agency Of Ind Science & Technol 測光装置
JPH03202732A (ja) * 1989-06-13 1991-09-04 Sharp Corp カラーセンサ
JP2000066166A (ja) * 1998-08-21 2000-03-03 Mitsubishi Electric Corp 投写型液晶表示装置
DE10101457A1 (de) * 2001-01-10 2002-07-18 Infineon Technologies Ag Optoelektronisches System zur Detektion elektromagnetischer Strahlung
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Publication number Priority date Publication date Assignee Title
WO2022003813A1 (ja) * 2020-06-30 2022-01-06 シャープ株式会社 電磁波センサ装置および表示装置

Also Published As

Publication number Publication date
EP2054705A1 (de) 2009-05-06
US20100097609A1 (en) 2010-04-22
TW200844412A (en) 2008-11-16
CN101535785B (zh) 2011-12-28
WO2008065170A1 (de) 2008-06-05
CN101535785A (zh) 2009-09-16
KR101430030B1 (ko) 2014-08-14
US8274657B2 (en) 2012-09-25
DE102007012115A1 (de) 2008-06-05
KR20090098850A (ko) 2009-09-17
TWI365976B (en) 2012-06-11

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