CN101535785B - 具有可调节的光谱灵敏度的辐射检测器 - Google Patents

具有可调节的光谱灵敏度的辐射检测器 Download PDF

Info

Publication number
CN101535785B
CN101535785B CN2007800414217A CN200780041421A CN101535785B CN 101535785 B CN101535785 B CN 101535785B CN 2007800414217 A CN2007800414217 A CN 2007800414217A CN 200780041421 A CN200780041421 A CN 200780041421A CN 101535785 B CN101535785 B CN 101535785B
Authority
CN
China
Prior art keywords
detector
radiation detector
sensitivity
radiation
channel
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
CN2007800414217A
Other languages
English (en)
Chinese (zh)
Other versions
CN101535785A (zh
Inventor
阿恩特·耶格
彼得·施陶斯
克劳斯·施特罗伊贝尔
韦尔纳·库尔曼
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Ams Osram International GmbH
Original Assignee
Osram Opto Semiconductors GmbH
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Osram Opto Semiconductors GmbH filed Critical Osram Opto Semiconductors GmbH
Publication of CN101535785A publication Critical patent/CN101535785A/zh
Application granted granted Critical
Publication of CN101535785B publication Critical patent/CN101535785B/zh
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Images

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/42—Photometry, e.g. photographic exposure meter using electric radiation detectors
    • G01J1/4228—Photometry, e.g. photographic exposure meter using electric radiation detectors arrangements with two or more detectors, e.g. for sensitivity compensation
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F99/00—Subject matter not provided for in other groups of this subclass
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/42—Photometry, e.g. photographic exposure meter using electric radiation detectors
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/28—Investigating the spectrum
    • G01J3/30—Measuring the intensity of spectral lines directly on the spectrum itself
    • G01J3/36—Investigating two or more bands of a spectrum by separate detectors
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/46—Measurement of colour; Colour measuring devices, e.g. colorimeters
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/46—Measurement of colour; Colour measuring devices, e.g. colorimeters
    • G01J3/465—Measurement of colour; Colour measuring devices, e.g. colorimeters taking into account the colour perception of the eye; using tristimulus detection
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/46—Measurement of colour; Colour measuring devices, e.g. colorimeters
    • G01J3/50—Measurement of colour; Colour measuring devices, e.g. colorimeters using electric radiation detectors
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/46—Measurement of colour; Colour measuring devices, e.g. colorimeters
    • G01J3/50—Measurement of colour; Colour measuring devices, e.g. colorimeters using electric radiation detectors
    • G01J3/51—Measurement of colour; Colour measuring devices, e.g. colorimeters using electric radiation detectors using colour filters
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/46—Measurement of colour; Colour measuring devices, e.g. colorimeters
    • G01J3/50—Measurement of colour; Colour measuring devices, e.g. colorimeters using electric radiation detectors
    • G01J3/51—Measurement of colour; Colour measuring devices, e.g. colorimeters using electric radiation detectors using colour filters
    • G01J3/513—Measurement of colour; Colour measuring devices, e.g. colorimeters using electric radiation detectors using colour filters having fixed filter-detector pairs
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F30/00—Individual radiation-sensitive semiconductor devices in which radiation controls the flow of current through the devices, e.g. photodetectors
    • H10F30/20—Individual radiation-sensitive semiconductor devices in which radiation controls the flow of current through the devices, e.g. photodetectors the devices having potential barriers, e.g. phototransistors
    • H10F30/21—Individual radiation-sensitive semiconductor devices in which radiation controls the flow of current through the devices, e.g. photodetectors the devices having potential barriers, e.g. phototransistors the devices being sensitive to infrared, visible or ultraviolet radiation
    • H10F30/22—Individual radiation-sensitive semiconductor devices in which radiation controls the flow of current through the devices, e.g. photodetectors the devices having potential barriers, e.g. phototransistors the devices being sensitive to infrared, visible or ultraviolet radiation the devices having only one potential barrier, e.g. photodiodes
    • H10F30/223—Individual radiation-sensitive semiconductor devices in which radiation controls the flow of current through the devices, e.g. photodetectors the devices having potential barriers, e.g. phototransistors the devices being sensitive to infrared, visible or ultraviolet radiation the devices having only one potential barrier, e.g. photodiodes the potential barrier being a PIN barrier
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/02—Details
    • G01J1/04—Optical or mechanical part supplementary adjustable parts
    • G01J1/0488—Optical or mechanical part supplementary adjustable parts with spectral filtering
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/46—Measurement of colour; Colour measuring devices, e.g. colorimeters
    • G01J3/50—Measurement of colour; Colour measuring devices, e.g. colorimeters using electric radiation detectors
    • G01J2003/507—Measurement of colour; Colour measuring devices, e.g. colorimeters using electric radiation detectors the detectors being physically selective

Landscapes

  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • General Physics & Mathematics (AREA)
  • Light Receiving Elements (AREA)
  • Spectrometry And Color Measurement (AREA)
  • Photometry And Measurement Of Optical Pulse Characteristics (AREA)
CN2007800414217A 2006-11-30 2007-11-29 具有可调节的光谱灵敏度的辐射检测器 Active CN101535785B (zh)

Applications Claiming Priority (5)

Application Number Priority Date Filing Date Title
DE102006056579.7 2006-11-30
DE102006056579 2006-11-30
DE102007012115.8 2007-03-13
DE102007012115A DE102007012115A1 (de) 2006-11-30 2007-03-13 Strahlungsdetektor
PCT/EP2007/063007 WO2008065170A1 (de) 2006-11-30 2007-11-29 Strahlungsdetektor mit einstellbarer spektraler empfindlichkeit

Publications (2)

Publication Number Publication Date
CN101535785A CN101535785A (zh) 2009-09-16
CN101535785B true CN101535785B (zh) 2011-12-28

Family

ID=39110400

Family Applications (1)

Application Number Title Priority Date Filing Date
CN2007800414217A Active CN101535785B (zh) 2006-11-30 2007-11-29 具有可调节的光谱灵敏度的辐射检测器

Country Status (8)

Country Link
US (1) US8274657B2 (enExample)
EP (1) EP2054705A1 (enExample)
JP (1) JP2010511162A (enExample)
KR (1) KR101430030B1 (enExample)
CN (1) CN101535785B (enExample)
DE (1) DE102007012115A1 (enExample)
TW (1) TWI365976B (enExample)
WO (1) WO2008065170A1 (enExample)

Families Citing this family (27)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7057256B2 (en) 2001-05-25 2006-06-06 President & Fellows Of Harvard College Silicon-based visible and near-infrared optoelectric devices
US7442629B2 (en) 2004-09-24 2008-10-28 President & Fellows Of Harvard College Femtosecond laser-induced formation of submicrometer spikes on a semiconductor substrate
US7890055B1 (en) * 2007-07-09 2011-02-15 Everlokt Corporation Touch field compound field detector personal ID
JP2010112808A (ja) * 2008-11-05 2010-05-20 Hioki Ee Corp 光パワーメータ
JP2010112807A (ja) * 2008-11-05 2010-05-20 Hioki Ee Corp 光パワーメータ
US8008613B2 (en) 2009-05-05 2011-08-30 Apple Inc. Light sensing device having a color sensor and a clear sensor for infrared rejection
DE102009024069A1 (de) 2009-06-05 2010-12-09 Osram Opto Semiconductors Gmbh Optisches Beleuchtungsgerät und optisches Aufzeichnungsgerät
KR101893331B1 (ko) * 2009-09-17 2018-08-30 사이오닉스, 엘엘씨 감광성 이미징 장치 및 이와 관련된 방법
US9673243B2 (en) 2009-09-17 2017-06-06 Sionyx, Llc Photosensitive imaging devices and associated methods
US9911781B2 (en) 2009-09-17 2018-03-06 Sionyx, Llc Photosensitive imaging devices and associated methods
JP5333596B2 (ja) * 2009-10-05 2013-11-06 株式会社島津製作所 放射線検出器
US8692198B2 (en) 2010-04-21 2014-04-08 Sionyx, Inc. Photosensitive imaging devices and associated methods
US20120146172A1 (en) 2010-06-18 2012-06-14 Sionyx, Inc. High Speed Photosensitive Devices and Associated Methods
KR102025522B1 (ko) 2011-03-10 2019-11-26 사이오닉스, 엘엘씨 3차원 센서, 시스템, 및 관련 방법
JP2014509746A (ja) * 2011-03-29 2014-04-21 オスラム オプト セミコンダクターズ ゲゼルシャフト ミット ベシュレンクテル ハフツング ２つのフォトダイオードを用いて優位を占める光源のタイプを求めるためのユニット
US9496308B2 (en) 2011-06-09 2016-11-15 Sionyx, Llc Process module for increasing the response of backside illuminated photosensitive imagers and associated methods
US20130016203A1 (en) 2011-07-13 2013-01-17 Saylor Stephen D Biometric imaging devices and associated methods
US8865507B2 (en) 2011-09-16 2014-10-21 Sionyx, Inc. Integrated visible and infrared imager devices and associated methods
US9064764B2 (en) 2012-03-22 2015-06-23 Sionyx, Inc. Pixel isolation elements, devices, and associated methods
JP6466346B2 (ja) 2013-02-15 2019-02-06 サイオニクス、エルエルシー アンチブルーミング特性を有するハイダイナミックレンジｃｍｏｓ画像センサおよび関連づけられた方法
WO2014151093A1 (en) 2013-03-15 2014-09-25 Sionyx, Inc. Three dimensional imaging utilizing stacked imager devices and associated methods
US9209345B2 (en) 2013-06-29 2015-12-08 Sionyx, Inc. Shallow trench textured regions and associated methods
US10281329B2 (en) * 2017-06-14 2019-05-07 Simmonds Precision Products, Inc. Method and system for fast determination of the wavelength of a light beam
CN109556710B (zh) * 2018-12-28 2024-04-16 浙江智慧照明技术有限公司 照明环境光传感器
DE102019114537A1 (de) * 2019-05-29 2020-12-03 OSRAM Opto Semiconductors Gesellschaft mit beschränkter Haftung Optoelektronisches sensorbauelement zur lichtmessung mit eingebauter redundanz
KR102774244B1 (ko) * 2019-11-19 2025-03-05 삼성전자주식회사 스펙트럼을 분할하는 발광 소자 측정 장치, 및 이의 동작 방법
US20230243703A1 (en) * 2020-06-30 2023-08-03 Sharp Kabushiki Kaisha Electromagnetic wave sensor device and display device

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE2920773A1 (de) * 1979-05-22 1980-12-04 Siemens Ag Optoelektronischer sensor
US5818977A (en) * 1996-03-12 1998-10-06 Her Majesty The Queen In Right Of Canada As Represented By The Minister Of Supply And Services And Of Public Works Photometric measurement apparatus
DE10101457A1 (de) * 2001-01-10 2002-07-18 Infineon Technologies Ag Optoelektronisches System zur Detektion elektromagnetischer Strahlung
EP1521069A2 (de) * 2003-10-02 2005-04-06 MAZet GmbH Photosensor zur normgerechten Farbmessung
EP1643565A2 (de) * 2004-09-30 2006-04-05 Osram Opto Semiconductors GmbH Strahlungsdetektor

Family Cites Families (29)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS55104725A (en) 1979-02-05 1980-08-11 Nec Corp Wave-length discrimination type photo-detector
JPS59227171A (ja) 1983-06-08 1984-12-20 Oki Electric Ind Co Ltd カラ−センサ
US4758734A (en) 1984-03-13 1988-07-19 Nec Corporation High resolution image sensor array using amorphous photo-diodes
JPH0612808B2 (ja) 1984-07-13 1994-02-16 日本電気株式会社 固体撮像装置の製造方法
JPS6336121A (ja) 1986-07-29 1988-02-16 Minolta Camera Co Ltd 測色センサ
JPH01233328A (ja) 1988-03-14 1989-09-19 Agency Of Ind Science & Technol 測光装置
JPH03202732A (ja) 1989-06-13 1991-09-04 Sharp Corp カラーセンサ
DE4024011A1 (de) * 1990-07-28 1992-01-30 Gossen Gmbh Verfahren und vorrichtung zur elektronischen belichtungsmessung
JPH04280678A (ja) * 1991-03-08 1992-10-06 Nec Corp 固体撮像素子
DE4143284A1 (de) 1991-12-30 1992-10-01 Klaus Eberhard Engel Integrierter halbleitersensor fuer spektrometer
GB2277405A (en) 1993-04-22 1994-10-26 Sharp Kk Semiconductor colour display or detector array
US5362969A (en) 1993-04-23 1994-11-08 Luxtron Corporation Processing endpoint detecting technique and detector structure using multiple radiation sources or discrete detectors
EP0645826A3 (en) 1993-09-23 1995-05-17 Siemens Comp Inc Monolithic multi-channel optocoupler.
WO1997012212A1 (de) * 1995-09-27 1997-04-03 Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. Multispektralsensorvorrichtung
US6307660B1 (en) 1997-01-28 2001-10-23 Tellium, Inc. Optical receiver particularly useful for a multi-wavelength receiver array
JP4030199B2 (ja) 1998-08-21 2008-01-09 三菱電機株式会社 投写型液晶表示装置
US6359274B1 (en) 1999-01-25 2002-03-19 Gentex Corporation Photodiode light sensor
US6407439B1 (en) 1999-08-19 2002-06-18 Epitaxial Technologies, Llc Programmable multi-wavelength detector array
US7065035B1 (en) 1999-10-25 2006-06-20 Matsushita Electric Industrial Co., Ltd. Optical multilayer disk, multiwavelength light source, and optical system using them
US6380532B1 (en) 2000-04-19 2002-04-30 Eaton Corporation Optical object detector with multiple photodetectors
GB2381950A (en) 2001-11-06 2003-05-14 Denselight Semiconductors Pte Field effect based photodetector array responsivity control
TW499577B (en) 2001-12-07 2002-08-21 Univ Yuan Ze Coiled optical fiber wavelength - power converter
DE102004037020B4 (de) * 2003-09-30 2021-10-21 OSRAM Opto Semiconductors Gesellschaft mit beschränkter Haftung Strahlungsdetektor zur Detektion von Strahlung gemäß einer vorgegebenen spektralen Empfindlichkeitsverteilung
DE10345410A1 (de) 2003-09-30 2005-05-04 Osram Opto Semiconductors Gmbh Strahlungsdetektor
US8212285B2 (en) 2004-03-31 2012-07-03 Osram Opto Semiconductors Gmbh Radiation detector
DE102005001280B4 (de) * 2004-09-30 2022-03-03 OSRAM Opto Semiconductors Gesellschaft mit beschränkter Haftung Strahlungsdetektor
EP1667246A1 (en) * 2004-12-03 2006-06-07 ETeCH AG A multi-colour sensitive device for colour image sensing
JP2006189291A (ja) * 2005-01-05 2006-07-20 Konica Minolta Sensing Inc 測光装置及び単色光の測光方法
DE102005043918B4 (de) 2005-05-30 2014-12-04 Osram Opto Semiconductors Gmbh Detektoranordnung und Verfahren zur Bestimmung spektraler Anteile in einer auf eine Detektoranordnung einfallenden Strahlung

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE2920773A1 (de) * 1979-05-22 1980-12-04 Siemens Ag Optoelektronischer sensor
US5818977A (en) * 1996-03-12 1998-10-06 Her Majesty The Queen In Right Of Canada As Represented By The Minister Of Supply And Services And Of Public Works Photometric measurement apparatus
DE10101457A1 (de) * 2001-01-10 2002-07-18 Infineon Technologies Ag Optoelektronisches System zur Detektion elektromagnetischer Strahlung
EP1521069A2 (de) * 2003-10-02 2005-04-06 MAZet GmbH Photosensor zur normgerechten Farbmessung
EP1643565A2 (de) * 2004-09-30 2006-04-05 Osram Opto Semiconductors GmbH Strahlungsdetektor

Also Published As

Publication number Publication date
KR101430030B1 (ko) 2014-08-14
TWI365976B (en) 2012-06-11
DE102007012115A1 (de) 2008-06-05
JP2010511162A (ja) 2010-04-08
WO2008065170A1 (de) 2008-06-05
CN101535785A (zh) 2009-09-16
KR20090098850A (ko) 2009-09-17
US20100097609A1 (en) 2010-04-22
EP2054705A1 (de) 2009-05-06
US8274657B2 (en) 2012-09-25
TW200844412A (en) 2008-11-16

Similar Documents

Publication Publication Date Title
CN101535785B (zh) 具有可调节的光谱灵敏度的辐射检测器
DE112016004962B4 (de) Leuchte mit bildsensormodul
US7525083B2 (en) Radiation detector with an epitaxially grown semiconductor body
RU2437184C2 (ru) Твердотельный источник света с обратной связью по цвету и комбинированное средство связи
DE102009010265A1 (de) Halbleiter-Leuchtvorrichtung
US7030916B2 (en) Color image pickup apparatus with light source distinguishing function
DE102017100918A1 (de) Halbleitervorrichtung für ein Lichtquellenmodul, ein Anzeigefeld oder eine Anzeigevorrichtung
EP2359668A2 (de) Optoelektronische vorrichtung
DE102004004765A1 (de) Aktive Zonen aufweisende Halbleiterstruktur
DE102005061204A1 (de) Beleuchtungsvorrichtung, Beleuchtungssteuergerät und Beleuchtungssystem
DE102008021572A1 (de) Multichip LED Leuchten
EP3276680A1 (de) Optische rauchdetektion nach dem zweifarben-prinzip mittels einer leuchtdiode mit einem led-chip zur lichtemission und mit einem lichtkonverter zum umwandeln eines teils des emittierten lichts in langwelligeres licht
CN101933142A (zh) 辐射接收器和用于制造辐射接收器的方法
CN101365929A (zh) 具有集成的温度传感器功能的光传感器
DE102007054314A1 (de) Schaltungsanordnung zum Erzeugen von licht- und temperaturabhängigen Signalen, insbesondere für ein bildgebendes Pyrometer
DE102014200436A1 (de) LED-Modul und Verfahren zum Betrieb basierend auf der Erfassung des Umgebungslichts
CN101981696B (zh) 光电射线检测器和用于制造多个检测器元件的方法
JP5447756B2 (ja) 放射検出器
EP1668674B1 (de) Strahlungsdetektor
EP2361489B1 (de) Led-anordnung mit lichtsensor
DE102007040873B4 (de) Beleuchtungsvorrichtung und Verfahren zur Anpassung einer Abstrahlcharakteristik einer Beleuchtungsvorrichtung
DE102004056705B4 (de) Lumineszenzdiodenanordnung und Verfahren zur Überwachung von Lumineszenzdiodenchips
US10985200B2 (en) Method for producing an image sensor, and an image sensor
DE102005043918B4 (de) Detektoranordnung und Verfahren zur Bestimmung spektraler Anteile in einer auf eine Detektoranordnung einfallenden Strahlung
JP2009510732A (ja) 検出器装置および検出器素子

Legal Events

Date Code Title Description
C06 Publication
PB01 Publication
C10 Entry into substantive examination
SE01 Entry into force of request for substantive examination
C14 Grant of patent or utility model
GR01 Patent grant