DE102007012115A1 - Strahlungsdetektor - Google Patents

Strahlungsdetektor Download PDF

Info

Publication number
DE102007012115A1
DE102007012115A1 DE102007012115A DE102007012115A DE102007012115A1 DE 102007012115 A1 DE102007012115 A1 DE 102007012115A1 DE 102007012115 A DE102007012115 A DE 102007012115A DE 102007012115 A DE102007012115 A DE 102007012115A DE 102007012115 A1 DE102007012115 A1 DE 102007012115A1
Authority
DE
Germany
Prior art keywords
detector
sensitivity
radiation detector
radiation
control device
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Ceased
Application number
DE102007012115A
Other languages
German (de)
English (en)
Inventor
Arndt Dr. Jaeger
Klaus Dr. Streubel
Peter Dr. Stauss
Werner Kuhlmann
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Ams Osram International GmbH
Original Assignee
Osram Opto Semiconductors GmbH
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Osram Opto Semiconductors GmbH filed Critical Osram Opto Semiconductors GmbH
Priority to DE102007012115A priority Critical patent/DE102007012115A1/de
Priority to TW096144735A priority patent/TWI365976B/zh
Priority to PCT/EP2007/063007 priority patent/WO2008065170A1/de
Priority to KR1020097013679A priority patent/KR101430030B1/ko
Priority to CN2007800414217A priority patent/CN101535785B/zh
Priority to EP07847523A priority patent/EP2054705A1/de
Priority to JP2009538716A priority patent/JP2010511162A/ja
Priority to US12/516,831 priority patent/US8274657B2/en
Publication of DE102007012115A1 publication Critical patent/DE102007012115A1/de
Ceased legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/42—Photometry, e.g. photographic exposure meter using electric radiation detectors
    • G01J1/4228—Photometry, e.g. photographic exposure meter using electric radiation detectors arrangements with two or more detectors, e.g. for sensitivity compensation
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F99/00—Subject matter not provided for in other groups of this subclass
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/42—Photometry, e.g. photographic exposure meter using electric radiation detectors
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/28—Investigating the spectrum
    • G01J3/30—Measuring the intensity of spectral lines directly on the spectrum itself
    • G01J3/36—Investigating two or more bands of a spectrum by separate detectors
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/46—Measurement of colour; Colour measuring devices, e.g. colorimeters
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/46—Measurement of colour; Colour measuring devices, e.g. colorimeters
    • G01J3/465—Measurement of colour; Colour measuring devices, e.g. colorimeters taking into account the colour perception of the eye; using tristimulus detection
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/46—Measurement of colour; Colour measuring devices, e.g. colorimeters
    • G01J3/50—Measurement of colour; Colour measuring devices, e.g. colorimeters using electric radiation detectors
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/46—Measurement of colour; Colour measuring devices, e.g. colorimeters
    • G01J3/50—Measurement of colour; Colour measuring devices, e.g. colorimeters using electric radiation detectors
    • G01J3/51—Measurement of colour; Colour measuring devices, e.g. colorimeters using electric radiation detectors using colour filters
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/46—Measurement of colour; Colour measuring devices, e.g. colorimeters
    • G01J3/50—Measurement of colour; Colour measuring devices, e.g. colorimeters using electric radiation detectors
    • G01J3/51—Measurement of colour; Colour measuring devices, e.g. colorimeters using electric radiation detectors using colour filters
    • G01J3/513—Measurement of colour; Colour measuring devices, e.g. colorimeters using electric radiation detectors using colour filters having fixed filter-detector pairs
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F30/00—Individual radiation-sensitive semiconductor devices in which radiation controls the flow of current through the devices, e.g. photodetectors
    • H10F30/20—Individual radiation-sensitive semiconductor devices in which radiation controls the flow of current through the devices, e.g. photodetectors the devices having potential barriers, e.g. phototransistors
    • H10F30/21—Individual radiation-sensitive semiconductor devices in which radiation controls the flow of current through the devices, e.g. photodetectors the devices having potential barriers, e.g. phototransistors the devices being sensitive to infrared, visible or ultraviolet radiation
    • H10F30/22—Individual radiation-sensitive semiconductor devices in which radiation controls the flow of current through the devices, e.g. photodetectors the devices having potential barriers, e.g. phototransistors the devices being sensitive to infrared, visible or ultraviolet radiation the devices having only one potential barrier, e.g. photodiodes
    • H10F30/223—Individual radiation-sensitive semiconductor devices in which radiation controls the flow of current through the devices, e.g. photodetectors the devices having potential barriers, e.g. phototransistors the devices being sensitive to infrared, visible or ultraviolet radiation the devices having only one potential barrier, e.g. photodiodes the potential barrier being a PIN barrier
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/02—Details
    • G01J1/04—Optical or mechanical part supplementary adjustable parts
    • G01J1/0488—Optical or mechanical part supplementary adjustable parts with spectral filtering
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/46—Measurement of colour; Colour measuring devices, e.g. colorimeters
    • G01J3/50—Measurement of colour; Colour measuring devices, e.g. colorimeters using electric radiation detectors
    • G01J2003/507—Measurement of colour; Colour measuring devices, e.g. colorimeters using electric radiation detectors the detectors being physically selective

Landscapes

  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • General Physics & Mathematics (AREA)
  • Light Receiving Elements (AREA)
  • Spectrometry And Color Measurement (AREA)
  • Photometry And Measurement Of Optical Pulse Characteristics (AREA)
DE102007012115A 2006-11-30 2007-03-13 Strahlungsdetektor Ceased DE102007012115A1 (de)

Priority Applications (8)

Application Number Priority Date Filing Date Title
DE102007012115A DE102007012115A1 (de) 2006-11-30 2007-03-13 Strahlungsdetektor
TW096144735A TWI365976B (en) 2006-11-30 2007-11-26 Radiation detector
PCT/EP2007/063007 WO2008065170A1 (de) 2006-11-30 2007-11-29 Strahlungsdetektor mit einstellbarer spektraler empfindlichkeit
KR1020097013679A KR101430030B1 (ko) 2006-11-30 2007-11-29 조절 가능한 스펙트럼 감도를 갖는 방사선 검출기
CN2007800414217A CN101535785B (zh) 2006-11-30 2007-11-29 具有可调节的光谱灵敏度的辐射检测器
EP07847523A EP2054705A1 (de) 2006-11-30 2007-11-29 Strahlungsdetektor mit einstellbarer spektraler empfindlichkeit
JP2009538716A JP2010511162A (ja) 2006-11-30 2007-11-29 調整可能なスペクトル感度を備えたビーム検出器
US12/516,831 US8274657B2 (en) 2006-11-30 2007-11-29 Radiation detector

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
DE102006056579 2006-11-30
DE102006056579.7 2006-11-30
DE102007012115A DE102007012115A1 (de) 2006-11-30 2007-03-13 Strahlungsdetektor

Publications (1)

Publication Number Publication Date
DE102007012115A1 true DE102007012115A1 (de) 2008-06-05

Family

ID=39110400

Family Applications (1)

Application Number Title Priority Date Filing Date
DE102007012115A Ceased DE102007012115A1 (de) 2006-11-30 2007-03-13 Strahlungsdetektor

Country Status (8)

Country Link
US (1) US8274657B2 (enExample)
EP (1) EP2054705A1 (enExample)
JP (1) JP2010511162A (enExample)
KR (1) KR101430030B1 (enExample)
CN (1) CN101535785B (enExample)
DE (1) DE102007012115A1 (enExample)
TW (1) TWI365976B (enExample)
WO (1) WO2008065170A1 (enExample)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102010064519B3 (de) 2009-05-05 2024-03-21 Apple Inc. Verfahren und vorrichtung zum detektieren eines masses von sichtbarem umgebungslicht ausserhalb einer vorrichtung

Families Citing this family (26)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7442629B2 (en) 2004-09-24 2008-10-28 President & Fellows Of Harvard College Femtosecond laser-induced formation of submicrometer spikes on a semiconductor substrate
US7057256B2 (en) 2001-05-25 2006-06-06 President & Fellows Of Harvard College Silicon-based visible and near-infrared optoelectric devices
US7890055B1 (en) * 2007-07-09 2011-02-15 Everlokt Corporation Touch field compound field detector personal ID
JP2010112807A (ja) * 2008-11-05 2010-05-20 Hioki Ee Corp 光パワーメータ
JP2010112808A (ja) * 2008-11-05 2010-05-20 Hioki Ee Corp 光パワーメータ
DE102009024069A1 (de) * 2009-06-05 2010-12-09 Osram Opto Semiconductors Gmbh Optisches Beleuchtungsgerät und optisches Aufzeichnungsgerät
US9673243B2 (en) 2009-09-17 2017-06-06 Sionyx, Llc Photosensitive imaging devices and associated methods
KR102234065B1 (ko) * 2009-09-17 2021-03-31 사이오닉스, 엘엘씨 감광성 이미징 장치 및 이와 관련된 방법
US9911781B2 (en) 2009-09-17 2018-03-06 Sionyx, Llc Photosensitive imaging devices and associated methods
CN102549454A (zh) * 2009-10-05 2012-07-04 株式会社岛津制作所 放射线检测器
US8692198B2 (en) 2010-04-21 2014-04-08 Sionyx, Inc. Photosensitive imaging devices and associated methods
CN103081128B (zh) 2010-06-18 2016-11-02 西奥尼克斯公司 高速光敏设备及相关方法
KR102394088B1 (ko) 2011-03-10 2022-05-03 사이오닉스, 엘엘씨 3차원 센서, 시스템, 및 관련 방법
JP2014509746A (ja) 2011-03-29 2014-04-21 オスラム オプト セミコンダクターズ ゲゼルシャフト ミット ベシュレンクテル ハフツング ２つのフォトダイオードを用いて優位を占める光源のタイプを求めるためのユニット
US9496308B2 (en) 2011-06-09 2016-11-15 Sionyx, Llc Process module for increasing the response of backside illuminated photosensitive imagers and associated methods
CN103946867A (zh) 2011-07-13 2014-07-23 西奥尼克斯公司 生物计量成像装置和相关方法
US8865507B2 (en) 2011-09-16 2014-10-21 Sionyx, Inc. Integrated visible and infrared imager devices and associated methods
US9064764B2 (en) 2012-03-22 2015-06-23 Sionyx, Inc. Pixel isolation elements, devices, and associated methods
KR20150130303A (ko) 2013-02-15 2015-11-23 사이오닉스, 아이엔씨. 안티 블루밍 특성 및 관련 방법을 가지는 높은 동적 범위의 cmos 이미지 센서
WO2014151093A1 (en) 2013-03-15 2014-09-25 Sionyx, Inc. Three dimensional imaging utilizing stacked imager devices and associated methods
WO2014209421A1 (en) 2013-06-29 2014-12-31 Sionyx, Inc. Shallow trench textured regions and associated methods
US10281329B2 (en) * 2017-06-14 2019-05-07 Simmonds Precision Products, Inc. Method and system for fast determination of the wavelength of a light beam
CN109556710B (zh) * 2018-12-28 2024-04-16 浙江智慧照明技术有限公司 照明环境光传感器
DE102019114537A1 (de) * 2019-05-29 2020-12-03 OSRAM Opto Semiconductors Gesellschaft mit beschränkter Haftung Optoelektronisches sensorbauelement zur lichtmessung mit eingebauter redundanz
KR102774244B1 (ko) * 2019-11-19 2025-03-05 삼성전자주식회사 스펙트럼을 분할하는 발광 소자 측정 장치, 및 이의 동작 방법
US20230243703A1 (en) * 2020-06-30 2023-08-03 Sharp Kabushiki Kaisha Electromagnetic wave sensor device and display device

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE4024011A1 (de) * 1990-07-28 1992-01-30 Gossen Gmbh Verfahren und vorrichtung zur elektronischen belichtungsmessung
WO1997012212A1 (de) * 1995-09-27 1997-04-03 Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. Multispektralsensorvorrichtung
DE102004037020A1 (de) * 2003-09-30 2005-08-25 Osram Opto Semiconductors Gmbh Strahlungsdetektor
DE102005001280A1 (de) * 2004-09-30 2006-04-13 Osram Opto Semiconductors Gmbh Strahlungsdetektor
US20060146326A1 (en) * 2005-01-05 2006-07-06 Konica Minolta Sensing, Inc. Light measuring apparatus and method for measuring monochromatic light

Family Cites Families (29)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS55104725A (en) 1979-02-05 1980-08-11 Nec Corp Wave-length discrimination type photo-detector
DE2920773A1 (de) 1979-05-22 1980-12-04 Siemens Ag Optoelektronischer sensor
JPS59227171A (ja) 1983-06-08 1984-12-20 Oki Electric Ind Co Ltd カラ−センサ
US4758734A (en) 1984-03-13 1988-07-19 Nec Corporation High resolution image sensor array using amorphous photo-diodes
JPH0612808B2 (ja) 1984-07-13 1994-02-16 日本電気株式会社 固体撮像装置の製造方法
JPS6336121A (ja) * 1986-07-29 1988-02-16 Minolta Camera Co Ltd 測色センサ
JPH01233328A (ja) * 1988-03-14 1989-09-19 Agency Of Ind Science & Technol 測光装置
JPH03202732A (ja) * 1989-06-13 1991-09-04 Sharp Corp カラーセンサ
JPH04280678A (ja) * 1991-03-08 1992-10-06 Nec Corp 固体撮像素子
DE4143284A1 (de) 1991-12-30 1992-10-01 Klaus Eberhard Engel Integrierter halbleitersensor fuer spektrometer
GB2277405A (en) 1993-04-22 1994-10-26 Sharp Kk Semiconductor colour display or detector array
US5362969A (en) 1993-04-23 1994-11-08 Luxtron Corporation Processing endpoint detecting technique and detector structure using multiple radiation sources or discrete detectors
EP0645826A3 (en) 1993-09-23 1995-05-17 Siemens Comp Inc Monolithic multi-channel optocoupler.
CA2171574C (en) * 1996-03-12 2000-10-03 Brian W. Tansley Photometric measurement apparatus
US6307660B1 (en) 1997-01-28 2001-10-23 Tellium, Inc. Optical receiver particularly useful for a multi-wavelength receiver array
JP4030199B2 (ja) * 1998-08-21 2008-01-09 三菱電機株式会社 投写型液晶表示装置
US6359274B1 (en) * 1999-01-25 2002-03-19 Gentex Corporation Photodiode light sensor
US6407439B1 (en) 1999-08-19 2002-06-18 Epitaxial Technologies, Llc Programmable multi-wavelength detector array
US7065035B1 (en) 1999-10-25 2006-06-20 Matsushita Electric Industrial Co., Ltd. Optical multilayer disk, multiwavelength light source, and optical system using them
US6380532B1 (en) 2000-04-19 2002-04-30 Eaton Corporation Optical object detector with multiple photodetectors
DE10101457A1 (de) 2001-01-10 2002-07-18 Infineon Technologies Ag Optoelektronisches System zur Detektion elektromagnetischer Strahlung
GB2381950A (en) 2001-11-06 2003-05-14 Denselight Semiconductors Pte Field effect based photodetector array responsivity control
TW499577B (en) 2001-12-07 2002-08-21 Univ Yuan Ze Coiled optical fiber wavelength - power converter
DE10345410A1 (de) 2003-09-30 2005-05-04 Osram Opto Semiconductors Gmbh Strahlungsdetektor
US7132644B2 (en) 2003-10-02 2006-11-07 Mazet Gmbh Photo sensor for standardized color measurement
KR20130036337A (ko) 2004-03-31 2013-04-11 오스람 옵토 세미컨덕터스 게엠베하 방사선 검출기
EP1643565B1 (de) * 2004-09-30 2020-03-04 OSRAM Opto Semiconductors GmbH Strahlungsdetektor
EP1667246A1 (en) * 2004-12-03 2006-06-07 ETeCH AG A multi-colour sensitive device for colour image sensing
DE102005043918B4 (de) 2005-05-30 2014-12-04 Osram Opto Semiconductors Gmbh Detektoranordnung und Verfahren zur Bestimmung spektraler Anteile in einer auf eine Detektoranordnung einfallenden Strahlung

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE4024011A1 (de) * 1990-07-28 1992-01-30 Gossen Gmbh Verfahren und vorrichtung zur elektronischen belichtungsmessung
WO1997012212A1 (de) * 1995-09-27 1997-04-03 Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. Multispektralsensorvorrichtung
DE102004037020A1 (de) * 2003-09-30 2005-08-25 Osram Opto Semiconductors Gmbh Strahlungsdetektor
DE102005001280A1 (de) * 2004-09-30 2006-04-13 Osram Opto Semiconductors Gmbh Strahlungsdetektor
US20060146326A1 (en) * 2005-01-05 2006-07-06 Konica Minolta Sensing, Inc. Light measuring apparatus and method for measuring monochromatic light

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102010064519B3 (de) 2009-05-05 2024-03-21 Apple Inc. Verfahren und vorrichtung zum detektieren eines masses von sichtbarem umgebungslicht ausserhalb einer vorrichtung

Also Published As

Publication number Publication date
WO2008065170A1 (de) 2008-06-05
TW200844412A (en) 2008-11-16
CN101535785B (zh) 2011-12-28
EP2054705A1 (de) 2009-05-06
TWI365976B (en) 2012-06-11
US20100097609A1 (en) 2010-04-22
US8274657B2 (en) 2012-09-25
JP2010511162A (ja) 2010-04-08
KR20090098850A (ko) 2009-09-17
CN101535785A (zh) 2009-09-16
KR101430030B1 (ko) 2014-08-14

Similar Documents

Publication Publication Date Title
DE102007012115A1 (de) Strahlungsdetektor
EP1643565B1 (de) Strahlungsdetektor
DE69020189T2 (de) Optisches Bauelement.
EP2238624B1 (de) Strahlungsempfänger und verfahren zur herstellung eines strahlungsempfängers
WO2008014983A1 (de) Optischer spektralsensor und ein verfahren zum herstellen eines optischen spektralsensors
EP1465335B1 (de) Rauscharmer Lichtempfänger
EP0986110A1 (de) Lichtempfindliches Halbleiterelement und Verwendung zur Regelung von Flammen
EP1730787B1 (de) Strahlungsdetektor
EP2269221B1 (de) Optoelektronischer strahlungsdetektor und verfahren zur herstellung einer mehrzahl von detektorelementen
DE112014000624T5 (de) Fotodioden-Anordnung mit einer ladungsabsorbierenden dotierten Zone
DE3526337C2 (enExample)
EP1668674A2 (de) Strahlungsdetektor
DE102005043918B4 (de) Detektoranordnung und Verfahren zur Bestimmung spektraler Anteile in einer auf eine Detektoranordnung einfallenden Strahlung
DE102005061206B4 (de) Verwendung einer Detektoranordnung als Umgebungslichtsensor
WO2017207441A1 (de) Bauelement zum detektieren von uv-strahlung und verfahren zur herstellung eines bauelements
DE102005001280A1 (de) Strahlungsdetektor
DE102004037020B4 (de) Strahlungsdetektor zur Detektion von Strahlung gemäß einer vorgegebenen spektralen Empfindlichkeitsverteilung
DE3149257A1 (de) Kondensator mit veraenderbarer kapazitaet
DE102022127888A1 (de) Sensorvorrichtung
DE102004018549B4 (de) Photodetektor mit spannungsabhängiger spektraler Empfindlichkeit
DE102013207801A1 (de) Photozelleneinrichtungen und verfahren für spektrometrische anwendungen

Legal Events

Date Code Title Description
OM8 Search report available as to paragraph 43 lit. 1 sentence 1 patent law
R012 Request for examination validly filed

Effective date: 20121206

R082 Change of representative

Representative=s name: SCHEELE JAEGER WETZEL PATENTANWAELTE PARTNERSC, DE

Representative=s name: ZACCO PATENTANWALTS- UND RECHTSANWALTSGESELLSC, DE

R016 Response to examination communication
R082 Change of representative

Representative=s name: SCHEELE JAEGER WETZEL PATENTANWAELTE PARTNERSC, DE

R002 Refusal decision in examination/registration proceedings
R003 Refusal decision now final