JP2009543034A5 - - Google Patents

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Publication number
JP2009543034A5
JP2009543034A5 JP2009517418A JP2009517418A JP2009543034A5 JP 2009543034 A5 JP2009543034 A5 JP 2009543034A5 JP 2009517418 A JP2009517418 A JP 2009517418A JP 2009517418 A JP2009517418 A JP 2009517418A JP 2009543034 A5 JP2009543034 A5 JP 2009543034A5
Authority
JP
Japan
Prior art keywords
tensile
platen
deposit
tensile tester
jaw
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2009517418A
Other languages
English (en)
Japanese (ja)
Other versions
JP2009543034A (ja
JP5158887B2 (ja
Filing date
Publication date
Priority claimed from GBGB0613205.4A external-priority patent/GB0613205D0/en
Application filed filed Critical
Publication of JP2009543034A publication Critical patent/JP2009543034A/ja
Publication of JP2009543034A5 publication Critical patent/JP2009543034A5/ja
Application granted granted Critical
Publication of JP5158887B2 publication Critical patent/JP5158887B2/ja
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

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JP2009517418A 2006-07-03 2007-07-03 引張り試験機 Expired - Fee Related JP5158887B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
GBGB0613205.4A GB0613205D0 (en) 2006-07-03 2006-07-03 High speed test cartridge
GB0613205.4 2006-07-03
PCT/GB2007/002474 WO2008003948A1 (en) 2006-07-03 2007-07-03 Tensile test device and method for testing deposits on electronic substrates

Related Child Applications (1)

Application Number Title Priority Date Filing Date
JP2012133538A Division JP5563019B2 (ja) 2006-07-03 2012-06-13 引張り応力の測定方法

Publications (3)

Publication Number Publication Date
JP2009543034A JP2009543034A (ja) 2009-12-03
JP2009543034A5 true JP2009543034A5 (enExample) 2010-08-05
JP5158887B2 JP5158887B2 (ja) 2013-03-06

Family

ID=36888555

Family Applications (2)

Application Number Title Priority Date Filing Date
JP2009517418A Expired - Fee Related JP5158887B2 (ja) 2006-07-03 2007-07-03 引張り試験機
JP2012133538A Expired - Fee Related JP5563019B2 (ja) 2006-07-03 2012-06-13 引張り応力の測定方法

Family Applications After (1)

Application Number Title Priority Date Filing Date
JP2012133538A Expired - Fee Related JP5563019B2 (ja) 2006-07-03 2012-06-13 引張り応力の測定方法

Country Status (7)

Country Link
US (2) US8100021B2 (enExample)
EP (2) EP2728335B1 (enExample)
JP (2) JP5158887B2 (enExample)
KR (1) KR101370297B1 (enExample)
CN (2) CN101484788B (enExample)
GB (1) GB0613205D0 (enExample)
WO (1) WO2008003948A1 (enExample)

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GB0604700D0 (en) * 2006-03-08 2006-04-19 Dage Prec Ind Ltd Shear testing of metallic balls of electrical components
GB0613205D0 (en) * 2006-07-03 2006-08-09 Dage Prec Ind Ltd High speed test cartridge
US7810374B2 (en) 2007-12-03 2010-10-12 The Hong Kong University Of Science And Technology Single solder ball impact tester
EP2363702B1 (en) * 2010-03-05 2016-09-28 Nordson Corporation Bond strength tester with switchable backlash control
US8534136B2 (en) * 2010-03-31 2013-09-17 Flextronics Ap, Llc. Pin soldering for printed circuit board failure testing
CN102735540A (zh) * 2011-04-01 2012-10-17 亚旭电子科技(江苏)有限公司 拉力试验装置
CN102494949A (zh) * 2011-10-20 2012-06-13 华中科技大学 一种焊球强度测试装置
WO2014089545A1 (en) * 2012-12-07 2014-06-12 Purdue Research Foundation Feedback system and method for assessing fixation and stability of implantable leads
EP3165895B1 (en) 2013-07-03 2019-05-08 Nordson Corp CARTRIDGE FOR SUCH A MACHINE COMPRISING A PLURALITY OF TEST TOOLS
WO2015148208A1 (en) * 2014-03-28 2015-10-01 United Technologies Corporation Material testing apparatus and method
CN103900807B (zh) * 2014-04-01 2016-04-06 苏州博众精工科技有限公司 一种拉拔测试机构
US9964563B1 (en) 2014-07-18 2018-05-08 Flextronics Ap, Llc Method and apparatus for ICT fixture probe cleaning
GB201413225D0 (en) * 2014-07-25 2014-09-10 Sykes Robert J And Xyztec Bv Solder cleaning system
CN105067518B (zh) * 2015-09-18 2017-11-03 吉林大学 一种用于片状基材的粘接剂粘接性能测试的方法
NL2015919B1 (en) 2015-12-07 2017-06-28 Xyztec B V A method for determining a strength of a bond and/or a material as well as a bond tester apparatus.
CN105738279A (zh) * 2016-03-01 2016-07-06 银邦金属复合材料股份有限公司 试样拉伸模具及使用该模具的试样拉伸方法
CN106442313B (zh) * 2016-08-23 2019-04-02 北京时代民芯科技有限公司 一种引线牢固性试验仪
US10416053B2 (en) * 2017-01-23 2019-09-17 Northwestern University Grips for a linear fracture testing machine and method of designing same
GB201713169D0 (en) * 2017-08-16 2017-09-27 Nordson Corp Bond test apparatus and method
EP3885844A1 (fr) * 2020-03-27 2021-09-29 Nivarox-FAR S.A. Pince pour machine reglante d'horlogerie
KR20230064155A (ko) 2021-11-03 2023-05-10 삼성전자주식회사 반도체 장치의 테스트 장비 및 방법
CN114858884A (zh) * 2022-05-07 2022-08-05 天津北洋精工技术有限公司 一种通用型酸度计的夹头结构
WO2024044103A1 (en) * 2022-08-24 2024-02-29 Acoustic Wells, Inc. Systems and methods for measuring wire rope tension
CN117907080A (zh) * 2023-12-12 2024-04-19 广东省科学院佛山产业技术研究院有限公司 一种铝合金抗拉强度的检测装置及其使用方法
CN118392782B (zh) * 2024-06-28 2024-09-13 江苏铭丰电子材料科技有限公司 一种铜箔生产用抗剥离检测装置

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JP3328473B2 (ja) * 1995-08-03 2002-09-24 ワイケイケイニューマックス株式会社 スナップ部材の外し力測定装置
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US6237422B1 (en) 1997-12-13 2001-05-29 Dage Precision Industries Ltd. Apparatus and method for testing strength of electrical bond sites on semiconductor devices
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GB0406434D0 (en) * 2004-03-22 2004-04-28 Dage Prec Ind Ltd High speed pull test device
JP4337595B2 (ja) * 2004-03-25 2009-09-30 株式会社島津製作所 ロードセル
GB0411057D0 (en) 2004-05-18 2004-06-23 Dage Prec Ind Ltd Test apparatus
WO2007093799A1 (en) * 2006-02-17 2007-08-23 Dage Precision Industries Ltd. Shear test apparatus and method
GB0604700D0 (en) 2006-03-08 2006-04-19 Dage Prec Ind Ltd Shear testing of metallic balls of electrical components
GB0613205D0 (en) * 2006-07-03 2006-08-09 Dage Prec Ind Ltd High speed test cartridge

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