JP2009540346A5 - - Google Patents

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Publication number
JP2009540346A5
JP2009540346A5 JP2009513725A JP2009513725A JP2009540346A5 JP 2009540346 A5 JP2009540346 A5 JP 2009540346A5 JP 2009513725 A JP2009513725 A JP 2009513725A JP 2009513725 A JP2009513725 A JP 2009513725A JP 2009540346 A5 JP2009540346 A5 JP 2009540346A5
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JP
Japan
Prior art keywords
image
interference
light source
confocal microscope
generating
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Application number
JP2009513725A
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English (en)
Japanese (ja)
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JP5592108B2 (ja
JP2009540346A (ja
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Publication date
Priority claimed from FR0605087A external-priority patent/FR2902202B1/fr
Application filed filed Critical
Publication of JP2009540346A publication Critical patent/JP2009540346A/ja
Publication of JP2009540346A5 publication Critical patent/JP2009540346A5/ja
Application granted granted Critical
Publication of JP5592108B2 publication Critical patent/JP5592108B2/ja
Expired - Fee Related legal-status Critical Current
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JP2009513725A 2006-06-08 2007-05-30 干渉共焦点顕微鏡および光源撮像方法 Expired - Fee Related JP5592108B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
FR06/05087 2006-06-08
FR0605087A FR2902202B1 (fr) 2006-06-08 2006-06-08 Microscope confocal interferometrique
PCT/FR2007/000898 WO2007141409A1 (fr) 2006-06-08 2007-05-30 Microscope confocal interférométrique

Publications (3)

Publication Number Publication Date
JP2009540346A JP2009540346A (ja) 2009-11-19
JP2009540346A5 true JP2009540346A5 (https=) 2012-12-20
JP5592108B2 JP5592108B2 (ja) 2014-09-17

Family

ID=37671973

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2009513725A Expired - Fee Related JP5592108B2 (ja) 2006-06-08 2007-05-30 干渉共焦点顕微鏡および光源撮像方法

Country Status (7)

Country Link
US (1) US8223343B2 (https=)
EP (1) EP2024771B1 (https=)
JP (1) JP5592108B2 (https=)
AT (1) ATE463756T1 (https=)
DE (1) DE602007005795D1 (https=)
FR (1) FR2902202B1 (https=)
WO (1) WO2007141409A1 (https=)

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2008093099A2 (en) * 2007-02-02 2008-08-07 King's College London Method and apparatus for improving image resolution
FR2930031A1 (fr) * 2008-04-14 2009-10-16 Centre Nat Rech Scient Dispositif et procede d'analyse exaltee d'un echantillon de particules.
US8319971B2 (en) * 2008-05-06 2012-11-27 Industrial Technology Research Institute Scatterfield microscopical measuring method and apparatus
JP5686684B2 (ja) * 2011-07-19 2015-03-18 株式会社日立製作所 光学装置
CN104568884B (zh) * 2014-12-31 2017-03-29 深圳先进技术研究院 基于焦点调制的荧光显微系统及方法
CN113137926B (zh) * 2021-05-06 2023-04-07 王勇 一种可用于特种工况下的平面测量系统
CN116430565A (zh) * 2023-04-25 2023-07-14 西安工业大学 一种显微成像装置及成像方法
CN117491285B (zh) * 2023-11-03 2024-08-27 魅杰光电科技(上海)有限公司 基于图像清晰度聚焦的方法及装置

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2734786B2 (ja) * 1991-02-25 1998-04-02 株式会社ニコン 光エコー顕微鏡
US5257089A (en) * 1992-06-15 1993-10-26 United Technologies Corporation Optical head for shearography
DE19733193B4 (de) * 1997-08-01 2005-09-08 Carl Zeiss Jena Gmbh Mikroskop mit adaptiver Optik
JP3350442B2 (ja) * 1998-04-09 2002-11-25 科学技術振興事業団 顕微鏡システム
JPH11305133A (ja) * 1998-04-23 1999-11-05 Olympus Optical Co Ltd 高解像顕微鏡
US6721094B1 (en) * 2001-03-05 2004-04-13 Sandia Corporation Long working distance interference microscope
DE10227120A1 (de) * 2002-06-15 2004-03-04 Carl Zeiss Jena Gmbh Mikroskop, insbesondere Laserscanningmikroskop mit adaptiver optischer Einrichtung
EP1524491A1 (en) * 2003-10-16 2005-04-20 Universite Libre De Bruxelles Apparatus coupling an interferometer and a microscope

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