JP2009537836A5 - - Google Patents

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Publication number
JP2009537836A5
JP2009537836A5 JP2009511474A JP2009511474A JP2009537836A5 JP 2009537836 A5 JP2009537836 A5 JP 2009537836A5 JP 2009511474 A JP2009511474 A JP 2009511474A JP 2009511474 A JP2009511474 A JP 2009511474A JP 2009537836 A5 JP2009537836 A5 JP 2009537836A5
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JP
Japan
Prior art keywords
inspection apparatus
inspection
computing system
radiation
inspection device
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2009511474A
Other languages
English (en)
Japanese (ja)
Other versions
JP2009537836A (ja
JP5187695B2 (ja
Filing date
Publication date
Priority claimed from FR0651902A external-priority patent/FR2901609B1/fr
Application filed filed Critical
Publication of JP2009537836A publication Critical patent/JP2009537836A/ja
Publication of JP2009537836A5 publication Critical patent/JP2009537836A5/ja
Application granted granted Critical
Publication of JP5187695B2 publication Critical patent/JP5187695B2/ja
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

Links

JP2009511474A 2006-05-24 2007-05-16 放射散逸の解析による部品の非破壊検査装置 Expired - Fee Related JP5187695B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
FR0651902 2006-05-24
FR0651902A FR2901609B1 (fr) 2006-05-24 2006-05-24 Dispositif de controle non destructif d'une piece par analyse de dissipation de rayonnement
PCT/EP2007/054762 WO2007135059A1 (fr) 2006-05-24 2007-05-16 Dispositif de contrôle non destructif d'une pièce par analyse de dissipation de rayonnement

Publications (3)

Publication Number Publication Date
JP2009537836A JP2009537836A (ja) 2009-10-29
JP2009537836A5 true JP2009537836A5 (enExample) 2010-07-01
JP5187695B2 JP5187695B2 (ja) 2013-04-24

Family

ID=37607011

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2009511474A Expired - Fee Related JP5187695B2 (ja) 2006-05-24 2007-05-16 放射散逸の解析による部品の非破壊検査装置

Country Status (9)

Country Link
US (1) US8173964B2 (enExample)
EP (1) EP2027457A1 (enExample)
JP (1) JP5187695B2 (enExample)
CN (1) CN101449153B (enExample)
BR (1) BRPI0712211A2 (enExample)
CA (1) CA2651392A1 (enExample)
FR (1) FR2901609B1 (enExample)
RU (1) RU2439545C2 (enExample)
WO (1) WO2007135059A1 (enExample)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8986778B2 (en) * 2006-07-06 2015-03-24 Siemens Energy, Inc. Coating method for non-destructive examination of articles of manufacture
RU2494434C1 (ru) * 2012-06-07 2013-09-27 Закрытое акционерное общество "ГИАП-ДИСТцентр" Способ управления промышленной безопасностью и диагностики эксплуатационного состояния промышленного объекта
RU2502058C1 (ru) * 2012-08-23 2013-12-20 Сергей Михайлович Мужичек Способ контроля состояния конструкции летательного аппарата и устройство для его осуществления
CN110304195A (zh) * 2019-07-01 2019-10-08 上海外高桥造船有限公司 船体应力的检测方法及系统
CN113702441A (zh) * 2021-09-23 2021-11-26 合肥维信诺科技有限公司 断裂检测装置及断裂检测方法
CN120276013B (zh) * 2025-06-12 2025-09-09 聚变新能(安徽)有限公司 测试装置

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FR2598250B1 (fr) * 1986-04-30 1988-07-08 Thomson Csf Panneau de prise de vue radiologique, et procede de fabrication
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US5047719A (en) 1990-05-25 1991-09-10 The Failure Group, Inc. Flexible coil assembly for reflectance-mode nondestructive eddy-current examination
JPH05107212A (ja) * 1991-10-18 1993-04-27 Fujitsu Ltd 部品類が実装されたプリント板の外観検査法
US5315234A (en) 1992-04-03 1994-05-24 General Electric Company Eddy current device for inspecting a component having a flexible support with a plural sensor array
WO1993025877A1 (en) * 1992-06-11 1993-12-23 Honeywell, Inc. Use of vanadium oxide in microbolometer sensors
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JP2002232640A (ja) * 2001-02-01 2002-08-16 Fuji Photo Film Co Ltd ラインセンサおよびそれを用いた放射線画像情報読取装置
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FR2836994B1 (fr) * 2002-03-05 2004-12-17 Airbus France Procede et dispositif de controle de pieces par rayons x
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