CN101449153B - 通过分析辐射耗散来非破坏性地监控部件的设备 - Google Patents

通过分析辐射耗散来非破坏性地监控部件的设备 Download PDF

Info

Publication number
CN101449153B
CN101449153B CN2007800185580A CN200780018558A CN101449153B CN 101449153 B CN101449153 B CN 101449153B CN 2007800185580 A CN2007800185580 A CN 2007800185580A CN 200780018558 A CN200780018558 A CN 200780018558A CN 101449153 B CN101449153 B CN 101449153B
Authority
CN
China
Prior art keywords
watch
dog
microsensor
parts
radiation
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
CN2007800185580A
Other languages
English (en)
Chinese (zh)
Other versions
CN101449153A (zh
Inventor
M-A·德斯迈特
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Airbus Operations SAS
Original Assignee
Airbus Operations SAS
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Airbus Operations SAS filed Critical Airbus Operations SAS
Publication of CN101449153A publication Critical patent/CN101449153A/zh
Application granted granted Critical
Publication of CN101449153B publication Critical patent/CN101449153B/zh
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Images

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N25/00—Investigating or analyzing materials by the use of thermal means
    • G01N25/72—Investigating presence of flaws
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F39/00—Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
    • H10F39/10—Integrated devices
    • H10F39/12—Image sensors
    • H10F39/15—Charge-coupled device [CCD] image sensors
    • H10F39/159—Charge-coupled device [CCD] image sensors comprising a photoconductive layer deposited on the CCD structure

Landscapes

  • General Health & Medical Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analyzing Materials Using Thermal Means (AREA)
  • Radiation Pyrometers (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
CN2007800185580A 2006-05-24 2007-05-16 通过分析辐射耗散来非破坏性地监控部件的设备 Expired - Fee Related CN101449153B (zh)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
FR0651902 2006-05-24
FR0651902A FR2901609B1 (fr) 2006-05-24 2006-05-24 Dispositif de controle non destructif d'une piece par analyse de dissipation de rayonnement
PCT/EP2007/054762 WO2007135059A1 (fr) 2006-05-24 2007-05-16 Dispositif de contrôle non destructif d'une pièce par analyse de dissipation de rayonnement

Publications (2)

Publication Number Publication Date
CN101449153A CN101449153A (zh) 2009-06-03
CN101449153B true CN101449153B (zh) 2012-07-11

Family

ID=37607011

Family Applications (1)

Application Number Title Priority Date Filing Date
CN2007800185580A Expired - Fee Related CN101449153B (zh) 2006-05-24 2007-05-16 通过分析辐射耗散来非破坏性地监控部件的设备

Country Status (9)

Country Link
US (1) US8173964B2 (enExample)
EP (1) EP2027457A1 (enExample)
JP (1) JP5187695B2 (enExample)
CN (1) CN101449153B (enExample)
BR (1) BRPI0712211A2 (enExample)
CA (1) CA2651392A1 (enExample)
FR (1) FR2901609B1 (enExample)
RU (1) RU2439545C2 (enExample)
WO (1) WO2007135059A1 (enExample)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8986778B2 (en) * 2006-07-06 2015-03-24 Siemens Energy, Inc. Coating method for non-destructive examination of articles of manufacture
RU2494434C1 (ru) * 2012-06-07 2013-09-27 Закрытое акционерное общество "ГИАП-ДИСТцентр" Способ управления промышленной безопасностью и диагностики эксплуатационного состояния промышленного объекта
RU2502058C1 (ru) * 2012-08-23 2013-12-20 Сергей Михайлович Мужичек Способ контроля состояния конструкции летательного аппарата и устройство для его осуществления
CN110304195A (zh) * 2019-07-01 2019-10-08 上海外高桥造船有限公司 船体应力的检测方法及系统
CN113702441A (zh) * 2021-09-23 2021-11-26 合肥维信诺科技有限公司 断裂检测装置及断裂检测方法
CN120276013B (zh) * 2025-06-12 2025-09-09 聚变新能(安徽)有限公司 测试装置

Citations (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3511086A (en) * 1966-11-23 1970-05-12 Boeing Co Nondestructive testing with liquid crystals
US3970074A (en) * 1974-08-22 1976-07-20 Spitalul Clinic Filantropia Bucuresti Method of and apparatus for making medical thermographs
US4232554A (en) * 1978-11-30 1980-11-11 Grumman Aerospace Corporation Thermal emission flaw detection method
US4433637A (en) * 1979-06-04 1984-02-28 Vectra International Corporation Microencapsulated cholesteric liquid crystal temperature measuring device for determining the temperature of non-planar or planar surfaces
EP0672380A1 (en) * 1994-03-15 1995-09-20 EUROPIANA S.r.l. Apparatus for measuring the temperature of the epidermis
CN1163396A (zh) * 1996-04-15 1997-10-29 松下电工株式会社 热电型红外接收元件及使用该元件的红外传感器
US6077228A (en) * 1998-11-04 2000-06-20 Schonberger; Milton Breast temperature scanner
JP2000171418A (ja) * 1998-12-02 2000-06-23 Ishikawajima Harima Heavy Ind Co Ltd 耐熱鋼のクリープひずみ量の非破壊的推定法
CN1258000A (zh) * 1998-12-18 2000-06-28 中国科学院金属研究所 X射线应力智能分析仪
US20030031296A1 (en) * 2001-07-27 2003-02-13 Martin Hoheisel X-ray diagnostics installation with a flexible solid state X-ray detector

Family Cites Families (21)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2598250B1 (fr) * 1986-04-30 1988-07-08 Thomson Csf Panneau de prise de vue radiologique, et procede de fabrication
JPS63157024A (ja) * 1986-12-22 1988-06-30 Hiroshi Ogawa 検出素子
JPS63250554A (ja) * 1987-04-08 1988-10-18 Fujita Corp 腐食診断法及び診断装置
US5166573A (en) * 1989-09-26 1992-11-24 Atochem North America, Inc. Ultrasonic contact transducer and array
US5047719A (en) 1990-05-25 1991-09-10 The Failure Group, Inc. Flexible coil assembly for reflectance-mode nondestructive eddy-current examination
JPH05107212A (ja) * 1991-10-18 1993-04-27 Fujitsu Ltd 部品類が実装されたプリント板の外観検査法
US5315234A (en) 1992-04-03 1994-05-24 General Electric Company Eddy current device for inspecting a component having a flexible support with a plural sensor array
WO1993025877A1 (en) * 1992-06-11 1993-12-23 Honeywell, Inc. Use of vanadium oxide in microbolometer sensors
DE4220544B4 (de) * 1992-06-24 2005-10-20 Woelfel Horst Verfahren zum Messen mechanischer Spannungskomponenten an der Oberfläche von dynamisch belasteten Meßobjekten
US5659248A (en) 1994-10-17 1997-08-19 General Electric Company Multilayer eddy current probe array for complete coverage of an inspection surface without mechanical scanning
US5793206A (en) 1995-08-25 1998-08-11 Jentek Sensors, Inc. Meandering winding test circuit
US5911158A (en) * 1996-02-29 1999-06-08 The United States Of America As Represented By The Secretary Of The Air Force Piezoelectric strain sensor array
US5915277A (en) 1997-06-23 1999-06-22 General Electric Co. Probe and method for inspecting an object
JP3778659B2 (ja) * 1997-07-07 2006-05-24 浜松ホトニクス株式会社 放射線位置検出装置
US7039326B1 (en) * 1999-09-29 2006-05-02 Ess Technology, Inc. Infrared communication system utilizing receiver with multiple photo-sensors
JP2001337059A (ja) * 2000-05-26 2001-12-07 Toshiba Corp プリント配線板の劣化検出方法および装置
JP2002232640A (ja) * 2001-02-01 2002-08-16 Fuji Photo Film Co Ltd ラインセンサおよびそれを用いた放射線画像情報読取装置
FR2836994B1 (fr) * 2002-03-05 2004-12-17 Airbus France Procede et dispositif de controle de pieces par rayons x
US7078702B2 (en) * 2002-07-25 2006-07-18 General Electric Company Imager
US6812697B2 (en) 2002-09-24 2004-11-02 General Electric Company Molded eddy current array probe
JP3812559B2 (ja) 2003-09-18 2006-08-23 Ｔｄｋ株式会社 渦電流プローブ

Patent Citations (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3511086A (en) * 1966-11-23 1970-05-12 Boeing Co Nondestructive testing with liquid crystals
US3970074A (en) * 1974-08-22 1976-07-20 Spitalul Clinic Filantropia Bucuresti Method of and apparatus for making medical thermographs
US4232554A (en) * 1978-11-30 1980-11-11 Grumman Aerospace Corporation Thermal emission flaw detection method
US4433637A (en) * 1979-06-04 1984-02-28 Vectra International Corporation Microencapsulated cholesteric liquid crystal temperature measuring device for determining the temperature of non-planar or planar surfaces
EP0672380A1 (en) * 1994-03-15 1995-09-20 EUROPIANA S.r.l. Apparatus for measuring the temperature of the epidermis
CN1163396A (zh) * 1996-04-15 1997-10-29 松下电工株式会社 热电型红外接收元件及使用该元件的红外传感器
US6077228A (en) * 1998-11-04 2000-06-20 Schonberger; Milton Breast temperature scanner
JP2000171418A (ja) * 1998-12-02 2000-06-23 Ishikawajima Harima Heavy Ind Co Ltd 耐熱鋼のクリープひずみ量の非破壊的推定法
CN1258000A (zh) * 1998-12-18 2000-06-28 中国科学院金属研究所 X射线应力智能分析仪
US20030031296A1 (en) * 2001-07-27 2003-02-13 Martin Hoheisel X-ray diagnostics installation with a flexible solid state X-ray detector

Also Published As

Publication number Publication date
FR2901609A1 (fr) 2007-11-30
RU2439545C2 (ru) 2012-01-10
US20100011861A1 (en) 2010-01-21
EP2027457A1 (fr) 2009-02-25
BRPI0712211A2 (pt) 2012-03-13
RU2008151170A (ru) 2010-06-27
US8173964B2 (en) 2012-05-08
CA2651392A1 (fr) 2007-11-29
FR2901609B1 (fr) 2009-01-16
WO2007135059A1 (fr) 2007-11-29
CN101449153A (zh) 2009-06-03
JP2009537836A (ja) 2009-10-29
JP5187695B2 (ja) 2013-04-24

Similar Documents

Publication Publication Date Title
US8151643B2 (en) Device for non-destructive testing of a structure by vibratory analysis
US7434480B2 (en) Methods and systems for using active surface coverings for structural assessment and monitoring
US10302524B2 (en) Detection and assessment of damage to composite structure
CN101449153B (zh) 通过分析辐射耗散来非破坏性地监控部件的设备
CA2667458C (en) Infrared ndi for detecting shallow irregularities
CN101449158B (zh) 通过分析漏磁场的分布来非破坏性地监控部件的设备
US10126273B2 (en) Inspection of structures
KR20140031163A (ko) 항공기의 비파괴 검사를 위한 신규한 시스템 및 방법
US9194769B1 (en) Systems and methods for environmental testing and evaluation of non-destructive inspection sensors
US8490493B2 (en) Device and method for the detection of composite defects
US20080025664A1 (en) System for measurement and detection of parameters and anomalies
Georgeson Trends in R&D for nondestructive evaluation of in-service aircraft
EP2235682B1 (en) Methods and systems for automatically assessing and reporting structural health
Roach et al. Application and Certification of Comparative Vacuum Monitoring Sensors for In-Situ Crack Detection.
Roach et al. Development and validation of nondestructive inspection techniques for composite doubler repairs on commercial aircraft
Pitropakis Dedicated solutions for structural health monitoring of aircraft components
Dong et al. Reviews of Structural Health Monitoring Technologies in Airplane Fuselage Maintenance Perspective
Moore et al. Crack detection on HC-130H aircraft using low frequency eddy current

Legal Events

Date Code Title Description
C06 Publication
PB01 Publication
C10 Entry into substantive examination
SE01 Entry into force of request for substantive examination
C53 Correction of patent of invention or patent application
CB02 Change of applicant information

Address after: France Toulouse

Applicant after: Airbus Operations S.A.S.

Address before: France Toulouse

Applicant before: Airbus France

Address after: France Toulouse

Applicant after: AIRBUS FRANCE

Address before: France Toulouse

Applicant before: Airbus France

COR Change of bibliographic data

Free format text: CORRECT: APPLICANT; FROM: AIRBUS FRANCE TO: AIRBUS OPERATIONS GMBH

C14 Grant of patent or utility model
GR01 Patent grant
CF01 Termination of patent right due to non-payment of annual fee
CF01 Termination of patent right due to non-payment of annual fee

Granted publication date: 20120711

Termination date: 20160516