JP2009229345A - 検査治具 - Google Patents
検査治具 Download PDFInfo
- Publication number
- JP2009229345A JP2009229345A JP2008077149A JP2008077149A JP2009229345A JP 2009229345 A JP2009229345 A JP 2009229345A JP 2008077149 A JP2008077149 A JP 2008077149A JP 2008077149 A JP2008077149 A JP 2008077149A JP 2009229345 A JP2009229345 A JP 2009229345A
- Authority
- JP
- Japan
- Prior art keywords
- pair
- levers
- contact
- inspection jig
- lever
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2893—Handling, conveying or loading, e.g. belts, boats, vacuum fingers
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/073—Multiple probes
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
- G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2855—Environmental, reliability or burn-in testing
- G01R31/2872—Environmental, reliability or burn-in testing related to electrical or environmental aspects, e.g. temperature, humidity, vibration, nuclear radiation
- G01R31/2879—Environmental, reliability or burn-in testing related to electrical or environmental aspects, e.g. temperature, humidity, vibration, nuclear radiation related to electrical aspects, e.g. to voltage or current supply or stimuli or to electrical loads
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2884—Testing of integrated circuits [IC] using dedicated test connectors, test elements or test circuits on the IC under test
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2886—Features relating to contacting the IC under test, e.g. probe heads; chucks
Abstract
【解決手段】間隔をおいて互いに対向した接近及び離間が可能な対のレバー1,2を備える。対のレバーの非対向位置にそれぞれ対の接触子13,23を保持させる。バネ4によって対のレバーを互いに接近する向きに付勢し、対の接触子を被測定物8,9に接触させる。
【選択図】図1
Description
3 軸
4 バネ
7 測定器
8,9 被測定物
11,21 内向面
12,22 外向面
13,23 接触子
14,24 作用部
15,25 操作部
31,32 レバー
33 結合部
41 ネジ
71,72 プローブ
81,91 接続部
82,92 配線部
83,93 端子部
Claims (7)
- 被測定物の電気抵抗を測定する際に使用される検査治具であって、間隔をおいて互いに対向した接近及び離間が可能な対のレバーと、前記レバーの非対向位置にそれぞれ保持された対の接触子と、前記対のレバーを互いに接近する向きに付勢し、前記対の接触子を前記被測定物に接触させる付勢手段とを含むことを特徴とする検査治具。
- 前記接触子は前記レバーを貫通し、前記電気抵抗を測定する測定器に接続される、請求項1に記載の検査治具。
- 前記対のレバーを互いに回動可能に繋いだ軸をさらに含み、前記付勢手段は、前記対のレバー間に作用するバネを有する、請求項1又は2に記載の検査治具。
- 前記レバーは、前記軸から見た一側の作用部と、前記軸から見た他側の操作部とを含み、前記接触子は前記作用部に保持されており、前記バネは前記操作部に作用している、請求項3に記載の検査治具。
- 前記対のレバーを互いに接近及び離間可能に結合させた結合部をさらに含み、前記レバー及び前記結合部は弾力性を有する一体部材として形成され、前記付勢手段は、前記一体部材の弾力性を利用している、請求項1又は2に記載の検査治具。
- 前記対の接触部のうち少なくとも一方の接触部は、前記レバーを貫通した棒状のものであり、かつ、前記レバーに対し軸心方向に可動に保持されている、請求項1から5のいずれかに記載の検査治具。
- 前記少なくとも一方の接触部は、前記対のレバーの対応したものに螺合したネジを有する、請求項6に記載の検査治具。
Priority Applications (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2008077149A JP4678034B2 (ja) | 2008-03-25 | 2008-03-25 | 検査治具 |
KR1020090022503A KR101070062B1 (ko) | 2008-03-25 | 2009-03-17 | 검사 지그 |
TW098109343A TWI402512B (zh) | 2008-03-25 | 2009-03-23 | 檢驗夾具 |
CN2009101277608A CN101545928B (zh) | 2008-03-25 | 2009-03-25 | 检验夹具 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2008077149A JP4678034B2 (ja) | 2008-03-25 | 2008-03-25 | 検査治具 |
Publications (2)
Publication Number | Publication Date |
---|---|
JP2009229345A true JP2009229345A (ja) | 2009-10-08 |
JP4678034B2 JP4678034B2 (ja) | 2011-04-27 |
Family
ID=41193175
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2008077149A Active JP4678034B2 (ja) | 2008-03-25 | 2008-03-25 | 検査治具 |
Country Status (4)
Country | Link |
---|---|
JP (1) | JP4678034B2 (ja) |
KR (1) | KR101070062B1 (ja) |
CN (1) | CN101545928B (ja) |
TW (1) | TWI402512B (ja) |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN103091519A (zh) * | 2013-01-29 | 2013-05-08 | 福建省电力有限公司 | 手车开关回路电阻测试铆钉型线夹 |
CN103513110A (zh) * | 2013-10-21 | 2014-01-15 | 国家电网公司 | 一种用于开关设备回路电阻测试的装置 |
WO2016016448A1 (de) * | 2014-07-31 | 2016-02-04 | Thyssenkrupp System Engineering Gmbh | NIEDERHALTER, SCHWEIßVORRICHTUNG UND VERFAHREN ZUM ÜBERPRÜFEN DES VORHANDENSEINS UND/ODER DER QUALITÄT EINER FÜGEVERBINDUNG |
Families Citing this family (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US8531305B2 (en) * | 2011-05-10 | 2013-09-10 | GM Global Technology Operations LLC | Method of measuring electrical resistance of joints |
CN105137191B (zh) * | 2015-09-08 | 2018-04-17 | 哈尔滨工业大学 | 防止永磁材料电阻率测量区域氧化的测量装置与测量方法 |
Citations (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS59117972U (ja) * | 1983-01-29 | 1984-08-09 | 日置電機株式会社 | クリツプ |
JPS60259971A (ja) * | 1984-06-06 | 1985-12-23 | Yaskawa Electric Mfg Co Ltd | 印刷回路基板の検査方法 |
JPS62162969A (ja) * | 1986-01-13 | 1987-07-18 | Oki Electric Ind Co Ltd | 電気測定具 |
JPS62170567U (ja) * | 1986-04-18 | 1987-10-29 | ||
JPH08304485A (ja) * | 1995-05-11 | 1996-11-22 | Toshiba Corp | 絶縁診断機能付き電気機器、絶縁診断用センサ、絶縁診断機能付きモールド変圧器、及び絶縁診断機能付き回転電機 |
JPH11183521A (ja) * | 1997-12-22 | 1999-07-09 | Yokowo Co Ltd | クリップ式中継コネクタ |
JP2001311742A (ja) * | 2000-04-28 | 2001-11-09 | Hioki Ee Corp | 電気計測用の測定プローブユニット |
JP2002096731A (ja) * | 2000-09-26 | 2002-04-02 | Hioki Ee Corp | 鉄道レールの電気計測用の測定プローブ |
Family Cites Families (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
GB384565A (en) * | 1931-05-30 | 1932-12-08 | Reiniger Gebbert & Schall A G | Appliance for electrically stunning animals for slaughter |
GB443437A (en) * | 1934-08-29 | 1936-02-28 | New Process Welders Ltd | Improvements in or relating to an electric portable welding appliance |
CN2155571Y (zh) * | 1992-07-13 | 1994-02-09 | 张力 | 低电阻测试仪通用测试卡具 |
CN1253126C (zh) * | 2004-01-01 | 2006-04-26 | 浙江大学 | 一种用于生物电阻、阻抗、电位测量的参考电极夹 |
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2008
- 2008-03-25 JP JP2008077149A patent/JP4678034B2/ja active Active
-
2009
- 2009-03-17 KR KR1020090022503A patent/KR101070062B1/ko active IP Right Grant
- 2009-03-23 TW TW098109343A patent/TWI402512B/zh active
- 2009-03-25 CN CN2009101277608A patent/CN101545928B/zh active Active
Patent Citations (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS59117972U (ja) * | 1983-01-29 | 1984-08-09 | 日置電機株式会社 | クリツプ |
JPS60259971A (ja) * | 1984-06-06 | 1985-12-23 | Yaskawa Electric Mfg Co Ltd | 印刷回路基板の検査方法 |
JPS62162969A (ja) * | 1986-01-13 | 1987-07-18 | Oki Electric Ind Co Ltd | 電気測定具 |
JPS62170567U (ja) * | 1986-04-18 | 1987-10-29 | ||
JPH08304485A (ja) * | 1995-05-11 | 1996-11-22 | Toshiba Corp | 絶縁診断機能付き電気機器、絶縁診断用センサ、絶縁診断機能付きモールド変圧器、及び絶縁診断機能付き回転電機 |
JPH11183521A (ja) * | 1997-12-22 | 1999-07-09 | Yokowo Co Ltd | クリップ式中継コネクタ |
JP2001311742A (ja) * | 2000-04-28 | 2001-11-09 | Hioki Ee Corp | 電気計測用の測定プローブユニット |
JP2002096731A (ja) * | 2000-09-26 | 2002-04-02 | Hioki Ee Corp | 鉄道レールの電気計測用の測定プローブ |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN103091519A (zh) * | 2013-01-29 | 2013-05-08 | 福建省电力有限公司 | 手车开关回路电阻测试铆钉型线夹 |
CN103513110A (zh) * | 2013-10-21 | 2014-01-15 | 国家电网公司 | 一种用于开关设备回路电阻测试的装置 |
WO2016016448A1 (de) * | 2014-07-31 | 2016-02-04 | Thyssenkrupp System Engineering Gmbh | NIEDERHALTER, SCHWEIßVORRICHTUNG UND VERFAHREN ZUM ÜBERPRÜFEN DES VORHANDENSEINS UND/ODER DER QUALITÄT EINER FÜGEVERBINDUNG |
Also Published As
Publication number | Publication date |
---|---|
CN101545928A (zh) | 2009-09-30 |
JP4678034B2 (ja) | 2011-04-27 |
CN101545928B (zh) | 2012-03-21 |
KR101070062B1 (ko) | 2011-10-04 |
TWI402512B (zh) | 2013-07-21 |
KR20090102648A (ko) | 2009-09-30 |
TW200942833A (en) | 2009-10-16 |
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