201005299 九、發明說明： 【發明所屬之技術領域】 本發明係有關於一種測試治具’尤指一種針對電路板線路之檢測’能 使電路板在進行插接電子組件之前能精密、確實完成測試’而具有確保電 路板線路品質之精密型印刷電路板測試治具。 【先前技術】 按，習知之印刷電路板(PCB，printed circuit board)於製成後，尚 需經過檢測程序以檢測該印刷電路板是否為良品，若未能將印刷電路板之 不良品檢測出，待該印刷電路板插設電子組件後才發現線路無法運作，則 φ 所造成之損失將由印刷電路板礙商負責，使得該印刷電路板之檢測操作更 形重要；習知印刷電路板測試治具如第1圖所示，其主要在測試機90上設 有相對之治具座91，該等治具座91上分別設有複數檢測管92及位於該檢 測管92内之探針93 ’該探針93並受一設於該檢測管92内之彈簧94所抵 頂而凸伸出該治具座91外’再者，該探針93係電性連接一引線95，用以 連接一電壓計（圖未示）。而習知印刷電路板測試治具檢測時，係將該探針 93接觸於一印刷電路板100之導接點1〇1(PAD)，以檢測二導接點1〇1間線 路之是否正常（開/短路；0PEN/SH0RT)及微電阻，進而判定該印刷電路板 Λ 100是否為良品。 〇 眾所皆知，現行印刷電路板之設計日趨複雜與精密，當所測試之印刷 電路板線路屬於低電阻、微電阻時，進行測試之引線電阻和接觸電阻將形 成干擾因素而無法忽略，使得習知印刷電路板測試治具之二線連接測試電 阻方式難以正確或精準進行測試，進而造成印刷電路板良品正確判斷之困 難性等缺失贼，誠有盡速加贿決、克服之必要。 緣此’本發明人有鑑於前述習知印刷電路板測試治具其檢測上之缺失 問題及其結構設計上未臻理想之事實，本案發明人即著手研發構思其解決 方案希望能開發出-種更具正確性、精準性之精密型印刷電路板測試治 201005299 具’以促進此業之發展’遂經多時之構思而有本發明之產生。 【發明内容】 本發明之目的在提供一種精密型印刷電路板測試治具，其能適用於微 電阻之印刷電路板線路檢測，並具有印刷電路板良品測試上之正確性及精 準性，而能徹底改善現有印刷電路板測試治具其二線連接測試微電阻方式 之缺失問題。 本發明之再一目的在提供一種精密型印刷電路板測試治具，其能使印 刷電路板在進行插接電子組件之前能正確完成良品測試之判斷，而能積極 避免印刷電路板不良品後續誤行電子組件插設所帶來之損失。 ® 本發明為了達成上述之目的及功效，其所採行之技術手段包括：-檢 測管，係具有一中空容室，該中空容室内係設有一第二彈性件，該檢測管 係電性連接有一第二檢測線；一第二檢測件’係設於該檢測管之該中空容 室内，該第二檢測件設有一第二容室及開口，該第二檢測件並受該第二彈 性件之抵頂；一第一檢測件，係包括有一内套筒、第一彈性件及探針’該 内套筒係抵設於該第二容室内，該内套筒係設有一第一容室，該第一彈性 件係設於該第一容室内；該探針係設於該第一容室内並受該第一彈性件之 抵頂’該第-檢測件係電性連接有一第一檢測線。 ❹本發明之技術手段進一步包括：二治具裝置，該治具裝置包括有一檢 測管’該檢測管係電性連接有一第二檢測線；一第一檢測件，係設於該檢 測管内，該第一檢測件係電性連接有一第一檢測線；一電壓計，係分別連 接該二第一檢測線；一定電流電源，係分別連接該二第二檢測線；一印刷 電路板’係至少包括有二導接點，該二導接點係分別與該二治具裝置相導 接。 兹為使責審查委員對本發明之技術、特徵及所達成之功效更有進一步 之瞭解與⑽n議奴實酬目及配合詳細之綱說明如後： 【實施方式】 201005299 請參閲第2圖，本發明精密型印刷電路板測試治具係包括有一治具裝 置10，該治具裝置10係設於一測試機1上，用來測試一印刷電路板5〇之 開/短路（OPEN/SHORT)及微電阻，其中該測試機〗設有相對之治具座u， 該治具座11係設有用以設置該治具裝置10之複數個治具容室12,使該治 具裝置10得以便利對該印刷電路板50進行線路良否之檢測。 請一併參閱第3、4圖，該治具裝置1〇係包括有一檢測管2〇、第二檢 測件30及第一檢測件40 ;該檢測管20係定位設於該治具座u(圖未示）之 治具容室12内，其係具有一中空容室21之筒體，該中空容室21内係設有 -第二彈性件22(如彈簧）’該檢測管20係連接有-第二檢測線23 ;該第 Φ 一檢測件30設有一第二容室31及開口 32(如套筒），該第二檢測件30係設 於該檢測管20之中空容室21内’並受該第二彈性件22之抵頂而可於該檢 測管20内進行伸縮作動，在適當的機構設計t，該第二檢測件3〇係抵設 於該檢測管20内，不會受該第二彈性件22之抵頂而脫離出該檢測管2〇 ; 該第一檢測件40係包括有一内套筒41、第一彈性件42及探針43 ,該内套 同41係抵設於該第一檢測件30之第二容室31内，該内套筒41係設有一 第一容室411，該内套筒411之外圍係設有一絕緣層412，用以產生絕緣作 用，即該内套筒41與該第二檢測件30間係形成絕緣；該第一彈性件犯(如 φ 彈簧)係設於該内套筒41之第一容室41丨内；該探針43係設於該内套筒41 之第一容室411内，並受該第一彈性件42之抵頂而凸伸出該第二檢測件3〇 之開口 32 ’並可於該内套筒41内進行伸縮作動，在適當的機構設計中，該 探針43係抵設於該内套筒41内，不會受該第一彈性件42之抵頂而脫離出 該内套筒41 ’又’該第一檢測件40係連接有一第一檢測線44。 請參閱第5圖，用以說明本發明精密型印刷電路板測試治具之應用操 作’該相鄰二组治具裝置1〇係用以對該印刷電路板5〇進行二導接點5ι、 52(PAD)間之線路檢測，該二治具裝置10之第一檢測線从係連結一電壓電 源61(如電壓計），而該二治具裝置10之第二檢測線23係連結一定電流電 201005299 源62;如圖所示，當該印刷電路板5〇下壓時該第一檢測㈣之探針仏 第二檢測件30將分別抵壓該第—彈性件42、第二彈性件没而下虔， 祕該探針43及第二檢測件30同時與該印刷電路板5〇之導接點、於 接觸，即可_四線連接職電阻原理（域接定電輯源，兩點接電屢電 源)來做測試’達到精密測試微電阻之效果，用以精確判斷該印刷電路板 其二導接點51、52間線路之正常與否。 當然，在前述測試方式t，若以該治具裝置1Q下壓以接觸該印刷電路 板50之導接點51、52，同樣可達其測試效果。 請參閱第6圖’用以說明本發明利用四線連接測試電阻之運算其令， ❹該定電流電源62係提供一電流I»，該電摩電源61(如電堡計)係相對測得一 電磨值Vd，如圖所示： 由於，1。=11+12 (電阻無限大/Resistance=〇〇) 因此，I2=〇 I〇=Ij 而利用四線連接測試電阻原理計算如下： V〇=(r3+r4)xI2+IixR〇201005299 IX. INSTRUCTIONS: [Technical Field] The present invention relates to a test fixture, especially a detection for a circuit board line, which enables a circuit board to be accurately and accurately tested before being plugged into an electronic component. 'There is a precision printed circuit board test fixture that ensures the quality of the circuit board. [Prior Art] According to the conventional printed circuit board (PCB), it is necessary to go through a test procedure to detect whether the printed circuit board is a good product, and if the defective printed circuit board is not detected, After the printed circuit board is inserted into the electronic component, it is found that the line cannot be operated, and the loss caused by φ will be borne by the printed circuit board, making the detection operation of the printed circuit board more important; the conventional printed circuit board test and treatment As shown in FIG. 1 , the test fixture 90 is mainly provided with a relative fixture seat 91. The fixture holders 91 are respectively provided with a plurality of detection tubes 92 and a probe 93 ' located in the detection tube 92. The probe 93 is protruded from the outside of the fixture holder 91 by a spring 94 disposed in the detection tube 92. Further, the probe 93 is electrically connected to a lead 95 for connecting a Voltmeter (not shown). When the conventional printed circuit board test fixture is detected, the probe 93 is brought into contact with a conductive contact point 1〇1 (PAD) of the printed circuit board 100 to detect whether the line between the two conductive contacts 1〇1 is normal. (ON/OFF; 0PEN/SH0RT) and micro-resistance to determine whether the printed circuit board Λ 100 is good. As is well known, the design of current printed circuit boards is becoming more and more complicated and precise. When the printed circuit board circuit under test is low-resistance and micro-resistance, the lead resistance and contact resistance to be tested will form interference factors and cannot be ignored. The second-line connection test resistance method of the printed circuit board test fixture is difficult to test correctly or accurately, which leads to the difficulty of correct judgment of the printed circuit board, and the lack of thieves. Therefore, the present inventors have in view of the above-mentioned lack of detection of the printed circuit board test fixture and the fact that the structural design is not ideal, the inventor of the present invention started to develop a solution and hoped to develop a solution. More accurate and accurate precision printed circuit board test treatment 201005299 With the idea of 'promoting the development of this industry', the invention has been produced. SUMMARY OF THE INVENTION The object of the present invention is to provide a precision printed circuit board test fixture, which can be applied to the circuit trace detection of a micro-resistor, and has the correctness and accuracy of the printed circuit board test, and can Thoroughly improve the lack of micro-resistance in the test of the existing printed circuit board test fixture. Still another object of the present invention is to provide a precision printed circuit board test fixture which enables a printed circuit board to correctly judge a good product test before being inserted into an electronic component, and can actively avoid subsequent errors of defective printed circuit boards. The loss caused by the insertion of electronic components. In order to achieve the above objects and effects, the technical means adopted by the present invention include: - a detecting tube having a hollow chamber, the hollow chamber being provided with a second elastic member, the detecting tube being electrically connected a second detecting line is disposed in the hollow chamber of the detecting tube, the second detecting member is provided with a second chamber and an opening, and the second detecting member is received by the second elastic member The first detecting member includes an inner sleeve, a first elastic member and a probe. The inner sleeve is disposed in the second housing, and the inner sleeve is provided with a first chamber. The first elastic member is disposed in the first housing; the probe is disposed in the first housing and is received by the first elastic member. The first detecting member is electrically connected to have a first detection. line. The technical means of the present invention further includes: a two-clamping device, the fixture device comprising a detecting tube, the detecting tube is electrically connected to a second detecting line; and a first detecting member is disposed in the detecting tube, The first detecting component is electrically connected to a first detecting line; a voltmeter is connected to the two first detecting lines; a certain current power source is respectively connected to the two second detecting lines; and a printed circuit board' includes at least There are two guiding points, which are respectively connected to the two fixture devices. In order to make the Responsible Review Committee have a better understanding of the technology, features and efficacies of the present invention, and (10) n Opinions on the rewards and cooperation with the detailed outlines as follows: [Embodiment] 201005299 Please refer to Figure 2, The precision printed circuit board test fixture of the present invention comprises a fixture device 10, which is mounted on a testing machine 1 for testing an open/short circuit of a printed circuit board (OPEN/SHORT) And the micro resistance, wherein the testing machine is provided with a relative fixture seat u, and the fixture seat 11 is provided with a plurality of fixture chambers 12 for setting the fixture device 10, so that the fixture device 10 is facilitated The printed circuit board 50 is tested for goodness of the line. Please refer to FIG. 3 and FIG. 4 together. The fixture device 1 includes a detecting tube 2〇, a second detecting member 30 and a first detecting member 40. The detecting tube 20 is positioned and disposed on the fixture holder u ( The inside of the fixture chamber 12 is a cylinder having a hollow chamber 21, and the hollow chamber 21 is provided with a second elastic member 22 (such as a spring). The detecting tube 20 is connected. The second detection line 30 is provided with a second chamber 31 and an opening 32 (such as a sleeve). The second detecting member 30 is disposed in the hollow chamber 21 of the detecting tube 20. 'With the top of the second elastic member 22, the telescopic operation can be performed in the detecting tube 20, and in the appropriate mechanism design t, the second detecting member 3 is placed in the detecting tube 20, and will not The first detecting member 40 includes an inner sleeve 41, a first elastic member 42 and a probe 43, and the inner sleeve is 41 with the bottom of the detecting tube 2; The first sleeve 411 is disposed in the second chamber 31 of the first detecting member 30. The inner sleeve 41 is provided with an insulating layer 412 on the periphery of the inner sleeve 411 for generating insulation. The inner sleeve 41 is insulated from the second detecting member 30; the first elastic member (such as a φ spring) is disposed in the first chamber 41 of the inner sleeve 41; the probe 43 is The first housing 411 of the inner sleeve 41 is disposed, and is protruded from the first elastic member 42 to protrude from the opening 32' of the second detecting member 3' and is disposed in the inner sleeve 41. The telescopic actuation is performed. In a suitable mechanism design, the probe 43 is abutted in the inner sleeve 41 and is not detached from the inner sleeve 41 by the abutment of the first elastic member 42. The first detecting member 40 is connected to a first detecting line 44. Please refer to FIG. 5 for explaining the application operation of the precision printed circuit board test fixture of the present invention. The adjacent two-group fixture device 1 is used to perform two-way contact 5 on the printed circuit board 5 In the line detection between 52 (PAD), the first detection line of the two fixtures 10 is connected to a voltage source 61 (such as a voltmeter), and the second detection line 23 of the fixture unit 10 is connected to a certain current. Electric 201005299 source 62; as shown, when the printed circuit board 5 is pressed down, the first detecting (four) probe 仏 second detecting member 30 will respectively press the first elastic member 42 and the second elastic member respectively And the lower jaw, the secret probe 43 and the second detecting member 30 are simultaneously in contact with the conductive contact point of the printed circuit board 5, and can be connected to the four-wire connection resistance principle (domain connection power source, two points Connect the power and repeatedly power supply to test 'to achieve the effect of precision test micro-resistance, to accurately determine the normality of the line between the two conductive contacts 51, 52 of the printed circuit board. Of course, in the foregoing test mode t, if the jig device 1Q is pressed down to contact the contact points 51, 52 of the printed circuit board 50, the test effect can be achieved as well. Please refer to FIG. 6 for illustrating the operation of the present invention by using a four-wire connection test resistor. The constant current power source 62 provides a current I», which is relatively measured. An electric grinding value Vd, as shown: due to, 1. =11+12 (resistance infinity/Resistance=〇〇) Therefore, I2=〇 I〇=Ij and the four-wire connection test resistance principle is calculated as follows: V〇=(r3+r4)xI2+IixR〇
Vo/ I〇 = R〇 如此即可測得該導接點51、52間線路之電阻值，而得以判斷該線路之 φ 正常與否。 本發明最大的特色是藉由前述之設計，使能符合四線連接測試電阻原 理之應用’而得以對現行精密印刷電路板之低電阻、微電阻線路進行精密、 準確之測試，而徹底解決、改善現有測試治具技術其面臨之困難及缺失， 同時可積極避免印刷電路板不良品之誤判，消除印刷電路板不良品其後績 誤行電子組件之插設所帶來之損失。 綜合以上所述，本發明確實為一相當優異之創思，爰依法提出申請發 明專利；惟上述說明之内容，僅為本發明之較佳實施例說明，凡依本發明 之技術手段所延伸之變化，皆應落入本發明之專利申請範圍，特此說明。 8 201005299 【圖式簡單說明】 第1圖為習知印刷電路板測試治具示意圖。 第2圖為本發明測試機示意圖。 第3圖為本發明治具裝置分解示意圖。 第4圖為本發明治具裝置组合示意圖。 第5圖為本發明治具裝置測試操作示意圖。 第6圖為本發明治具裝置測試操作電路示意圖 【主要元件符號說明】 測試機1Vo/ I〇 = R〇 In this way, the resistance value of the line between the conduction points 51 and 52 can be measured, and it can be judged whether the line φ is normal or not. The most important feature of the present invention is that the above-mentioned design enables the application of the four-wire connection test resistance principle to accurately and accurately test the low-resistance and micro-resistance lines of the current precision printed circuit board, and completely solve the problem. Improve the difficulties and shortcomings of the existing test fixture technology, and at the same time actively avoid the misjudgment of defective printed circuit boards, and eliminate the loss caused by the defective electronic components of the printed circuit board. In summary, the present invention is indeed a rather excellent invention, and the invention patent is filed according to law; however, the above description is only for the preferred embodiment of the present invention, and is extended by the technical means of the present invention. Variations are intended to fall within the scope of the patent application of the present invention. 8 201005299 [Simple description of the diagram] Figure 1 is a schematic diagram of a conventional printed circuit board test fixture. Figure 2 is a schematic view of the test machine of the present invention. Fig. 3 is a schematic exploded view of the jig device of the present invention. Figure 4 is a schematic view showing the assembly of the jig device of the present invention. Fig. 5 is a schematic view showing the test operation of the jig device of the present invention. Figure 6 is a schematic diagram of the test operation circuit of the jig device of the present invention. [Main component symbol description] Test machine 1
治具座11 治具裝置10 檢測管20 第二彈性件22 第二檢測件30 開口 32 第一檢測件40 第一容室411 第一彈性件42 第一檢測線44 印刷電路板50 導接點51、52 電壓電源61 治具容室12 中空容室21 第二檢測線23 第二容室31 内套筒41 絕緣層412 探針43 定電流電源62Fixture seat 11 Fixture device 10 Detection tube 20 Second elastic member 22 Second detecting member 30 Opening 32 First detecting member 40 First chamber 411 First elastic member 42 First detecting line 44 Printed circuit board 50 Leading point 51, 52 voltage power supply 61 fixture chamber 12 hollow chamber 21 second detection line 23 second chamber 31 inner sleeve 41 insulation layer 412 probe 43 constant current power supply 62