CN201867430U - Positioning structure of test bench - Google Patents
Positioning structure of test bench Download PDFInfo
- Publication number
- CN201867430U CN201867430U CN2010205957030U CN201020595703U CN201867430U CN 201867430 U CN201867430 U CN 201867430U CN 2010205957030 U CN2010205957030 U CN 2010205957030U CN 201020595703 U CN201020595703 U CN 201020595703U CN 201867430 U CN201867430 U CN 201867430U
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- CN
- China
- Prior art keywords
- tester table
- location structure
- pad
- test pedestal
- measurement jig
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
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Abstract
The utility model relates to a positioning structure of a test bench. The positioning structure is provided with at least one test base, a test fixture is arranged on the test base and used for testing an objected to be tested, the test base is provided with a positioning structure which is provided with a pad, a suction component and at least one vacuum suction hole, wherein the pad is sleeved on the outer side of the top of the test base, the object to be tested is adsorbed by the vacuum suction holes to be further positioned on the test fixture quickly, and accordingly stable contact between the object to be tested and the test fixture is formed.
Description
Technical field
The location structure of the relevant a kind of tester table of the utility model, provide a kind of measured objects such as testing printed circuit board, semiconductor package or wafer that are used for whether to have and open circuit or the tester table of phenomenon such as bad, measured object is positioned on the measurement jig fast, and can constitutes the location structure that contacts stability between measured object and measurement jig.
Background technology
Press, generally have the making of a plurality of measured points (as the contact of electronic package) such as printed circuit board (PCB), semiconductor package or wafer etc. after, all need see through a kind of special fixture and be detected, and whether be non-defective unit or have or not breaking phenomena if use affirmation.Again, by adopting this mode of detection between known industry such as measured objects such as printed circuit board (PCB), semiconductor package or wafers, on the whole as shown in Figure 1, table is provided with some probes 20 on a tool 10, and each tested measuring point (figure does not show) position of these some probes 20 and cooperation measured object 30 bottom surfaces is provided with; In addition, and be provided with at least one joint 11, these joint 11 1 ends electrically connect with probe 20, and these joints 11 in addition end and with the winding displacement (scheming not show) of electric circuit inspection machine conducting is connected.
When detecting measured object 30, winding displacement with the circuit test machine inserts joint 11 in advance, continue measured object 30 correspondences are placed on the probe 20 of tool 10, with after the tested measuring point of measured object 30 bottom surfaces contacts, the circuit test machine can show just whether measured object 30 has and open circuit or phenomenon such as bad by probe 20.Again, in order to make the detection certainty of these measured object 30 all tested measuring points, and measured object 30 implemented to press when detecting by probe 20, and this probe 20 or tested measuring point breakoff phenomenon can not take place, but this all probe 20 and be provided with and be the elastic telescopic start.
Yet, general measured object 30 directly is placed on the probe 20 of tool 10, and detect, just differ during sometimes because of each probe assembling, perhaps the tested measuring point of this measured object just differs, make this measured object 30 really mean pressure touch on each probe 20, to such an extent as to there is the tested measuring point of part can't contact probe, make testing result produce inaccurate and untrue situation.
The utility model content
Whether the technical matters that the utility model solved is promptly providing a kind of measured objects such as testing printed circuit board, semiconductor package or wafer that are used for to have and open circuit or the tester table of phenomenon such as bad, measured object is positioned on the measurement jig fast, and can constitutes the location structure that contacts stability between measured object and measurement jig.
The technical solution of the utility model is: a kind of location structure of tester table, this tester table is provided with at least one test pedestal, on this test pedestal and be provided with a measurement jig, and in this measurement jig and be provided with plural probe, each probe links with the detection main frame, is contacted and tests with the tested measuring point of measured object by each probe; This test pedestal also is provided with a location structure, this location structure is provided with a pad, and attracts assembly and at least one vacuum to inhale the hole, this pad is sheathed on this test pedestal top outer, and this pad is a little more than this measurement jig, this vacuum suction hole is located at this test pedestal and is located at relatively between this measurement jig and pad, and this attraction assembly communicates with this vacuum suction hole, inhales hole by this vacuum and adsorbs this measured object, and it is positioned on this measurement jig.
This tester table is provided with a support body and and connects support, this support body is connected support vertical setting mutually with this, this test pedestal is located on this support body, then be provided with at least one join domain on this connection support, this join domain is provided with plural contact, and each contact is connected with the probe of measurement jig.
Further be connected with connector on this join domain, this connector is provided with plural number and the corresponding terminal of each contact of this join domain, and this connector end in addition then is connected with the detection main frame.
This connection support is provided with at least one contraposition hole, and this connector and be provided with at least one inserting column relative with this registration holes.
This connector is fixed on this tester table by at least one fixture.
This pad is a soft materials.
This measured object is arranged on the plummer, is positioned on this test pedestal by this plummer, and contacts with this pad.
This plummer is provided with the tested surface that window can make this measured object and exposes to test pedestal place.
This tester table further is provided with a base and following holder, and this base one side is provided with at least one positional punch, and this side of this base also can be arranged in this time holder, and this time holder one side is provided with at least one guide pillar, and this guide pillar is movable to be arranged in this positional punch.
The beneficial effects of the utility model are: tester table of the present utility model is provided with at least one test pedestal, on this test pedestal and be provided with a measurement jig, in order to measured object is tested; Wherein: this test pedestal also is provided with a location structure, and this location structure is provided with a pad, and attracts assembly and at least one vacuum to inhale the hole, and this pad is sheathed on this test pedestal top outer.
Wherein, this measured object is arranged on the plummer, be positioned on this test pedestal by this plummer, control this vacuum suction hole via this attraction assembly again this plummer is carried out vacuum suction, this measured object is positioned on this measurement jig fast, but more can make this measured object mean pressure touch on each probe, make its stable contact, to guarantee the accuracy of testing result.
Description of drawings
Fig. 1 is for practising the structural representation that tool is arranged.
Fig. 2 is the structure cut-open view of tester table in the utility model.
Fig. 3 is the structural representation of tester table in the utility model.
Fig. 4 is the structural representation that connects support in the utility model.
Fig. 5 is the structural representation of location structure in the utility model.
Fig. 6 is the structural representation of join domain and Connection Block in the utility model.
Fig. 7 is the action synoptic diagram of location structure in the utility model.
Figure number explanation: tool 10; Joint 11; Probe 20; Measured object 30; Plummer 31; Window 32; Tester table 40; Test pedestal 41; Measurement jig 42; Support body 43; Connect support 44; Join domain 441; Contact 442; Registration holes 443; Pad 45; Attract assembly 46; Vacuum is inhaled hole 47; Base 48; Positional punch 481; Following holder 49; Guide pillar 491; Connector 51; Terminal 511; Inserting column 512; Detect main frame 52; Fixture 53.
Embodiment
The location structure of the utility model tester table, extremely shown in Figure 4 as Fig. 2, this tester table 40 is provided with at least one test pedestal 41, on this test pedestal 41 and be provided with a measurement jig 42, and in this measurement jig 42 and be provided with plural probe (figure does not show), among the embodiment as shown in the figure, this tester table 40 is provided with a support body 43 and and connects support 44, this support body 43 is connected support 44 mutual vertical settings with this, this test pedestal 41 is located on this support body 43, then be provided with at least one join domain 441 on this connection support 44, this join domain 441 is provided with plural contact 442, and each contact 442 is connected with the probe of measurement jig 42.
Focusing on of this case: this test pedestal 41 also is provided with a location structure, please consult shown in Figure 5 simultaneously, this location structure is provided with a pad 45 (can be soft materials), and attracts assembly 46 and at least one vacuum to inhale hole 47, this pad 45 is sheathed on this test pedestal 41 top outer, and this pad 45 is a little more than this measurement jig 42, this vacuum suction hole 47 is located at this test pedestal 41 and also is located at 45 of this measurement jig 42 and pads relatively, and this attraction assembly 46 communicates with this vacuum suction hole 47.
Moreover, further be connected with connector 51 on this join domain 441, as shown in Figure 6, this connector 51 is provided with plural number and each contact 442 corresponding terminal 511 of this join domain, this connector 51 end in addition then is connected with a detection main frame 52, this connection support 44 is provided with at least one contraposition hole 443, and this connector 51 and be provided with the relative inserting column 512 of at least one and this registration holes 443, this connector 51 is fixed on this tester table 40 by at least one fixture 53 (can be screw), so this connector 51 can be plugged on the predetermined join domain 441, and reach the contraposition effect by this registration holes 443 and inserting column 512, and making each terminal 61 contact conducting really with each contact 442, the effect by this fixture 53 is fixed on this tester table 40 this connector 51 again.
During concrete enforcement, measured object 30 is arranged on the plummer 31, be positioned on this test pedestal 41 by this plummer 31, and contact with this pad 45, as shown in Figure 5, wherein this plummer 31 is provided with the tested surface that window 32 can make this measured object 30 and exposes to test pedestal 41 places, attract the effect of assembly 46 again by this, make each vacuum inhale hole 47 these plummers 31 of absorption, this moment this plummer 31, measured object 30 and pad 45 are because each vacuum is inhaled the effect in hole 47, close towards measurement jig 42 together, as shown in Figure 7, and this measured object 30 is positioned on this measurement jig 42, and link with detection main frame (figure does not show) by each probe of measurement jig, contact and test with the tested measuring point of measured object by each probe.
Wherein, utilize the pull of vacuum effect that this measured object is located fast, also can provide the measured object mean pressure to touch strength, the contact stabilization between this measured object and measurement jig is significantly promoted, to guarantee the accuracy of testing result in each probe.
In addition, this tester table 40 further is provided with a base 48 and following holder 49, as shown in Figure 2, these base 48 1 sides are provided with at least one positional punch 481, these base 48 these sides also can be arranged in this time holder 49, and this time holder 49 1 sides are provided with at least one guide pillar 491, and these guide pillar 491 movable being arranged in this positional punch 481 are located this tester table 40.
Claims (9)
1. the location structure of a tester table, this tester table is provided with at least one test pedestal, on this test pedestal and be provided with a measurement jig, and in this measurement jig and be provided with plural probe, each probe links with the detection main frame, is contacted and tests with the tested measuring point of measured object by each probe; It is characterized in that:
This test pedestal also is provided with a location structure, this location structure is provided with a pad, and attracts assembly and at least one vacuum to inhale the hole, this pad is sheathed on this test pedestal top outer, and this pad is a little more than this measurement jig, this vacuum suction hole is located at this test pedestal and is located at relatively between this measurement jig and pad, and this attraction assembly communicates with this vacuum suction hole, inhales hole by this vacuum and adsorbs this measured object, and it is positioned on this measurement jig.
2. the location structure of tester table according to claim 1, it is characterized in that, this tester table is provided with a support body and and connects support, this support body is connected support vertical setting mutually with this, this test pedestal is located on this support body, then be provided with at least one join domain on this connection support, this join domain is provided with plural contact, and each contact is connected with the probe of measurement jig.
3. as the location structure of tester table as described in the claim 2, it is characterized in that, further be connected with connector on this join domain, this connector is provided with plural number and the corresponding terminal of each contact of this join domain, this connector in addition end then with detect main frame and be connected.
4. as the location structure of tester table as described in the claim 3, it is characterized in that this connection support is provided with at least one contraposition hole, and this connector and be provided with at least one inserting column relative with this registration holes.
5. as the location structure of tester table as described in the claim 3, it is characterized in that this connector is fixed on this tester table by at least one fixture.
6. as the location structure of tester table as described in the claim 1,2,3,4 or 5, it is characterized in that this pad is a soft materials.
7. as the location structure of tester table as described in the claim 1,2,3,4 or 5, it is characterized in that this measured object is arranged on the plummer, be positioned on this test pedestal by this plummer, and contact with this pad.
8. as the location structure of tester table as described in the claim 7, it is characterized in that this plummer is provided with the tested surface that window can make this measured object and exposes to test pedestal place.
9. as the location structure of tester table as described in the claim 1,2,3,4 or 5, it is characterized in that, this tester table further is provided with a base and following holder, this base one side is provided with at least one positional punch, this side of this base also can be arranged in this time holder, and this time holder one side is provided with at least one guide pillar, and this guide pillar is movable to be arranged in this positional punch.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2010205957030U CN201867430U (en) | 2010-11-08 | 2010-11-08 | Positioning structure of test bench |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2010205957030U CN201867430U (en) | 2010-11-08 | 2010-11-08 | Positioning structure of test bench |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN201867430U true CN201867430U (en) | 2011-06-15 |
Family
ID=44138582
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN2010205957030U Expired - Fee Related CN201867430U (en) | 2010-11-08 | 2010-11-08 | Positioning structure of test bench |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN201867430U (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN108254593A (en) * | 2016-12-28 | 2018-07-06 | 致茂电子(苏州)有限公司 | absorption type test device |
| CN112014600A (en) * | 2019-05-31 | 2020-12-01 | 三赢科技（深圳）有限公司 | Test fixture and test machine |
-
2010
- 2010-11-08 CN CN2010205957030U patent/CN201867430U/en not_active Expired - Fee Related
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN108254593A (en) * | 2016-12-28 | 2018-07-06 | 致茂电子(苏州)有限公司 | absorption type test device |
| CN108254593B (en) * | 2016-12-28 | 2020-02-18 | 致茂电子(苏州)有限公司 | Adsorption type testing device |
| CN112014600A (en) * | 2019-05-31 | 2020-12-01 | 三赢科技（深圳）有限公司 | Test fixture and test machine |
| CN112014600B (en) * | 2019-05-31 | 2023-11-24 | 三赢科技（深圳）有限公司 | Test fixture and test machine |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| CF01 | Termination of patent right due to non-payment of annual fee | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20110615 Termination date: 20161108 |