CN117074927B

CN117074927B - PCB circuit board detection device

Info

Publication number: CN117074927B
Application number: CN202311332853.0A
Authority: CN
Inventors: 姜锐; 唐先华; 薄松; 程云
Original assignee: Shenzhen Zhaoxing Botuo Technology Co ltd
Current assignee: Shenzhen Zhaoxing Botuo Technology Co ltd
Priority date: 2023-10-16
Filing date: 2023-10-16
Publication date: 2024-01-05
Anticipated expiration: 2043-10-16
Also published as: CN117074927A

Abstract

The application relates to a PCB circuit board detection device. The PCB circuit board detection device comprises a frame, a probe assembly, a bearing assembly and a linkage assembly, wherein the probe installation piece ascends relative to the frame, and the bearing assembly is driven to move from a testing station to a picking and placing station through a first linkage piece and a second linkage piece of the linkage assembly, so that the bearing assembly and the probe installation piece are arranged in a staggered mode, and the PCB circuit board to be detected is conveniently placed on the bearing assembly. After the placement is completed, the probe assembly is driven to descend, the first linkage piece and the second linkage piece drive the bearing piece to move to the testing station from the pick-and-place working position, the bearing piece is positioned on the probe mounting piece in an opposite way, and the conductive probes are in opposite contact with the testing points of the PCB to be tested on the bearing piece. The PCB detection device realizes the linkage of the bearing piece placed with the PCB to be detected and the probe assembly through the linkage assembly, reduces the possibility of detection error or alignment error, and effectively improves the detection efficiency and the detection reliability of the PCB.

Description

PCB circuit board detection device

Technical Field

The application relates to the technical field of PCB (printed circuit board), in particular to a PCB detection device.

Background

The PCB circuit board is called a printed circuit board, also called a printed circuit board, is an important electronic component, is a support body of the electronic component, is a carrier for electrically connecting the electronic component and the component, adopts a specific manufacturing process, and combines the components into a complete electronic circuit according to a multi-layer wiring or tunnel wiring method. And the integrated PCB circuit board needs to be tested after the manufacture is finished to check whether the functions of the electronic devices on the PCB circuit board are normal, and the detection efficiency and the accuracy of the PCB circuit board are particularly important. Traditional test to PCB circuit board adopts PCB circuit board function test frame generally, and function test frame generally is provided with positioning fixture, will await measuring PCB circuit board through positioning fixture fixed on the base, and elevation structure drive probe bed is pressed on the PCB circuit board that awaits measuring and is made the probe contradict with the test point of PCB circuit board that awaits measuring, tests the function of each test point of PCB circuit board that awaits measuring through the operation probe.

However, the positioning and mounting operation of the conventional testing device for the PCB is complex, and the placing or taking out operation of the PCB is inconvenient, so that the testing working efficiency of the PCB is affected.

Disclosure of Invention

Based on this, it is necessary to provide a PCB board detection apparatus that is simpler to operate and facilitates picking and placing of the circuit to be tested.

The PCB circuit board detection device comprises a frame, a probe assembly, a bearing assembly and a linkage assembly, wherein the probe assembly comprises a probe mounting piece and a conductive probe, the conductive probe is inserted on the probe mounting piece, and the probe mounting piece is arranged on the frame in a lifting manner; the bearing component comprises a bearing piece, the bearing piece is positioned on one side of the probe mounting piece, one side of the bearing piece, which faces the probe mounting piece, is used for placing a PCB to be tested, and the bearing piece is movable relative to the rack so that the bearing piece can be switched between a testing station and a taking and placing station; the linkage assembly comprises a first linkage piece and a second linkage piece, the first linkage piece is in transmission connection with the second linkage piece, the first linkage piece is connected with the probe installation piece, the second linkage piece is connected with the bearing piece, when the probe installation piece moves towards the bearing piece, the bearing piece is driven to move from the picking and placing work position to the testing work position by the first linkage piece and the second linkage piece, so that the bearing piece is opposite to the probe installation piece, and the conductive probe can be in butt joint with a test point of a PCB to be tested on the bearing piece; when the probe mounting piece moves in a direction far away from the bearing piece, the first linkage piece and the second linkage piece drive the bearing piece to move from the testing station to the picking and placing station, so that the bearing piece and the probe mounting piece are arranged in a dislocation mode.

In one embodiment, the first linkage member includes a first cylinder, a first piston body and a first piston rod, the first piston body is disposed in the first cylinder, one end of the first piston rod is connected to the first piston body, the other end of the first piston rod is connected to the probe mounting member, the second linkage member includes a second cylinder, a second piston body and a second piston rod, the second piston body is disposed in the second cylinder, one end of the second piston rod is connected to the second piston body, and the other end of the second piston rod is connected to the carrier; the first piston body divides the first cylinder body inner space into a first rod space and a first rodless space, the second piston body divides the second cylinder body inner space into a second rod space and a second rodless space, the second rodless space is communicated with the first rodless space, and the second rod space is communicated with the first rod space.

In one embodiment, the linkage assembly further comprises a rotating gear, the first linkage member comprises a first rack, the first rack is meshed with the rotating gear and is connected with the probe mounting member, the length direction of the first rack is the lifting direction of the probe mounting member, the second linkage member comprises a second rack, the second rack is meshed with the rotating gear and is connected with the bearing member, and the length direction of the second rack is the moving direction of the bearing member.

In one embodiment, a sliding rail is arranged on the rack, the length direction of the sliding rail is the switching direction of the bearing piece between the test station and the picking and placing station, the bearing piece is slidably connected to the sliding rail, a positioning piece is formed on the rack, the positioning piece is arranged on one side, opposite to the picking and placing station, of the test station, and the bearing piece can be abutted to the positioning piece when located at the test station.

In one embodiment, the linkage assembly further comprises a sliding block, the second linkage member is connected with the sliding block, a sliding groove is formed in the bottom of the bearing member, the sliding block is slidably arranged in the sliding groove, two inner walls which are arranged in the sliding groove at intervals relatively are respectively a first abutting wall and a first limiting wall, the direction of the first abutting wall is the direction of the testing station towards the picking and placing station, the sliding block can be detachably connected with the first abutting wall, and when the bearing member abuts against the positioning member, the sliding block is arranged with the first limiting wall at intervals.

In one embodiment, the linkage assembly further comprises a sliding part, a sliding groove is formed in the sliding part, a limiting block is arranged at the bottom of the bearing part and slidably arranged in the sliding groove, the sliding direction of the limiting block in the sliding groove is the length direction of the sliding rail, two inner walls which are arranged at intervals in the sliding groove are respectively a second abutting wall and a second limiting wall, the direction of the second limiting wall faces to the second abutting wall is the direction of the test station towards the picking and placing station, the limiting block can be detachably connected with the second limiting wall, and when the bearing part abuts to the positioning part, the limiting block and the second abutting walls are arranged at intervals.

In one embodiment, if the linkage assembly includes a slider, a magnetic attraction piece is disposed on the first abutting wall of the chute, and the slider can be attracted with the magnetic attraction piece; or, an electromagnet is arranged on the first abutting wall of the sliding chute, a contact sensor is arranged on the positioning piece, the contact sensor is electrically connected with the electromagnet, the electromagnet can adsorb the sliding block, when the contact sensor senses the bearing piece, the electromagnet is controlled to be powered off, and when the contact sensor does not sense the bearing piece, the electromagnet is controlled to be powered on;

in one embodiment, if the linkage assembly includes a sliding member, a magnetic attraction member is disposed on a second limiting wall of the sliding groove, and the limiting block can be attracted with the magnetic attraction member; or the second limiting wall is provided with an electromagnet, the positioning piece is provided with a contact sensor, the contact sensor is electrically connected with the electromagnet, the electromagnet can adsorb the limiting block, when the contact sensor senses the bearing piece, the electromagnet is controlled to be powered off, and when the contact sensor does not sense the bearing piece, the electromagnet is controlled to be powered on.

In one embodiment, the carrier assembly further includes a positioning template, the positioning template is disposed on the frame, the positioning template is located between the carrier and the probe assembly, a plurality of positioning holes are formed in the positioning template, the positioning holes are aligned with the conductive probes one by one, and when the carrier moves to the testing station, the positioning holes are aligned with testing points of the PCB to be tested on the carrier one by one.

In one embodiment, the positioning template is detachably inserted on the frame.

In one embodiment, the positioning template is consistent with the structure of the PCB to be tested.

In one embodiment, the cross-section of the locating hole tends to increase in size along the direction of the carrier toward the probe mount.

In one embodiment, the PCB board detection apparatus further includes a power assembly, the power assembly is disposed on the frame, and the power assembly is used to drive the probe mounting member to move up and down.

In one embodiment, the power assembly comprises a power source, a power shaft and a transmission sleeve, wherein the power source is arranged on the frame, the power shaft is rotatably arranged on the frame, one end of the transmission sleeve is connected to the probe mounting piece, the other end of the transmission sleeve is sleeved on the power shaft and is in transmission connection with the power shaft, and the power source is used for driving the power shaft to rotate so as to drive the transmission sleeve to move up and down; the power shaft is hollow to form a wiring channel, the wiring channel is communicated with the space in the transmission sleeve, and a connecting wire on the conductive probe penetrates through the transmission sleeve and is arranged in the wiring channel in a penetrating mode.

According to the PCB detection device, when the PCB detection device is used, the probe mounting piece ascends relative to the frame, and the bearing piece is driven to move from the test station to the taking and placing station through the first linkage piece and the second linkage piece of the linkage assembly, so that the bearing piece and the probe mounting piece are arranged in a staggered mode. Because the bearing piece and the probe mounting piece are arranged in a staggered mode, the PCB to be tested can be placed on the bearing piece from the position right above the bearing piece, and the influence on the placement of the PCB to be tested on the bearing piece caused by the fact that the probe mounting piece is located right above the bearing piece is avoided. After the PCB is placed, the probe assembly is driven to descend or the bearing piece is driven to move relative to the rack, and the bearing piece can be driven to move to the testing station by the pick-and-place work through the first linkage piece and the second linkage piece, so that the bearing piece is positioned on the probe mounting piece. After the bearing piece moves to the testing station, the conductive probe is in aligned contact with the testing point of the PCB to be tested on the bearing piece, so that the PCB to be tested is tested. Above-mentioned PCB circuit board detection device has realized placing the linkage of the carrier of PCB circuit board that awaits measuring and probe subassembly through the linkage subassembly, only needs a drive start motion can realize another synchronous motion, and avoids appearing the carrier to be located getting and puts the station, and probe subassembly triggers the detection, appears detecting error, perhaps avoids appearing the carrier to be located the test station, and probe subassembly does not trigger and presses on the PCB circuit board that awaits measuring, effectively improves the detection efficiency and the detection reliability of PCB circuit board.

Drawings

The accompanying drawings, which are included to provide a further understanding of the invention and are incorporated in and constitute a part of this specification, illustrate embodiments of the invention and together with the description serve to explain the invention.

In order to more clearly illustrate the technical solutions of the embodiments of the present invention, the drawings required for the description of the embodiments will be briefly described below, and it is apparent that the drawings in the following description are only some embodiments of the present invention, and other drawings may be obtained according to these drawings without inventive effort for a person skilled in the art.

Moreover, the figures are not drawn to a 1:1 scale, and the relative sizes of various elements are merely exemplary in the figures, and are not necessarily drawn to true scale. In the drawings:

fig. 1 is a schematic structural diagram of a carrier of a PCB board testing apparatus in an embodiment at a testing station.

Fig. 2 is a schematic structural diagram of a carrier of the PCB board detection apparatus shown in fig. 1 at a pick-and-place station.

Fig. 3 is a schematic structural diagram of a carrier of a PCB board testing apparatus in another embodiment at a testing station.

Fig. 4 is an enlarged view at a in fig. 1.

Fig. 5 is an enlarged view at B in fig. 2.

Fig. 6 is a schematic structural view of a linkage assembly in another embodiment.

Reference numerals illustrate:

10. PCB circuit board detection device; 100. a frame; 110. a positioning piece; 200. a probe assembly; 210. a probe mount; 220. a conductive probe; 300. a carrier assembly; 310. a carrier; 312. placing space; 314. a chute; 315. a first abutment wall; 316. a first limiting wall; 317. a limiting block; 320. a testing station; 330. a picking and placing station; 340. a magnetic attraction piece; 350. positioning a template; 352. positioning holes; 410. a first linkage member; 411. a first cylinder; 412. a first piston body; 413. a first piston rod; 414. a first pole space; 415. a first rodless space; 418. a first rack; 420. a second linkage member; 421. a second cylinder; 422. a second piston body; 423. a second piston rod; 424. a second pole space; 425. a second rodless space; 428. a second rack; 430. a slide block; 440 a slider; 441. a sliding groove; 442. a second abutment wall; 443. the second limiting wall; 450. rotating the gear; a first gear 452; 454. a second gear; 500. a power assembly; 510. a power source; 520. a power shaft; 522. a routing channel; 530. a transmission sleeve; 600. and a manipulator.

Detailed Description

In order to make the above objects, features and advantages of the present application more comprehensible, embodiments accompanied with figures are described in detail below. In the following description, numerous specific details are set forth in order to provide a thorough understanding of the present application. This application is, however, susceptible of embodiment in many other forms than those described herein and similar modifications can be made by those skilled in the art without departing from the spirit of the application, and therefore the application is not to be limited to the specific embodiments disclosed below.

Referring to fig. 1 and 2, the PCB circuit board detection apparatus 10 in an embodiment of the present application can at least improve the testing efficiency of the PCB circuit board to be tested, and facilitate the taking and placing of the PCB circuit board to be tested. Specifically, the PCB board detection apparatus 10 includes a frame 100, a probe assembly 200, a bearing assembly 300 and a linkage assembly, the probe assembly 200 includes a probe mounting member 210 and a conductive probe 220, the conductive probe 220 is inserted on the probe mounting member 210, and the probe mounting member 210 is disposed on the frame 100 in a liftable manner. The carrier assembly 300 includes a carrier 310, the carrier 310 is located on one side of the probe mount 210, the side of the carrier 310 facing the probe mount 210 is used for placing a PCB to be tested, the carrier 310 is movable relative to the rack 100, so that the carrier 310 can be switched between the testing station 320 and the pick-and-place station 330; the linkage assembly includes a first linkage member 410 and a second linkage member 420, the first linkage member 410 is in driving connection with the second linkage member 420, the first linkage member 410 is connected with the probe mount 210, and the second linkage member 420 is connected with the carrier 310. When the probe mounting piece 210 moves towards the direction of the carrier piece 310, the carrier piece 310 is driven by the first linkage piece 410 and the second linkage piece 420 to move from the taking-out and placing station 330 to the testing station 320, so that the carrier piece 310 is positioned on the probe mounting piece 210, and the conductive probes 220 are in butt joint with the testing points of the PCB to be tested on the carrier piece 310; when the probe mounting member 210 moves away from the carrier member 310, the carrier member 310 is driven by the first linkage member 410 and the second linkage member 420 to move from the testing station 320 to the picking and placing station 330, so that the carrier member 310 and the probe mounting member 210 are arranged in a staggered manner.

In use, the probe mount 210 is raised relative to the frame 100, and the carrier 310 is driven to move from the testing station 320 to the pick-and-place station 330 by the first and second linkage members 410 and 420 of the linkage assembly, so that the carrier 310 and the probe mount 210 are arranged in a staggered manner. Because the bearing piece 310 and the probe mounting piece 210 are arranged in a staggered manner, the PCB to be tested can be placed on the bearing piece 310 from the right upper side of the bearing piece 310, and the influence on the placement of the PCB to be tested on the bearing piece 310 caused by the fact that the probe mounting piece 210 is positioned right above the bearing piece 310 is avoided. After the placement of the PCB is completed, the carrier 310 can be driven to move from the pick-and-place station 330 to the test station 320 by the first and second linkage members 410 and 420 only by driving the probe assembly 200 to descend or driving the carrier 310 to move relative to the frame 100, so that the carrier 310 is located on the probe mounting member 210. After the carrier 310 moves to the testing station 320, the conductive probe 220 is in aligned contact with the testing point of the PCB to be tested on the carrier 310, so as to realize the detection of the PCB to be tested.

The PCB circuit board detection device 10 realizes the linkage of the bearing part 310 with the PCB circuit board to be detected and the probe assembly 200 through the linkage assembly, and can realize the synchronous motion of the other one by only starting one driving part, so that the bearing part 310 is prevented from being positioned at the picking and placing working position 330, the probe assembly 200 is prevented from triggering detection, the detection error is prevented from occurring, or the bearing part 310 is prevented from being positioned at the testing working position 320, the probe assembly 200 is not triggered and pressed on the PCB circuit board to be detected, and the detection efficiency and the detection reliability of the PCB circuit board are effectively improved.

In an embodiment, a placement space 312 for placing the PCB to be tested is formed on a side of the carrier 310 facing the probe mounting member 210, and the carrier 310 is driven to move from the pick-and-place station 330 to the test station 320 by the first linkage member 410 and the second linkage member 420, so that the placement space 312 of the carrier 310 is located on the probe mounting member 210, and the conductive probes 220 can be aligned with test points of the PCB to be tested in the placement space 312. Through setting up space 312, can be convenient for realize the location spacing to the PCB circuit board that awaits measuring, and then guarantee the accuracy of PCB circuit board that awaits measuring and conductive probe 220 counterpoint.

In another embodiment, a positioning module may be further disposed on the carrier 310, where the positioning module positions the PCB to be tested on the carrier 310, so as to ensure the reliability of the placement of the PCB to be tested on the carrier 310. Specifically, the positioning module is detachably disposed on the carrier 310, and the positioning module can be replaced according to the PCB to be tested with different sizes and different shapes, so as to further improve the applicability of the PCB testing device 10.

In an embodiment, the first linkage member 410 includes a first cylinder 411, a first piston body 412 and a first piston rod 413, the first piston body 412 is disposed in the first cylinder 411, one end of the first piston rod 413 is connected to the first piston body 412, and the other end is connected to the probe mounting member 210. The second linkage member 420 includes a second cylinder 421, a second piston body 422, and a second piston rod 423, where the second piston body 422 is disposed in the second cylinder 421, and one end of the second piston rod 423 is connected to the second piston body 422, and the other end is connected to the carrier 310; wherein the first piston body 412 divides the space inside the first cylinder 411 into a first rod space 414 and a first rod-free space 415, the second piston body 422 divides the space inside the second cylinder 421 into a second rod space 424 and a second rod-free space 425, the second rod-free space 425 communicates with the first rod-free space 415, and the second rod space 424 communicates with the first rod-free space 414.

When the probe mounting piece 210 descends, the first piston body 412 is driven to move in the first cylinder 411 by the first piston rod 413, so that the medium in the first rodless space 415 can be compressed into the second rodless space 425, the volume of the first rod space 414 is increased, the medium in the second rod space 424 enters the first rod space 414 synchronously, and the second piston body 422 moves in the second cylinder 421 along the direction from the second rodless space 425 to the second rod space 424, so that the purpose that the carrier 310 is driven to move from the picking and placing station 330 to the testing station 320 by the second piston rod 423 is achieved. Conversely, when the probe mounting member 210 is lifted, the first piston rod 413 drives the first piston body 412 to compress the medium in the first rod space 414 into the second rod space 424, and the volume of the first rodless space 415 is increased, so that the medium in the second rodless space 425 enters the first rodless space 415 simultaneously, and the second piston body 422 moves in the second cylinder 421 along the direction from the second rod space 424 to the second rodless space 425, so as to achieve the purpose of driving the carrier 310 to move from the test station 320 to the pick-and-place station 330 through the second piston rod 423.

Specifically, the second rodless space 425 is in communication with the first rodless space 414 via a pipe, the second rodless space 424 is in communication with the first rodless space 415 via a pipe, and thus the relative installation position between the first cylinder 411 and the second cylinder 421 is not affected by the mutual linkage relationship, so long as the connection of the first piston rod 413 and the probe mount 210 is ensured, and the connection of the second piston rod 423 and the carrier 310 is ensured.

In the present embodiment, the size of the cross section in the first cylinder 411 is larger than the size of the cross section in the second cylinder 421. Because the carrier 310 needs to switch between the retest station 320 and the pick-and-place station 330, the probe mount 210 only needs to move between the conductive probe 220 abutting on and leaving the PCB to be tested, and the moving stroke of the carrier 310 can be larger than that of the probe mount 210. By making the size of the cross section in the first cylinder 411 larger than the size of the cross section in the second cylinder 421, it is possible to achieve the purpose of moving the second piston body 422 a larger distance in the case where the first piston body 412 moves a smaller distance.

In other embodiments, the cross-sectional dimensions of the first cylinder 411 and the second cylinder 421 may be set according to the movement stroke of the carrier 310 and the probe mount 210. The ratio between the size of the cross section of the first piston rod 413 and the size of the cross section of the second piston rod 423 may be matched with the ratio between the size of the cross section of the first cylinder 411 and the size of the cross section of the second cylinder 421, so as to realize dynamic balance of the movement of the first piston body 412 and the second piston body 422 during the linkage.

In another embodiment, as shown in fig. 3, the linkage assembly further includes a rotating gear 450, the first linkage member 410 includes a first rack 418, the first rack 418 is engaged with the rotating gear 450 and connected to the probe mount 210, and a length direction of the first rack 418 is a lifting direction of the probe mount 210. The second linkage 420 includes a second rack 428, the second rack 428 is meshed with the rotation gear 450 and connected to the carrier 310, and a length direction of the second rack 428 is a moving direction of the carrier 310. When the rotation gear 450 is driven to rotate, the first rack 418 and the second rack 428 can be synchronously driven to move along the respective length directions, so that the probe mount 210 and the carrier 310 can be synchronously driven to move.

Specifically, the rotating gear 450 includes a first gear 452 and a second gear 454, the first gear 452 and the second gear 454 are coaxially disposed, the first rack 418 is meshed with the first gear 452, and the second rack 428 is meshed with the second gear 454. When the first rack 418 moves up and down, the first gear 452 can be driven to drive the second gear 454 to rotate synchronously, and then the second rack 428 can be driven to drive the carrier 310 to move synchronously.

Further, the diameter of the first gear 452 is smaller than that of the second gear 454, so when the first gear 418 drives the first gear 452 to rotate one turn, the second gear 454 rotates one turn synchronously, and the second gear 428 is formed as the circumference of the second gear 454, the stroke of the first gear 418 is the circumference of the first gear 452, and the stroke distance of the second gear 454 driving the carrier 310 to move is greater than the movement stroke of the probe mount 210.

In an embodiment, a sliding rail is disposed on the rack 100, the length direction of the sliding rail is the switching direction of the carrier 310 between the testing station 320 and the picking and placing station 330, the carrier 310 is slidably connected to the sliding rail, a positioning member 110 is formed on the rack 100, the positioning member 110 is disposed on one side of the testing station 320 opposite to the picking and placing station 330, and the carrier 310 can be abutted to the positioning member 110 when being located at the testing station 320. The sliding rail can provide a guiding effect for the movement of the bearing member 310, so that the stability of the switching movement of the bearing member 310 between the testing station 320 and the taking and placing station 330 is improved, the bearing member 310 can be abutted on the positioning member 110 when moving to the testing station 320, the position of the bearing member 310 is effectively limited by the positioning member 110, and the reliability of the butt joint of the conductive probe 220 and the testing member of the PCB to be tested on the bearing member 310 is ensured.

Referring to fig. 1, 2 and 4, in an embodiment, the linkage assembly further includes a slider 430, the second linkage member 420 is connected to the slider 430, a sliding groove 314 is provided at the bottom of the carrier 310, the slider 430 is slidably disposed in the sliding groove 314, two inner walls disposed at opposite intervals in the sliding groove 314 are a first abutment wall 315 and a first limiting wall 316 respectively, the direction of the first limiting wall 316 towards the first abutment wall 315 is the direction of the test station 320 towards the pick-and-place station 330, the slider 430 can be detachably connected to the first abutment wall 315, and when the carrier 310 abuts against the positioning member 110, the slider 430 and the first limiting wall 316 are disposed at intervals.

When the carrier 310 is located at the pick-and-place station 330, the slider 430 is connected with the first abutment wall 315 of the chute 314, and when the probe mounting member 210 moves downward and the first linkage member 410 and the second linkage member 420 drive the slider 430 to drive the carrier 310 to move to the test station 320, the carrier 310 abuts against the positioning member 110 to be positioned, and at this time, a space is provided between the conductive probe 220 and the PCB to be tested on the carrier 310. The probe mounting member 210 continues to move downwards, at this time, the carrier member 310 cannot move, and the second linkage member 420 drives the slider 430 to separate from the first abutment wall 315, so that the slider 430 moves towards the first limiting wall 316 until the conductive probe 220 presses against the PCB to be tested on the carrier member 310. By arranging the sliding groove 314 and the sliding block 430, when the supporting piece 310 is abutted against the positioning piece 110 and the position is kept unchanged, the conductive probe 220 is driven to continuously move and abut against the PCB to be tested, and the reliability of the contact between the conductive probe 220 and the PCB to be tested is improved. When the probe mounting member 210 drives the conductive probe 220 to move upwards and away from the PCB to be tested, the slider 430 moves from the direction of the first limiting wall 316 toward the direction of the first abutting wall 315, and the carrier 310 remains motionless until the slider 430 abuts against the first abutting wall 315, so as to push the carrier 310 to leave from the testing station 320, so that the conductive probe 220 leaves more reliably, and friction of the conductive probe 220 on the PCB to be tested is avoided.

Specifically, the first abutment wall 315 of the chute 314 is provided with a magnetic attraction member 340, and the slider 430 can be attracted to the magnetic attraction member 340. The slider 430 moves towards the first abutment wall 315 and abuts against the first abutment wall 315, so that the reliability of connection can be improved by the attraction of the magnetic attraction piece 340, and when the carrier 310 moves to the test station 320 and abuts against the positioning piece 110, the slider 430 continues to move towards the first limiting wall 316, so that the slider 430 is separated from the magnetic attraction piece 340, at this time, attractive force is generated between the slider 430 and the magnetic attraction piece 340, and further force towards the direction of the positioning piece 110 can be applied to the carrier 310, so that the reliability of abutting of the carrier 310 against the positioning piece 110 can be improved.

In the present embodiment, the side edges of the carrier 310 are slidably connected to the sliding rails, and the sliding grooves 314 are formed on the bottom wall of the carrier 310.

In another embodiment, an electromagnet is disposed on the first abutting wall 315 of the chute 314, a contact sensor is disposed on the positioning member 110, the contact sensor is electrically connected with the electromagnet, the electromagnet is capable of adsorbing the slider 430, and when the contact sensor senses the carrier, the electromagnet is controlled to be powered off, and when the contact sensor does not sense the carrier, the electromagnet is controlled to be powered on. The electromagnet is controlled to be powered on or off through the contact sensor, so that the electromagnet is firmer when the sliding block 430 is attracted, the electromagnet is not easy to separate, and when the electromagnet needs to be separated, the electromagnet is directly controlled to be powered off, so that the magnetic attraction force disappears.

As shown in fig. 6, in another embodiment, the linkage assembly further includes a sliding member 440, a sliding groove 441 is formed on the sliding member 440, a stopper 317 is disposed at a bottom of the carrier 310 and slidably disposed in the sliding groove 441, a sliding direction of the stopper 317 in the sliding groove 441 is a length direction of a sliding rail, two inner walls disposed at opposite intervals in the sliding groove 441 are a second abutment wall 442 and a second limiting wall 443 respectively, a direction of the second limiting wall 443 toward the second abutment wall 442 is a direction of the test station 320 toward the picking and placing station 330, the stopper 317 can be detachably connected with the second limiting wall 443, and when the carrier 310 abuts against the positioning member 110, the stopper 317 and the second abutment wall 442 are disposed at intervals.

As above, when the carrier 310 is located at the pick-and-place station 330, the second limiting wall 443 of the slider 440 is connected to the limiting block 317, and the slider 440 drives the carrier 310 to move to the testing station 320 to make the carrier 310 abut against the positioning member 110, and at this time, a space is provided between the conductive probe 220 and the PCB to be tested on the carrier 310. The second linkage member 420 drives the sliding member 440 to move continuously to separate the limiting block 317 from the second limiting wall 443, and the second abutting wall 442 of the sliding member 440 moves towards the limiting block 317 until the conductive probe 220 is pressed against the PCB to be tested on the carrier 310. When the probe mounting member 210 drives the conductive probe 220 to move up and away from the PCB to be tested, the sliding member 440 moves toward the pick-and-place station 330 to move the second limiting wall 443 toward the limiting block 317, and the carrier 310 remains stationary until the second limiting wall 443 abuts against the limiting block 317, so as to push the carrier 310 to leave from the testing station 320.

Specifically, the second limiting wall 443 of the sliding groove 441 is provided with a magnetic attraction member 340, and the limiting block 317 can be attracted to the magnetic attraction member 340. The sliding member 440 moves along the direction of the test station 320 towards the pick-and-place station 330, so that the limiting block 317 can abut against the second limiting wall 443, and the magnetic attraction member 340 is attracted, thereby improving the reliability of connection. When the carrier 310 moves to the testing station 320 and abuts against the positioning member 110, the sliding member 440 continues to move in a direction away from the pick-and-place station 330, so that the stopper 317 is separated from the magnetic member 340 on the second limiting wall 443, and an attractive force is generated between the stopper 317 and the magnetic member 340, so that a force towards the positioning member 110 can be applied to the carrier 310, and the reliability of the abutment of the carrier 310 on the positioning member 110 is improved.

In another embodiment, an electromagnet is disposed on the second limiting wall 443, a contact sensor is disposed on the positioning member 110, the contact sensor is electrically connected with the electromagnet, the electromagnet can adsorb the limiting block 317, when the contact sensor senses the carrier, the electromagnet is controlled to be powered off, and when the contact sensor does not sense the carrier, the electromagnet is controlled to be powered on. The electromagnet is controlled to be powered on or off through the contact sensor, so that the electromagnet is firmer when the sliding block 430 is attracted, the electromagnet is not easy to separate, and when the electromagnet needs to be separated, the electromagnet is directly controlled to be powered off, so that the magnetic attraction force disappears.

Referring to fig. 1 and 2, in an embodiment, the carrier 300 further includes a positioning template 350, the positioning template 350 is disposed on the frame 100, and the positioning template 350 is located between the carrier 310 and the probe assembly 200, the positioning template 350 is provided with a plurality of positioning holes 352, the plurality of positioning holes 352 are aligned with the conductive probes 220 one by one, and when the carrier 310 moves to the testing station 320, the plurality of positioning holes 352 are aligned with test points of the PCB to be tested on the carrier 310 one by one. In this embodiment, when the carrier 310 abuts against the positioning member 110, the positioning holes 352 on the positioning template 350 are in one-to-one correspondence with the test points of the PCB to be tested on the carrier 310, and the conductive probes 220 pass through the positioning holes 352 in one-to-one correspondence and then abut against the test points of the PCB to be tested, so as to avoid the conductive probes 220 from being skewed during the abutting process to affect the stability of the abutting contact, and improve the reliability of the conductive probes 220 abutting against the test points of the PCB to be tested.

Referring also to FIG. 5, in one embodiment, the cross-sectional dimension of the positioning hole 352 tends to increase along the direction of the carrier 310 toward the probe mount 210. Specifically, the portion of the positioning hole 352 facing the probe mount 210 is a tapered hole, and the portion of the positioning hole 352 facing the carrier 310 is a circular hole. The conical hole can facilitate insertion of the conductive probe 220, and the conductive probe 220 penetrates out through the round hole, so that reliability of abutting contact of the conductive probe 220 on a test point on the PCB to be tested is improved through the round hole.

In one embodiment, the positioning template 350 is identical to the structure of the PCB to be tested. Because the structure of the positioning template 350 is consistent with that of the PCB to be tested, it can be understood that a PCB to be tested is selected as the positioning template 350, and then the position of the test point of the PCB to be tested can be directly determined on the positioning template 350, and the positioning hole 352 is directly drilled at the position of the test point. The positioning holes 352 can be formed without using a PCB to be tested, performing image acquisition processing on the PCB to be tested, performing processing analysis on a software program, and determining the positions of the positioning holes 352 more accurately and simply without increasing equipment cost.

In one embodiment, the positioning template 350 is removably inserted on the frame 100. For example, a slot is provided between the probe mount 210 and the test station 320, and the positioning template 350 can be inserted into the slot, so that the corresponding positioning template 350 can be replaced according to different PCB boards to be tested.

Referring to fig. 1 and 2, in an embodiment, the PCB board detection apparatus 10 further includes a power assembly 500, the power assembly 500 is disposed on the frame 100, and the power assembly 500 is used for driving the probe mounting member 210 to move up and down. The power assembly 500 can automatically drive the probe mounting member 210 to move up and down, and the carrier 310 can move synchronously through the linkage assembly. In other embodiments, the power assembly 500 may also drive the carrier 310 to move or directly drive the linkage assembly.

Specifically, the power assembly 500 includes a power source 510, a power shaft 520, and a transmission sleeve 530, the power source 510 is disposed on the frame 100, the power shaft 520 is rotatably disposed on the frame 100, the transmission sleeve 530 is connected to the probe mounting member 210 and is in transmission connection with the power shaft 520, and the power source 510 is used for driving the power shaft 520 to rotate so as to drive the transmission sleeve 530 to move up and down. The power shaft 520 is driven to rotate by the power source 510, so that the probe mounting piece 210 is driven to move up and down by the driving transmission sleeve 530.

Further, one end of the driving sleeve 530 is connected to the probe mounting member 210, and the other end is sleeved on the power shaft 520 and is in driving connection with the power shaft 520. For example, the inner wall of the driving sleeve 530 is provided with an internal thread, and the outer wall of the power shaft 520 is provided with an external thread, which is matched with the internal thread. Or the inner wall of the transmission sleeve 530 is provided with a sliding bulge or a rolling ball, the outer wall of the power shaft 520 is provided with a wave-shaped chute around the axis, and the sliding bulge or the rolling ball is arranged in the wave-shaped chute, so that the transmission sleeve 530 can be driven to reciprocate through the sliding bulge or the rolling ball when the power shaft 520 rotates.

In this embodiment, the power shaft 520 is hollow to form a wire channel 522, the wire channel 522 is communicated with the space in the transmission sleeve 530, and the connection wire on the conductive probe 220 passes through the transmission sleeve 530 and is arranged in the wire channel 522. Because each conductive probe 220 is provided with a connecting wire, the connecting wires on each conductive probe 220 are arranged in the wiring channel 522 in a penetrating way, the wiring harness is regulated, and the connecting wires cannot be excessively disturbed due to the rotation movement of the power shaft 520.

Referring to fig. 1 and 2, in an embodiment, the PCB inspecting apparatus 10 further includes a manipulator 600, and the manipulator 600 is used to grasp the PCB to be inspected and place the PCB to be inspected on the carrier 310 located at the pick-and-place station 330. Specifically, the manipulator 600 may be disposed on the rack and located on a side of the pick-and-place station 330 facing away from the test station 320. In other embodiments, the robot 600 may also be omitted.

In the description of the present application, it should be understood that, if there are terms such as "center", "longitudinal", "transverse", "length", "width", "thickness", "upper", "lower", "front", "rear", "left", "right", "vertical", "horizontal", "top", "bottom", "inner", "outer", "clockwise", "counterclockwise", "axial", "radial", "circumferential", etc., these terms refer to the orientation or positional relationship based on the drawings, which are merely for convenience of description and simplification of description, and do not indicate or imply that the apparatus or element referred to must have a specific orientation, be configured and operated in a specific orientation, and therefore should not be construed as limiting the present application.

Furthermore, the terms "first," "second," and the like, if any, are used for descriptive purposes only and are not to be construed as indicating or implying a relative importance or implicitly indicating the number of technical features indicated. Thus, a feature defining "a first" or "a second" may explicitly or implicitly include at least one such feature. In the description of the present application, the terms "plurality" and "a plurality" if any, mean at least two, such as two, three, etc., unless specifically defined otherwise.

In this application, unless explicitly stated and limited otherwise, the terms "mounted," "connected," "secured," and the like are to be construed broadly. For example, the two parts can be fixedly connected, detachably connected or integrated; can be mechanically or electrically connected; either directly or indirectly, through intermediaries, or both, may be in communication with each other or in interaction with each other, unless expressly defined otherwise. The specific meaning of the terms in this application will be understood by those of ordinary skill in the art as the case may be.

In this application, unless expressly stated or limited otherwise, the meaning of a first feature being "on" or "off" a second feature, and the like, is that the first and second features are either in direct contact or in indirect contact through an intervening medium. Moreover, a first feature being "above," "over" and "on" a second feature may be a first feature being directly above or obliquely above the second feature, or simply indicating that the first feature is level higher than the second feature. The first feature being "under", "below" and "beneath" the second feature may be the first feature being directly under or obliquely below the second feature, or simply indicating that the first feature is less level than the second feature.

It will be understood that if an element is referred to as being "fixed" or "disposed" on another element, it can be directly on the other element or intervening elements may also be present. If an element is referred to as being "connected" to another element, it can be directly connected to the other element or intervening elements may also be present. The terms "vertical," "horizontal," "upper," "lower," "left," "right," and the like as used herein, if any, are for descriptive purposes only and do not represent a unique embodiment.

The technical features of the above-described embodiments may be arbitrarily combined, and all possible combinations of the technical features in the above-described embodiments are not described for brevity of description, however, as long as there is no contradiction between the combinations of the technical features, they should be considered as the scope of the description.

The above examples only represent a few embodiments of the present application, which are described in more detail and are not to be construed as limiting the scope of the claims. It should be noted that it would be apparent to those skilled in the art that various modifications and improvements could be made without departing from the spirit of the present application, which would be within the scope of the present application. Accordingly, the scope of protection of the present application is to be determined by the claims appended hereto.

Claims

1. The utility model provides a PCB circuit board detection device which characterized in that, PCB circuit board detection device includes:

a frame;

the probe assembly comprises a probe mounting piece and a conductive probe, the conductive probe is inserted on the probe mounting piece, and the probe mounting piece is arranged on the rack in a lifting manner;

the bearing assembly comprises a bearing piece, the bearing piece is positioned on one side of the probe mounting piece, one side of the bearing piece, which faces the probe mounting piece, is used for placing a PCB to be tested, and the bearing piece is movable relative to the rack so that the bearing piece can be switched between a testing station and a taking and placing station; and

The linkage assembly comprises a first linkage piece and a second linkage piece, the first linkage piece is in transmission connection with the second linkage piece, the first linkage piece is connected with the probe installation piece, the second linkage piece is connected with the bearing piece, when the probe installation piece moves towards the bearing piece, the bearing piece is driven to move from the picking and placing work position to the testing work position through the first linkage piece and the second linkage piece, so that the bearing piece is opposite to the probe installation piece, and the conductive probe can be in butt joint with a test point of a PCB (printed circuit board) to be tested on the bearing piece; when the probe mounting piece moves in a direction far away from the bearing piece, the first linkage piece and the second linkage piece drive the bearing piece to move from the testing station to the picking and placing station, so that the bearing piece and the probe mounting piece are arranged in a dislocation mode.

2. The PCB board detection apparatus according to claim 1, wherein the first linkage member includes a first cylinder, a first piston body and a first piston rod, the first piston body is disposed in the first cylinder, one end of the first piston rod is connected to the first piston body, the other end is connected to the probe mounting member, the second linkage member includes a second cylinder, a second piston body and a second piston rod, the second piston body is disposed in the second cylinder, one end of the second piston rod is connected to the second piston body, and the other end is connected to the carrier; the first piston body divides the first cylinder body inner space into a first rod space and a first rodless space, the second piston body divides the second cylinder body inner space into a second rod space and a second rodless space, the second rodless space is communicated with the first rodless space, and the second rod space is communicated with the first rod space.

3. The PCB board detection apparatus of claim 1, wherein the linkage assembly further includes a rotation gear, the first linkage member includes a first rack engaged with the rotation gear and connected to the probe mount, a length direction of the first rack is a lifting direction of the probe mount, and the second linkage member includes a second rack engaged with the rotation gear and connected to the carrier, and a length direction of the second rack is a moving direction of the carrier.

4. The device for detecting the PCB according to claim 1, wherein a sliding rail is arranged on the frame, the length direction of the sliding rail is the switching direction of the bearing piece between the test station and the picking and placing station, the bearing piece is slidably connected to the sliding rail, a positioning piece is formed on the frame, the positioning piece is arranged on one side, opposite to the picking and placing station, of the test station, and the bearing piece can be abutted to the positioning piece when being positioned at the test station.

5. The device for detecting the PCB of claim 4, wherein the linkage assembly further comprises a slider, the second linkage member is connected with the slider, a chute is provided at the bottom of the carrier member, the slider is slidably disposed in the chute, two inner walls disposed in the chute at opposite intervals are a first abutment wall and a first limiting wall respectively, the direction of the first limiting wall facing the first abutment wall is the direction of the test station facing the pick-and-place station, the slider can be detachably connected with the first abutment wall, and when the carrier member abuts against the positioning member, the slider and the first limiting wall are disposed at intervals; or alternatively

The linkage assembly further comprises a sliding part, a sliding groove is formed in the sliding part, a limiting block is arranged at the bottom of the bearing part and slidably arranged in the sliding groove, the sliding direction of the limiting block in the sliding groove is the length direction of the sliding rail, two inner walls which are arranged at intervals in the sliding groove are respectively a second abutting wall and a second limiting wall, the direction of the second limiting wall faces to the second abutting wall is the direction of the test station towards the picking and placing station, the limiting block can be detachably connected with the second limiting wall, and when the bearing part abuts against the positioning part, the limiting block is arranged at intervals between the second abutting walls.

6. The PCB inspection apparatus of claim 5, wherein if the linkage assembly includes a slider, a magnetic attraction member is disposed on the first abutment wall of the chute, and the slider is capable of being attracted to the magnetic attraction member; or, an electromagnet is arranged on the first abutting wall of the sliding chute, a contact sensor is arranged on the positioning piece, the contact sensor is electrically connected with the electromagnet, the electromagnet can adsorb the sliding block, when the contact sensor senses the bearing piece, the electromagnet is controlled to be powered off, and when the contact sensor does not sense the bearing piece, the electromagnet is controlled to be powered on;

If the linkage assembly comprises a sliding piece, a magnetic attraction piece is arranged on the second limiting wall of the sliding groove, and the limiting block can be attracted with the magnetic attraction piece; or the second limiting wall is provided with an electromagnet, the positioning piece is provided with a contact sensor, the contact sensor is electrically connected with the electromagnet, the electromagnet can adsorb the limiting block, when the contact sensor senses the bearing piece, the electromagnet is controlled to be powered off, and when the contact sensor does not sense the bearing piece, the electromagnet is controlled to be powered on.

7. The device for inspecting a PCB of any one of claims 1-6, wherein the carrier further comprises a positioning template, the positioning template is disposed on the frame and is located between the carrier and the probe assembly, the positioning template is provided with a plurality of positioning holes, the plurality of positioning holes are aligned with the conductive probes one by one, and when the carrier moves to the testing station, the plurality of positioning holes are aligned with the testing points of the PCB to be inspected on the carrier one by one.

8. The PCB testing device of claim 7, wherein the positioning template is removably inserted on the frame; and/or

The positioning template is consistent with the structure of the PCB to be tested; and/or

The size of the cross section of the positioning hole tends to increase along the direction of the carrier toward the probe mount.

9. The PCB testing device of any one of claims 1-6, further comprising a power assembly disposed on the frame for driving the probe mount to move up and down.

10. The device for detecting the PCB of claim 9, wherein the power assembly includes a power source, a power shaft and a transmission sleeve, the power source is disposed on the frame, the power shaft is rotatably disposed on the frame, one end of the transmission sleeve is connected to the probe mounting member, the other end is sleeved on the power shaft and is in transmission connection with the power shaft, and the power source is used for driving the power shaft to rotate so as to drive the transmission sleeve to move up and down; the power shaft is hollow to form a wiring channel, the wiring channel is communicated with the space in the transmission sleeve, and a connecting wire on the conductive probe penetrates through the transmission sleeve and is arranged in the wiring channel in a penetrating mode.