CN218797471U

CN218797471U - Chip testing and screening equipment

Info

Publication number: CN218797471U
Application number: CN202222850425.4U
Authority: CN
Inventors: 陈晖�
Original assignee: Shenzhen Jiahejingwei Electronic Technology Ltd
Current assignee: Shenzhen Jiahejingwei Electronic Technology Ltd
Priority date: 2022-10-26
Filing date: 2022-10-26
Publication date: 2023-04-07
Anticipated expiration: 2032-10-26

Abstract

The utility model discloses a chip testing screening installation for the memory chip, wherein, chip testing screening installation includes that frame, transport mechanism, at least three groups bear mechanism, visual detection device and memory chip testing arrangement. The frame is provided with a feeding station, a visual detection station, a testing station, a good product discharging station and a defective product discharging station which are arranged at intervals along a first direction; after the visual detection device and/or the memory chip testing device test the chips, the chips are transferred to a good product blanking station or a defective product blanking station by a transfer mechanism arranged on the rack. The utility model discloses technical scheme relates to chip manufacturing technical field, this application utilizes transport mechanism will await measuring the chip operation between visual detection device and memory chip testing arrangement to direct letter sorting to different station baits after detecting reduces artifical the participation, reduces the human cost, improves production efficiency.

Description

Chip testing and screening equipment

Technical Field

The utility model relates to a chip manufacturing technical field, in particular to chip testing screening installation.

Background

With the development of technology, in order to make various electronic devices have more functionality and operability, different types of memory chips are often disposed in the electronic devices to be used as a storage medium for temporary data of an operating system or other programs being executed.

In the related art, in order to make the memory chip meet the functional requirements of the correspondingly mounted electronic device, manufacturers of the memory chip usually test the performance of the memory chip and further screen defective products. The memory chips produced in batch are manually transferred and detected in the visual detection equipment and the software test equipment, and then are manually sorted and loaded and unloaded according to the detection result of the equipment.

However, it takes a lot of time and management cost to manually perform testing and screening, and manual screening is also prone to cause misjudgment due to physical fatigue of testers in the sorting process, thereby affecting the sorting effect after screening.

SUMMERY OF THE UTILITY MODEL

The utility model aims at providing a chip testing screening installation aims at overcoming above-mentioned prior art not enough, reduces artifical the participation, combines memory chip's test and screening process, promotes memory chip's production efficiency.

In order to achieve the above object, the utility model provides a chip testing screening installation includes that support piece, transport mechanism, three at least groups bear mechanism, visual detection device and memory chip testing arrangement. The supporting piece is provided with a feeding station, a visual detection station, a testing station, a good product discharging station and a defective product discharging station which are arranged at intervals along a first direction; the transfer mechanism is arranged on the supporting piece and used for transferring the chip in a moving way along a first direction; the three groups of bearing mechanisms are respectively arranged on the feeding station, the good product discharging station and the bad product discharging station; the visual detection device is arranged at the visual detection station and used for carrying out appearance detection on the memory chip; the memory chip testing device is arranged at the testing station and used for testing the memory chip.

The utility model relates to an embodiment, transport mechanism is including transporting the frame, transporting the slide rail and getting the material subassembly. The transfer rack is fixedly connected with the supporting piece; the transfer slide rail is arranged on the transfer rack and extends along the first direction; get material subassembly swing joint in the slide rail, it is used for snatching to get the material subassembly the chip will the chip is along first direction transmission.

The utility model discloses an embodiment, get the material subassembly and include the sliding plate and get the material manipulator. The sliding plate is connected with the transfer sliding rail in a sliding manner; the material taking robot is arranged on the sliding plate and used for grabbing or releasing the chip.

The utility model discloses an embodiment, get the material subassembly and include two at least material taking machine hands, two at least material taking machine hands symmetry are located the sliding plate.

The utility model relates to an embodiment, get the material subassembly still including promoting the slide rail, promoting the slide rail and promoting the structure. The lifting slide rail is arranged on the sliding plate and extends along the height direction; the lifting slide rail is connected with the lifting slide rail in a sliding manner; the lifting structure is arranged on the lifting slide rail, the material taking robot hand is arranged on the lifting structure, and the lifting structure drives the material taking robot hand to lift.

The utility model provides an embodiment, memory chip testing arrangement includes frame, positioning jig, pressing mechanism and test assembly. The frame is provided with a first slide rail groove, the positioning jig is fixedly connected to the frame and extends along a first direction, one end of the positioning jig, which is located in the first direction, is provided with a test space for placing a memory chip, and the first slide rail groove extends towards the positioning jig; the pressing mechanism is provided with an abutting part and is connected with the first slide rail groove in a sliding manner, so that the abutting part can be lifted along with the sliding of the pressing mechanism above the test space; the test assembly comprises a test board and a control board, the control board is arranged on the rack, the test board is inserted into the positioning jig and positioned on the lower side of the test space, and the test board is electrically connected with the control board.

In an embodiment of the present invention, the pressing mechanism is defined to face the extending direction of the positioning fixture is the second direction, and the pressing mechanism includes a lifting structure and a guiding component. The lifting structure is arranged on the rack; the guide assembly comprises a supporting plate, a support and a handle, the supporting plate is fixed on the upper side of the lifting structure, the support is movably connected to the supporting plate and can slide along the second direction, the handle is fixedly connected to the support, the first slide rail groove is obliquely arranged along the height direction, the handle is slidably connected to the first slide rail groove, the abutting part is arranged on one side, close to the positioning jig, of the support, the lifting structure drives the supporting plate to lift, and the first slide rail groove and the handle guide the supporting plate to slide along the second direction when the supporting plate is lifted.

In an embodiment of the present invention, the positioning fixture includes a base, a clamping member 33 and a positioning member. The base is fixedly connected to the rack; the clamping piece is fixedly connected to the upper side of the base, and an insertion space for the test board to be inserted is defined by the clamping piece and the base; the clamping piece is provided with an installation groove, the positioning piece is movably installed in the installation groove, the positioning piece is provided with a positioning hole, and the installation groove and the positioning hole enclose a testing space for the memory chip to be placed.

In an embodiment of the present invention, the bearing mechanism includes a bearing rail and a bearing platform. The bearing guide rail is arranged on the supporting piece; the bearing platform is connected to the bearing guide rail in a sliding mode and used for placing the chip.

The utility model discloses an embodiment, chip test screening installation still includes control module, control module includes operating panel and observes and controls the screen. The operation panel is arranged on the supporting piece, is electrically connected with the transferring mechanism and the at least three groups of bearing mechanisms, and is used for controlling the transferring mechanism and the at least three groups of bearing mechanisms to move; the measurement and control screen is arranged on the supporting piece and electrically connected with the vision detection device and the memory chip testing device, and the measurement and control screen is used for controlling the vision detection device and displaying a detection result and controlling the memory chip testing device and displaying a detection result.

The utility model discloses technical scheme will await measuring the chip operation between visual detection device and memory chip testing arrangement through adopting transport mechanism to the testing result that obtains according to the testing result that visual detection device obtained and/or memory chip testing arrangement after detecting carries out the unloading process with memory chip letter sorting to yields unloading station or defective products unloading station, reduces artifical the participation, reduces the human cost, improves production efficiency.

Drawings

In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings needed to be used in the description of the embodiments or the prior art will be briefly described below, it is obvious that the drawings in the following description are only some embodiments of the present invention, and for those skilled in the art, other drawings can be obtained according to the structures shown in the drawings without creative efforts.

FIG. 1 is a schematic structural diagram of an embodiment of the chip testing and screening apparatus of the present invention;

FIG. 2 is a schematic diagram illustrating a structure of the hidden upper housing and the control module in the embodiment of FIG. 1;

FIG. 3 is a schematic structural diagram of the embodiment of FIG. 1 with the upper housing, the control module and the inner housing hidden;

FIG. 4 is a schematic structural view of the transfer mechanism of the embodiment of FIG. 1;

FIG. 5 is a schematic view of the material take-off assembly of the embodiment of FIG. 1;

FIG. 6 is a schematic structural diagram of the memory chip testing apparatus in the embodiment of FIG. 1;

FIG. 7 is an exploded view of the memory chip testing apparatus of FIG. 1;

fig. 8 is an exploded view of the positioning fixture and the testing board in the embodiment of fig. 1.

The reference numbers illustrate:

the realization, the functional characteristics and the advantages of the utility model are further explained by combining the embodiment and referring to the attached drawings.

Detailed Description

The technical solutions in the embodiments of the present invention will be described clearly and completely with reference to the accompanying drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only some embodiments of the present invention, not all embodiments. Based on the embodiments of the present invention, all other embodiments obtained by a person skilled in the art without making creative efforts belong to the protection scope of the present invention.

It should be noted that all the directional indicators (such as up, down, left, right, front, back \8230;) in the embodiments of the present invention are only used to explain the relative position relationship between the components, the motion situation, etc. in a specific posture (as shown in the attached drawings), and if the specific posture is changed, the directional indicator is changed accordingly.

In addition, the descriptions related to "first", "second", etc. in the present invention are for descriptive purposes only and are not to be construed as indicating or implying relative importance or implicit ly indicating the number of technical features indicated. Thus, a feature defined as "first" or "second" may explicitly or implicitly include at least one of the feature. In addition, the technical solutions in the embodiments may be combined with each other, but it must be based on the realization of those skilled in the art, and when the technical solutions are contradictory to each other or cannot be realized, such a combination should not be considered to exist, and is not within the protection scope of the present invention.

The utility model provides a chip testing screening installation 1000.

As shown in fig. 1 to 8, the chip testing and screening apparatus 1000 includes a support 300, a transferring mechanism 500, at least three sets of carrying mechanisms 700, a vision inspection device 900, and a memory chip testing device 100. The supporting piece 300 is provided with a feeding station, a visual detection station, a testing station, a good product discharging station and a defective product discharging station which are arranged at intervals along a first direction; the transfer mechanism 500 is arranged on the support 300, and the transfer mechanism 500 is used for transferring the chip in a first direction; the three groups of bearing mechanisms 700 are respectively arranged at a feeding station, a good product discharging station and a bad product discharging station; the visual inspection device 900 is arranged at a visual inspection station and used for performing appearance inspection on the memory chip; the memory chip testing device 100 is disposed at a testing station and used for testing a memory chip.

Specifically, in the working process, the transferring mechanism 500 absorbs the memory chips to be tested, and the memory chips are sequentially transferred among the feeding station, the visual inspection station, the testing station, the good product discharging station and the defective product discharging station 1 which are arranged on the support 300 at intervals along the first direction. At the loading station, the memory chip to be tested is loaded on the loading mechanism 700 disposed at the loading station, and the transferring mechanism 500 sucks the memory chip loaded on the loading mechanism 700 and transfers the memory chip along the first direction when the working process starts. When the memory chips are transmitted to the visual detection station, the appearance of the memory chips to be tested is detected by the visual detection device 900, the memory chips to be tested, the appearance of which does not meet the requirement of the detection, are directly transmitted to the bearing mechanism 700 arranged at the defective product blanking station by the transfer mechanism 500 and are blanked, the memory chips to be tested, the appearance of which meets the requirement of the detection, are continuously transmitted to the test station by the transfer mechanism 500, the memory chip test device 100 performs software test on the memory chips and further transmits the test result to the good product blanking station or the defective product blanking station to complete the whole memory chip test screening process.

So set up, the chip test screening installation 1000 of this application combines the visual detection process and the software test process in the test process of memory chip to same equipment in order, has improved the production efficiency of memory chip, reduces artifical the participation, reduces the human cost.

As shown in fig. 1 to fig. 4, in an embodiment of the present invention, the transferring mechanism 500 includes a transferring rack 501, a transferring slide rail 503, and a material taking assembly 505. The transfer rack 50 is fixedly connected with the support 300; the transfer slide rail 503 is arranged on the transfer rack 501, and the transfer slide rail 503 extends along a first direction; get material subassembly 505 swing joint in slide rail, get material subassembly 505 and be used for snatching the chip and pass the chip along first direction.

It can be understood that, in order to guarantee that the memory chip that awaits measuring can be accurate in the first direction be transmitted to corresponding spatial position, have certain requirement to getting the precision when material subassembly 505 and transporting frame 501 swing joint, slide rail and slider can have higher precision when not influencing the direction effect as the part of common direction rectilinear motion, satisfy this embodiment to getting the required precision of material subassembly 505 when transporting frame 501 and moving. Similarly, the slide rail and the slide block are low in maintenance cost and stable and reliable in performance, and the stability of the chip testing and screening device 1000 in the embodiment is further improved.

Referring to fig. 1-5 in combination, in an embodiment of the present invention, the material taking assembly 505 includes a sliding plate 505a and a material taking robot 505b. The sliding plate 505a is slidably connected to the transfer slide 503; the material taking robot 505b is provided on the sliding plate 505a, and the material taking robot 505b is used for grabbing or releasing a chip.

It can be understood that, in the movement process after the material taking robot 505b arranged on the sliding plate 505a sucks a chip, the position needs to be adjusted along the height direction in addition to the movement along the first direction, the transfer slide rail 503 meets the movement requirement of the material taking robot 505b in the first direction in the material operation process, and the sliding connection arrangement of the material taking robot 505b and the sliding plate 505a meets the movement requirement of the material taking robot 505b in the height direction in the material operation process. So set up, transport slide rail 503 and sliding plate 505a linkage ground and make material taking robot 505b can be in the nimble motion of direction of height and first direction to appointed spatial position, satisfied the demand of test, further improved the job stabilization nature of the chip test screening installation 1000 of this application.

As shown in fig. 1 to 5, in an embodiment of the present invention, the material taking assembly 505 includes at least two material taking robots 505b, and the at least two material taking robots 505b are symmetrically disposed on the sliding plate 505a.

It should be noted that at least two material extracting robots 505b are disposed on two symmetrical sides of the sliding plate 505a, and the at least two symmetrically disposed material extracting robots 505b can move independently. Specifically, in the working process, at least two material taking robots 505b can simultaneously absorb and transfer at least two memory chips to be tested, the memory chips to be tested which are transferred to the appearance detection station and are not qualified after being detected by the vision detection device 900 can be firstly absorbed on the corresponding material taking robots 505b, the memory chips to be tested which are additionally arranged on the sliding plate 505a and are to be transferred to the next station together with the chips on at least one material taking robot 505b, at the moment, the memory chips to be tested which are qualified in appearance detection are placed on the memory chip testing device 100 by the corresponding robots and are subjected to software testing, the memory chips which are not qualified in appearance detection are absorbed by the corresponding robots and are lifted for waiting, and after the software testing process of the memory chips to be tested which are qualified in appearance detection is finished, the transfer process is continuously carried out together and the memory chips to be tested are respectively transferred to the corresponding good product blanking stations and/or defective product blanking stations so as to complete the whole testing and screening process of the memory chips.

As shown in fig. 1 to fig. 5, in an embodiment of the present invention, the material taking assembly 505 further includes a lifting slide rail 505c, and a lifting structure 505e. The lifting slide rail 505c is arranged on the sliding plate 505a, and the lifting slide rail 505c extends along the height direction; the lifting slide rail 505c is slidably connected to the lifting slide rail 505c; promote structure 505e and locate and promote slide rail 505c, get material robot 505b and locate and promote structure 505e, promote structure 505e drive and get material robot 505b and go up and down.

It will be appreciated that the provision of the lifting slide 505c and the lifting slide 505c improves the accuracy of the sliding movement of the material extracting robot 505b, which is slidably coupled to the sliding plate 505a, in the height direction. Further, a lifting structure 505e is provided on the lifting slide rail 505c, and the lifting structure 505e can change the spatial position of the material taking robot 505b in the height direction again within a certain range. By combining the lifting slide rail 505c with the lifting slider 505d and the lifting structure 505e, the material taking robot 505b provided on the lifting structure 505e has two controllable displacements in the height direction. So set up, the required high position setting when getting material machine hand 505b through the visual inspection station can be corresponded to the displacement distance of first section promotion slide rail 505c and promotion slider 505d, when passing through the visual inspection station, promotes promotion slider 505d on the slide rail 505c and drives and get material machine hand 505b and go up and down to the assigned position. Correspondingly, the displacement distance of the lifting structure 505e is set corresponding to the difference between the height position required by the visual detection station and the height position required by the test station, when the memory chip to be tested is transferred from the visual detection station to the test station, the positions of the lifting slide rail 505c and the lifting slide block 505d are kept unchanged, and the spatial position of the material taking robot 505b is changed only by the lifting structure 505e, so that the purpose of software testing is achieved. Therefore, the times that the robot hand needs to be adjusted in the height direction are reduced, errors possibly generated in the working process are reduced, and the chip transmission precision and the working stability of the chip testing and screening equipment 1000 are further improved.

For example, in an embodiment of the present application, the lifting structure 505e may be selected as a cylinder. The cylinder is used as a common accessory for providing linear reciprocating motion power, and has stable and reliable performance, low required cost, small volume, flexibility and convenience. Of course, the lifting structure 505e may also be an oil hydraulic cylinder, an electric cylinder, or a lead screw assembly, which is not limited herein. It can be understood that, when choosing the cylinder for use as promoting structure 505e, promote structure 505e including promoting cylinder body and swing joint in the promotion piston rod that promotes the cylinder body, promote the cylinder body and locate and promote slider 505d, the piston rod deviates from the one end fixed connection who promotes the cylinder body and gets material manipulator 505b in order to drive and get material manipulator 505b and change spatial position.

As shown in fig. 1 to fig. 7, in an embodiment of the present invention, the memory chip testing apparatus 100 includes a frame 10, a positioning fixture 30, a pressing mechanism 50, and a testing component 70. The rack 10 is provided with a first slide rail groove 11, the positioning jig 30 is fixedly connected to the rack 10 and extends along a first direction, one end of the positioning jig 30 located in the first direction is provided with a test space for placing a memory chip, and the first slide rail groove 11 extends towards the positioning jig 30; the pressing mechanism 50 is provided with an abutting piece 51, and the pressing mechanism 50 is connected to the first slide rail groove 11 in a sliding manner, so that the abutting piece 51 can be lifted and lowered along with the sliding of the pressing mechanism 50 above the test space; the testing assembly 70 includes a testing board 71 and a control board 73, the control board 73 is disposed on the frame 10, the testing board 71 is inserted into the positioning fixture 30 and located at a lower side of the testing space, and the testing board 71 is electrically connected to the control board 73.

In the testing process, the memory chip to be tested is horizontally placed in the testing space enclosed in the positioning fixture 30, the pressing mechanism 50 slides in a guiding manner through the first slide rail groove 11 arranged on the rack 10 to drive the abutting part 51 arranged on one side of the pressing mechanism 50 close to the positioning fixture 30 to press the memory chip to be tested, so that one side of the memory chip departing from the abutting part 51 is electrically conducted with the testing component 70 arranged below the testing space to be tested, after the testing process is finished, the abutting part 51 is lifted again and does not abut against the memory chip to be tested, the material taking robot 505b takes out the memory chip to be tested, and transmits the testing result to the bearing mechanism 700 arranged at a good product station or a bad product station, thereby completing the whole testing and screening process of the memory chip. By the arrangement, the manual participation in the testing process of the memory chip in the pressing process of the abutting part 51 is reduced, and the production efficiency is high.

Referring to fig. 1 to 8, in an embodiment of the present invention, the extending direction of the pressing mechanism 50 toward the positioning fixture 30 is defined as a second direction, and the pressing mechanism 50 includes a lifting structure 53 and a guiding assembly 55. The lifting structure 53 is arranged on the frame 10; guide assembly 55 includes backup pad 551, support 553 and handle 555, backup pad 551 is fixed in the elevation structure 53 upside, support 553 swing joint in backup pad 551, and can slide along the second direction, handle 555 fixed connection in support 553, first slide rail groove 11 sets up along direction of height slope, handle 555 slide connection in first slide rail groove 11, support 553 is located to the butt piece 51 is close to the one side of positioning jig 30, elevation structure 53 drives backup pad 551 and goes up and down, first slide rail groove 11 and handle 555 guide backup pad 551 slides along the second direction when going up and down.

It should be noted that the lifting structure 53 provided on the frame 10 is an air cylinder in this embodiment, but may be an oil cylinder, an electric cylinder, a screw rod assembly, or other accessories capable of providing a linear reciprocating motion power, and the invention is not limited thereto. It can be understood that, when the cylinder is selected as the lifting structure 53, the lifting structure 53 includes a cylinder body and a piston rod movably connected to the cylinder body, the cylinder body is disposed on the frame 10, and the piston rod movably connected to the cylinder body is away from the supporting plate 551 fixedly connected to the guiding component 55 at one end of the cylinder body.

Specifically, during the operation of the pressing mechanism 50, the piston rod vertically reciprocates in the height direction within the horizontally disposed cylinder body to drive the holder 553 and the pull handle 555 provided on the support plate 551 to move in the height direction. It should be noted that the handle 555 fixedly connected to the bracket 553 is also movably connected to the first slide rail groove 11 of the rack 10, the first slide rail groove 11 is disposed in a height direction, and when the handle 555 moves in the height direction, the handle is guided by the first slide rail groove 11 and moves closer to the positioning fixture 30 in the second direction. Further, the movement of the handle 555 indirectly drives the abutting piece 51 disposed on one side of the support 553 close to the positioning fixture 30 to move close to the positioning fixture 30. In this way, the abutting member 51 can move away from the testing space of the positioning fixture 30 while ascending, and correspondingly, the abutting member 51 moves close to the testing space of the positioning fixture 30 while descending under the combined action of the lifting structure 53 and the guiding component 55. The lifting structure 53 and the guide assembly 55 which are arranged in a linkage manner occupy small space, are compact in structural arrangement, small in required space, flexible and convenient, and low in required cost.

Referring to fig. 1 to 8, in an embodiment of the present invention, the positioning fixture 30 includes a base 31, a clamping member 33, and a positioning member 35. The base 31 is fixedly connected to the frame 10; the clamping member 33 is fixedly connected to the upper side of the base 31, and the clamping member 33 and the base 31 enclose an insertion space for inserting the test board 71; the clamping member 33 is provided with a mounting groove 331, the positioning member 35 is movably mounted in the mounting groove 331, the positioning member 35 is provided with a positioning hole 351, and the mounting groove 331 and the positioning hole 351 enclose a testing space for placing a memory chip.

It should be noted that the base 31 fixedly connected to the frame 10 is used for carrying the clamping member 33 and the positioning member 35 on the base 31. The base 31 and the clamping member 33 enclose an insertion space of a recess, and the positioning hole 351 of the positioning member 35 encloses a testing space located at an upper side of the insertion space. In the process of testing the memory chip, the testing board 71 of the testing assembly 70 is inserted into the insertion space, and the memory chip to be tested placed in the testing space is pressed by the abutting member 51 of the pressing mechanism 50 to electrically conduct the testing board 71 in the insertion space. With the arrangement, different test boards 71 can be flexibly replaced according to different test items required by the memory chip to achieve the test purpose, and the test boards 71 can be replaced when loss or faults occur. With such a configuration, the universality and the adaptability of the memory chip testing device 100 of the present application are increased, and the service life of the memory chip testing device 100 is prolonged.

It can be understood that the positioning holes 351 of the positioning member 35 movably mounted in the mounting recess 331 are configured to have a shape matching the external dimensions of the memory chips to be tested, and when testing memory chips with different dimensions, the testing purpose can also be achieved by replacing different positioning members 35 with positioning holes 351 having different dimensions. With such an arrangement, the versatility and the adaptability of the memory chip testing apparatus 100 are further increased.

As shown in fig. 1 to 3, in an embodiment of the present invention, the supporting mechanism 700 includes a supporting rail 701 and a supporting platform 703. The bearing guide rail 701 is arranged on the support 300; the bearing platform 703 is slidably connected to the bearing rail 701, and the bearing platform 703 is used for placing a chip. It can be appreciated that the connection between the load-bearing rails 701 and the load-bearing platform 703 facilitates the precision of the movement process of loading or unloading the memory chips on the load-bearing platform 703.

In an embodiment of the present application, the bearing rail 701 may be a linear module, and the bearing platform 703 is movably connected to the bearing rail 701. In the testing process of memory chip, when the material taking robot 505b in the transfer mechanism 500 moves to the corresponding station, the sliding table on the bearing mechanism 700 arranged at the corresponding station correspondingly moves to the position under the material taking robot 505b, the material taking robot 505b ascends or descends along the height direction to complete the taking or releasing of the chip, the bearing mechanism 700 arranged in this way is simple in structure and easy to maintain, and the stability and the working efficiency of the chip testing and screening equipment 1000 are further improved.

As shown in fig. 1 to fig. 3, in an embodiment of the present invention, the chip testing and screening apparatus 1000 further includes a control module 800, and the control module 800 includes an operation panel 801 and a measurement and control screen 803. The operation panel 801 is disposed on the support 300, the operation panel 801 is electrically connected to the transferring mechanism 500 and the at least three sets of bearing mechanisms 700, and the operation panel 801 is used for controlling the transferring mechanism 500 and the at least three sets of bearing mechanisms 700 to move; the monitor screen 803 is disposed on the supporting member 300, the monitor screen 803 is electrically connected to the vision inspection apparatus 900 and the memory chip testing apparatus 100, and the monitor screen 803 is used for controlling the vision inspection apparatus 900 and displaying the testing result, and for controlling the memory chip testing apparatus 100 and displaying the testing result.

It should be noted that the supporting member 300 includes a supporting platform 301, an upper housing 303 and an inner housing 305. The loading station, the visual inspection station, the testing station, the good product unloading station and the defective product unloading station are disposed at an interval on the supporting platform 301 along a first direction, and the transferring mechanism 500, the at least three sets of bearing mechanisms 700, the visual inspection device 900 and the memory chip testing device 100 are accommodated in the accommodating space in the inner cavity of the upper housing 303.

Further, the memory chip testing device 100 disposed at the testing station is accommodated in the inner cavity of the inner case 305. The inner case 305 reduces the influence of external environment such as dust on the testing and screening process of the whole memory chip, and ensures the working stability of the chip testing and screening device 1000. It can be understood that the requirement of the working environment of the memory chip testing apparatus 100 is higher than that of the transportation mechanism 500 and the carrying mechanism 700 when operating, and the inner housing 305 is disposed to prevent the memory chip testing apparatus from being affected by external environment such as dust. Therefore, the testing precision and the working stability of the chip testing and screening equipment 1000 are further improved.

It can be understood that the operation panel 801 and the measurement and control screen 803 are both disposed on the upper housing 303, the settings of the operation panel 801 and the measurement and control screen 803 provide a plurality of different control operation modes for a user of the chip testing and screening device 1000, and various data required in the working process and various data required for control are displayed on the measurement and control screen 803 in real time, so that the whole testing and screening process is visualized, and the working accuracy and working efficiency of the chip testing and screening device 1000 in the testing and screening process of chips are improved.

The above only is the preferred embodiment of the present invention, not so limiting the patent scope of the present invention, all under the inventive concept of the present invention, the equivalent structure transformation made by the contents of the specification and the drawings is utilized, or the direct/indirect application in other related technical fields is included in the patent protection scope of the present invention.

Claims

1. A chip test screening apparatus for memory chips, the chip test screening apparatus comprising:

the supporting piece is provided with a feeding station, a visual detection station, a testing station, a good product discharging station and a defective product discharging station which are arranged at intervals along a first direction;

the transfer mechanism is arranged on the supporting piece and used for transferring the chip in a moving manner along the first direction;

the three bearing mechanisms are respectively arranged on the feeding station, the good product discharging station and the bad product discharging station;

the visual detection device is arranged at the visual detection station and is used for performing appearance detection on the memory chip; and

the memory chip testing device is arranged at the testing station and used for testing the memory chip.

2. The chip testing screening apparatus of claim 1, wherein the transfer mechanism includes:

the transfer rack is fixedly connected with the supporting piece;

the transfer slide rail is arranged on the transfer rack and extends along the first direction; and

get the material subassembly, get material subassembly swing joint in the slide rail, get the material subassembly and be used for snatching the chip will the chip is followed the first direction transmission.

3. The chip testing and screening apparatus of claim 2, wherein the take-off assembly comprises:

the sliding plate is connected with the transfer sliding rail in a sliding manner; and

and the material taking robot is arranged on the sliding plate and is used for grabbing or releasing the chip.

4. The chip testing and screening apparatus of claim 3, wherein the picking assembly includes at least two picking robots symmetrically disposed on the sliding plate.

5. The chip testing and screening apparatus of claim 3, wherein the take-off assembly further comprises:

the lifting slide rail is arranged on the sliding plate and extends along the height direction;

the lifting slide rail is connected with the lifting slide rail in a sliding manner; and

the lifting structure is arranged on the lifting slide rail, the material taking manipulator is arranged on the lifting structure, and the lifting structure drives the material taking manipulator to lift.

6. The chip test screening apparatus according to any one of claims 1 to 5, wherein the memory chip test device includes:

the device comprises a rack, a first guide rail and a second guide rail, wherein the rack is provided with a first slide rail groove;

the positioning jig is fixedly connected to the rack and extends along a first direction, a testing space for placing a memory chip is arranged at one end of the positioning jig in the first direction, and the first slide rail groove extends towards the positioning jig;

the pressing mechanism is provided with an abutting part and is connected with the first slide rail groove in a sliding manner, so that the abutting part can be lifted along with the sliding of the pressing mechanism above the test space; and

the test assembly comprises a test board and a control board, the control board is arranged on the rack, the test board is inserted into the positioning jig and is positioned on the lower side of the test space, and the test board is electrically connected with the control board.

7. The apparatus of claim 6, wherein the extending direction of the pressing mechanism toward the positioning fixture is defined as a second direction, and the pressing mechanism comprises:

the lifting structure is arranged on the rack; and

the guide assembly comprises a supporting plate, a support and a handle, the supporting plate is fixed on the upper side of the lifting structure, the support is movably connected to the supporting plate and can slide along the second direction, the handle is fixedly connected to the support, the first sliding rail groove is obliquely arranged along the height direction, the handle is slidably connected to the first sliding rail groove, the abutting part is arranged on one side, close to the positioning jig, of the support, the lifting structure drives the supporting plate to lift, and the first sliding rail groove and the handle guide the supporting plate to slide along the second direction when the supporting plate lifts.

8. The chip testing and screening apparatus of claim 6, wherein the positioning fixture comprises:

the base is fixedly connected to the rack;

the clamping piece is fixedly connected to the upper side of the base, and an insertion space for the test board to be inserted is defined by the clamping piece and the base; and

the memory chip testing device comprises a positioning piece, wherein the clamping piece is provided with a mounting groove, the positioning piece is movably mounted in the mounting groove and provided with a positioning hole, and the mounting groove and the positioning hole enclose a testing space for the memory chip to be placed.

9. The chip testing and screening apparatus of any one of claims 1 to 5, wherein the carrying mechanism comprises:

the bearing guide rail is arranged on the supporting piece; and

the bearing platform is connected to the bearing guide rail in a sliding mode and used for placing the chip.

10. The chip test screening apparatus of any one of claims 1 to 5, further comprising a control module, the control module comprising:

the operation panel is arranged on the supporting piece and is electrically connected with the transfer mechanism and the at least three groups of bearing mechanisms, and the operation panel is used for controlling the transfer mechanism and the at least three groups of bearing mechanisms to move; and

observe and control the screen, observe and control the screen and locate support piece, observe and control screen electric connection visual detection device reaches memory chip testing arrangement, observe and control the screen and be used for control visual detection device shows the testing result to and, be used for control memory chip testing arrangement shows the testing result.