200928397 九、發明說明： .【發明所屬之技術領域】 本發明係關一種測試夾具，尤指一種對電路板進行測 試之測試夾具。 ' 【先前技術】 在電腦之組成結構中，有一個很重要之部分，就是圮 憶體。S己憶體疋用來存儲程式和資料之部件，對於電腦來 說，有了記憶體，才有記憶功能，才能保證正常工作，目 ®前DDR (DOUBLE DATA RAGE)記憶體已成為最主流之 記憶體產品。為保證DDR記憶體之正常工作，我們需要 對其時鐘訊號，控制訊號，定址訊號，資料讀寫訊號等進 行訊號完整性測試。該項測試主要是在DDR記憶體工作 之時候對以上訊號之高、低電平，頻率，週期，建立保 時間等參數進行驗證。 '、 為對DDR記憶體之時鐘訊號，控制訊號，定址訊號， ❹資料讀寫訊號進行訊號完整性量測，目前我們先是從 記憶體上所預留之測試點上用金屬線焊接出測試延長線來 引出上述幾個讯號，然後再用測試儀上之探棒進行探測.。 、之所以使用測試延長線來引出上述幾個訊號，是因為記憔 體在主機板上所處位置以及記憶體之間之空間所限制^ 試儀之探棒不能直接接觸記憶體之測試點以進行訊號之捕 獲而疋要在把憶體之測試點上焊接一根測試延長線 供探棒測試。 -采 這樣我們每測試一組訊號就需要在相對應之記憶體測 5 200928397 試點上焊接測試延長線供測試儀之探棒進行探測，此種測 胃試過程會造成以下弊端： 1.由於DDR記憶體之測試點焊盤很小，點與點之分佈 =密’ &成焊接測試延長線非常困難，而且賴延長線很 谷易松脫’掉落’這時需要重新焊接才能繼續測試，而這 在DDR需要測試多組訊號時，嚴重影響到了訊號完 驗證之效率。 ❻ 2·該測試延長線之焊接存在焊接不充分，虛焊等現 ’衫響到訊號完整性驗證之品質。 3.該測試延長線之焊接必須在測試某—組之前完成， 當要進行下一組訊號之測試時，必須先關機，取下DDR 5憶體’去除上—次之測試延長線，重新焊接，插上記憶 ，開機繼續測試這樣—個流程，過程煩靖，效率低下。 4·反復在DDR記憶體上焊接測試延長線，極易造成記 憶體之抽壞，增加了測試驗證之成本。 ❹【發明内容】 兩曰蓉於以上内纟，有必、要提供一種電路板測試爽具，不 需焊接測試延長線即能方便測試電路板。 -種電路板職夾具，包括—夹持件及固定於該爽持 之探測件，該探測件包括兩測試探針，該夾持件 待測電路板上，並且可使該探測件上之一測試探 十^待測電路板上之測試點電性接觸，另—測試探針可 連接一測試儀之探棒。 相較習知技術，該電路板測試夹具應用該失持件央持 6 200928397 待測電路板，並將該探測件之一測試探針與該待測電路板 ，上之測试點電性接觸，再將該探 、 ^^ ^ „ 、j件之另一測試探針與測 • ^ 探連P可方便地對該待測電路板進行測 3式，省去了重複焊接測試延長f 、 、焚深之裱郎，杜絕了因 長線焊接瑕疲而引起之測量不精 、 同時也大大提高了測試效率確及㈣電路板等問題， 【實施方式】 請一併參考圖1及圖2，太菸兩灿， ❹#音#古彳a + x月電路板測試夾具之較 及一探測件20,該夾持件 包括兩夾持板12、14及-扭力彈菁16，該兩夹 14相互面狀侧面上线㈣之兩邊處賴設有半圓形 連接部丄22及142,該半圓形連接部⑵及⑷上均設有 一圓形通孔（未標號）。 組裝時’該扭力彈簧16套在—圓柱形套接部Μ上， 將該囫柱形套接部18之兩端分別穿套在該半圓形 ® 122及142上之圓柱形通孔中，該夾持件K)便具有了夾; 功該兩夹持㈣、14相互面對之側面上還設有絕緣防 )月層124及144,以便更好地失持待測電路板。 本實施方式中，該探測件2〇具有—連接部22及分別 位於該連接部22兩端之兩測試探針24及26，該連接部u 透過該夾持板12上之兩固定元件126固定在該夾持板η 上。該探測件20底部之測試探針24與連接部以垂直且位 於該夾持件12底端下方之-小段距離處，用於有效接觸待 測電路板上之測試點。該探測件2〇頂部之測試探針％自 7 200928397 連接部22雙垂直彎折後繼續垂直向上延伸，用於連接測試 儀上之探棒。該夾持板12、14之外側面上部均設有複數防 滑槽128，以產生防滑之作用。 Ο 請繼續一併參考圖3至圖6，當測試一電路板30 (如 5己憶體）時，將該電路板測試夾具之夾持件1〇打開，再將 其夾持在該電路板30上，以使其上之探測件2〇之測試探 針24與該電路板30之測試點有效地電性接觸，然後將測 試儀上之探棒40與該探測件2〇之測試探針％有效電性連 接，啟動測試儀即可為該電路板3〇進行相應之測試。如果 該電路板3G上之測試點不僅有—個時，可相應地使用多個 本發明電路板測試夾具來進行對應之測試，十分方便，這 種測試方法可省去重複焊接測試延長線之環節，也杜絕了° 因測試延長線焊接瑕㈣引起之測量不精確及損壞電路板 等問題，同時也大大提高了測試效率，節省了測試成本。 Ο 綜上所述，本發明符合發明專利要件，爰依法提出專 '°月惟，以上所述者僅為本發明之較佳實施方式，舉 案技藝之人士 ’在爱依本發明精神所作之等效修 飾或變化’皆應涵蓋於以下之中請專利範圍内。 【圖式簡單說明】 圖。圖1係本發明電路板測試夾具較佳實施方式之主視 圖2係圖1之左視圖。 示意^係圖1中電路板測試夹具夹持一電路板時之正面 200928397 圖4係圖3之左視圖。 圖5係一測試儀之探棒連接圖3中電路板測試失具 正面示意圖。 ” 圖6係圖5之左視圖。 【主要元件符號說明】200928397 IX. Description of the invention: [Technical field to which the invention pertains] The present invention relates to a test fixture, and more particularly to a test fixture for testing a circuit board. [Prior Art] In the composition of the computer, there is a very important part, which is the memory. S memory is used to store programs and data components. For computers, with memory, memory is available to ensure proper operation. DDR (DOUBLE DATA RAGE) memory has become the mainstream. Memory products. In order to ensure the normal operation of DDR memory, we need to perform signal integrity test on its clock signal, control signal, address signal, data read and write signal. This test mainly verifies the parameters such as the high, low level, frequency, period, and setup time of the above signals when the DDR memory is working. ', for the DDR memory clock signal, control signal, address signal, ❹ data read and write signals for signal integrity measurement, we are currently from the test points reserved on the memory with metal wire soldering test extension Line to extract the above signals, and then use the probe on the tester to detect. The reason why the test extension cable is used to extract the above signals is because the position of the body on the motherboard and the space between the memory are limited. The probe of the tester cannot directly contact the test point of the memory. To capture the signal, a test extension cord is soldered to the test point of the memory. - In this way, every time we test a group of signals, we need to test the extension of the test tester on the corresponding test of the memory test 5 200928397. This kind of stomach test process will cause the following drawbacks: 1. Due to DDR memory The test point of the body is small, the distribution of points and points = dense ' & welding test extension line is very difficult, and the extension line is very easy to loose 'drop' then need to re-weld to continue testing, and this is in DDR When multiple sets of signals need to be tested, the efficiency of verifying the signal is seriously affected. ❻ 2. The soldering of the test extension cord is insufficiently soldered, and the soldering of the current soldering is the quality of the signal integrity verification. 3. The soldering of the test extension cord must be completed before testing a certain group. When testing the next group of signals, it must be shut down first, remove the DDR 5 memory, remove the upper-second test extension cable, re-solder Insert the memory, start the test and continue the test. This process is troublesome and inefficient. 4. Repeatedly soldering the test extension cable on the DDR memory, it is easy to cause the memory to be damaged, which increases the cost of test verification. ❹【Contents of the Invention】 In the above, it is necessary to provide a circuit board test and cool, and it is convenient to test the circuit board without welding test extension. a circuit board fixture comprising: a clamping member and a detecting member fixed to the cooling, the detecting member comprising two test probes, the clamping member to be tested on the circuit board, and one of the detecting members The test probe 10 is electrically connected to the test point on the circuit board to be tested, and the test probe can be connected to the probe of a tester. Compared with the prior art, the circuit board test fixture applies the missing component to the circuit board to be tested, and electrically contacts one test probe of the detecting component with the test point on the circuit board to be tested. Then, the probe, ^^^ „, another test probe of the j piece, and the test probe can be conveniently tested on the circuit board to be tested, eliminating the need for repeated soldering test to extend f , , The smashing of the deep slogan eliminates the measurement caused by the long-term welding fatigue, and also greatly improves the test efficiency and (4) the board, etc. [Embodiment] Please refer to Figure 1 and Figure 2 together, too smoke Two can, ❹#音#古彳a + x month circuit board test fixture and a detecting member 20, the clamping member comprises two clamping plates 12, 14 and a torsion spring 16 which are mutually facing each other The two sides of the upper side line (4) are provided with semi-circular connecting portions 22 and 142, and the semi-circular connecting portions (2) and (4) are provided with a circular through hole (not labeled). When assembled, the torque spring 16 sets. On the cylindrical sleeve portion, the two ends of the cylindrical sleeve portion 18 are respectively sleeved on the semicircular® 122 and 14 In the cylindrical through hole in the second hole, the clamping member K) has a clamp; the two clamping sides (four) and 14 face each other are also provided with insulation preventing) moon layers 124 and 144 for better In the present embodiment, the detecting member 2 has a connecting portion 22 and two test probes 24 and 26 respectively located at opposite ends of the connecting portion 22, and the connecting portion u passes through the clamping plate 12 The upper two fixing members 126 are fixed on the clamping plate n. The test probe 24 at the bottom of the detecting member 20 is perpendicular to the connecting portion and located at a small distance below the bottom end of the clamping member 12 for effective contact. The test point on the circuit board to be tested. The test probe % at the top of the detecting member 2 is continuously bent vertically upward from the connection of the joint portion 22 of the 2009 2009. The connecting rod is connected to the probe on the tester. 12 and 14 are provided with a plurality of anti-slip grooves 128 on the upper side of the outer side to generate anti-slip effect. Ο Please continue to refer to FIG. 3 to FIG. 6 , when testing a circuit board 30 (such as 5 memory), The clamping member of the circuit board test fixture is opened, and then clamped on the circuit board 30 to make it detect The test probe 24 of the device 2 is in effective electrical contact with the test point of the circuit board 30, and then the probe 40 on the tester is effectively electrically connected with the test probe of the probe member 2, and the tester is started. It is convenient to test the board 3。. If there are not only one test point on the board 3G, it is very convenient to use a plurality of board test fixtures of the invention to perform corresponding tests accordingly. The test method can eliminate the need of the repeated soldering test extension line, and also eliminates the problems of inaccurate measurement and damage to the circuit board caused by the test extension wire soldering 四 (4), and also greatly improves the test efficiency and saves the test cost. In summary, the present invention complies with the requirements of the invention patents, and the above is only a preferred embodiment of the present invention. The above description is only a preferred embodiment of the present invention, and the person skilled in the art is in the spirit of the invention. Equivalent modifications or changes shall be covered by the following patents. [Simple diagram of the diagram] Figure. BRIEF DESCRIPTION OF THE DRAWINGS Figure 1 is a front elevational view of a preferred embodiment of a circuit board test fixture of the present invention. Illustrated is the front side of the circuit board test fixture of Figure 1 when clamping a circuit board. 200928397 Figure 4 is a left side view of Figure 3. Figure 5 is a front view of the test strip connection of a tester in Figure 3. Figure 6 is a left side view of Figure 5. [Main component symbol description]
夹持件 10 夾持板 12 半圓形連接部 122、142絕緣防滑層 124、144 固定元件 126 夾持板 14 扭力彈簧 16 圓柱形套揍部 18 探測件 20 連接部 22 测試探針 24、26 防滑槽 128 電路板 30 探棒 40Clamping member 10 clamping plate 12 semi-circular connecting portion 122, 142 insulating anti-slip layer 124, 144 fixing member 126 clamping plate 14 torsion spring 16 cylindrical sleeve portion 18 detecting member 20 connecting portion 22 testing probe 24, 26 anti-slip groove 128 circuit board 30 probe 40