1351521 100年08月17日 六、發明說明： 【發明所屬之技術頜域】'· - [0001]本發明係關於一種測試裝置，尤指一種用於測試主機板 上CPU (Central Pr〇Cessing Unit,中央處理器）插 槽之測試裝置。 【先前技術】 [酬在對電腦主機板進行琪1 ㈣時，CPU插槽之測試係比較重要 之—項測試。一般來講，CPU插槽之測試分為靜態測試和 動態測試，當靜態測試時，電腦主機板不需上電，測試 人員利用測試儀器對需要測試之cpu插槽之引腳--進行 剛域’檢查是否有空焊或者短路等現象但此方式很不 方便，測試人員需先對照圖紙——找到需要測試之引腳 才能進行測試，需耗費—定時間，有時還可能漏測某些 引腳。當動態測試時，測試人員需先要在cpu插槽上插入 對應之CPU並給主機板上電，然後再對從CPU插槽引腳引 出之一些待測訊號引腳之測試點（一般設於CPU插槽之附 近）進行測試，此方式亦很不方便，由於CPU上之散熱器 之體積一般很大’該等需要測試之待測訊號引腳之測試 點大多被散熱器蓋住’以至於很難對該等待測訊號引腳 之測試點進行測試’而且這種方式需要直接插入CPU來測 試，如果CPU插槽存在問題的話，报有可能會燒毁CPU， 造成不必要地經濟損失。 [0003] 因是，實有必要對習知之CPU插槽之測試方式加以改進， 以消除上述缺失。 【發明内容】 095138854 表單編號A0101 第3頁/共11頁 1003298539-0 1351521 [0004] [0005] [0006] [0007] [0008] 095138854 100年03月17日接正替ife'k 鑒於以上内谷，有必要提供一種方便、有效地測試主機 板上cpu插槽之 —種CPU插槽測試裝置，用於測試一主機板之cpu插槽， 其包括一基板及一設於該基板上之測試板，該基板包括 複數與該CPU插槽之引腳相匹配之插接腳位，該基板可透 過該等插接腳位電性連接到該cpu插槽上，該測試板包括 複數插孔，該等插扎與該等插接腳位中對應該CPU插槽之 待測訊號引腳之插接腳位電性相連。 相較於習知技術，將該CPU插槽測試裝置插接到需測試之 主機板之CPU插槽後，可透過該等插接腳位間接地測量該 CPU插槽上需測試之引腳，同時藉由該測試板上之插孔可 測量該CPU插槽上之待測訊號引腳，以檢查該等引腳是否 有空焊或者短路等現象，十分方便，快捷。 【實施方式】 請一併參閱圖1及圖2，本發明CPU插槽測試裝置10用於測 試一主機板上之CPU插槽，其較佳實施方式包括一基板12 及一測試板14。 該基板12包括複數插接腳位122，該等插接腳位122與需 要測試之CPU插槽上之引腳相匹配，透過該等插接腳位 122可使該基板12之一面（圖1之反面）插接到該CPU插 槽上，該等插接腳位122之數量及位置關係可根據具體需 要測試之CPU插槽來設計，本實施方式以775 CPU插槽為 例加以說明。根據測試要求，該等插接腳位122包括複數 與該CPU插槽中需要測試之引腳對應之特定插接腳位124 ，該等特定插接引腳124上設有標記（如方框），該等標 表單编號A0101 第4頁/共11頁 1003298539-0 1.351521 - 100年08月17日修正替換頁 記可使測試人員不需對照圖紙就能輕易地找到需測試之 特定插接腳位12 4，十分本·便^^快捷。 [0009] 該測試板14設於該基板12上，其包括一電壓控制部142及 一具有八個插孔之插座144，該電壓控制部142包括六個 ' 電阻Rl、R2、R3、R4、R5、R6及六個開關ΚΙ、Κ2、Κ3 、Κ4、Κ5、Κ6 »該電壓控制部142用於調整該CPU插槽測 試裝置10之上電電壓，以便代替具有不同上電電壓之CPU 進行動態測試，該等電阻及開關之數量亦可根據實際CPU 插槽中之VID (Voltage Identification,電壓識別 )訊號引腳之數量來配置。該插座144之插孔電性連接於 該等插接腳位122中與該CPU插槽中需測試之待測訊號引 腳相對應之插接腳位122。 [〇〇1〇] 本實施方式中’該CPU插槽之引腳中包括六個VID訊號引 腳，該基板12上與等該VID訊號引腳相對應之插接腳位 122 (在圖2 中用符號VID(T、VID1 —、VID2 >、VID3 '、VID4 '、VID5 >標記）分別經由該等開關ΚΙ、K2、 K3、K4、K5、K6中之一開關後再經由該等電阻Rl、R2、 R3、R4、R5、R6中之一電阻後接地，透過調節與該等 VID訊號引腳對應之插接腳位122之電平高低（開關閉合 ，則對應插接腳位122為低電平；開關開啟，則對應插接 腳位122為高電平），可使該CPU插槽測試裝置1〇之上電 電壓與需要代替CPU之上電電壓相符合，以便使該CPU插 槽測試裝置10能代替該CPU插接到該主機板後使該主機板 可以上電。該插座144之八個插孔分別連接該等插接腳位 122中與該CPU插槽之待測訊號引腳相對應之插接腳位 095138854 表單编號A0101 第5頁/共11頁 1003298539-0 1351521 )____ [ioo年08月17日修正替換叙 122，該CPU插槽之待測訊號引腳包括GND、VCC、VTT、 RST、PG、VREF、CLK、VDD弓{:解殊為實施方式中與該 CPU插槽之待測訊號引腳GND、VCC、VTT、RST、PG、 VREF、CLK、VDD相對應之該插接腳位122在圖2中分別用 符號GND '、VCC '、VTT '、RST，、PG -、VREF '、 CLK '、VDD z標記，該插座144之插孔之數量不僅僅可 以設為八個，其可根據該CPU插槽中實際需測試之待測訊 號引腳之數量來確定。 [0011] 當測試該主機板上之CPU插槽時，首先進行靜態測試，將 該CPU插槽測試裝置1〇插接到該CPU插槽上，利用一測試 儀器，如萬用表一一測試該等特定插接腳位124及該插座 144之八個插孔，由於該等特定插接腳位124對應連接到 該CPU插槽中需要測試之引腳上，該插座144之八個插孔 對應連接到與該CPU插槽中需測試之待測訊號引腳相對應 之插接腳位122上，故可方便、快捷測試出該CPU插槽中 需要測試之引腳之焊接情況，從而判斷該等引腳是否有 空焊或者短路等現象。進行動態測試時，根據該需代替 之CPU之上電電壓調節該等開關κι、K2、K3、K4、K5、 K6之通斷，以使該CPU插槽測試裝置1〇之上電電壓與需要 代替之CPU之上電電壓相符合，給該主機板上電後，利用 該測試儀器一一測試該插座144之八個插孔，即間接測試 該CPU插槽中之八個待測訊號引腳，檢查該等待測訊號引 腳上之訊號是否符合規範要求，十分方便。 [0012] 該CPU插槽測試裝置10可代替CPU來對CPU插槽進行動態 測試’而不需直接插入CPU，消除了直接用CPU測試而損 095138854 表單編號A0101 第6頁/共11頁 1003298539-0 1351521 • · 100年08月17日 修正 耗CPU之隱患 此外，由於該CPU插槽測試裝置10上安置 了該插座I44 測試人員可透過該插座144來插拔該CPU 插槽測試裝置10，故在一定程度上方便了測試人員之操 作，可謂一舉兩得。 [0013] 综上所述，本發明符合發明專利要件，爰依法提出專利 申請。惟’以上所述者僅為本發明之較佳實施方式，舉 凡熟悉本案技藝之人士，在爰依本發明精神所作之等效 修飾或變化，皆應涵蓋於以下之申請專利範圍内。 【圖式簡單說明】 [0014] 圖1係本發明cpu插槽測試裝置之較佳實施方式之正面示 意圖。 [0015] 圖2係圖1電路原理圖。 【主要元件符號說明】 [0016] CPU插槽測試裝置：10 [0017] 基板：12 [0018] 插接腳位：122 [0019] 特定插接引腳：124 [0020] 測試板：14 [0021] 電壓控制部：142 [0022] 插座：144 [0023] 電阻：Rl、R2、R3、R4、、Μ [0024] 開關：ΚΙ、Κ2、Κ3、Κ4、κ5、Κ6 095138854 表單編號Α0101 第7頁/共11頁 1003298539-01351521 August 17th, 100th, invention invention: [Technology of the invention] [·] - [0001] The present invention relates to a test device, in particular to a CPU for testing a motherboard (Central Pr〇Cessing Unit) , central processing unit) test device for the slot. [Prior Art] [When the computer board is used for Qi 1 (4), the test of the CPU socket is more important - the test. Generally speaking, the test of the CPU socket is divided into static test and dynamic test. When the static test, the computer motherboard does not need to be powered on, the tester uses the test instrument to test the pin of the cpu slot to be tested. 'Check if there is any welding or short circuit, but this method is very inconvenient. The tester needs to check the drawing to find the pin that needs to be tested before it can be tested. It takes time - sometimes it may miss some foot. When testing dynamically, the tester must first insert the corresponding CPU in the cpu slot and power on the host board, and then test the test pins of the signal pins to be tested from the CPU socket pins. Tested in the vicinity of the CPU slot, this method is also very inconvenient, because the size of the heat sink on the CPU is generally large. 'The test points of the signal pins to be tested that need to be tested are mostly covered by the heat sink'. It is difficult to test the test point waiting for the test pin. 'This method needs to be directly inserted into the CPU to test. If there is a problem with the CPU socket, the report may burn the CPU and cause unnecessary economic loss. [0003] Therefore, it is necessary to improve the testing method of the conventional CPU socket to eliminate the above deficiency. SUMMARY OF THE INVENTION 095138854 Form No. A0101 Page 3 / Total 11 Page 1003298539-0 1351521 [0004] [0005] [0007] [0008] 095138854 On March 17, 100, the ife'k was replaced by the above Valley, it is necessary to provide a CPU socket test device for conveniently and effectively testing the cpu slot on the motherboard, for testing a cpu slot of a motherboard, comprising a substrate and a test set on the substrate a board, the board includes a plurality of pins that match the pins of the CPU socket, and the board is electrically connected to the CPU socket through the pins, the test board includes a plurality of jacks. The plugs are electrically connected to the pin pins of the pins of the CPU socket corresponding to the signal pins to be tested. Compared with the prior art, after the CPU socket test device is plugged into the CPU socket of the motherboard to be tested, the pins to be tested in the CPU socket can be indirectly measured through the plug pins. At the same time, the jack of the signal to be tested on the CPU socket can be measured by the jack on the test board to check whether the pins are free soldered or short-circuited, which is very convenient and fast. [Embodiment] Referring to FIG. 1 and FIG. 2 together, the CPU socket testing device 10 of the present invention is used to test a CPU socket on a motherboard. The preferred embodiment includes a substrate 12 and a test board 14. The substrate 12 includes a plurality of pin pins 122 that match the pins on the CPU socket to be tested, and one of the substrates 12 can be formed through the pins 122 (FIG. 1) The reverse side of the CPU socket is inserted into the CPU socket. The number and positional relationship of the pins 122 can be designed according to the CPU socket to be tested. This embodiment uses the 775 CPU socket as an example. According to the test requirements, the pin pins 122 include a plurality of specific pin pins 124 corresponding to the pins to be tested in the CPU socket, and the specific plug pins 124 are provided with a mark (such as a square). The standard form number A0101 Page 4 / 11 pages 1003298539-0 1.351521 - Correction of the replacement page on August 17, 100 allows testers to easily find the specific pins to be tested without having to compare drawings Bit 12 4, very much, then ^^ fast. The test board 14 is disposed on the substrate 12 and includes a voltage control unit 142 and a socket 144 having eight jacks. The voltage control unit 142 includes six 'resistors R1, R2, R3, and R4. R5, R6 and six switches ΚΙ, Κ2, Κ3, Κ4, Κ5, Κ6 » The voltage control unit 142 is used to adjust the electric voltage on the CPU socket test device 10 to replace the CPU with different power-on voltages for dynamic Tests, the number of these resistors and switches can also be configured according to the number of VID (Voltage Identification) signal pins in the actual CPU socket. The socket of the socket 144 is electrically connected to the pin 122 of the socket pin 122 corresponding to the signal pin to be tested in the CPU socket. [〇〇1〇] In the present embodiment, the pin of the CPU socket includes six VID signal pins, and the pin 12 corresponding to the VID signal pin on the substrate 12 (in FIG. 2) The medium symbol VID (T, VID1 —, VID2 >, VID3 ', VID4 ', VID5 > mark) is respectively switched via one of the switches ΚΙ, K2, K3, K4, K5, K6 and then One of the resistors R1, R2, R3, R4, R5, and R6 is grounded after the resistor, and the level of the pin 122 corresponding to the VID signal pin is adjusted (the switch is closed, and the corresponding pin 122 is connected). If the switch is turned on, the corresponding pin 122 is at a high level, so that the voltage on the CPU socket test device 1 is matched with the voltage required to replace the CPU, so that the CPU The slot test device 10 can be powered on after the CPU is plugged into the motherboard, and the eight sockets of the socket 144 are respectively connected to the sockets 122 and the CPU sockets to be tested. The signal pin corresponds to the pin 095138854 Form No. A0101 Page 5 / Total 11 Page 1003298539-0 1351521 )____ [ioo year August 17 In the replacement of the 122, the signal pin of the CPU socket to be tested includes GND, VCC, VTT, RST, PG, VREF, CLK, VDD bow {: the solution is to be tested in the implementation with the CPU socket The pin pins 122 corresponding to the pins GND, VCC, VTT, RST, PG, VREF, CLK, and VDD are respectively labeled with symbols GND ', VCC ', VTT ', RST, PG -, VREF ', CLK ', VDD z mark, the number of jacks of the socket 144 can be set to not only eight, which can be determined according to the number of signal pins to be tested actually tested in the CPU socket. [0011] When testing the CPU socket on the motherboard, first perform a static test, plug the CPU socket test device 1 into the CPU socket, and test the same with a test instrument, such as a multimeter. The specific plug pin 124 and the eight jacks of the socket 144, since the specific pin pins 124 are correspondingly connected to the pins to be tested in the CPU socket, the eight jacks of the socket 144 are correspondingly connected. It is connected to the pin 122 corresponding to the signal pin to be tested in the CPU socket, so that the soldering of the pins to be tested in the CPU socket can be conveniently and quickly tested, thereby judging such Whether the pin has an empty solder or a short circuit. During the dynamic test, the on/off of the switches κι, K2, K3, K4, K5, K6 is adjusted according to the voltage of the CPU to be replaced, so that the CPU socket test device 1 电 above the electric voltage and needs Instead of the power voltage on the CPU, after the board is powered on, the test device is used to test the eight jacks of the socket 144 one by one, that is, indirectly test the eight signal pins to be tested in the CPU socket. It is very convenient to check whether the signal on the waiting signal pin meets the specification requirements. [0012] The CPU socket test device 10 can dynamically test the CPU socket instead of the CPU' without directly inserting the CPU, eliminating the direct CPU test and damaging 095138854 Form No. A0101 Page 6 / 11 pages 1003298539- 0 1351521 • · Augmented CPU hazard on August 17, 100. In addition, since the socket I44 is placed on the CPU socket test device 10, the tester can insert and remove the CPU socket test device 10 through the socket 144. To a certain extent, it is convenient for the tester's operation, which can be described as two things. [0013] In summary, the present invention complies with the requirements of the invention patent, and submits a patent application according to law. The above description is only the preferred embodiment of the present invention, and equivalent modifications or variations made by those skilled in the art will be included in the following claims. BRIEF DESCRIPTION OF THE DRAWINGS [0014] FIG. 1 is a front elevational view of a preferred embodiment of a cpu slot testing device of the present invention. 2 is a schematic diagram of the circuit of FIG. 1. [Main component symbol description] [0016] CPU socket test device: 10 [0017] Base plate: 12 [0018] Pin pin: 122 [0019] Specific plug pin: 124 [0020] Test board: 14 [0021 Voltage Control Unit: 142 [0022] Socket: 144 [0023] Resistor: Rl, R2, R3, R4, Μ [0024] Switch: ΚΙ, Κ2, Κ3, Κ4, κ5, Κ6 095138854 Form No. Α0101 Page 7 / Total 11 pages 1003298539-0