CN205302957U - Storage device volume production detecting system - Google Patents
Storage device volume production detecting system Download PDFInfo
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Abstract
一种存储装置量产检测系统,用以测试若干存储装置中是否有坏块,包括一测试架及一直流电源,所述测试架包括一基板及安装在所述基板上的一总电源接口及若干连接电路板,所述总电源接口连接所述直流电源的输出端,每一连接电路板上安装一电源总开关及若干接口插槽,每一接口插槽用以插接一待测存储装置,所述总电源接口通过所述电源总开关供电给对应的连接电路板上的接口插槽,使所述待测存储装置通电后运行自身存储的测试程序。
A mass production detection system for storage devices, used to test whether there are bad blocks in several storage devices, including a test frame and a DC power supply, the test frame includes a base board and a total power interface installed on the base board and A plurality of connection circuit boards, the main power interface is connected to the output end of the DC power supply, a main power switch and a plurality of interface slots are installed on each connection circuit board, and each interface slot is used to insert a storage device to be tested , the main power supply interface supplies power to the corresponding interface slot on the connection circuit board through the main power switch, so that the storage device to be tested runs the test program stored by itself after being powered on.
Description
技术领域 technical field
本实用新型涉及一种检测系统及方法,特别是一种存储装置量产检测系统及方法。 The utility model relates to a detection system and method, in particular to a storage device mass production detection system and method.
背景技术 Background technique
目前对存储装置,如固态硬盘的测试,主要是检测固态硬盘是是否有坏块。通常的做法是将待检测的固定硬盘外接到电脑主板上进行测试。然而,主板的接口少,每次只能测试几个固态硬盘。 At present, testing of storage devices, such as solid-state drives, is mainly to detect whether there are bad blocks in the solid-state drives. The usual practice is to connect the fixed hard disk to be tested externally to the computer motherboard for testing. However, the mainboard has few interfaces, and only a few SSDs can be tested at a time.
实用新型内容 Utility model content
鉴于以上内容,有必要提供一种可以一次检测多个存储装置的量产检测系统。 In view of the above, it is necessary to provide a mass production inspection system that can inspect multiple storage devices at one time.
一种存储装置量产检测系统,用以测试若干存储装置中是否有坏块,包括一测试架及一直流电源,所述测试架包括一基板及安装在所述基板上的一总电源接口及若干连接电路板,所述总电源接口连接所述直流电源的输出端,每一连接电路板上安装一电源总开关及若干接口插槽,每一接口插槽用以插接一待测存储装置,所述总电源接口通过所述电源总开关供电给对应的连接电路板上的接口插槽,使所述待测存储装置通电后运行自身存储的测试程序。 A mass production detection system for storage devices, used to test whether there are bad blocks in several storage devices, including a test frame and a DC power supply, the test frame includes a base board and a total power interface installed on the base board and A plurality of connection circuit boards, the main power interface is connected to the output end of the DC power supply, a main power switch and a plurality of interface slots are installed on each connection circuit board, and each interface slot is used to insert a storage device to be tested , the main power supply interface supplies power to the corresponding interface slot on the connection circuit board through the main power switch, so that the storage device under test runs the test program stored by itself after being powered on.
相较于现有技术,在上述存储装置量产检测系统中,只需要一个外接的端口就可以给全部的待测存储装置供电,并且同时检测的数量可以不局限于主板接口的个数。 Compared with the prior art, in the above storage device mass production testing system, only one external port is needed to supply power to all the storage devices to be tested, and the number of simultaneous detections is not limited to the number of motherboard interfaces.
附图说明 Description of drawings
图1是本实用新型存储装置量产检测系统一第一实施方式的结构示意图。 FIG. 1 is a schematic structural diagram of a first embodiment of a storage device mass production detection system of the present invention.
图2是本实用新型存储装置量产检测系统一第二实施方式的结构示意图。 FIG. 2 is a schematic structural diagram of a second embodiment of a storage device mass production detection system of the present invention.
图3是本实用新型一实施例的连接框图。 Fig. 3 is a connection block diagram of an embodiment of the utility model.
主要元件符号说明 Description of main component symbols
如下具体实施方式将结合上述附图进一步说明本实用新型。 The following specific embodiments will further illustrate the utility model in conjunction with the above-mentioned accompanying drawings.
具体实施方式 detailed description
请参阅图1及图2,本实用新型存储装置量产检测系统用以测试若干存储装置100中是否有坏块,包括一测试架10。在一实施方式中,所述存储装置100是固定硬盘。 Please refer to FIG. 1 and FIG. 2 , the storage device mass production inspection system of the present invention is used to test whether there are bad blocks in several storage devices 100 , and includes a test rack 10 . In one embodiment, the storage device 100 is a fixed hard disk.
所述测试架10包括一基板11及安装在所述基板11上的一总电源接口13及若干连接电路板20。每一连接电路板20用以电连接若干存储装置100。所述总电源接口13用以连接一直流电源的输出端口30。所述直流电源输出端口可以是安装在电脑主板的电源端口、移动电源输出端口及电源适配器的输出端口等。在一实施方式中,所述连接电路板20的数量是4,每块连接电路板20电连接10个待测试的存储装置100,所述总电源接口13的类型可以是圆孔电源接口或SATA电源接口。所述直流电源电路也可以是安装在所述基板11上的交流转直流电路板,只要外加一个插头插接在交流电上就可以产生需要的直流电压。 The test rack 10 includes a base plate 11 , a general power interface 13 and a plurality of connecting circuit boards 20 mounted on the base plate 11 . Each connecting circuit board 20 is used for electrically connecting a plurality of storage devices 100 . The main power interface 13 is used to connect to an output port 30 of a DC power supply. The DC power output port may be a power port installed on a computer motherboard, a mobile power output port, an output port of a power adapter, and the like. In one embodiment, the number of the connection circuit boards 20 is 4, and each connection circuit board 20 is electrically connected to 10 storage devices 100 to be tested, and the type of the total power interface 13 can be a round hole power interface or SATA power interface. The DC power supply circuit can also be an AC-to-DC circuit board installed on the base plate 11 , as long as an additional plug is plugged into the AC power, the required DC voltage can be generated.
每一连接电路板20上安装一电源总开关21、若干分开关23、若干接口插槽25及若干指示灯27。在一实施方式中,所述若干接口插槽25平行排列,所述分开关23大致排列在同一条直线上,所述若干指示灯27也大致排列在一条直线上。 A main power switch 21 , some sub-switches 23 , some interface slots 25 and some indicator lights 27 are installed on each connecting circuit board 20 . In one embodiment, the several interface slots 25 are arranged in parallel, the sub-switches 23 are roughly arranged on the same straight line, and the several indicator lights 27 are also roughly arranged on the same straight line.
所述电源总开关21连接每一分开关23。每一接口插槽25对应连接其中一分开关23及一其中指示灯27。每一接口插槽25用以对应插接其中一待测试的存储装置100。 The main power switch 21 is connected to each branch switch 23 . Each interface slot 25 is correspondingly connected to one of the sub-switches 23 and one of the indicator lights 27 therein. Each interface slot 25 is used for correspondingly inserting one of the storage devices 100 to be tested.
请同时参阅图3,所述存储装置100包括一控制器101及一flash103。所述控制器101内设置一存储模块102。所述存储模块102中存储有boot程序及测试程序。所述flash103中存储有量产数据。所述测试程序用以检测所述flash103中是否存在坏块及坏块的位置。 Please also refer to FIG. 3 , the storage device 100 includes a controller 101 and a flash 103 . A storage module 102 is set in the controller 101 . The storage module 102 stores a boot program and a test program. Mass production data is stored in the flash103. The test program is used to detect whether there is a bad block and the location of the bad block in the flash103.
所述直流电源将电流经过电源总开关21及对应的分开关23供应给对应的待测试的存储装置100,从而启动所述控制器101进行测试。测试的结果数据将存放在所述存储模块102中。通过提取所述存储模块102中的数据就可以根据测试结果观察到flash103中坏块的情况。所述指示灯27用以在测试程序运行过程中闪烁,以显示目前正在测试。当测试结束后,指示灯27熄灭。 The DC power supply supplies current to the corresponding storage device 100 to be tested through the main power switch 21 and the corresponding sub-switch 23, thereby starting the controller 101 for testing. The test result data will be stored in the storage module 102 . By extracting the data in the storage module 102, the bad blocks in the flash 103 can be observed according to the test results. The indicator light 27 is used to flicker during the running of the test program to show that it is currently being tested. After the test ended, the indicator light 27 went out.
这样,只需要一个电源端口就可以检测多个存储装置100,并且排放整齐,节省空间。 In this way, only one power port is needed to detect multiple storage devices 100, and they are neatly arranged to save space.
一种存储装置量产检测方法包括以下步骤: A mass production detection method of a storage device comprises the following steps:
步骤S1:将测试程序写入控制器101的存储模块102中。通过电脑接USB转SATA的读卡器将测试程式写进控制器101中。测试程式会暂放在存储模块102中。 Step S1: Write the test program into the storage module 102 of the controller 101 . The test program is written into the controller 101 through a computer connected to a USB-to-SATA card reader. The test program is temporarily stored in the storage module 102 .
步骤S2:将待测的存储装置100的接口与对应的接口插槽25插接。 Step S2: Insert the interface of the storage device 100 to be tested into the corresponding interface slot 25 .
步骤S3:测试程序运行检测存储装置100的flash103中是否有坏块并记录检测结果。 Step S3: The test program is run to detect whether there is a bad block in the flash 103 of the storage device 100 and record the detection result.
步骤S3包括以下步骤: Step S3 comprises the following steps:
步骤S3.1:给对应的接口插槽25通电;通过打开电源总开关21及对应的分开关23给对应的接口插槽25通电。 Step S3.1: Power on the corresponding interface slot 25; power on the corresponding interface slot 25 by turning on the main power switch 21 and the corresponding sub-switch 23.
步骤S3.2:存储模块102中的boot程序启动测试程序开始检测。 Step S3.2: The boot program in the storage module 102 starts the test program and starts detection.
步骤S3.3:指示灯27开始闪烁。 Step S3.3: The indicator light 27 starts to blink.
步骤S3.4:扫描检测结束,并记录扫描检测结果。 Step S3.4: The scanning detection ends, and the scanning detection result is recorded.
步骤S3.5:指示灯27熄灭。 Step S3.5: The indicator light 27 goes out.
步骤S4:将检测结果读出,即可知道哪一颗flash有问题,有多少坏块等信息。步骤S4将存储装置通过读卡器,与电脑相接,再通过开卡软件读出测试程式记录的扫描过程,就会在软件中清楚看到哪一颗flash有问题,有多少坏块等信息。 Step S4: Read out the detection result, and you can know which flash has a problem, how many bad blocks there are, and other information. Step S4 Connect the storage device to the computer through the card reader, and then read the scanning process recorded by the test program through the card opening software, and you will clearly see in the software which flash has a problem, how many bad blocks and other information .
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