CN205680083U - Memory testing device - Google Patents
Memory testing device Download PDFInfo
- Publication number
- CN205680083U CN205680083U CN201620427074.8U CN201620427074U CN205680083U CN 205680083 U CN205680083 U CN 205680083U CN 201620427074 U CN201620427074 U CN 201620427074U CN 205680083 U CN205680083 U CN 205680083U
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- China
- Prior art keywords
- memory
- mainboard
- test device
- internal memory
- configuration information
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- 230000015654 memory Effects 0.000 title claims abstract description 97
- 238000012360 testing method Methods 0.000 title claims abstract description 32
- 238000001514 detection method Methods 0.000 claims description 8
- 230000002950 deficient Effects 0.000 claims description 3
- 238000000151 deposition Methods 0.000 claims description 2
- 230000002349 favourable effect Effects 0.000 abstract 1
- 238000013522 software testing Methods 0.000 abstract 1
- 238000010586 diagram Methods 0.000 description 3
- 238000005299 abrasion Methods 0.000 description 1
- 238000010276 construction Methods 0.000 description 1
- 230000009977 dual effect Effects 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
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Abstract
A memory test device comprises a mainboard, a memory device, a mainboard slot arranged on the mainboard and a memory adapter card. The mainboard stores preset information corresponding to a plurality of memory devices. The memory device stores corresponding configuration information. The main board judges whether the configuration information of the memory device is stored in preset information stored in the main board or not according to the acquired configuration information of the memory device; and when the acquired configuration information exists in the preset information, the mainboard judges that the memory device is qualified. The utility model discloses memory testing arrangement passes through the mainboard slot connection of memory switching card with memory equipment and mainboard, and then tests this memory equipment through the memory switching card, is favorable to having improved efficiency of software testing.
Description
Technical field
This utility model relates to a kind of test device for internal memory, particularly to the test device of a kind of notebook internal memory.
Background technology
At present, it is required to when the memory device of notebook computer dispatches from the factory memory bar is tested, as detection internal memory sets
The literacy etc. of standby stability, the storage of memory device and data.But, the memory device of general notebook computer is only
Can test on main board for notebook computer, and then cause the raising of testing cost, reduce the efficiency of test.
Utility model content
In view of the foregoing, it is necessary to a kind of test device for internal memory improving testing efficiency is provided.
A kind of test device for internal memory, including:
One mainboard, storage has the presupposed information corresponding to some memory devices；
One memory device, including a configuration serial detection, in this configuration serial detection, storage has the configuration information of correspondence；
One host slot, is arranged on this mainboard；And
One memory adaptor card, is electrically connected with this connecting portion by this connecting plate including a plate, a junction and one
Memory bank, this connecting plate is used for being plugged in this host slot, and this memory device is plugged in this memory bank；This mainboard
For obtaining, by this host slot, memory adaptor card, the configuration information that this memory device comprises；This mainboard is always according to obtaining
To configuration information judge whether in presupposed information；When the configuration information acquired exists in this presupposed information, this is main
Plate judges that this memory device is qualified.
Preferably, when the configuration information acquired does not stores in this presupposed information, this mainboard judges this memory device
Defective.
Preferably, this connecting portion is arranged on the first side of this keyset, and this memory bank is arranged at this connecting plate
On one side.
Preferably, this memory adaptor card also includes a buckle, and when this memory device is plugged in this memory bank, this is interior
Equipment of depositing is fixed in this memory bank by this buckle.
Preferably, this connecting portion is a golden finger.
Preferably, this host slot is a memory bank.
Preferably, this host slot supports the internal memory of a single-row memory modules.
Preferably, this host slot supports the internal memory of a pair of column memory module.
Preferably, this configuration information includes the running frequency of this memory device, voltage, row/column address, bit wide, internal memory mould
Block serial number, manufacturer code.
Preferably, this memory device is the internal memory of a notebook computer.
Memory device is connected with the host slot of mainboard by above-mentioned test device for internal memory by memory adaptor card, and then passes through
This memory device is tested by memory adaptor card, is conducive to improve testing efficiency.
Accompanying drawing explanation
Fig. 1 is the block diagram of the better embodiment of this utility model test device for internal memory, described test device for internal memory bag
Include a memory adaptor card and a memory device.
Fig. 2 is the schematic diagram of the better embodiment of memory adaptor card in Fig. 1.
Fig. 3 is the schematic diagram of the better embodiment of memory device in Fig. 1.
Main element symbol description
Test device for internal memory 1
Mainboard 10
Host slot 20
Memory adaptor card 30
Memory device 40
Connecting portion 300
Keyset 302
Memory bank 304
Buckle 306
Configuration serial detection 402
Following detailed description of the invention will further illustrate this utility model in conjunction with above-mentioned accompanying drawing.
Detailed description of the invention
Referring to Fig. 1, this utility model test device for internal memory 1 includes host slot 20, memory adaptor card 30 and
Memory device 40.In present embodiment, this host slot 20 is arranged on the mainboard 10 of a desktop computer, and this mainboard 10 is by being somebody's turn to do
This memory device 40 is tested by host slot 20, memory adaptor card 30, as tested stability and the number of this memory device 40
Ability etc. according to read-write.
In present embodiment, this host slot 20 can be a memory bank, and this host slot 20 can support plurality of specifications
Memory bank, as supported a SIMM(Single Inline Memory Module, single-row memory modules) or a DIMM(Dual
Inline Memory Modules, biserial memory modules) internal memory.
Referring to Fig. 2, this memory adaptor card 30 includes that a plate 302, is arranged at the first side of this keyset 302
Connecting portion 300 and be arranged at the memory bank 304 of one side of this connecting plate 302.In present embodiment, this memory bank
At 304 second sides being disposed in proximity to this keyset 302.This memory bank 304 also includes a buckle 306, for this is interior
Deposit equipment 40 to be fixed.In present embodiment, this connecting portion 300 is a golden finger, and this adapter 30 is for inserting with this mainboard
Groove 20 matches.
When this memory device 40 is plugged in this memory bank 304, this memory device 40 can be by this buckle 306 by it
It is fixed in this memory bank 304.This memory device 40 can pass through memory bank 304, keyset 302 and connecting portion 302 and be somebody's turn to do
Mainboard 10 communicates.In present embodiment, this memory device 40 is the internal memory of a notebook computer.
Owing to the memory bank of notebook computer is on SIMM and the basis of dimm socket by the memory bank of desktop computer
On develop.The memory device of notebook computer typically uses 72 stitch, 144 stitch, the interface of 200 stitch, desktop computer
Memory device typically use 168 stitch, 184 stitch and the interface of 240 stitch.In present embodiment, this host slot 20
Stitch is for changing the stitch of this memory bank 304, with by electrical characteristics different in the stitch of this memory bank 304
Stitch is converted to stitch corresponding on this host slot 20.
Referring to Fig. 3, this memory device 40 includes configuration serial detection (Serial Presence Detect, SPD)
402, this configuration serial detects 402 internal memories and contains the basic fundamental specification information of this memory device 40, such as this memory device 40
The configuration informations such as running frequency, voltage, rank addresses, bit wide, memory modules serial number, manufacturer code.
In present embodiment, this mainboard 10 can be previously stored with the presupposed information corresponding to some memory devices 40.When right
When memory device 40 to be measured is tested, this mainboard 10 is used for obtaining in this memory device 40 configuration serial detection 402 and comprises
Configuration information, and judge whether in presupposed information according to the configuration information acquired, when the configuration information acquired
When existing in this presupposed information, this mainboard 10 then judges that this memory device 40 is qualified；When the configuration information acquired does not stores
Time in this presupposed information, this mainboard 10 judges that this memory device 40 is defective.
The internal memory of notebook computer is connected with the host slot of mainboard by above-mentioned test device for internal memory by memory adaptor card,
And then by memory adaptor card, the internal memory of notebook computer is tested, not only achieve and test on the mainboard of desktop computer
Notebook computer internal memory；And this memory adaptor card simple in construction, low cost, plugging in test frequently, effectively prevent
The damage of mainboard memory bank and the abrasion of internal memory golden finger.
Although above it has been shown and described that embodiment of the present utility model, it is to be understood that above-described embodiment is
Exemplary, it is impossible to it is interpreted as that those of ordinary skill in the art is in scope of the present utility model to restriction of the present utility model
In above-described embodiment can be changed, revise, replace and modification.
Claims (10)
1. a test device for internal memory, including: a mainboard, storage has the presupposed information corresponding to some memory devices；In one
Depositing equipment, including a configuration serial detection, in this configuration serial detection, storage has the configuration information of correspondence；One host slot, if
It is placed on this mainboard；And a memory adaptor card, including a plate, a junction and one by this connecting plate and this connecting portion
The memory bank being electrically connected with, this connecting plate is used for being plugged in this host slot, and this memory device is plugged in this memory bank
In；This mainboard is for obtaining, by this host slot, memory adaptor card, the configuration information that this memory device comprises；This mainboard also root
Judge whether in presupposed information according to the configuration information acquired；In there is this presupposed information in the configuration information acquired
Time, this mainboard judges that this memory device is qualified.
2. test device for internal memory as claimed in claim 1, it is characterised in that: when the configuration information acquired, not store this pre-
If time in information, this mainboard judges that this memory device is defective.
3. test device for internal memory as claimed in claim 2, it is characterised in that: this connecting portion is arranged at the first side of this keyset
Bian Shang, this memory bank is arranged on the one side of this connecting plate.
4. test device for internal memory as claimed in claim 3, it is characterised in that: this memory adaptor card also includes a buckle, when this
When memory device is plugged in this memory bank, this memory device is fixed in this memory bank by this buckle.
5. test device for internal memory as claimed in claim 4, it is characterised in that: this connecting portion is a golden finger.
6. test device for internal memory as claimed in claim 5, it is characterised in that: this host slot is a memory bank.
7. test device for internal memory as claimed in claim 6, it is characterised in that: this host slot supports a single-row memory modules
Internal memory.
8. test device for internal memory as claimed in claim 6, it is characterised in that: this host slot supports a pair of column memory module
Internal memory.
9. the test device for internal memory as described in any one in claim 1-8, it is characterised in that: this configuration information includes that this is interior
Deposit the running frequency of equipment, voltage, rank addresses, bit wide, memory modules serial number, manufacturer code.
10. test device for internal memory as claimed in claim 9, it is characterised in that: this memory device is the interior of a notebook computer
Deposit.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201620427074.8U CN205680083U (en) | 2016-05-11 | 2016-05-11 | Memory testing device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201620427074.8U CN205680083U (en) | 2016-05-11 | 2016-05-11 | Memory testing device |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN205680083U true CN205680083U (en) | 2016-11-09 |
Family
ID=57436175
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201620427074.8U Expired - Fee Related CN205680083U (en) | 2016-05-11 | 2016-05-11 | Memory testing device |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN205680083U (en) |
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN108279929A (en) * | 2016-12-30 | 2018-07-13 | 技嘉科技股份有限公司 | Memory body clock frequency method of adjustment, motherboard and computer operating system |
| CN109829083A (en) * | 2019-01-25 | 2019-05-31 | 深圳市金泰克半导体有限公司 | SPD data automatic verification method, device, computer equipment and storage medium |
| CN111273098A (en) * | 2020-01-20 | 2020-06-12 | 深圳市明信测试设备有限公司 | Detection device and method for detecting SIM card and TF card of mobile phone |
| WO2022252248A1 (en) * | 2021-06-01 | 2022-12-08 | 长鑫存储技术有限公司 | Memory test method and apparatus, device, and storage medium |
-
2016
- 2016-05-11 CN CN201620427074.8U patent/CN205680083U/en not_active Expired - Fee Related
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN108279929A (en) * | 2016-12-30 | 2018-07-13 | 技嘉科技股份有限公司 | Memory body clock frequency method of adjustment, motherboard and computer operating system |
| CN109829083A (en) * | 2019-01-25 | 2019-05-31 | 深圳市金泰克半导体有限公司 | SPD data automatic verification method, device, computer equipment and storage medium |
| CN111273098A (en) * | 2020-01-20 | 2020-06-12 | 深圳市明信测试设备有限公司 | Detection device and method for detecting SIM card and TF card of mobile phone |
| WO2022252248A1 (en) * | 2021-06-01 | 2022-12-08 | 长鑫存储技术有限公司 | Memory test method and apparatus, device, and storage medium |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| CF01 | Termination of patent right due to non-payment of annual fee | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20161109 Termination date: 20190511 |