CN201436662U - Memory test device - Google Patents
Memory test device Download PDFInfo
- Publication number
- CN201436662U CN201436662U CN2009200699400U CN200920069940U CN201436662U CN 201436662 U CN201436662 U CN 201436662U CN 2009200699400 U CN2009200699400 U CN 2009200699400U CN 200920069940 U CN200920069940 U CN 200920069940U CN 201436662 U CN201436662 U CN 201436662U
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- Prior art keywords
- slot
- memory
- support plate
- storer
- test fixture
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Abstract
The utility model discloses a memory test device which is suitable for a mainboard with a memory slot. The memory test device comprises a connection member and a support plate. The connection member is provided with a first slot and a first finger-welding part, wherein the first slot is electrically connected with the first finger-welding part. A memory to be tested is inserted in the first slot, and the first finger-welding part is inserted in the memory slot to electrically connect the mainboard and the memory to be tested. The support plate is provided with a plurality of adjustable resistances, and the support plate is connected with the connection member so that each adjustable resistance is respectively connected between the first slot and the first finger-welding part, wherein each adjustable resistance respectively adjusts reference voltage and work voltage of memory to be test.
Description
Technical field
The utility model relates to a kind of testing making apparatus, particularly relates to a kind of memory test fixture of adjusting memory reference voltage and operating voltage.
Background technology
In the age of science and technology prosperity now, unavoidable ground, computer system has become people's indispensable information processing instrument in life.Computer system can satisfy the whole demands of people in work, travelling and amusement each side, for example data such as individual's finance detail, financial account number password, privacy file and photo, emotion mail, business documentation and intelligence creation all can be stored in the computer system.In computer system, central processing unit can see through that storer gets instruction and data carrying out computing, and the result of computing is stored in the storer, so storer indispensable assembly when being the computer system operation.
According to above-mentioned,, also can cause computer system to meet accident (for example working as machine or reopening machine) if storer makes a mistake or fault when computer system is moved.So the running that can storer when computer system is moved stable affects the degree of stability of computer system operation.Therefore, in the computer system of focusing on degree of stability (for example server), except meeting is carried out long playing test to whole computer system (comprising central processing unit and storer), can adjust the reference voltage and the operating voltage of storer simultaneously and carry out the operation of computer system, to test the running whether employed storer can be stable in permissible regulation of line voltage.And adjust the reference voltage and the operating voltage of storer, and then earlier the pin of adjustable resistance is seen through wire bonds corresponding pin position on mainboard, adjust the reference voltage and the operating voltage of storer via adjustable resistance.And this welds caused high temperature and may have influence on chip on the mainboard, and because the adjustable resistance that uses is more, and adjustable resistance does not have more pin, can make that the lead that is welded out by mainboard can be comparatively disorderly, and is very attractive in appearance and be difficult for the pairing pin of identification adjustable resistance pin position.
The utility model content
The utility model provides a kind of memory test fixture, can adjust the reference voltage and the operating voltage of storer, so that storer is tested under the situation of not changing motherboard circuit.
The utility model proposes a kind of memory test fixture, be applicable to the mainboard with a memory bank, the memory test fixture comprises web member and support plate.Web member has first slot and first soldering finger part, and wherein first slot electrically connects first soldering finger part.First slot plugs storer to be measured, and first soldering finger part inserts memory bank to electrically connect mainboard and storer to be measured.Support plate disposes a plurality of adjustable resistances, and support plate connects web member so that each adjustable resistance is electrically connected at respectively between first slot and first soldering finger part, and wherein each adjustable resistance is adjusted the reference voltage and the operating voltage of storer to be measured respectively.
In an embodiment of the present utility model, this web member has second slot, and support plate has second soldering finger part, and wherein second soldering finger part inserts second slot to connect this web member and support plate.
In an embodiment of the present utility model, this web member has first connectivity port, and support plate has second connectivity port, and wherein first connectivity port connects second connectivity port to connect web member and support plate.
In an embodiment of the present utility model, this first connectivity port sees through winding displacement and connects second connectivity port.
In an embodiment of the present utility model, this first slot has identical structure with memory bank, and first slot and memory bank are dual inline type memory assembly slot.
In an embodiment of the present utility model, this support plate is a printed circuit board (PCB).
In an embodiment of the present utility model, this storer to be measured is a third generation double data rate memory.
Comprehensive the above, memory test fixture of the present utility model electrically connects storer to be measured and mainboard by web member, and web member connects support plate so that the adjustable resistance on the support plate is electrically connected between storer to be measured and the mainboard.By this, can not change reference voltage and operating voltage that motherboard circuit can be adjusted storer, so that storer to be measured is tested.
Above-mentioned explanation only is the general introduction of technical solutions of the utility model, for can clearer understanding technological means of the present utility model, and can be implemented according to the content of instructions, below with preferred embodiment of the present utility model and conjunction with figs. describe in detail as after.
Description of drawings
Fig. 1 is the structural representation of the memory test fixture of the utility model one embodiment.
Fig. 2 is the structural representation of the memory test fixture of another embodiment of the utility model.
Fig. 3 is the structural representation of the memory test fixture of the another embodiment of the utility model.
Embodiment
Below in conjunction with accompanying drawing and preferred embodiment, to according to its feature of memory test fixture and the effect thereof that the utility model proposes, describe in detail as after.
Fig. 1 is the structural representation of the memory test fixture of the utility model one embodiment.Please refer to Fig. 1, in the present embodiment, memory test fixture 100 comprises web member 110 and support plate 120, and wherein support plate 110 for example is a printed circuit board (PCB).Web member 110 has first slot 111, first soldering finger part 112 and first connectivity port 113, and wherein first slot 111, first soldering finger part 112 and first connectivity port 113 are electrically connected to each other, and first soldering finger part 112 is a golden finger.First slot 111 is in order to plug storer 20 to be measured, memory bank 11 on first soldering finger part, the 112 insertion mainboards 10 is to electrically connect mainboard 10 and storer to be measured 20, wherein first slot 111 for example is memory bank with memory bank 11 and is dual inline type memory assembly slot, and storer to be measured 20 for example is a third generation double data rate memory.
Fig. 2 is the structural representation of the memory test fixture of another embodiment of the utility model.Please refer to Fig. 1 and Fig. 2, its difference is that the web member 210 of memory test fixture 200 has second slot 213, and support plate 220 has second soldering finger part 221, and wherein second soldering finger part 112 is a golden finger.Second soldering finger part 221 inserts second slot 213 to connect this web member 210 and support plate 220, causes each adjustable resistance (to be electrically connected at respectively between first slot 211 and first soldering finger part 212 as resistance R 5～R8).By this, the resistance of adjustable resistance R5～R8 is adjusted the reference voltage and the operating voltage of storer 20 to be measured, to carry out the test of storer 20 to be measured.
Fig. 3 is the structural representation of the memory test fixture of the another embodiment of the utility model.Please refer to Fig. 1 and Fig. 3, its difference is that the support plate 320 of memory test fixture 300 is divided into two partly, to fit in the both sides of web member 310 respectively.Simultaneously, fit in web member 310, connect this web member 310 and support plate 320, cause each adjustable resistance (to be electrically connected at respectively between first slot 311 and first soldering finger part 312 as resistance R 9～R12) with this by support plate 320.By this, the reference voltage of storer 20 to be measured and operating voltage can be adjusted via the resistance of adjusting resistance R 5～R8, carry out the test of storer 20 to be measured with this.
Comprehensive the above, the memory test fixture of the utility model embodiment, electrically connect storer to be measured and mainboard by web member, and web member connects support plate so that the adjustable resistance on the support plate is electrically connected between the memory bank of storer to be measured and mainboard.By this, can not change reference voltage and operating voltage that motherboard circuit can be adjusted storer, so that storer to be measured is tested.
The above, it only is preferred embodiment of the present utility model, be not that the utility model is done any pro forma restriction, though the utility model discloses as above with preferred embodiment, yet be not in order to limit the utility model, any those skilled in the art, in not breaking away from the technical solutions of the utility model scope, when the structure that can utilize above-mentioned announcement and technology contents are made a little change or be modified to the equivalent embodiment of equivalent variations, but every content that does not break away from technical solutions of the utility model, according to technical spirit of the present utility model to any simple modification that above embodiment did, equivalent variations and modification all still belong in the scope of technical solutions of the utility model.
Claims (8)
1. a memory test fixture is applicable to the mainboard with a memory bank, it is characterized in that comprising:
A connection piece, have one first slot and one first soldering finger part, wherein this first slot electrically connects this first soldering finger part, and this first slot plugs a storer to be measured, and this first soldering finger part inserts this memory bank to electrically connect this mainboard and this storer to be measured; And
One support plate, dispose a plurality of adjustable resistances, and this support plate connects this web member so that those adjustable resistances are electrically connected at respectively between this first slot and this first soldering finger part, and wherein each those adjustable resistance is adjusted a reference voltage and an operating voltage of this storer to be measured respectively.
2. memory test fixture according to claim 1 is characterized in that wherein this web member has one second slot, and this support plate has one second soldering finger part, and wherein this second soldering finger part inserts this second slot to connect this web member and this support plate.
3. memory test fixture according to claim 1, it is characterized in that wherein this web member has one first connectivity port, and this support plate has one second connectivity port, and wherein this first connectivity port connects this second connectivity port to connect this web member and this support plate.
4. memory test fixture according to claim 3 is characterized in that wherein this first connectivity port connects this second connectivity port through a winding displacement.
5. memory test fixture according to claim 1 is characterized in that wherein this first slot has identical structure with this memory bank.
6. memory test fixture according to claim 5 is characterized in that wherein this first slot and this memory bank are the direct insertion memory assembly slot of a biserial.
7. memory test fixture according to claim 1 is characterized in that wherein this support plate is a printed circuit board (PCB).
8. memory test fixture according to claim 1 is characterized in that wherein this storer to be measured is a third generation double data rate memory.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2009200699400U CN201436662U (en) | 2009-04-03 | 2009-04-03 | Memory test device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2009200699400U CN201436662U (en) | 2009-04-03 | 2009-04-03 | Memory test device |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN201436662U true CN201436662U (en) | 2010-04-07 |
Family
ID=42373111
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN2009200699400U Expired - Fee Related CN201436662U (en) | 2009-04-03 | 2009-04-03 | Memory test device |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN201436662U (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN104134903A (en) * | 2014-07-15 | 2014-11-05 | 深圳市兴森快捷电路科技股份有限公司 | Connecting body of high-speed connector and testing single plate, tool and testing method |
| CN104795110A (en) * | 2015-04-17 | 2015-07-22 | 深圳市江波龙电子有限公司 | Testing device for memory modules |
-
2009
- 2009-04-03 CN CN2009200699400U patent/CN201436662U/en not_active Expired - Fee Related
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN104134903A (en) * | 2014-07-15 | 2014-11-05 | 深圳市兴森快捷电路科技股份有限公司 | Connecting body of high-speed connector and testing single plate, tool and testing method |
| CN104134903B (en) * | 2014-07-15 | 2016-05-25 | 深圳市兴森快捷电路科技股份有限公司 | Connector, frock and the method for testing of a kind of high speed connector and testing single-board |
| CN104795110A (en) * | 2015-04-17 | 2015-07-22 | 深圳市江波龙电子有限公司 | Testing device for memory modules |
| CN104795110B (en) * | 2015-04-17 | 2017-10-20 | 深圳市江波龙电子有限公司 | A kind of test device of memory module |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20100407 Termination date: 20160403 |
|
| CF01 | Termination of patent right due to non-payment of annual fee |