CN107231462A - The test device of terminal - Google Patents
The test device of terminal Download PDFInfo
- Publication number
- CN107231462A CN107231462A CN201710385462.3A CN201710385462A CN107231462A CN 107231462 A CN107231462 A CN 107231462A CN 201710385462 A CN201710385462 A CN 201710385462A CN 107231462 A CN107231462 A CN 107231462A
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- China
- Prior art keywords
- terminal
- deck
- sim card
- neck
- kato
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- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04M—TELEPHONIC COMMUNICATION
- H04M1/00—Substation equipment, e.g. for use by subscribers
- H04M1/24—Arrangements for testing
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- Engineering & Computer Science (AREA)
- Signal Processing (AREA)
- Tests Of Electronic Circuits (AREA)
Abstract
The disclosure is directed to a kind of test device of terminal, the test device of the terminal includes：Printing board PCB, sets the first Kato on the pcb, at least one first deck for installing client identification module SIM card；Wherein, first Kato is electrically connected with least one described first deck, at least one first electric connecting terminal is provided with first Kato, when first Kato inserts the neck of terminal, the terminal reads the SIM card being arranged on each first deck by least one described first electric connecting terminal.The test device for the terminal that the disclosure is provided, it is possible to increase the testing efficiency of the SIM card function of test terminal, and then the testing time can be reduced, reduce testing cost.
Description
Technical field
This disclosure relates to terminal technology, more particularly to a kind of test device of terminal.
Background technology
With the continuous lifting of user's request, and, the rise of mobile Internet, terminal turns into must can not in user's life
Few everyday tools.User can be called with using terminal, send short message, surf the Net, take pictures, positioning.
At present, terminal manufacturer can put into many testers to terminal before the terminal produced is dispatched from the factory, all
Function tested, to ensure that the termination function dispatched from the factory is normal.For example：In the client identification module of test terminal
During (Subscriber Identification Module, SIM) card function, tester needs SIM card being arranged on terminal
Kato on, then by SIM card support insert terminal neck, it is whether normal with the SIM card function of testing terminal.When terminal is set
Be using card taking pin card taking Kato when, tester is after the SIM card function of terminal has been tested, in addition it is also necessary to by card taking
Pin takes out SIM card from terminal so that testing efficiency is relatively low, and testing cost is higher.
The content of the invention
To overcome problem present in correlation technique, the disclosure provides a kind of test device of terminal.Technical scheme is as follows：
According to the first aspect of the embodiment of the present disclosure there is provided a kind of test device of terminal, including：Printing board PCB,
The first Kato on the pcb, at least one first deck for installing client identification module SIM card are set；Wherein,
First Kato is electrically connected with least one described first deck, and at least one is provided with first Kato
First electric connecting terminal, when first Kato inserts the neck of terminal, the terminal by it is described at least one first be electrically connected
End is connect, the SIM card being arranged on each first deck is read.
The technical scheme provided by this disclosed embodiment can include the following benefits：Pass through first in test device
Kato and the first deck, can draw the PIN needle on the inside SIM card deck of the neck of terminal to be tested for reading SIM card
To the outside of terminal, during make it that tester inserts the first Kato of test device in the neck of terminal, it can simulate
The scene of SIM card is inserted in the neck of terminal, is tested so as to the SIM card function to terminal.Because tester exists
After the test for the SIM functions of completing terminal, directly test device can be extracted from the neck of terminal, it is not necessary to by any
Instrument, therefore, it is possible to the testing efficiency for the SIM card function of improving test terminal, and then testing cost can be improved improve
Testing efficiency, and then the testing time can be reduced, reduce testing cost.Further, when tester is using above-mentioned test
Device, when testing the SIM card functions of multiple terminals of same model, tester is only needed to above-mentioned test device point
The neck of each terminal is not inserted, it is not necessary to the operation of plug-in card and card taking is carried out to each terminal, can significantly be carried
High testing efficiency, create a further reduction testing cost.
Optionally, each first deck is provided with least one first test point.
The technical scheme provided by this disclosed embodiment can include the following benefits：Block by the first of test device
, can be by detecting the first test point on the first deck in test device, to determine terminal during the neck of support insertion terminal
Whether the PIN needle of SIM card holder is damaged in neck, improves the effect whether PIN needle of the SIM card deck in detection terminal groove is damaged
Rate, further reduces the testing time, reduces testing cost.
Optionally, the neck is SIM card and the shared neck of flash TF cards, and the test device also includes：If
Put is used for the second deck for installing TF cards on the pcb；
First Kato is electrically connected with second deck, and the second electric connecting terminal is provided with first Kato,
When first Kato inserts the neck, the terminal reads by second electric connecting terminal and is arranged on the described second card
TF cards on seat.
The technical scheme provided by this disclosed embodiment can include the following benefits：Pass through first in test device
Kato and the second deck, can lead to being internally integrated on deck for the neck of terminal to be tested for reading the PIN needle of TF cards
The outside of terminal, during make it that tester inserts the first Kato of test device in the neck of terminal, can be simulated at end
The scene of TF cards is inserted in the neck at end, is tested so as to the TF functions to terminal.Because tester completes eventually
After the test of the TF functions at end, directly test device can be extracted from the neck of terminal, it is not necessary to by any instrument,
Therefore, it is possible to the testing efficiency for the TF functions of improving test terminal, and then testing cost can be improved improve testing efficiency, enter
And the testing time can be reduced, reduce testing cost.Further, when tester is using above-mentioned test device, to same
When the TF functions of multiple terminals of model are tested, tester only needs to above-mentioned test device inserting each terminal respectively
Neck, it is not necessary to the operation of plug-in card and card taking is carried out to each terminal, testing efficiency can be greatly improved, enters one
Reduce testing cost to step.
Optionally, second deck is provided with least one second test point.
The technical scheme provided by this disclosed embodiment can include the following benefits：Block by the first of test device
, can be by detecting the second test point on the second deck in test device, to determine terminal during the neck of support insertion terminal
Deck improves the effect whether PIN needle in detection terminal groove is damaged for reading whether the PIN needle of TF cards is damaged in neck
Rate, further reduces the testing time, reduces testing cost.
Optionally, described device also includes：General-purpose serial bus USB interface on the pcb, OTG modules are set, used
In the 3rd deck for installing flash TF cards；
The OTG modules are electrically connected with the USB interface and the 3rd deck respectively, and institute is inserted in the USB interface
When stating the USB interface of terminal, the OTG modules are according to the read write command of the terminal, on the 3rd deck
TF cards perform read-write operation.
The technical scheme provided by this disclosed embodiment can include the following benefits：Pass through the USB in test device
Interface, OTG modules and the 3rd deck, can be such that tester inserts the USB interface of test device after the interface of terminal, you can
OTG functions to terminal are tested, it is not necessary to individually prepared OTG patchcords and OTG instruments again, improved testing efficiency, subtract
Lack the testing time, and then reduce testing cost.
Optionally, described device also includes：Indicator lamp on the pcb, the indicator lamp and the OTG modules are set
Electrical connection.
The technical scheme provided by this disclosed embodiment can include the following benefits：, can be with by setting indicator lamp
When the OTG functional tests of terminal are unqualified, whether lighted by indicator lamp judge the underproof reason of OTG functions whether due to
Fail to caused by TF cards power supply station, further increase testing efficiency.
Optionally, it is the public mouths of USB to set USB interface on the pcb.
Optionally, the USB interface on the PCB is provided with least one the 3rd test point.
The technical scheme provided by this disclosed embodiment can include the following benefits：Connect by the USB of test device
, can be by detecting the 3rd test point on the USB interface in test device, to determine end during the USB interface of mouth insertion terminal
Whether the PIN needle of the USB interface at end is damaged, and improves the efficiency whether PIN needle of the USB interface of detection terminal is damaged, further
Ground reduces the testing time, reduces testing cost.
Optionally, when the neck of the terminal is the shared neck of two SIM cards, two the are provided with the PCB
One deck；
First Kato is electrically connected with described two first decks, and two first are provided with first Kato and is electrically connected
End is connect, when first Kato inserts the neck of terminal, the terminal is read and installed by described two first electric connecting terminals
SIM card on described two first decks.
It should be appreciated that the general description of the above and detailed description hereinafter are only exemplary and explanatory, not
The disclosure can be limited.
Brief description of the drawings
Accompanying drawing herein is merged in specification and constitutes the part of this specification, shows the implementation for meeting the disclosure
Example, and be used to together with specification to explain the principle of the disclosure.
Fig. 1 is a kind of structural representation of the test device of terminal according to an exemplary embodiment；
Fig. 2 is a kind of structural representation in the face of test device first of terminal according to an exemplary embodiment；
Fig. 3 is a kind of structural representation in the face of test device second of terminal according to an exemplary embodiment；
Fig. 4 is the circuit diagram of first deck SIM1 according to an exemplary embodiment a kind of；
Fig. 5 is the circuit diagram of first deck SIM2 according to an exemplary embodiment a kind of；
Fig. 6 is the circuit diagram of first Kato J1 according to an exemplary embodiment a kind of；
Fig. 7 is the circuit diagram of second deck J3 according to an exemplary embodiment a kind of；
Fig. 8 is the circuit diagram of 3rd deck J2 according to an exemplary embodiment a kind of；
Fig. 9 is the circuit diagram of USB interface J4 according to an exemplary embodiment a kind of；
Figure 10 is the circuit diagram of OTG modules U1 according to an exemplary embodiment a kind of；
Figure 11 is the circuit diagram of indicator lamp D1 according to an exemplary embodiment a kind of.
Pass through above-mentioned accompanying drawing, it has been shown that the clear and definite embodiment of the disclosure, will hereinafter be described in more detail.These accompanying drawings
It is not intended to limit the scope that the disclosure is conceived by any mode with word description, but is by reference to specific embodiment
Those skilled in the art illustrate the concept of the disclosure.
Embodiment
Here exemplary embodiment will be illustrated in detail, its example is illustrated in the accompanying drawings.Following description is related to
During accompanying drawing, unless otherwise indicated, the same numbers in different accompanying drawings represent same or analogous key element.Following exemplary embodiment
Described in embodiment do not represent all embodiments consistent with the disclosure.On the contrary, they be only with it is such as appended
The example of the consistent apparatus and method of some aspects be described in detail in claims, the disclosure.
It is described in detail below with specifically embodiment technical scheme of this disclosure.These specific implementations below
Example can be combined with each other, and may be repeated no more for same or analogous concept or process in some embodiments.
Fig. 1 is a kind of structural representation of the test device of terminal according to an exemplary embodiment.Fig. 2 is basis
A kind of structural representation in the face of test device first of terminal shown in one exemplary embodiment.Fig. 2 is according to an exemplary reality
Apply a kind of structural representation in the face of test device first of the terminal exemplified.When front of first face for the test device of terminal
When, the second face is the back side of the test device of terminal, and when the back side of first face for the test device of terminal, the second face is
The front of the test device of terminal.
As shown in Figure 1 to Figure 3, the test device (abbreviation of the terminal：Test device) include：Printed circuit board (PCB) (Printed
Circuit Board, PCB), it is arranged on the first Kato that on PCB and with terminal neck is adapted to, for installing SIM card
At least one first deck.
Wherein, the first Kato is electrically connected with least one first deck, and at least one first electricity is provided with the first Kato
Connection end, when the first Kato inserts the neck of terminal, terminal reads by least one the first electric connecting terminal and is arranged on each
SIM card on first deck.
In the present embodiment, above-mentioned test device can be used for the SIM card function of testing terminal.Wherein, the first electrical connection
The structure at end can specifically be determined according to the arrangement mode of the PIN needle of SIM card deck in neck.First electric connecting terminal is in the first card
Position in support can specifically be determined according to position of the PIN needle of SIM card deck in neck in neck.First electric connecting terminal
Quantity, and the first deck quantity, specifically can according in neck SIM card deck quantity determine.In the present embodiment,
The structure of one deck and SIM card deck in neck can be consistent.
For example, when only one of which SIM card deck in the neck of terminal, can be provided with the PCB of above-mentioned test device
One the first deck.First deck can be electrically connected with the first Kato.Correspondingly, one can be provided with above-mentioned first Kato
The first electric connecting terminal that the individual PIN needle with the SIM card deck is adapted to.When the first Kato inserts the neck of terminal, the SIM card card
The PIN needle of seat is electrically connected by first electric connecting terminal with the first deck.Therefore, terminal can be read installed in first deck
On SIM card.Now, the SIM card installed on the first deck specifically can be in neck SIM card deck support SIM card
It is determined that.Exemplary, when the SIM card deck in neck supports miniature (Micro) SIM card, what is installed on the first deck is
Micro SIM cards.When SIM card deck in neck supports nanometer technology (Nano) SIM card, what is installed on the first deck is
Nano SIM cards.
When having two SIM card decks in the neck of terminal, i.e., the neck of terminal is the shared neck of two SIM cards
When, two the first decks can be provided with the PCB of above-mentioned test device.Two first decks can be with the first Kato electricity
Connection.Wherein, two the first electric connecting terminals, each first electric connecting terminal correspondence, one first card can be provided with the first Kato
Seat and each first electric connecting terminal is corresponding with the PIN needle of a SIM card deck in neck.That is, a certain SIM in the neck of terminal
The PIN needle of card deck passes through the first corresponding electric connecting terminal, corresponding the first deck electrical connection.
Correspondingly, the SIM card installed on each first deck can permitting according to the SIM card deck of the position of this in neck
Perhaps the SIM card installed is determined.Exemplary, to have two SIM card decks, the respectively He of SIM card deck 1 in the neck of terminal
SIM card deck 2, wherein, SIM card deck 1 allows to insert SIM card 1, and SIM card deck 2 allows exemplified by insertion SIM card 2, test dress
The first deck 1 and the first deck 2 are provided with the PCB put, wherein, the first electric connecting terminal 1 and first is provided with the first Kato
Electric connecting terminal 2.First electric connecting terminal 1 is corresponding with the PIN needle of SIM card deck 1 in neck, for by the PIN needle of SIM card deck 1
It is electrically connected with the first deck 1, the first electric connecting terminal 2 is corresponding with the PIN needle of SIM card deck 2 in neck, for by SIM card deck 2
PIN needle connected with the first deck 2.That is, the PIN needle of SIM card deck 1 is electrically connected by corresponding first in the neck of terminal
End 1 is connect, is electrically connected with the first deck 1, the PIN needle of SIM card deck 2 passes through the first corresponding electrical connection in the neck of terminal
End 2, is electrically connected with the first deck 2.Therefore, the above-mentioned corresponding SIM card 1 of first deck 1, the corresponding SIM card 2 of the first deck 2.
Under the scene, when SIM card 1 and SIM card 2 are Micro SIM cards, pacify on the first deck 1 and the first deck 2
Dress is Micro SIM cards.When SIM card 1 is that Micro SIM cards, SIM card 2 are Nano SIM, installed on the first deck 1
Be Micro SIM cards, install on the first deck 2 is Nano SIM cards.When SIM card 1 is that Nano SIM cards, SIM card 2 are
During Micro SIM, installed on the first deck 1 is Nano SIM cards, install on the first deck 2 is Micro SIM cards.
So, when the first Kato inserts the neck of terminal, terminal can be read and installed by two the first electric connecting terminals
SIM card on two the first decks.That is, terminal reads by each first electric connecting terminal and is arranged on first electric connecting terminal
SIM card on corresponding first deck.
That is, above-mentioned test device is by the first Kato and the first deck, can be by the neck of terminal to be tested
PIN needle on internal SIM card deck for reading SIM card leads to the outside of terminal.Therefore, in the present embodiment, tester
When testing the SIM card function of terminal, tester can allow the SIM of installation according to each position in the neck of terminal
Card, it is determined that the SIM card being adapted on the first deck corresponding with the position, and installs on first deck SIM card of the adaptation.
Meanwhile, tester can take out the original-pack Kato of terminal to be tested from neck, and by the first of above-mentioned test device
In the neck of Kato insertion terminal, to simulate the scene that SIM card is inserted in the neck of terminal.
Then, tester can run the test software for testing SIM card function in terminal, to test terminal
Whether SIM card function is normal.For example：Whether tester with reading SIM card, can determine the SIM card of terminal by terminal
Whether function is normal.Whether tester can also can be connected into corresponding carrier network by terminal by SIM card, it is determined that
Whether the SIM card function of terminal is normal etc., test software can specifically be determined according to used in tester, the present embodiment pair
This is without limiting.
After the test of SIM card function is completed, tester can need not be by any instrument (for example：Card taking pin
Deng), above-mentioned test device is directly extracted from the neck of terminal, testing efficiency is improved, the testing time is reduced, and then dropped
Low testing cost.Further, when tester is using above-mentioned test device, to the SIM of multiple terminals of same model
When card function is tested, tester only needs to respectively insert above-mentioned test device the neck of each terminal, is not required to
The operation of plug-in card and card taking is carried out to each terminal, testing efficiency can be greatly improved, test is create a further reduction
Cost.
The test device for the terminal that the disclosure is provided, can be by by the first Kato and the first deck in test device
PIN needle on the inside SIM card deck of the neck of terminal to be tested for reading SIM card leads to the outside of terminal, to survey
When examination personnel insert the first Kato of test device in the neck of terminal, it can simulate and insert SIM card in the neck of terminal
Scene, tested so as to the SIM card function to terminal.Because tester is in the survey for the SIM functions of completing terminal
After examination, directly test device can be extracted from the neck of terminal, it is not necessary to by any instrument, therefore, it is possible to improve
The testing efficiency of the SIM card function of terminal is tested, and then testing cost can be improved and improves testing efficiency, and then can be reduced
Testing time, reduce testing cost.
With continued reference to Fig. 2 and Fig. 3, when the neck of terminal is the shared neck of two SIM cards, i.e., have in the neck of terminal
When having two SIM card decks (by taking SIM card deck 1 and SIM card deck 2 as an example), it can be provided with the PCB of above-mentioned test device
Two the first decks.By taking the first deck SIM1 and the first deck SIM2 as an example, the first deck SIM1 and the first deck SIM2
To be electrically connected with the first Kato J1.Wherein, two the first electric connecting terminals, the respectively first electrical connection are provided with the first Kato J1
Hold the 1, first electric connecting terminal 2.First electric connecting terminal 1 is corresponding with the first deck SIM1 and the first electric connecting terminal 1 and SIM card deck 1
PIN needle correspondence.That is, the PIN needle of SIM card deck 1 by with the first electric connecting terminal 1, electrically connected with the first deck 1.First electricity
Connection end 2 is corresponding with the first deck SIM2 and PIN needle of the first electric connecting terminal 2 and SIM card deck 2 is corresponding.That is, SIM card deck
2 PIN needle by with the first electric connecting terminal 2, electrically connected with the first deck 2.In this way, can be by the neck of terminal
PIN needle on internal SIM card deck for reading SIM card leads to the outside of terminal.
Correspondingly, the SIM card installed on the first deck SIM1 can allow the SIM card of installation according to SIM card deck 1
It is determined that, the SIM card installed on the first deck SIM2 can allow the SIM card installed to determine according to SIM card deck 2.Originally show
Example is exemplified by Micro SIM cards, SIM card 2 are Nano SIM by SIM card 1, i.e., under the scene, installation on the first deck SIM1
Be Micro SIM cards, install on the first deck SIM2 is Nano SIM cards.
Fig. 4 is the circuit diagram of first deck SIM1 according to an exemplary embodiment a kind of.Fig. 5 is according to one
The circuit diagram of first deck SIM2 shown in exemplary embodiment a kind of.Fig. 6 is shown according to an exemplary embodiment
A kind of first Kato J1 circuit diagram.As shown in Figures 4 to 6, when the first deck SIM1 is used to install Micro SIM cards
When, the first deck SIM1 circuit diagram can be as shown in Figure 4.When the first deck SIM2 is used to install Nano SIM cards, first
Deck SIM2 circuit diagram can be as shown in Figure 5.Under the scene, the first Kato J1 circuit diagram can be as shown in Figure 6.
Wherein, Fig. 4 is electrically connected with pin label identical pin in Fig. 6.Specifically, SIM1 pin 1 and 2 and J1 draws
Pin 5 is electrically connected, and SIM1 pin 3 and 4 is electrically connected with J1 pin 6, and SIM1 pin 5 and 6 is electrically connected with J1 pin 7,
SIM1 pin 9 is electrically connected with J1 pin 1.SIM1 pin 10 is electrically connected with J1 pin 2, SIM1 pin 11 and J1's
Pin 3 is electrically connected.
Pin label identical pin has electrical connection in Fig. 5 and Fig. 6.Specifically, SIM2 pin 1 and 2 and J1
Pin 19 electrically connect, SIM2 pin 3 and 4 is electrically connected with J1 pin 18, the electricity of pin 17 of SIM2 pin 5 and 6 and J1
Connection, SIM2 pin 9 is electrically connected with J1 pin 24, and SIM2 pin 10 is electrically connected with J1 pin 23, SIM2 pin
11 electrically connect with J1 pin 22.
With continued reference to Fig. 1 to Fig. 3, further, on the basis of above-described embodiment, may be used also on above-mentioned each first deck
To be provided with least one first test point, the PIN needle of at least one first test point SIM card deck corresponding with the deck
Correspond.That is, SIM card deck there are several PIN needles, just there are several first test points.So, inserted in the first Kato
During the neck of terminal, the PIN needle of the SIM card deck in the neck of terminal is corresponding by its corresponding first electric connecting terminal
The electrical connection of the first deck, and connected with least one first test point on first deck.Therefore, by this at least one
Whether the first test point, can be damaged (for example with the PIN needle of the SIM card deck electrically connected in test card slot with first deck：Collapse
Fall into or lose).
Continue so that test device includes the first deck SIM1 and the first deck SIM2 as an example, when above-mentioned first deck SIM1's
When circuit diagram is as shown in Figure 4, illustrate the circuit diagram of SIM card deck 1 in the corresponding necks of the first deck SIM1 also such as Fig. 4 institutes
Show.Therefore, above-mentioned first deck SIM1 at least one first test point can be as shown in Figure 2.I.e. each of SIM card deck draws
Pin (i.e. PIN needle) one the first test point of correspondence.When above-mentioned first deck SIM2 circuit diagram is as shown in Figure 5, illustrate first
The circuit diagram of SIM card deck 2 in the corresponding necks of deck SIM2 is also as shown in Figure 5.Therefore, above-mentioned first deck SIM2 is extremely
Few first test point can be as shown in Figure 2.That is one first test of each pin (i.e. PIN needle) correspondence of SIM card deck
Point.
Wherein, the present embodiment does not limit whether tester is damaged by the PIN needle of the first test point test SIM card deck
Mode.For example, tester can detect each first test point resistance to earth value in terminal closedown using universal meter.
Then, tester can according to the difference of each first test point resistance to earth value and the standard value of first test point,
To judge whether the PIN needle of the corresponding SIM card deck of each first test point is damaged.When the corresponding difference of a certain first test point
During predetermined threshold value corresponding more than the first test point, or, it is impossible to, can be with when detecting a certain first test point resistance to earth value
Determine that the PIN needle of the corresponding SIM card deck of first test point is damaged.The standard value of above-mentioned described each first test point
Can for same model terminal SIM card deck PIN needle when not damaging, tester detects in first test point
Effective resistance value.Wherein, above-mentioned predetermined threshold value can be determined according to the model of terminal.
With in correlation technique, tester need by terminal dismantle open, to remove the SIM of terminal from the mainboard of terminal
After deck, then the PIN needle resistance to earth value of SIM card holder and the difference of standard value are detected, to judge SIM card holder in neck
Whether PIN needle, which is damaged, is compared, the method for the present embodiment, can improve detection terminal groove in SIM card deck PIN needle whether
The efficiency of damage, further reduces the testing time, reduces testing cost.Further, by terminal power-off state
The mode of SIM card deck PIN needle in lower test terminal groove, can avoid during detection PIN needle, damage and lead because of PIN needle
Short circuit is caused, the situation of terminal mainboard is burnt.
The test device for the terminal that the disclosure is provided, can when the first Kato of test device to be inserted to the neck of terminal
With by detecting the first test point on the first deck in test device, to determine that the PIN needle of SIM card holder in terminal groove is
It is no to damage, the efficiency whether PIN needle of the SIM card deck in detection terminal groove is damaged is improved, test is further reduced
Time, reduce testing cost.
Terminal manufacturer can also test the flash (Trans- of terminal before the terminal produced is dispatched from the factory
Flash, TF) whether function normal.In correlation technique, when the SIM card and TF cards of terminal share same neck, tester needs
SIM card to be taken out from neck after SIM card function has been tested.Then, tester loads onto TF on original-pack Kato again
Block, and Kato is inserted into the neck of terminal, it is whether normal with the TF functions of testing terminal.When terminal is provided that using card taking pin
During the Kato of card taking, tester is after the TF functions of terminal have been tested, in addition it is also necessary to by card taking pin by TF cards from terminal
Take out so that testing efficiency is relatively low, and testing cost is higher.
With continued reference to Fig. 2 and Fig. 3, when the neck that the neck of terminal shares for SIM card and TF cards, i.e., the card of above-mentioned terminal
There is an integrated deck in groove, when the integrated deck can also insert TF cards with plug sim card, above-mentioned test device can also be wrapped
Include：Being arranged on is used for the second deck for installing TF cards on PCB.Wherein, the first Kato is electrically connected with the second deck, on the first Kato
The second electric connecting terminal is provided with, when the first Kato inserts neck, terminal reads by the second electric connecting terminal and is arranged on the second card
TF cards on seat.Wherein, above-mentioned integrated deck can not insert SIM card and TF cards simultaneously.In above-mentioned integrated deck insertion SIM card
When, the PIN needle that the integrated deck is used for reading SIM card is corresponding with the first deck, in above-mentioned integrated deck insertion TF cards, the collection
The PIN needle for being used to read TF cards into deck is corresponding with the second deck.
In the present embodiment, above-mentioned test device can be also used for testing the TF functions of terminal.Wherein, the second electric connecting terminal
Structure specifically can according to integrated deck in neck be used for read TF cards PIN needle arrangement mode determination.Second electrical connection
Hold the position on the first Kato specifically can be according to integrated deck in neck for reading position of the PIN needle of TF cards in neck
Put determination.
That is, above-mentioned test device is by the first Kato and the second deck, can be by the neck of terminal to be tested
It is internally integrated the outside that deck leads to terminal for reading the PIN needle of TF cards.Therefore, in the present embodiment, tester is surveying
When trying the TF functions of terminal, tester can install TF cards on the second deck.Meanwhile, tester can will be to be tested
The original-pack Kato of terminal is taken out from neck, and the first Kato of above-mentioned test device is inserted in the neck of terminal, to simulate
The scene of TF cards is inserted in the neck of terminal.
Then, tester can run the test software for testing TF card functions in terminal, to test terminal
Whether TF functions are normal.For example：Whether tester can read TF cards by terminal, determine terminal TF functions whether
It is normal etc., test software it can specifically be determined according to used in tester, the present embodiment is to this without limiting.
After the test of TF functions is completed, tester can need not be by any instrument (for example：Card taking pin etc.),
Above-mentioned test device is directly extracted from the neck of terminal, testing efficiency is improved, reduces the testing time, and then reduce
Testing cost.Further, when tester is using above-mentioned test device, the TF functions to multiple terminals of same model are entered
During row test, tester only needs to respectively insert above-mentioned test device the neck of each terminal, it is not necessary to each
Terminal carries out the operation of plug-in card and card taking, and testing efficiency can be greatly improved, testing cost is create a further reduction.
The test device for the terminal that the disclosure is provided, can be by by the first Kato and the second deck in test device
Being internally integrated for the neck of terminal to be tested is used for the outside that the PIN needle for reading TF cards leads to terminal on deck, to cause test
When personnel insert the first Kato of test device in the neck of terminal, the field that TF cards are inserted in the neck of terminal can be simulated
Scape, is tested so as to the TF functions to terminal., can be with because tester is after the test of TF functions of terminal is completed
Directly test device is extracted from the neck of terminal, it is not necessary to by any instrument, therefore, it is possible to improve test terminal
The testing efficiency of TF functions, and then testing cost can be improved improve testing efficiency, and then the testing time can be reduced, reduce
Testing cost.
With continued reference to Fig. 2 and Fig. 3, by taking the second deck J3 and the first Kato J1 as an example, the first Kato J1 and the second deck J3
The second electric connecting terminal is provided with electrical connection, the first Kato J1, when the first Kato J1 inserts neck, terminal is electrically connected by second
End is connect, the TF cards being arranged on the second deck J3 are read.In this way, can be by the inside collection of the neck of terminal to be tested
The outside of terminal is led to for reading the PIN needle of TF cards into deck.
Fig. 7 is the circuit diagram of second deck J3 according to an exemplary embodiment a kind of.Such as Fig. 6 to Fig. 7 institutes
Show, above-mentioned second deck J3 circuit diagram can be as shown in Figure 7.Wherein, Fig. 6 is electrically connected with pin label identical pin in Fig. 7
Connect.Specifically, TF pin 1 is electrically connected with J1 pin 16, and TF pin 2 is electrically connected with J1 pin 15, TF pin 3 with
J1 pin 14 is electrically connected, and TF pin 4 is electrically connected with J1 pin 13, and TF pin 6 is electrically connected with J1 pin 12, TF's
Pin 7 is electrically connected with J1 pin 11, and TF pin 8 is electrically connected with J1 pin 10, and TF pin 9 and J1 pin 9 is electrically connected
Connect.
With continued reference to Fig. 2 to Fig. 3, further, on the basis of above-described embodiment, it can also be set on above-mentioned second deck
At least one second test point is equipped with, PIN of at least one second test point with integrated deck in neck for reading TF cards
Pin is corresponded.That is, integrated deck there are several PIN needles for being used to read TF cards, just there are several second test points.This
Sample, when the first Kato inserts the neck of terminal, integrated deck is right by its for the PIN needle for reading TF cards in the neck of terminal
The second electric connecting terminal answered, is electrically connected with the second deck, and is connected with least one second test point on the second deck.Cause
This, whether at least one second test point by this, the PIN needle that can be used to read TF cards with integrated deck in test card slot is damaged
(for example：Collapse or lose).
Continue so that test device includes the second deck J3 as an example, when above-mentioned second deck J3 circuit diagram is as shown in Figure 7,
Illustrate that the integrated deck in the corresponding necks of the second deck J3 is also as shown in Figure 7 for the circuit diagram for reading TF cards.Therefore, it is above-mentioned
Second deck J3 at least one second test point can be as shown in Figure 2.I.e. integrated deck is used for each pin for reading TF cards
One the second test point of (i.e. PIN needle) correspondence.
Wherein, the present embodiment does not limit tester and tests integrated deck for reading TF cards by the second test point
The mode whether PIN needle is damaged.For example, tester can detect each second test in terminal closedown using universal meter
Point resistance to earth value.Then, tester can be according to the mark of each second test point resistance to earth value and second test point
The difference of quasi- value, to judge the corresponding integrated deck of each second test point for reading whether the PIN needle of TF cards is damaged.When
When the corresponding difference of a certain second test point is more than the second test point corresponding predetermined threshold value, or, it is impossible to detect a certain the
During two test point resistance to earth values, it may be determined that the PIN needle that the corresponding integrated deck of second test point is used to read TF cards is damaged
It is bad.The standard value of above-mentioned described each second test point can be used to read TF cards for the integrated deck of the terminal of same model
PIN needle when not damaging, the effective resistance value that tester detects in second test point.Wherein, above-mentioned predetermined threshold value
It can be determined according to the model of terminal.
With in correlation technique, tester need by terminal dismantle open, to remove the collection of terminal from the mainboard of terminal
Into after deck, then detect that integrated deck is used to read the PIN needle resistance to earth value of TF cards and the difference of standard value, to judge card
Whether integrated deck is used to read the PIN needles of TF cards and damages and compare in groove, and the method for the present embodiment can improve detection terminal card
Integrated deck in groove is used to read the efficiency whether PIN needle of TF cards is damaged, and further reduces the testing time, reduces
Testing cost.Further, the PIN for reading TF cards by testing integrated deck in terminal groove to be used under terminal power-off state
The mode of pin, can be avoided during detection PIN needle, being damaged because of PIN needle causes short circuit, burns the situation of terminal mainboard.
The test device for the terminal that the disclosure is provided, can when the first Kato of test device to be inserted to the neck of terminal
With by detecting the second test point on the second deck in test device, to determine that deck is used to read TF cards in terminal groove
PIN needle whether damage, the efficiency whether damaged of PIN needle in detection terminal groove is improved, when further reducing test
Between, reduce testing cost.
Terminal manufacturer is before the terminal produced is dispatched from the factory, and can also test OTG (On-The-Go) function of terminal is
It is no normal.In correlation technique, when testing the OTG functions of terminal, tester needs to use OTG patchcords by OTG instrument (examples
Such as：Mouse, keyboard etc.) connected with USB (Universal Serial Bus, USB) interface of terminal, to test
Whether the OTG functions of terminal are normal.
With continued reference to Fig. 2 and Fig. 3, above-mentioned test device can also include：Be arranged on USB interface on PCB, OTG modules,
The 3rd deck for installing TF cards；Wherein, OTG modules are electrically connected with USB interface and the 3rd deck respectively, are inserted in USB interface
When entering the USB interface of terminal, OTG modules perform read-write according to the read write command of terminal to the TF cards on the 3rd deck
Operation.Wherein, the USB interface of above-mentioned test device is the interface being adapted to the USB interface of terminal, for example, when the USB of terminal connects
When mouth is micro USB interfaces, the USB interface of above-mentioned test device is also micro USB interfaces.Optionally, as the USB of terminal
When interface is public mouth, the USB interface of above-mentioned test device can be female mouth, when the USB interface of terminal is female mouth, above-mentioned test
The USB interface of device can be public mouth.
In the present embodiment, above-mentioned test device can be also used for testing the OTG functions of terminal.Specifically, tester
When testing the OTG functions of terminal, tester can install TF cards on the 3rd deck.Meanwhile, tester will can survey
The USB interface that trial assembly is put inserts the USB interface of terminal.Then, tester can be run in terminal for testing OTG functions
Test software, it is whether normal with the OTG functions of testing terminal.For example：Whether tester be able to can be read by terminal
The data in TF cards on 3rd deck, or whether data can be write to the TF cards on the 3rd deck, determine the OTG of terminal
Whether function is normal etc., test software can specifically be determined according to used in tester, the present embodiment is to this without limit
It is fixed.
When testing the OTG functions of terminal by above-mentioned test device, tester need not can individually prepare OTG and turn again
Wiring and OTG instruments, improve testing efficiency, reduce the testing time, and then reduce testing cost.Further, survey is worked as
Examination personnel are using above-mentioned test device, and when testing the OTG functions of multiple terminals of same model, tester only needs
Above-mentioned test device is inserted to the USB interface of each terminal respectively, testing efficiency can be greatly improved, further
Ground reduces testing cost.
Optionally, above-mentioned terminal can also be powered by the OTG modules of test device to the TF cards on the 3rd deck, with
So that TF can be with normal work.Then on the basis of above-described embodiment, above-mentioned test device can also include being arranged on PCB
Indicator lamp, indicator lamp is electrically connected with OTG modules.In OTG module of the terminal by test device, to the TF cards on the 3rd deck just
Often during power supply, indicator lamp can light.Therefore, whether whether tester can be lighted by indicator lamp, to judge terminal to
TF card normal power supplies on three decks.In this way, OTG work(can be judged when the OTG functional tests of terminal are unqualified
Whether the underproof reason of energy further increases testing efficiency due to failing to caused by TF cards power supply station.Wherein, above-mentioned finger
It can be any indicator lamp that can be lighted to show lamp, for example：Diode etc..
The test device for the terminal that the disclosure is provided, by the USB interface in test device, OTG modules and the 3rd deck,
Tester can be made to insert the USB interface of test device after the interface of terminal, you can the OTG functions to terminal are surveyed
Examination, it is not necessary to individually prepare OTG patchcords and OTG instruments again, improve testing efficiency, reduces the testing time, and then reduce
Testing cost.
With continued reference to Fig. 2, by taking the 3rd deck J2, USB interface J4, OTG module U1 as an example, OTG modules U1 connects with USB respectively
Mouthful J4 and the 3rd deck J2 electrical connections, when USB interface J4 inserts the USB interface of terminal, OTG modules U1 is according to the read-write of terminal
Instruction, read-write operation is performed to the TF cards on the 3rd deck J2.
Fig. 8 is the circuit diagram of 3rd deck J2 according to an exemplary embodiment a kind of.Fig. 9 is shown according to one
Example property implements a kind of USB interface J4 exemplified circuit diagram.Figure 10 is one kind according to an exemplary embodiment
OTG modules U1 circuit diagram.Figure 11 is the circuit diagram of indicator lamp D1 according to an exemplary embodiment a kind of.
As shown in Figs. 8 to 11, above-mentioned 3rd deck J2 circuit diagram can be as shown in Figure 8.Above-mentioned USB interface J4 circuit diagram can be with
As shown in Figure 9.Above-mentioned OTG modules U1 circuit diagram can be as shown in Figure 10.When above-mentioned indicator lamp D1 is diode, above-mentioned finger
Show that lamp D1 circuit diagram can be as shown in figure 11.
Wherein, Fig. 8 is electrically connected with pin label identical pin in Figure 10.Specifically, the pin 19 of J2 pin 1 and U1
Electrical connection, J2 pin 2 is electrically connected with U1 pin 18, and J2 pin 3 is electrically connected with U1 pin 17, J2 pin 5 and U1
Pin 13 electrically connect, J2 pin 7 is electrically connected with U1 pin 12, and J2 pin 8 is electrically connected with U1 pin 11, and J2's draws
Pin 9 is electrically connected with U1 pin 9.Fig. 9 is electrically connected with pin label identical pin in Figure 10.Specifically, J4 pin 3 and U1
Pin 4 electrically connect, J4 pin 4 is electrically connected with U1 pin 3.Figure 11 is electrically connected with pin label identical pin in Figure 10
Connect.Specifically, D1 can be electrically connected with U1 pin 20.
With continued reference to Fig. 2, further, on the basis of above-described embodiment, the USB interface on above-mentioned PCB be provided with to
PIN needle in the USB interface of few 3rd test point, at least one the 3rd test point and terminal is corresponded.Namely
Say, the USB interface of terminal there are several PIN needles, just there are several 3rd test points.So, inserted eventually in the USB interface of test device
During the USB interface at end, the PIN needle in the USB interface of terminal is electrically connected with the USB interface of test device, and with USB interface extremely
Few 3rd test point connection.Therefore, at least one the 3rd test point by this, can test the PIN of the USB interface of terminal
Whether pin damages (for example：Collapse or lose).
Continue so that test device includes USB interface J4 as an example, when above-mentioned USB interface J4 circuit diagram is as shown in Figure 9, say
The circuit diagram of the USB interface of the corresponding terminal of bright USB interface J4 is also as shown in Figure 9.Therefore, at least the one of above-mentioned USB interface J4
Individual 3rd test point can be as shown in Figure 2.That is one the 3rd test of each pin (i.e. PIN needle) correspondence of the USB interface of terminal
Point.
Wherein, the present embodiment do not limit tester by the 3rd test point test terminal USB interface PIN needle whether
The mode of damage.For example, tester can detect each 3rd test point resistance to earth in terminal closedown using universal meter
Value.Then, tester can be according to each 3rd test point resistance to earth value and the difference of the standard value of the 3rd test point
Value, to judge whether the PIN needle of USB interface of the corresponding terminal of each 3rd test point is damaged.When a certain 3rd test point pair
When the difference answered is more than the 3rd test point corresponding predetermined threshold value, or, it is impossible to detect a certain 3rd test point resistance to earth
During value, it may be determined that the PIN needle of the USB interface of the corresponding terminal of the 3rd test point is damaged.Above-mentioned described each 3rd survey
The standard value of pilot can for same model terminal USB interface PIN needle when not damaging, tester the 3rd survey
The effective resistance value that pilot is detected.Wherein, above-mentioned predetermined threshold value can be determined according to the model of terminal.
With in correlation technique, tester need by terminal dismantle open, to remove the end of terminal from the mainboard of terminal
After the USB interface at end, then the difference of the PIN needle resistance to earth value and standard value of the USB interface of terminal is detected, to judge terminal
The PIN needle of USB interface whether damage and compare, the method for the present embodiment can improve the PIN needle of the USB interface of detection terminal
The efficiency whether damaged, further reduces the testing time, reduces testing cost.Further, by terminal closedown
The mode of the PIN needle of the USB interface of terminal is tested under state, can be avoided during detection PIN needle, be damaged and lead because of PIN needle
Short circuit is caused, the situation of terminal mainboard is burnt.
The test device for the terminal that the disclosure is provided, when the USB interface of test device to be inserted to the USB interface of terminal,
Can by detecting the 3rd test point on the USB interface in test device, come determine terminal USB interface PIN needle whether
Damage, improve the efficiency whether PIN needle of the USB interface of detection terminal is damaged, further reduce the testing time, reduce
Testing cost.
It should be noted that the test device that the application Fig. 2 and Fig. 3 are provided only is a kind of signal, the application is in tool
When body is realized, layout on PCB of the structure and all parts of test device and to be limited.But, using Fig. 2 and Fig. 3
During shown structure, the structure of test device is smaller, and cost is relatively low.
Those skilled in the art will readily occur to its of the disclosure after considering specification and putting into practice disclosure disclosed herein
Its embodiment.The application is intended to any modification, purposes or the adaptations of the disclosure, these modifications, purposes or
Person's adaptations follow the general principle of the disclosure and including the undocumented common knowledge in the art of the disclosure
Or conventional techniques.Description and embodiments are considered only as exemplary, and the true scope of the disclosure and spirit are by following
Claims are pointed out.
It should be appreciated that the precision architecture that the disclosure is not limited to be described above and is shown in the drawings, and
And various modifications and changes can be being carried out without departing from the scope.The scope of the present disclosure is only limited by appended claims
System.
Claims (9)
1. a kind of test device of terminal, it is characterised in that including：Printing board PCB, sets first on the pcb
Kato, at least one first deck for installing client identification module SIM card；Wherein,
First Kato is electrically connected with least one described first deck, be provided with first Kato at least one first
Electric connecting terminal, first Kato insert terminal neck when, the terminal by least one described first electric connecting terminal,
Read the SIM card being arranged on each first deck.
2. device according to claim 1, it is characterised in that each first deck is provided with least one first survey
Pilot.
3. device according to claim 1, it is characterised in that the neck is that SIM card and flash TF cards are shared
Neck, the test device also includes：Set is used for the second deck for installing TF cards on the pcb；
First Kato is electrically connected with second deck, the second electric connecting terminal is provided with first Kato, described
When first Kato inserts the neck, the terminal is read and is arranged on second deck by second electric connecting terminal
TF cards.
4. device according to claim 3, it is characterised in that second deck is provided with least one second test
Point.
5. device according to claim 1, it is characterised in that described device also includes：On the pcb general is set
Serial bus USB interface, OTG modules, the 3rd deck for installing flash TF cards；
The OTG modules are electrically connected with the USB interface and the 3rd deck respectively, and the end is inserted in the USB interface
During the USB interface at end, the OTG modules are according to the read write command of the terminal, to the TF cards on the 3rd deck
Perform read-write operation.
6. device according to claim 5, it is characterised in that described device also includes：Instruction on the pcb is set
Lamp, the indicator lamp is electrically connected with the OTG modules.
7. device according to claim 5, it is characterised in that it is the public mouths of USB to set USB interface on the pcb.
8. device according to claim 5, it is characterised in that the USB interface on the PCB be provided with least one the 3rd
Test point.
9. the device according to claim any one of 1-8, it is characterised in that in the neck of the terminal be two SIM cards
During shared neck, two the first decks are provided with the PCB；
First Kato is electrically connected with described two first decks, and two first electrical connections are provided with first Kato
End, when first Kato inserts the neck of terminal, the terminal is arranged on by described two first electric connecting terminals, reading
SIM card on described two first decks.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201710385462.3A CN107231462A (en) | 2017-05-26 | 2017-05-26 | The test device of terminal |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201710385462.3A CN107231462A (en) | 2017-05-26 | 2017-05-26 | The test device of terminal |
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| Publication Number | Publication Date |
|---|---|
| CN107231462A true CN107231462A (en) | 2017-10-03 |
Family
ID=59933869
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201710385462.3A Pending CN107231462A (en) | 2017-05-26 | 2017-05-26 | The test device of terminal |
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| CN (1) | CN107231462A (en) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2019071530A1 (en) * | 2017-10-12 | 2019-04-18 | 深圳传音通讯有限公司 | Testing method and testing device applicable to expansion card of intelligent apparatus |
| CN111124962A (en) * | 2019-11-13 | 2020-05-08 | 苏州浪潮智能科技有限公司 | TF (Transflash) card slot multiplexing method and system based on server PCH (physical channel) and BMC (baseboard management controller) |
| CN112118342A (en) * | 2019-06-21 | 2020-12-22 | 神讯电脑(昆山)有限公司 | SIM card slot detection device |
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| CN103347113A (en) * | 2013-06-27 | 2013-10-09 | 深圳市中软信达电子有限公司 | Testing device and method of mobile phone SIM socket |
| CN204740313U (en) * | 2015-07-16 | 2015-11-04 | 青岛海信移动通信技术股份有限公司 | Cassette test fixture |
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| US6263746B1 (en) * | 1998-08-06 | 2001-07-24 | Inventec Corporation | Slot assembly test apparatus |
| CN102394098A (en) * | 2011-10-11 | 2012-03-28 | 南通芯迎设计服务有限公司 | USB (Universal Serial Bus) flash disc with function of OTG (On-The-Go) reading |
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Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
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| WO2019071530A1 (en) * | 2017-10-12 | 2019-04-18 | 深圳传音通讯有限公司 | Testing method and testing device applicable to expansion card of intelligent apparatus |
| CN112118342A (en) * | 2019-06-21 | 2020-12-22 | 神讯电脑(昆山)有限公司 | SIM card slot detection device |
| CN111124962A (en) * | 2019-11-13 | 2020-05-08 | 苏州浪潮智能科技有限公司 | TF (Transflash) card slot multiplexing method and system based on server PCH (physical channel) and BMC (baseboard management controller) |
| CN111124962B (en) * | 2019-11-13 | 2021-06-29 | 苏州浪潮智能科技有限公司 | TF (Transflash) card slot multiplexing method and system based on server PCH (physical channel) and BMC (baseboard management controller) |
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Application publication date: 20171003 |