CN108344909B - Automatic test method and system for IC card terminal and upper computer - Google Patents
Automatic test method and system for IC card terminal and upper computer Download PDFInfo
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- CN108344909B CN108344909B CN201810025547.5A CN201810025547A CN108344909B CN 108344909 B CN108344909 B CN 108344909B CN 201810025547 A CN201810025547 A CN 201810025547A CN 108344909 B CN108344909 B CN 108344909B
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
Abstract
The invention provides an automatic test method of an IC card terminal, a system and an upper computer thereof, wherein the method comprises the following steps: the system comprises a tested terminal, a signal adapter plate, a virtual oscilloscope and an upper computer which are connected in sequence; the signal adapter plate is used for being electrically connected with an IC card contact of the tested terminal, and an IC card test signal is led out by the signal adapter plate in the process that the tested terminal continuously triggers the IC card to be subjected to power-on and power-off operation; the virtual oscilloscope is used for collecting the IC card test signal from the signal adapter plate and sending the IC card test signal to the upper computer; and the upper computer is used for testing the IC card test signal according to the financial payment card standard. The invention can realize the automatic test of the contact type IC card of the terminal, and has the advantages of low test cost, accurate test result and high efficiency.
Description
Technical Field
The invention relates to the field of testing of contact type IC card terminals, in particular to an automatic IC card terminal testing method based on a virtual oscilloscope, a system and an upper computer thereof.
Background
The traditional contact type IC card test needs manual test item by item after extracting various test indexes according to EMV or PBOC standards, and the test method has the problems of low test efficiency, high error probability of manual test and the like.
Specifically, the conventional test method has the following disadvantages:
(1) the testing efficiency is low, and the testing personnel need to spend half a day or more of working time for testing.
(2) The test cost is high, more labor cost is invested, a traditional oscilloscope is needed during the test, and the price of the traditional oscilloscope ranges from tens of thousands yuan to tens of thousands yuan.
(3) The test system has larger volume and poor portability, and the test volume of the scheme is small, so that the portable requirements of various users can be met.
(4) The test result may cause the phenomena of wrong filling, missing filling and the like due to human factors,
disclosure of Invention
The technical problem to be solved by the invention is as follows: the automatic test method, the system and the upper computer for the IC card terminal are provided, the automatic test of the contact type IC card of the terminal is realized, the test cost is low, the test result is accurate, and the test efficiency is high.
In order to solve the technical problems, the invention adopts the technical scheme that:
an IC card terminal automatic test system based on a virtual oscilloscope comprises a tested terminal, a signal adapter plate, the virtual oscilloscope and an upper computer which are connected in sequence;
the signal adapter plate is used for being electrically connected with an IC card contact of the tested terminal, and an IC card test signal is led out by the signal adapter plate in the process that the tested terminal continuously triggers the IC card to be subjected to power-on and power-off operation;
the virtual oscilloscope is used for collecting the IC card test signal from the signal adapter plate and sending the IC card test signal to the upper computer;
and the upper computer is used for testing the IC card test signal according to the financial payment card standard.
The invention provides another technical scheme as follows:
an IC card terminal automatic test method based on a virtual oscilloscope comprises the following steps:
in the process that the tested terminal continuously triggers the on-off operation of the IC card, an IC card test signal is led out through a signal adapter plate which is electrically connected with an IC card contact of the tested terminal;
collecting the IC card test signal through a virtual oscilloscope connected with the signal adapter plate, and sending the IC card test signal to an upper computer;
and the upper computer tests the IC card test signal according to the financial payment card standard and generates a test report.
The third technical scheme provided by the invention is as follows:
a host computer comprising one or more processors and memory, the memory having stored thereon computer programs and being configured to perform, by the one or more processors, the steps of:
testing the IC card test signal received by the upper computer according to the financial payment card standard, and generating a test report;
the IC card test signal is led out by a signal adapter plate electrically connected with an IC card contact of the terminal to be tested in the process of continuously triggering the on-off operation of the IC card at the terminal to be tested, and then is collected by a virtual oscilloscope and sent to an upper computer.
The invention has the beneficial effects that: the invention is an automatic test process, can reduce the test flow of the traditional contact type IC card, obviously improves the test efficiency and has low test cost. Specifically, the IC card signals are led out through the signal adapter plate to be collected by the virtual oscilloscope and fed back to the upper computer for analysis and test on the premise of not damaging the terminal. The whole testing process only needs thirty-two seconds, so that the testing efficiency is greatly improved; meanwhile, compared with the traditional oscilloscope with high cost, the virtual oscilloscope with low cost can realize the test, thereby greatly saving the test cost; furthermore, the test system is small in size and convenient to carry; furthermore, the invention is an automatic testing process, and can effectively avoid errors caused by manual testing, thereby improving the testing precision.
Drawings
FIG. 1 is a schematic diagram of the structural connection of the IC card terminal automatic test system based on the virtual oscilloscope of the present invention;
FIG. 2 is a schematic flow chart of the IC card terminal automatic testing method based on the virtual oscilloscope according to the present invention;
fig. 3 is a flowchart illustrating a second embodiment of the present invention.
Description of reference numerals:
1. a terminal to be tested; 2. a virtual oscilloscope; 3. a signal transfer board; 4. and (4) an upper computer.
Detailed Description
In order to explain technical contents, achieved objects, and effects of the present invention in detail, the following description is made with reference to the accompanying drawings in combination with the embodiments.
The most key concept of the invention is as follows: on the premise of not damaging the terminal, the IC card signal is led out through the signal adapter plate to be collected by the virtual oscilloscope and fed back to the upper computer for analysis and test.
The technical terms related to the invention are explained as follows:
referring to fig. 1, the invention provides an IC card terminal automated test system based on a virtual oscilloscope, which comprises a tested terminal, a signal adapter board, a virtual oscilloscope and an upper computer, which are connected in sequence;
the signal adapter plate is used for being electrically connected with an IC card contact of the tested terminal, and an IC card test signal is led out by the signal adapter plate in the process that the tested terminal continuously triggers the IC card to be subjected to power-on and power-off operation;
the virtual oscilloscope is used for collecting the IC card test signal from the signal adapter plate and sending the IC card test signal to the upper computer;
and the upper computer is used for testing the IC card test signal according to the financial payment card standard.
From the above description, the beneficial effects of the present invention are: the terminal IC card automatic test system can reduce the test flow of the traditional contact type IC card, obviously improve the test efficiency and has low test cost. In particular, the following advantages are provided: 1. the virtual oscilloscope is used for replacing the traditional oscilloscope, so that the test cost is saved, and the test efficiency is improved. 2. The signal adapter plate is used for testing the IC card signal without disassembling the IC card. 3. The signal adapter plate has high fidelity to the signal due to the short wiring, a fool-proof design and testable double-sided insertion. 4. The program flexibility is large, the test standard can be updated according to the updating of the test standard, and the output report can be designed according to the requirements of customers.
Furthermore, the signal adapter plate comprises a front-end golden finger structure, a middle-end signal leading-out structure and a rear-end IC card slot;
the rear-end IC card slot and the front-end golden finger structure are respectively electrically connected with an IC card contact of the tested terminal; the middle-end signal leading-out structure is electrically connected with the front-end golden finger structure;
the golden finger contact of the front-end golden finger structure is matched with the IC card contact of the tested terminal and is used for leading out an IC card test signal to the middle-end signal leading-out structure after being electrically connected with the IC card contact;
and the rear-end IC card slot is used for replacing the IC card inserted by the induction of the tested terminal.
As can be seen from the above description, the front end of the signal adapter plate is designed as a gold finger contact adapted to the shape and size of the IC card chip, and a signal trace is respectively led out from each contact to the middle end as a test point; an IC card slot is arranged at the rear end for inserting a normal IC card for use, so that the IC card signals are printed out for being acquired and obtained by the virtual oscilloscope on the premise of not damaging the terminal.
Further, the method also comprises the following steps:
and the upper computer automatically generates a test report according to the test result.
According to the description, the test report can be automatically generated according to the test result, the phenomena of filling errors, missing filling and the like of the traditional manual filling list are avoided, and therefore the accuracy and the effectiveness of the test result are guaranteed.
Further, the upper computer comprises a measurement and control software module for testing the received IC card test signal and judging whether the IC card test signal meets an index range extracted according to the specification requirements including EMV and PBOC; and automatically generating a corresponding test report according to the judgment result.
According to the description, the upper computer directly utilizes the measurement and control software module to realize the automatic and accurate test of the IC card signals, the test is a program implementation process, the adjustment flexibility is high, the test can be updated according to the updating of the test specification, and the requirements of customers are better met.
Further, the indexes at least comprise a level index and a time sequence index; the level index is whether the maximum level in the IC card test signal exceeds a preset first threshold value or not; the time sequence index is whether the signal rising time is within a preset second threshold value range.
Further, the first threshold is 5.5V; the second threshold is 20 ms.
From the above description, it can be known that the IC card is tested according to the established unified standard specification of the IC card in the industry, and the validity of the test result is ensured.
Further, the measurement and control software module is a Lab VIEW measurement and control software module.
According to the description, the Lab VIEW measurement and control software module with strong test function can be directly adopted to realize the automatic analysis and test of the IC card signals, and an accurate test result is obtained, so that the test efficiency is further improved.
Furthermore, the tested terminal comprises an upper and lower electric operation module which is used for controlling the opening and the disconnection of an IC bayonet line of the tested terminal.
According to the description, the opening and the disconnection of the IC card port line of the terminal are controlled through software, the process of power-on and power-off of the plugged IC card is simulated, and the automatic test of the IC card signals is realized.
Further, the terminal to be tested is a POS machine.
Therefore, the method is particularly suitable for IC card-based business development of financial POS machines and other terminal devices which need to frequently plug and unplug IC cards to test IC card signals, and ensures that the IC cards of the financial POS machines have good functions.
Referring to fig. 2, a second technical solution provided by the present invention is:
an IC card terminal automatic test method based on a virtual oscilloscope comprises the following steps:
in the process that the tested terminal continuously triggers the on-off operation of the IC card, an IC card test signal is led out through a signal adapter plate which is electrically connected with an IC card contact of the tested terminal;
collecting the IC card test signal through a virtual oscilloscope connected with the signal adapter plate, and sending the IC card test signal to an upper computer;
and the upper computer tests the IC card test signal according to the financial payment card standard and generates a test report.
Further, the IC card test signal is led out through a signal adapter plate electrically connected to the IC card contact of the terminal to be tested, specifically:
the inserted IC card is sensed through the IC card slot at the rear end of the signal adapter plate;
and an IC card test signal is led out to a middle-end signal leading-out structure of the signal adapter plate through a golden finger contact matched with an IC card contact of a tested terminal on the front-end golden finger structure of the signal adapter plate.
Further, the upper computer tests the IC card test signal according to the financial payment card standard and generates a test report, specifically:
testing the received IC card test signal through a measurement and control software module of the upper computer, and judging whether the IC card test signal meets an index range extracted according to the standard requirements including EMV and PBOC; and automatically generating a corresponding test report according to the judgment result.
Further, the indexes at least comprise a level index and a time sequence index; the level index is whether the maximum level in the IC card test signal exceeds a preset first threshold value or not; the time sequence index is whether the signal rising time is within a preset second threshold value range.
Further, the first threshold is 5.5V; the second threshold is 20 ms.
Further, the measurement and control software module is a Lab VIEW measurement and control software module.
Further, the terminal under test constantly triggers the power-on and power-off operation of the IC card, specifically:
the tested terminal controls the opening and the disconnection of an IC (integrated circuit) bayonet line of the terminal through the power-on and power-off operation module.
Further, the terminal to be tested is a POS machine.
The third technical scheme provided by the invention is as follows:
a host computer comprising one or more processors and memory, the memory having stored thereon computer programs and being configured to perform, by the one or more processors, the steps of:
testing the IC card test signal received by the upper computer according to the financial payment card standard, and generating a test report;
the IC card test signal is led out by a signal adapter plate electrically connected with an IC card contact of the terminal to be tested in the process of continuously triggering the on-off operation of the IC card at the terminal to be tested, and then is collected by a virtual oscilloscope and sent to an upper computer.
Further, the computer program is a Lab VIEW measurement and control computer program.
Furthermore, the upper computer is a PC terminal or a tablet or an intelligent terminal.
Example one
Referring to fig. 3, the present embodiment provides an IC card terminal automated testing system based on a virtual oscilloscope, which includes a tested terminal, a signal adapter board, a virtual oscilloscope, and an upper computer electrically connected in sequence. The terminal to be tested is a terminal with an IC card function, such as a financial POS machine;
the tested terminal comprises an upper and lower electric operating module which is used for controlling the opening and the disconnection of an IC bayonet line of the tested terminal. The power-on and power-off operation module controls the opening and the disconnection of the IC card port line of the terminal through software so as to simulate the power-on and power-off process of the plug-in IC card and realize automatic test for the test system.
The signal adapter plate is used for being electrically connected with an IC card contact of a tested terminal, and an IC card test signal is led out by the signal adapter plate in the process that the tested terminal continuously triggers the up-down electric operation of the IC card.
Specifically, the signal adapter plate comprises a front-end golden finger structure, a middle-end signal leading-out structure and a rear-end IC card slot. The front end golden finger structure is a golden finger structure simulating the contact of the IC card; the middle-end signal leading-out structure is connected with the front-end golden finger structure and is used for leading out an IC card test signal to the middle of the adapter plate; the rear end IC card slot is an IC card inserting structure for inserting a normal IC card and is used as a test basis.
Preferably, the structure of the signal adapter plate is as compact as possible, so that the wiring is as short as possible, and the high fidelity of signal transmission is ensured; meanwhile, the two sides of the front-end golden finger structure of the signal adapter plate are consistent, namely, the two sides can be tested by inserting, so that the signal adapter plate has a foolproof function.
The circuit design principle of the signal transfer board is as follows: the front end of the signal adapter plate to be inserted into the terminal IC card slot is provided with a golden finger contact which is the same as the shape and size of the IC card chip and is used for being electrically connected with the IC card contact on the terminal, and after the IC card is inserted, IC card signals read by the terminal are led out from each contact and are wired to the middle of the adapter plate to be used as test points. Preferably, a test point is used for a BNC cable or a test point is used for a probe.
The signal adapter plate is used for leading out the IC card signal of the terminal on the premise of not damaging the terminal (disassembling machine) so as to be acquired and obtained by the virtual oscilloscope.
The virtual oscilloscope is used for collecting the IC card test signal from the signal adapter plate and sending the IC card test signal to the upper computer.
A virtual oscilloscope is a small hardware structure that is integrated with high performance modularity. Various testing, measuring and automation devices are completed by combining efficient and flexible programmable software. The flexible and efficient software may help the user create a fully customized user interface, and the modular hardware may conveniently provide full system integration to meet various needs of the customer. In this embodiment, the virtual oscilloscope mainly plays a role in acquiring and feeding back signals, and the virtual oscilloscope probe acquires signals transmitted from the signal adapter plate and feeds the signals back to the upper computer for analysis and judgment.
And the upper computer is used for testing the IC card test signal according to the financial payment card standard. Such as a PC or tablet or other intelligent terminal.
Specifically, the upper computer comprises a measurement and control software module, such as a Lab VIEW measurement and control software module. The upper computer tests the received IC card test signal by using the measurement and control software module and judges whether the IC card test signal meets an index range extracted according to the standard requirements including EMV and PBOC; and automatically generating a corresponding test report according to the judgment result.
In this embodiment, the Lab VIEW measurement and control software module is mainly programmed in the form of a computer program to design a test flow meeting EMV index and/or PBOC specification. And the test index and the test flow can be updated at any time along with the version update of the test specification. The Lab VIEW measurement and control software module mainly plays a role in control and judgment in the system. The corresponding signal of the virtual oscilloscope test can be controlled by LabVIEW programming, whether the signal meets the EMV or PBOC standard requirement or not can be judged according to the test result, wherein the specific standard of judgment is that the terminal index requirement is extracted according to the EMV or PBOC standard, for example, the maximum level index does not exceed 5.5V, the signal rise time of the time sequence index is within 20ns and the like, and the LabVIEW specifically designs a test program according to the extracted index requirement. The complete program judges whether the test is passed or not by judging whether the test data is in the extracted standard range or not, and automatically generates a test report after a test conclusion is obtained.
According to the automatic test system for the IC card terminal based on the virtual oscilloscope, the signal adapter plate is used for leading out the contact IC card signal from the inside of the tested terminal, and the Lab VIEW measurement and control software module is used for programming and controlling the virtual oscilloscope to collect the signal and then analyzing the signal, so that the automatic test system which accords with the Unionpay contact IC card test standard is provided.
Example two
Referring to fig. 3, the present embodiment provides a method for automatically testing an IC card terminal based on a virtual oscilloscope, based on the system provided in the first embodiment, including:
s1: the terminal controls the IC card port line of the terminal to be circularly opened and closed through the power-on and power-off operation module software so as to simulate the process of power-on and power-off of the plugged IC card;
s2: inserting the front end of the signal adapter plate into an IC card slot of a test terminal, wherein a golden finger structure at the front end is electrically connected with an IC card contact of the tested terminal;
s3: a normal IC card is inserted in the rear IC card slot of the signal adapter plate; the terminal induces the inserted IC card through the rear IC card slot of the signal adapter plate;
s4: and each contact on the front-end golden finger structure of the signal adapter plate leads out an IC card test signal wiring to the middle-end signal leading-out structure of the signal adapter plate.
S5: the upper computer controls the virtual oscilloscope to collect the IC card test signal on the signal leading-out structure at the middle end of the signal adapter plate through the Lab VIEW measurement and control software module and sends the IC card test signal to the upper computer;
s6: the upper computer tests the received IC card test signal through a Lab VIEW measurement and control software module and judges whether the IC card test signal meets an index range extracted according to the specification requirements including EMV and PBOC; and automatically generating a corresponding test report according to the judgment result.
Specifically, the specific standard of judgment is the terminal index requirement extracted according to the EMV or PBOC specification, for example, the maximum level index does not exceed 5.5V, the signal rise time of the timing index is within 20ns, and the like, and LabVIEW specifically designs a test program according to the extracted index requirement.
Preferably, the testing process is a process of testing item by item, if the current item passes the test, the testing data (including the result) is recorded, and the next item is continuously tested; if the current item test is not passed, recording the test data (including the result), and continuing to test the next item until each item is tested, and outputting a test report after probing.
EXAMPLE III
The embodiment corresponds to the first embodiment, and provides an upper computer which can be a PC terminal or a tablet or other intelligent terminals.
The upper computer of this embodiment includes one or more processors and a memory, and the memory stores thereon a computer program, preferably a computer program executed by the Lab VIEW instrumentation module, and is configured to execute the following steps by the one or more processors:
testing the IC card test signal received by the upper computer according to the financial payment card standard, and generating a test report;
the IC card test signal is led out by a signal adapter plate electrically connected with an IC card contact of the terminal to be tested in the process of continuously triggering the on-off operation of the IC card at the terminal to be tested, and then is collected by a virtual oscilloscope and sent to an upper computer.
In summary, according to the automatic testing method, the system and the upper computer for the IC card terminal provided by the invention, the virtual oscilloscope is used for replacing the traditional oscilloscope, so that the testing cost is saved, and the testing efficiency is improved; meanwhile, the signal adapter plate is used for testing the IC card signal on the premise that the terminal does not need to be dismounted; furthermore, the signal adapter plate is short in wiring, high in fidelity to signals and foolproof in design, and can be tested when being taken into two sides; furthermore, the invention is a computer program implementation process, which can be updated according to the updating of the test specification, and has high flexibility.
The above description is only an embodiment of the present invention, and not intended to limit the scope of the present invention, and all equivalent changes made by using the contents of the present specification and the drawings, or applied directly or indirectly to the related technical fields, are included in the scope of the present invention.
Claims (15)
1. An IC card terminal automatic test system based on a virtual oscilloscope is characterized by comprising a tested terminal, a signal adapter plate, the virtual oscilloscope and an upper computer which are sequentially connected;
the signal adapter plate is used for being electrically connected with an IC card contact of the tested terminal, and an IC card test signal is led out by the signal adapter plate in the process that the tested terminal continuously triggers the IC card to be subjected to power-on and power-off operation;
the virtual oscilloscope is used for collecting the IC card test signal from the signal adapter plate and sending the IC card test signal to the upper computer;
the upper computer is used for testing the IC card test signal according to the financial payment card standard;
the signal adapter plate comprises a front-end golden finger structure, a middle-end signal leading-out structure and a rear-end IC card slot;
the rear-end IC card slot and the front-end golden finger structure are respectively electrically connected with an IC card contact of the tested terminal; the middle-end signal leading-out structure is electrically connected with the front-end golden finger structure;
the golden finger contact of the front-end golden finger structure is matched with the IC card contact of the tested terminal and is used for leading out an IC card test signal to the middle-end signal leading-out structure after being electrically connected with the IC card contact;
and the rear-end IC card slot is used for replacing the IC card inserted by the induction of the tested terminal.
2. The IC card terminal automated test system based on a virtual oscilloscope of claim 1, further comprising:
and the upper computer automatically generates a test report according to the test result.
3. The virtual oscilloscope-based automatic test system for the IC card terminal according to claim 2, wherein the upper computer comprises a measurement and control software module for testing the received IC card test signal and judging whether the test signal meets the index range extracted according to the specification requirements including EMV and PBOC; and automatically generating a corresponding test report according to the judgment result.
4. The virtual oscilloscope-based IC card terminal automated test system according to claim 3, wherein the indicators at least comprise level indicators and timing indicators; the level index is whether the maximum level in the IC card test signal exceeds a preset first threshold value or not; the time sequence index is whether the signal rising time is within a preset second threshold value range.
5. The virtual oscilloscope-based IC card terminal automated test system according to claim 4, wherein the first threshold is 5.5V; the second threshold is 20 ms.
6. The virtual oscilloscope-based IC card terminal automated test system according to claim 3, wherein the measurement and control software module is a Lab VIEW measurement and control software module.
7. The virtual oscilloscope-based automatic test system for the IC card terminal is characterized in that the tested terminal comprises an electric-up and electric-down operation module which is used for controlling the opening and the disconnection of an IC card port line of the tested terminal.
8. The virtual oscilloscope-based IC card terminal automated test system according to claim 1, wherein the terminal under test is a POS machine.
9. An IC card terminal automatic test method based on a virtual oscilloscope is characterized by comprising the following steps:
in the process that the tested terminal continuously triggers the on-off operation of the IC card, an IC card test signal is led out through a signal adapter plate which is electrically connected with an IC card contact of the tested terminal;
collecting the IC card test signal through a virtual oscilloscope connected with the signal adapter plate, and sending the IC card test signal to an upper computer;
the upper computer tests the IC card test signal according to the financial payment card standard and generates a test report;
the IC card test signal is led out through the signal adapter plate electrically connected with the IC card contact of the tested terminal, and the method specifically comprises the following steps:
the inserted IC card is sensed through the IC card slot at the rear end of the signal adapter plate;
and an IC card test signal is led out to a middle-end signal leading-out structure of the signal adapter plate through a golden finger contact matched with an IC card contact of a tested terminal on the front-end golden finger structure of the signal adapter plate.
10. The IC card terminal automated testing method based on the virtual oscilloscope of claim 9, wherein the upper computer tests the IC card test signal according to a financial payment card standard and generates a test report, specifically:
testing the received IC card test signal through a measurement and control software module of the upper computer, and judging whether the IC card test signal meets an index range extracted according to the standard requirements including EMV and PBOC; and automatically generating a corresponding test report according to the judgment result.
11. The virtual oscilloscope-based IC card terminal automated testing method according to claim 10, wherein the indicators at least include a level indicator and a timing indicator; the level index is whether the maximum level in the IC card test signal exceeds a preset first threshold value or not; the time sequence index is whether the signal rising time is within a preset second threshold value range.
12. The virtual oscilloscope-based IC card terminal automated testing method according to claim 11, wherein the first threshold is 5.5V; the second threshold is 20 ms.
13. The virtual oscilloscope-based IC card terminal automated testing method according to claim 10, wherein the measurement and control software module is a Lab VIEW measurement and control software module.
14. The IC card terminal automated testing method based on the virtual oscilloscope of claim 9, wherein the tested terminal constantly triggers an IC card power-on and power-off operation, specifically:
the tested terminal controls the opening and the disconnection of an IC (integrated circuit) bayonet line of the terminal through the power-on and power-off operation module.
15. The virtual oscilloscope-based IC card terminal automated testing method according to claim 9, wherein the terminal under test is a POS machine.
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| CN104111359A (en) * | 2014-07-16 | 2014-10-22 | 赤松城(北京)科技有限公司 | Contact card reliability testing system |
| CN106526350A (en) * | 2015-09-15 | 2017-03-22 | 上海京微智能科技有限公司 | Card test method and system |
| CN106841975A (en) * | 2016-12-14 | 2017-06-13 | 新智数字科技有限公司 | A kind of test system |
-
2018
- 2018-01-11 CN CN201810025547.5A patent/CN108344909B/en active Active
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