CN214041654U

CN214041654U - Special chip test system based on 8-bit MCU

Info

Publication number: CN214041654U
Application number: CN202023101632.7U
Authority: CN
Inventors: 杨明
Original assignee: Wuxi Xinmingyuan Microelectronics Co ltd
Current assignee: Wuxi Xinmingyuan Microelectronics Co ltd
Priority date: 2020-12-22
Filing date: 2020-12-22
Publication date: 2021-08-24
Anticipated expiration: 2030-12-22

Abstract

The utility model belongs to the technical field of chip testing, in particular to a special chip testing system based on 8-bit MCU, and the following scheme is proposed, which comprises a testing system bus and an 8-bit MCU chip, wherein the testing system bus comprises a logic bus and an analog bus; the logic BUS includes an 8-bit DATA BUS (DATA _ BUS), 4-bit address BUS (ADDR _ BUS) function controls CTRL0 and CTRL1, interrupt signals INT0 and INT1, and TIMER signals TIMER0 and TIME 1; the analog bus comprises dual-channel ADC input signals AD1P, AD1N, AD2P and AD2N, a reference voltage VREF, voltage stabilizing sources 9V,5V,3.3V and VCC _ ADJ. The utility model discloses the system provides a test system based on 8 MCU chips, can test 8 MCU chips specially, and special test system test speed is faster.

Description

Special chip test system based on 8-bit MCU

Technical Field

The utility model relates to a chip test technical field especially relates to a special test system of chip based on 8 MCU.

Background

The chip is also called as an integrated circuit, and the most advanced integrated circuit is the core of a microprocessor or a multi-core processor and can control everything from a computer to a mobile phone to a digital microwave oven. While the cost of designing and developing a complex integrated circuit is very high, the cost per integrated circuit is minimized when spread over a typical million products. The performance of the integrated circuit is very high, because the small size brings a short path, so that the low-power logic circuit can be applied at a fast switching speed, under a normal condition, each function of each module of the chip needs to have an independent test item, so that the number of the test items is very large for the chip with high internal IP complexity, and meanwhile, the small-batch chip needs to perform independent verification test on each chip.

The 8-bit MCU chip is a universal chip, is mainly applied to a micro electronic system, has high market share, is difficult to realize in wafer level test, cannot simply and directly test main performance and functional parameters, and is realized by some special processes and methods, the cost of the middle-low end MCU chip is limited, and the larger part of chips are not provided with DFT modules (modules for auxiliary test), so the testability is poor.

The existing chip testing machine is a universal testing machine, and can not test single and special chips, so that the speed of a chip testing system is low, and the practicability of the device is reduced.

SUMMERY OF THE UTILITY MODEL

Based on current chip test machine that proposes in the background art is universal test machine, can not test single and dedicated chip, and the test system speed that leads to the chip is slower, has reduced the technical problem of the practicality of device, the utility model provides a special test system of chip based on 8 MCU.

The utility model provides a special test system of chip based on 8 bit MCU, include test system bus and 8 bit MCU chips, the test system bus contains logic bus and analog bus;

the logic BUS includes an 8-bit DATA BUS (DATA _ BUS), 4-bit address BUS (ADDR _ BUS) function controls CTRL0 and CTRL1, interrupt signals INT0 and INT1, and TIMER signals TIMER0 and TIME 1;

the analog bus comprises dual-channel ADC input signals AD1P, AD1N, AD2P and AD2N, reference voltage VREF, voltage stabilizing sources 9V,5V,3.3V and VCC _ ADJ, a relay driving power supply KVCC and a Trim special power supply EVCC.

Preferably, the test system bus comprises a regulated power supply, and the regulated power supply is a low-noise regulated power supply.

Preferably, the low-noise linear voltage-stabilized power supply provides an accurate and stable low-noise power supply, the 12V direct-current power supply input by the external adapter is stabilized to generate various power supplies and reference voltages required by the test, and the low-noise linear voltage-stabilized power supply provides the accurate and stable low-noise power supply and can meet the requirement that some special chips provide ultra-small-amplitude and ultra-low-noise input signals.

Preferably, the 8-bit MCU chip is an operation and control core of the system, and the flow and parameter extraction and range comparison of each test item of the chip are operated, and the result is counted; meanwhile, the internal servo program completes the communication with the upper computer and the result reporting work.

Preferably, the test system bus includes a dedicated chip custom DUT test board, and the dedicated chip custom DUT test board is a DUT test board developed according to each target chip custom.

Preferably, the special chip-customized DUT test board comprises a test circuit and corresponding relays, switches and test auxiliary circuits, which are special for each chip type, and connecting wires connected to Probe Card or Handler Socket.

Preferably, the 8-bit MCU chip can control a relay or Analog Switch on the DUT test board through a data line and an address line provided by the test system bus, for switching a voltage or a signal to each pin of the unit under test, and switching the signal and the voltage of each pin of the unit under test to a corresponding Analog test port in the test system; meanwhile, the test auxiliary circuit on the DUT test board can amplify, shape and sample signals on all pins of the tested unit, the special-purpose customized DUT test board is arranged, the special-purpose chip customized DUT test board is a DUT test board which is customized and developed according to each target chip, more complex parallel data output and verification comparison of some special-purpose chips can be customized and analyzed, meanwhile, the test auxiliary circuit on the DUT test board can amplify, shape and sample the signals on all pins of the tested unit, and the chips can be tested more clearly.

Preferably, the 8-bit MCU chip completes communication with an upper computer through a serial interface, the communication protocol is RS232, and the baud rate is 57600 bps.

Preferably, the upper computer can configure a test program and a test specification for the MCU test system through the interface, and receive and count test data and a yield report.

Preferably, the test system bus is provided with a high-precision dual-channel 16-bit Sigma-Delta ADC for measuring electrical parameters such as current and voltage in the parameters; the a/D conversion rate is 256 times/sec.

The utility model provides a beneficial effect does:

1. this special test system of chip based on 8 MCU, this system provide the test system based on 8 MCU chips, can test 8 MCU chips specially, and special test system test speed is faster.

2. According to the chip special test system based on the 8-bit MCU, the low-noise linear stabilized power supply is arranged and provides an accurate and stable low-noise power supply, and the requirements that some special chips provide input signals with ultra-small amplitude and ultra-low noise can be met.

3. This special test system of chip based on 8 bit MCU tests the board through being provided with dedicated customization DUT, and special chip customization DUT tests the board and is tested the board according to the DUT that every kind of target chip customization was developed, and it can customize and analyze the more complicated parallel data output of some special-purpose chips and check and compare, and the test auxiliary circuit on the DUT tests the board simultaneously can be amplified, the plastic and the sampling with the signal on each pin of unit under test, can be more clear test the chip.

The parts of the device not involved are the same as or can be implemented using prior art.

Drawings

Fig. 1 is a schematic structural diagram of a chip dedicated test system based on an 8-bit MCU according to the present invention;

fig. 2 is a schematic diagram of a structure of the chip dedicated test system based on the 8-bit MCU according to the present invention;

fig. 3 is a schematic structural diagram of a logic bus of the chip-specific test system based on the 8-bit MCU according to the present invention;

fig. 4 is the utility model provides a structural diagram of the analog bus of the chip special test system based on 8-bit MCU.

Detailed Description

The technical solution of the present patent will be described in further detail with reference to the following embodiments.

Reference will now be made in detail to embodiments of the present patent, examples of which are illustrated in the accompanying drawings, wherein like or similar reference numerals refer to the same or similar elements or elements having the same or similar function throughout. The embodiments described below with reference to the drawings are exemplary only for the purpose of explaining the present patent and are not to be construed as limiting the present patent.

In the description of this patent, it is to be understood that the terms "center," "upper," "lower," "front," "rear," "left," "right," "vertical," "horizontal," "top," "bottom," "inner," "outer," and the like are used in the orientations and positional relationships indicated in the drawings for the convenience of describing the patent and for the simplicity of description, and are not intended to indicate or imply that the referenced devices or elements must have a particular orientation, be constructed and operated in a particular orientation, and are not to be considered limiting of the patent.

In the description of this patent, it is noted that unless otherwise specifically stated or limited, the terms "mounted," "connected," and "disposed" are to be construed broadly and can include, for example, fixedly connected, disposed, detachably connected, disposed, or integrally connected and disposed. The specific meaning of the above terms in this patent may be understood by those of ordinary skill in the art as appropriate.

Referring to fig. 1-4, a chip special test system based on 8-bit MCU includes a test system bus and an 8-bit MCU chip, wherein the test system bus includes a logic bus and an analog bus;

the analog bus comprises dual-channel ADC input signals AD1P, AD1N, AD2P and AD2N, a reference voltage VREF, voltage stabilizing sources 9V,5V,3.3V and VCC _ ADJ, a relay driving power supply KVCC and a Trim special power supply EVCC.

The utility model discloses in, the test system bus is including constant voltage power supply, and constant voltage power supply is low noise voltage power supply.

The utility model discloses in, the linear constant voltage power supply of low noise provides accurate, stable low noise power, produces the required various power of test and reference electricity with the 12V DC power supply of external adapter input through the steady voltage, and through being provided with the linear constant voltage power supply of low noise, the linear constant voltage power supply of low noise provides accurate, stable low noise power, can satisfy the requirement that some special chip provided the input signal of super small range and super low noise.

In the utility model, the 8-bit MCU chip is the operation and control core of the system, and the flow of each test item and the parameter extraction and range comparison of the operation chip are performed, and the result is counted; meanwhile, the internal servo program completes the communication with the upper computer and the result reporting work.

The utility model discloses in, the test system bus is surveyed the board including special chip customization DUT, and special chip customization DUT surveys the board and is surveyed the board according to the DUT of every kind of target chip customization development.

The utility model discloses in, special chip customization DUT surveys test panel has contained dedicated test circuit of every money chip and corresponding relay, switch and test auxiliary circuit, and be connected to Probe Card or Handler Socket's connecting wire, survey test panel through being provided with dedicated customization DUT, special chip customization DUT surveys test panel is the DUT that surveys development according to every kind of target chip customization and surveys test panel, it can customize the parallel data output and the check-up of some special chip complicacies and compare, the test auxiliary circuit that DUT surveyed on the test panel can be amplified the signal on each pin of unit under test simultaneously, plastic and sampling, can be more clear test the chip.

In the utility model, the 8-bit MCU chip can control the relay or Analog Switch on the DUT test board through the data line and the address line provided by the test system bus, and is used for switching the voltage or signal of each pin of the tested unit and switching the signal and voltage of each pin of the tested unit to the corresponding simulation test port in the test system; meanwhile, the test auxiliary circuit on the DUT test board can amplify, shape and sample the signals on each pin of the tested unit.

The utility model discloses in, 8 communication between MCU chips pass through serial interface completion and the upper computer, communication protocol is RS232, and the baud rate is 57600 bps.

The utility model discloses in, this interface of upper computer accessible is to MCU test system configuration test procedure and test specification to and receive and statistics test data and yield report form.

The utility model discloses in, the test system bus is provided with 16 position Sigma-Delta ADC of high accuracy binary channels for current, voltage electricity isoparametric in the measurement parameter; the a/D conversion rate is 256 times/sec.

This system provides the test system based on 8 bit MCU chips, can test 8 bit MCU chips specially, special test system test speed is faster, the linear constant voltage power supply of low noise provides the accuracy, stable low noise power supply, can satisfy some special chip and provide the requirement of ultra-small range and ultra-low noise's input signal, special chip customization DUT surveys the board and surveys the board according to the DUT of every kind of target chip customization development, it can customize the parallel data output and the check-up comparison that some special chip are more complicated, the test auxiliary circuit that the DUT surveyed on the board can be with being surveyed the signal on each pin of unit and be enlargied, the plastic and the sampling, can be more clear test the chip.

The above, only be the concrete implementation of the preferred embodiment of the present invention, but the protection scope of the present invention is not limited thereto, and any person skilled in the art is in the technical scope of the present invention, according to the technical solution of the present invention and the utility model, the concept of which is equivalent to replace or change, should be covered within the protection scope of the present invention.

Claims

1. A chip special test system based on 8-bit MCU comprises a test system bus and an 8-bit MCU chip, and is characterized in that the test system bus comprises a logic bus and an analog bus;

the logic bus includes an 8-bit data bus, 4-bit address bus function controls CTRL0 and CTRL1, interrupt signals INT0 and INT1, and TIMER signals TIMER0 and TIME 1;

2. The system of claim 1, wherein the test system bus comprises a regulated power supply, and the regulated power supply is a low noise regulated power supply.

3. The system of claim 2, wherein the low-noise linear voltage regulator provides accurate and stable low-noise power, and the 12V DC power input by the external adapter is regulated to generate the power and reference voltage required by the test.

4. The system of claim 1, wherein the 8-bit MCU chip is the core of the system, and the flow and parameter extraction and range comparison of each test item of the running chip, and the statistical results; meanwhile, the internal servo program completes the communication with the upper computer and the result reporting work.

5. The 8-bit MCU based chip specific test system of claim 1, wherein the test system bus comprises a specific chip custom DUT test board, and the specific chip custom DUT test board is a DUT test board developed according to each target chip custom.

6. The system of claim 5, wherein the customized chip-specific test board comprises a test circuit specific to each chip, a corresponding relay, a switch, a test auxiliary circuit, and a connection line for connecting to a Probe Card or a Handler Socket.

7. The chip-specific test system based on 8-bit MCU of claim 1, wherein the 8-bit MCU chip can control the relay or Analog Switch on the DUT test board through the data line and address line provided by the test system bus for switching the voltage or signal to each pin of the unit under test and switching the signal and voltage of each pin of the unit under test to the corresponding Analog test port in the test system; meanwhile, the test auxiliary circuit on the DUT test board can amplify, shape and sample the signals on each pin of the tested unit.

8. The system as claimed in claim 1, wherein the 8-bit MCU chip is used for communication with the upper computer via a serial interface, the communication protocol is RS232, and the baud rate is 57600 bps.

9. The system of claim 8, wherein the host computer can configure test programs and test specifications for the MCU test system, and receive and count test data and yield reports.

10. The system of claim 9, wherein the test system bus is provided with a high-precision dual-channel 16-bit Sigma-Delta ADC for measuring electrical parameters such as current and voltage among the parameters; the a/D conversion rate is 256 times/sec.