CN209248512U - Multichannel flash chip test device - Google Patents
Multichannel flash chip test device Download PDFInfo
- Publication number
- CN209248512U CN209248512U CN201822116678.2U CN201822116678U CN209248512U CN 209248512 U CN209248512 U CN 209248512U CN 201822116678 U CN201822116678 U CN 201822116678U CN 209248512 U CN209248512 U CN 209248512U
- Authority
- CN
- China
- Prior art keywords
- chip
- test device
- multichannel
- flash chip
- multichannel flash
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
Abstract
The utility model discloses a kind of multichannel flash chip test devices, including power interface, MCU main control module, at least one chip special fixture and LCD display module, the power interface, at least one chip special fixture, LCD display module are connected with MCU main control module respectively；Power interface selects the power interface for having USB communication chip；Multiple chip special fixtures may be implemented multichannel flash chip with MCU main control module and test simultaneously；Setting EEPROM module is connect with MCU main control module, and the storage of test data may be implemented；Switching push button, which is arranged, may be implemented to check the switching of multi-channel test.The multichannel flash chip test device of the utility model, rationally, high reliablity can be improved testing efficiency and export specific service life data reporting for design.
Description
Technical field
The utility model relates to chip testing technology fields, and in particular to a kind of multichannel flash chip test device.
Background technique
The Chinese utility model patent of Publication No. CN203026141U discloses a kind of flash plate for test,
It includes plate body and array the flash chip on plate body, and setting plate body edge and connect the flash chip with
Interface for connecting with host computer, interface contain the stitch for selecting flash chip, and the program is for carrying out
The test of flash.
The Chinese invention patent application of Publication No. CN106653097A provides a kind of test macro of FLASH chip,
It includes main control server, aging cabinet and test control panel, and test board is inserted into testing jack；Main control server instructs test
It is issued to test control panel, test control panel issues control test board according to test instruction again, controls test board to be tested
FLASH carries out functional test；Main control server controls the temperature control system of aging cabinet, and control aging cabinet temperature curve controls aging cabinet
Temperature；The data feedback is simultaneously given to main control server by the test data of collecting test process, while by FLASH's to be tested
Each electric parameter data feedback is given to main control server, and main control server carries out FLASH to be tested according to the data of feedback
Automatic screening and mark.The program reduces the movement in test process to FLASH test, improves FLASH testing efficiency.
Flash chip test macro disclosed in the Chinese utility model patent of Publication No. CN208172174U includes meter
Multiple measuring heads are arranged in the test machine of calculation machine and connection computer, test machine, and each measuring head is connected to a probe station, each spy
Needle platform is equipped with one for being electrically connected the probe card of chip under test, and test machine is using multiple measuring heads to the quilt put on the probe card
Chip is surveyed to be tested simultaneously.
In design R&D process, related frequency is used for external flash chip, but on chip storage life,
The only value that producer provides, cannot make specific assessment.But when chip evaluation quality, life test is one
A relatively important parameter.And the flash read-write chip bought on the market, only there are write-in data and read the function of data
Can, do not have the authentication function in the service life under various speed, in order to specific analysis chip, obtains a comparable parameter
Value, one piece of the design automatic testing equipment for flash chip are reasonably necessary.
Utility model content
In order to solve the above-mentioned technical problem, the utility model provides a kind of multichannel flash chip test device, can be with
The write-in service life is tested to multiple external flash chips simultaneously, and according to the speed of writing speed, obtains the chip service life；Meanwhile needle
To each piece of flash chip, corresponding lifetime data is shown on LCD respectively, can also be reported by computer downloading data.
To achieve the goals above, the utility model adopts the following technical solution.
The multichannel flash chip test device of the utility model, including power interface, further include MCU main control module, core
Piece special fixture and LCD display module, the power interface, chip special fixture, LCD display module respectively with MCU master control mould
Block is connected.
Preferably, the power interface uses the power interface with USB communication chip.
In any of the above-described technical solution preferably, the MCU main control module controls chip using RN8213/8215 type
And support circuit.
In any of the above-described technical solution preferably, the multichannel flash chip test device includes at least one
For clamping the chip special fixture of flash chip.
In any of the above-described technical solution preferably, the multichannel flash chip test device includes that 6 chips are special
With fixture, 6 chip special fixtures are separately connected RN8213/8215 type control chip.
In any of the above-described technical solution preferably, 6 flash chips are respectively arranged at 6 chip special fixtures, institute
It states 6 chip special fixtures and is separately connected RN8213/8215 type control chip, the RN8213/8215 type control chip realizes 6
Road flash chip is tested simultaneously.
In any of the above-described technical solution preferably, the LCD display module includes 8 LCD displays and mating electricity
Road.
In any of the above-described technical solution preferably, 8 LCD displays connection N8213/8215 type controls core
Test data is transmitted to 8 LCD displays and shown by piece, N8213/8215 type control chip.
In any of the above-described technical solution preferably, the multichannel flash chip test device further includes EEPROM
Module.
In any of the above-described technical solution preferably, the EEPROM module connection RN8213/8215 type controls chip,
RN8213/8215 type controls chip and test data is transmitted to EEPROM module storage.
In any of the above-described technical solution preferably, the multichannel flash chip test device further include switching by
Button.
In any of the above-described technical solution preferably, the switching push button connects 8 LCD displays, is pressed by switching
Button realizes that the switching of test device multi-channel test is checked.
Compared with prior art, the above-mentioned technical proposal of the utility model has the following beneficial effects:
The flash test device of the utility model is a kind of multichannel flash chip test device, flash may be implemented
The test of chip storage life improves testing efficiency and exports specific service life data reporting.Test device design is simple, in device
Each functional module layout and the setting of component connection relationship rationally, improve testing reliability.As long as tester installs flash core
Piece and unlocking testing device just obtain specific flash chip lifetime data after the completion of waiting test.
Detailed description of the invention
In order to illustrate the embodiment of the utility model or the technical proposal in the existing technology more clearly, below will be to embodiment
Or attached drawing needed to be used in the description of the prior art is briefly described, it should be apparent that, the accompanying drawings in the following description is only
It is some embodiments of the utility model, for those of ordinary skill in the art, before not making the creative labor property
It puts, is also possible to obtain other drawings based on these drawings.
Fig. 1 is the test device according to a preferred embodiment of the multichannel flash chip test device of the utility model
Structural schematic diagram；
Fig. 2 is the test device according to a preferred embodiment of the multichannel flash chip test device of the utility model
Interior circuit diagram.
Specific embodiment
The following will be combined with the drawings in the embodiments of the present invention, carries out the technical scheme in the embodiment of the utility model
Clearly and completely describe, it is clear that the described embodiments are only a part of the embodiments of the utility model, rather than whole
Embodiment.Based on the embodiments of the present invention, those of ordinary skill in the art are without making creative work
Every other embodiment obtained, fall within the protection scope of the utility model.
In order to overcome flash test the problems of in the prior art, the utility model embodiment proposes that one kind is more
Channel flash chip test device can test the write-in service life to multiple external flash chips simultaneously, and according to writing speed
Speed, obtain the chip service life；Meanwhile for each piece of flash chip, corresponding lifetime data is shown on LCD respectively,
It can be reported by computer downloading data.
The multichannel flash chip test device of the present embodiment includes power interface, MCU main control module, chip exclusive clamps
Tool and LCD display module, power interface, chip special fixture, LCD display module are connected with MCU main control module respectively.
The multichannel flash chip test device of the present embodiment includes the chip that at least one is used to clamp flash chip
Special fixture.
As shown in Figure 1, the multichannel flash chip test device of the present embodiment has 6 chip special fixtures, 6 cores
Piece special fixture is separately connected MCU main control module.
As shown in Figure 1, the multichannel flash chip test device of the present embodiment, power interface is used to be communicated with USB
The power interface of chip.
As shown in Fig. 2, the multichannel flash chip test device of the present embodiment, MCU main control module uses RN8213/
8215 types control chip and support circuit.6 chip special fixtures are separately connected RN8213/8215 type control chip.
The multichannel flash chip test device of the present embodiment, 6 flash chips are respectively arranged at 6 chip exclusive clamps
Tool, 6 chip special fixtures are separately connected RN8213/8215 type control chip, and RN8213/8215 type controls chip and realizes 6 tunnels
Flash chip is tested simultaneously.
The multichannel flash chip test device of the present embodiment, LCD display module include 8 LCD displays and mating
Circuit.8 LCD display connection N8213/8215 types control chip, and N8213/8215 type control chip transmits test data
It is shown to 8 LCD displays.
As shown in Fig. 2, the multichannel flash chip test device of the present embodiment, uses JHD13232 type LCD and shows mould
Block.
As shown in Fig. 2, the multichannel flash chip test device of the present embodiment further includes EEPROM module.EEPROM mould
Block connects RN8213/8215 type and controls chip, and test data is transmitted to EEPROM module and deposited by RN8213/8215 type control chip
Storage.
The multichannel flash chip test device of the present embodiment further includes switching push button.It is aobvious that switching push button connects 8 LCD
Display screen realizes that the switching of the multi-channel test result data of test device is checked by switching push button.
The multichannel flash chip test device of the present embodiment is related to electronic technology field, is a auxiliary raw material inspection
It surveys, the test verifying device of research and development type selecting assessment, is illustrated according to above-mentioned hardware configuration, the multichannel flash chip test device
Design it is reasonable, each section of device completes its necessary work, and finally realize flash chip life test task；It can
To realize the test of the storage life of multichannel flash chip, improves testing efficiency and export specific service life data reporting.Tester
As long as member's chip and unlocking testing device just obtain specific chip lifetime data after the completion of waiting test.
In conjunction with Fig. 1 to 2, the course of work of the multichannel flash chip test device of the present embodiment is further illustrated:
Multichannel flash chip test device is provided with 6 chip special fixtures, and 6 chip special fixtures are separately connected
MCU main control module may be implemented to 6 external flash chips while test the write-in service life, and according to the speed of writing speed,
Obtain the chip service life.Meanwhile for every chip piece, corresponding lifetime data is shown in LCD display module respectively, it can also be with
The report that computer downloads test data is connected by USB interface.
The power interface of multichannel flash chip test device has USB communication chip (USB interface), can pass through PC
End obtains data.MCU main control module is mainly responsible for using RN8213/8215 type control chip and support circuit to flash chip
Route be written read operation, judge data correctly whether, realize chip life test.It is logical that RN8213/8215 type controls chip
6 chip special fixtures of connection are crossed, while 6 tunnel flash chips can be tested.It is dedicated per an all corresponding chip all the way
Fixture facilitates flash chip to install and remove.
In test process, RN8213/8215 type controls chip and is written by firmware, realizes the pre-set function of data,
According to the test speed that USB interface is arranged, flash chip is fixed the write-in of data, and read verifying, it is primary complete
Read-write cycle is considered as qualified primary.Due to same flash chip, under different read or write speeds, obtained lifetime data is
It is completely different, so read or write speed is needed to configure before testing flash chip, generally with the raising of chip producer
Maximum speed carry out test verifying, if nominal requirement can be met, after reducing speed, the service life can be greatly improved.
While test, RN8213/8215 type controls chip and is sent to lifetime data is tested in real time
JHD13232 type LCD display module, and store to EEPROM and carry out permanent retention, it exports to form report for later period PC end data.
Multichannel flash chip test device has one 8 LCD displays, can show flash chip in real time
The case where test, and checked by the switching that switching push button carries out multi-channel test result.When lifetime data reaches the limit values,
Display is not further added by, and keeps maximum value.
The flash chip endurance testing device of the multichannel of the present embodiment, can be according to the pre-set reading of MCU main control module
Writing rate automatically carries out multiple channel test chip, and test result is shown on LCD display, while storage is arrived
In EEPROM, downloads and export for subsequent PC.The test device of the present embodiment has raw material detection, research and development chip type selecting etc.
It improves efficiency, analyzes reliable advantage, greatly reduce the unnecessary time waste of development process.
The above is only that preferred embodiments of the present invention are described, and is not the model to the utility model
It encloses and is defined；The foregoing is merely specific embodiment of the present utility model, it is not used to limit the utility model
Protection scope；Under the premise of not departing from the spirit of the design of the utility model, this field ordinary engineering and technical personnel is practical new to this
Any modification, equivalent substitution, improvement and etc. that the technical solution of type is made, the claims that should all fall into the utility model determine
Protection scope in.
Claims (12)
1. a kind of multichannel flash chip test device, including power interface, it is characterised in that: the test device further includes MCU
Main control module, chip special fixture and LCD display module, the power interface, chip special fixture, LCD display module difference
It is connected with MCU main control module.
2. multichannel flash chip test device as described in claim 1, it is characterised in that: the power interface uses band
There is the power interface of USB communication chip.
3. multichannel flash chip test device as described in claim 1, it is characterised in that: the MCU main control module uses
RN8213/8215 type controls chip and support circuit.
4. multichannel flash chip test device as described in claim 1, it is characterised in that: the multichannel flash chip
Test device includes the chip special fixture that at least one is used to clamp flash chip.
5. multichannel flash chip test device as described in claim 1, it is characterised in that: the multichannel flash chip
Test device includes 6 chip special fixtures, and 6 chip special fixtures are separately connected RN8213/8215 type control chip.
6. multichannel flash chip test device as claimed in claim 5, it is characterised in that: 6 flash chips are set respectively
6 chip special fixtures are placed in, 6 chip special fixtures are separately connected RN8213/8215 type control chip, described
RN8213/8215 type control chip realizes that 6 tunnel flash chips are tested simultaneously.
7. multichannel flash chip test device as described in claim 1, it is characterised in that: the LCD display module includes
8 LCD displays and support circuit.
8. multichannel flash chip test device as claimed in claim 7, it is characterised in that: 8 LCD displays connect
N8213/8215 type control chip is connect, test data is transmitted to 8 LCD displays and shown by N8213/8215 type control chip.
9. multichannel flash chip test device as described in claim 1, it is characterised in that: the multichannel flash chip
Test device further includes EEPROM module.
10. multichannel flash chip test device as claimed in claim 9, it is characterised in that: the EEPROM module connection
RN8213/8215 type controls chip, and RN8213/8215 type controls chip and test data is transmitted to EEPROM module storage.
11. multichannel flash chip test device as described in claim 1, it is characterised in that: the multichannel flash core
Built-in testing device further includes switching push button.
12. multichannel flash chip test device as claimed in claim 11, it is characterised in that: the switching push button connection 8
Position LCD display realizes that the switching of test device multi-channel test is checked by switching push button.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201822116678.2U CN209248512U (en) | 2018-12-17 | 2018-12-17 | Multichannel flash chip test device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201822116678.2U CN209248512U (en) | 2018-12-17 | 2018-12-17 | Multichannel flash chip test device |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN209248512U true CN209248512U (en) | 2019-08-13 |
Family
ID=67533192
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201822116678.2U Active CN209248512U (en) | 2018-12-17 | 2018-12-17 | Multichannel flash chip test device |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN209248512U (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN111025121A (en) * | 2019-10-09 | 2020-04-17 | 上海华虹集成电路有限责任公司 | Embedded software implementation method for multi-channel simultaneous testing of smart card chips |
| CN114185327A (en) * | 2021-12-06 | 2022-03-15 | 广东利扬芯片测试股份有限公司 | High-precision test system for high-speed low-power-consumption microcontroller |
-
2018
- 2018-12-17 CN CN201822116678.2U patent/CN209248512U/en active Active
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN111025121A (en) * | 2019-10-09 | 2020-04-17 | 上海华虹集成电路有限责任公司 | Embedded software implementation method for multi-channel simultaneous testing of smart card chips |
| CN114185327A (en) * | 2021-12-06 | 2022-03-15 | 广东利扬芯片测试股份有限公司 | High-precision test system for high-speed low-power-consumption microcontroller |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN101221210B (en) | Automatic testing and emendation system and method for finished circuit board | |
| CN106571166B (en) | MT29F series NAND FLASH test aging system with customizable flow | |
| CN201812014U (en) | Automatic open-circuit and short-circuit testing system for integrated circuits | |
| CN207851236U (en) | A kind of chip testing plate and chip test system | |
| CN101009853A (en) | Automatic test system for handset single-plate and its method | |
| CN101848042A (en) | Method and system for testing radio frequency of mobile phones | |
| CN203587761U (en) | Frequency converter mainboard tester | |
| CN209248512U (en) | Multichannel flash chip test device | |
| CN108169564A (en) | A kind of Beam Detector and its detection method | |
| CN102331569B (en) | Intelligent interactive detection apparatus for detection on electric energy meter | |
| CN200997633Y (en) | Automatic testing system based on graphic testing platform | |
| CN112131109A (en) | Python-based chip automatic verification test system and method | |
| CN202903227U (en) | Tester for simultaneously testing multiple optical modules with one path of signals | |
| CN208077394U (en) | A kind of the communication test plate and communication test system of concentrator communication module | |
| CN104635104A (en) | Camera module open circuit and short circuit auto-test apparatus and method | |
| CN109901055A (en) | A kind of OBD equipment performance test macro | |
| CN106200623B (en) | The semi-physical simulation test device of reactor core measuring system logic module | |
| CN210839614U (en) | Handheld terminal supporting detection of communication protocols of multiple types of ammeter modules | |
| CN208110030U (en) | A kind of communication test plate of ammeter communication module | |
| CN202916406U (en) | Welding spot detecting system based on boundary scan | |
| CN202083777U (en) | Circuit board performance detector for IC card diaphragm gas meter | |
| CN104750101B (en) | A kind of airborne inquisitor digital signal processing module detection method | |
| CN206400062U (en) | High-performance radio-frequency Remote Control Automaticization test device | |
| CN206281909U (en) | Based on bus type I/O cell board intelligent test device | |
| CN205643569U (en) | Device of test cell -phone card signal |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| GR01 | Patent grant | ||
| GR01 | Patent grant |