CN202903227U - Tester for simultaneously testing multiple optical modules with one path of signals - Google Patents
Tester for simultaneously testing multiple optical modules with one path of signals Download PDFInfo
- Publication number
- CN202903227U CN202903227U CN 201220556609 CN201220556609U CN202903227U CN 202903227 U CN202903227 U CN 202903227U CN 201220556609 CN201220556609 CN 201220556609 CN 201220556609 U CN201220556609 U CN 201220556609U CN 202903227 U CN202903227 U CN 202903227U
- Authority
- CN
- China
- Prior art keywords
- optical modules
- tester
- connects
- optical module
- loading plate
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Images
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
Abstract
The utility model discloses a tester for simultaneously testing multiple optical modules with one path of signals. The tester comprises a power supply box, an optical module bearing plate connected with the power supply box and a testing device connected with the optical module bearing plate. The multiple optical modules are arranged on the optical module bearing plate so that the multiple optical modules can be tested simultaneously, the testing efficiency is high, and the coat of used equipment is low.
Description
Technical field
The utility model relates to the optical module field tests, especially a kind of optical module tester.
Background technology
The existing proving installation that optical module is tested can realize that in order to realize one road signal functional test of a plurality of modules all can adopt optoelectronic switch, singlechip technology, control chip etc. to realize the while test function.Shortcoming is: cost height, poor reliability, speed are slow and be unfavorable for batch testing.
So, need a kind of new technical matters to address the above problem.
The utility model content
The purpose of this utility model is the deficiency that exists for prior art, provides a road low signal of a kind of testing efficiency height and cost to realize the tester that a plurality of optical modules are tested simultaneously.
For achieving the above object, the utility model one road signal realizes that the tester that a plurality of optical modules are tested simultaneously can adopt following technical scheme:
A kind of one road signal is realized the tester that a plurality of optical modules are tested simultaneously, comprises power pack, connects the optical module loading plate of power pack and the proving installation that connects the optical module loading plate; On the described optical module loading plate a plurality of optical modules are installed; Described power pack is provided with the hyperchannel gauge tap; Described proving installation comprises the luminous power machine of coarse wavelength division multiplexer device, the wide-band coupler that connects the coarse wavelength division multiplexer device that connects the optical module loading plate, the attenuator that connects wide-band coupler, the test board that connects attenuator and connection wide-band coupler.
Compare with background technology, the utility model one road signal realizes that the tester that a plurality of optical modules are tested simultaneously can test a plurality of optical modules simultaneously, and testing efficiency is high, and the equipment cost that uses is low.
Description of drawings
Fig. 1 is the structural representation that the utility model one road signal is realized the tester that a plurality of optical modules are tested simultaneously.
Embodiment
Below in conjunction with the drawings and specific embodiments, further illustrate the utility model, should understand these embodiment only is used for explanation the utility model and is not used in restriction scope of the present utility model, after having read the utility model, those skilled in the art all fall within the application's claims limited range to the modification of the various equivalent form of values of the present utility model.
See also shown in Figure 1, the utility model discloses a kind of one road signal and realizes the tester that a plurality of optical modules are tested simultaneously, comprises power pack 20, connects the optical module loading plate 30 of power pack 20, the proving installation of connection optical module loading plate 30 and the digital analog converter (DCA) 40 that connects optical module loading plate 30.A plurality of optical modules 31 are installed on the described optical module loading plate 30.Described power pack 20 is provided with the digital electronic ammeter 22 of hyperchannel gauge tap 21 and a plurality of one by one corresponding optical modules 31.Described proving installation comprises the luminous power machine 55 of coarse wavelength division multiplexer device (CWDM) 51, the wide-band coupler 52 that connects coarse wavelength division multiplexer device 51 that connects optical module loading plate 30, the attenuator 53 that connects wide-band coupler 52, the test board 54 that connects attenuator 53 and connection wide-band coupler 52.Described test board 54 is provided with the emission standard module that connects attenuator 53.Described a plurality of optical module 31 connects coarse wavelength division multiplexer device 51 simultaneously.In the present embodiment, described optical module 31 is six.When testing, first tested optical module 31 is put on the optical module loading plate 30; Again optical module loading plate 30 and control power pack 20 are coupled together; The recycling concentric cable couples together optical module loading plate 30 and testing apparatus; Select to start testing apparatus demonstration test data behind the voltage.
The utlity model has following advantage:
1, improves on the testing efficiency, needed about 50 minutes if originally do the high low-temperature test of an optical module, so do simultaneously high low-temperature test with the test board of 6 optical modules now and at most only need about 60 minutes, independent test with respect to 6 optical modules will be saved 5 hours, if in like manner 6 optical modules carry out high low temperature test simultaneously, can save about 300 minutes at least.
2, on the precision accurately, guaranteed qualitatively, every optical module has independent digital electronic ammeter and coaxial wire to control to have guaranteed that every optical module can not form data cross and show.
3, energy consumption is low, and being embodied in power pack is external equipment, need not directly to enter in the high and low temperature circulating box, the damage of effectively having avoided long-term high and low temperature circulation to cause.
4, the equipment cost that uses is low.
5, realized batch processing on the operation, the repeatability of operation has been saved in many optical module tests than single optical module test.
6, simple in the processing, need not mcu programming.
7, convenient in the operation, each passage has tag recognition and testing apparatus and tested optical module convenient and fast connection.
8, flexible in the control, can external a lot of testing apparatuss and instrument.
Claims (5)
1. a signal is realized the tester that a plurality of optical modules are tested simultaneously, it is characterized in that: comprise power pack, connect the optical module loading plate of power pack and the proving installation that connects the optical module loading plate; On the described optical module loading plate a plurality of optical modules are installed; Described power pack is provided with the hyperchannel gauge tap; Described proving installation comprises the luminous power machine of coarse wavelength division multiplexer device, the wide-band coupler that connects the coarse wavelength division multiplexer device that connects the optical module loading plate, the attenuator that connects wide-band coupler, the test board that connects attenuator and connection wide-band coupler.
2. one road signal according to claim 1 is realized the tester that a plurality of optical modules are tested simultaneously, it is characterized in that: also comprise the digital analog converter that connects the optical module loading plate.
3. one road signal according to claim 2 is realized the tester that a plurality of optical modules are tested simultaneously, it is characterized in that: described a plurality of optical modules connect the coarse wavelength division multiplexer device simultaneously.
4. one road signal according to claim 3 is realized the tester that a plurality of optical modules are tested simultaneously, it is characterized in that: described test board is provided with the emission standard module that connects attenuator.
5. one road signal according to claim 1 is realized the tester that a plurality of optical modules are tested simultaneously, it is characterized in that: described power pack is provided with the digital electronic ammeter of a plurality of one by one corresponding optical modules.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN 201220556609 CN202903227U (en) | 2012-10-26 | 2012-10-26 | Tester for simultaneously testing multiple optical modules with one path of signals |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN 201220556609 CN202903227U (en) | 2012-10-26 | 2012-10-26 | Tester for simultaneously testing multiple optical modules with one path of signals |
Publications (1)
Publication Number | Publication Date |
---|---|
CN202903227U true CN202903227U (en) | 2013-04-24 |
Family
ID=48123886
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN 201220556609 Expired - Lifetime CN202903227U (en) | 2012-10-26 | 2012-10-26 | Tester for simultaneously testing multiple optical modules with one path of signals |
Country Status (1)
Country | Link |
---|---|
CN (1) | CN202903227U (en) |
Cited By (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN105004365A (en) * | 2015-07-03 | 2015-10-28 | 中山市佑崴自动化科技有限公司 | Data line test machine |
CN105049113A (en) * | 2015-06-17 | 2015-11-11 | 武汉光迅科技股份有限公司 | Active optical module multi-channel automatic test system and method |
CN105323582A (en) * | 2015-11-13 | 2016-02-10 | 宁波环球广电科技有限公司 | Intelligent high and low temperature test device and test method |
CN106092510A (en) * | 2016-06-02 | 2016-11-09 | 余丽波 | Laser test system |
CN107835048A (en) * | 2017-12-18 | 2018-03-23 | 上海市共进通信技术有限公司 | Optical module test system |
-
2012
- 2012-10-26 CN CN 201220556609 patent/CN202903227U/en not_active Expired - Lifetime
Cited By (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN105049113A (en) * | 2015-06-17 | 2015-11-11 | 武汉光迅科技股份有限公司 | Active optical module multi-channel automatic test system and method |
CN105049113B (en) * | 2015-06-17 | 2017-09-15 | 武汉光迅科技股份有限公司 | A kind of active light module multichannel automatization test system and method |
CN105004365A (en) * | 2015-07-03 | 2015-10-28 | 中山市佑崴自动化科技有限公司 | Data line test machine |
CN105323582A (en) * | 2015-11-13 | 2016-02-10 | 宁波环球广电科技有限公司 | Intelligent high and low temperature test device and test method |
CN106092510A (en) * | 2016-06-02 | 2016-11-09 | 余丽波 | Laser test system |
CN107835048A (en) * | 2017-12-18 | 2018-03-23 | 上海市共进通信技术有限公司 | Optical module test system |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
CN202903227U (en) | Tester for simultaneously testing multiple optical modules with one path of signals | |
CN106771987A (en) | A kind of IC chip ageing tester and method of testing based on mother baby plate | |
CN104569676A (en) | OBU automatic testing control method and device and OBU automatic testing system | |
CN201788265U (en) | Tester for battery protection board | |
CN206546416U (en) | A kind of IC chip ageing tester based on mother baby plate | |
CN204330929U (en) | The automatic measurement jig of OBU and system | |
CN104505125B (en) | A kind of multichannel SRAM single-particles test method and device | |
CN103267940B (en) | Multimode parallel test system | |
CN108594106A (en) | System level chip assessment device and method | |
CN103336237B (en) | Built-in endurance test system, ageing tester and corresponding endurance test method | |
CN204330928U (en) | OBU comprehensive tester and Auto-Test System | |
CN207198265U (en) | Hand-held contact point tester | |
CN103293456A (en) | Burn-in tester | |
CN209248512U (en) | Multichannel flash chip test device | |
CN203164383U (en) | Lithium battery test system | |
CN201243304Y (en) | Test device | |
CN214184148U (en) | Monitoring system for automatically detecting and screening large-batch fans | |
CN105137234A (en) | Multi-channel direct current analog detecting device | |
CN202974086U (en) | Automatic calibration system for radio fuse tester | |
CN202471932U (en) | Simulation testing platform for comprehensive battery management system | |
CN205450105U (en) | Collector mainboard consumption testing arrangement | |
CN103647599B (en) | The general-utility test platform of optical communication equipment functional module and method of testing thereof | |
CN114441941A (en) | Aging test system for linear voltage-stabilizing power supply chip | |
CN203606695U (en) | Current transforming controller tester of wind generating set | |
CN112547568A (en) | Method for automatically detecting and screening large-batch fans and monitoring system thereof |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
C14 | Grant of patent or utility model | ||
GR01 | Patent grant | ||
CX01 | Expiry of patent term | ||
CX01 | Expiry of patent term |
Granted publication date: 20130424 |