CN106092510A - Laser test system - Google Patents
Laser test system Download PDFInfo
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- CN106092510A CN106092510A CN201610383976.0A CN201610383976A CN106092510A CN 106092510 A CN106092510 A CN 106092510A CN 201610383976 A CN201610383976 A CN 201610383976A CN 106092510 A CN106092510 A CN 106092510A
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
- G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
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Abstract
The invention discloses a kind of laser test system, in order to solve measurement inefficiency existing for traditional test system and the highest problem of accuracy.This laser test system, including: light source generator, the first beam splitter, multiple first measured device and test control device；Wherein, light source generator, it is used for producing LASER Light Source；First beam splitter, is connected with light source generator, for LASER Light Source is divided into multiple first laser beam；The input of each the first measured device is respectively aligned to first laser beam, and, the power end of each the first measured device is connected with power supply by multiple power supplies switch, and the outfan of each the first measured device is connected with test control device by multi-channel rf switch；Further, laser test system farther includes: for the high-low temperature chamber being adjusted the temperature inside the box according to the control of test control device, and the first beam splitter and the first measured device are placed in high-low temperature chamber.
Description
Technical field
The present invention relates to photoelectricity test field, particularly to a kind of laser test system.
Background technology
Laser detector is capable of opto-electronic conversion, be may determine that the phase of optical signal by the relevant parameter of the test signal of telecommunication
The indexs such as related parameter, such as luminous power.The relevant parameter of the optical signal that laser detector is measured varies with temperature and changes.Cause
This, by measuring the index changes at different temperatures such as the responsiveness of photosignal, response time, noise, saturated light power
Rate can assess high/low temperature service behaviour.
At present, in order to measure optical signal relevant parameter at different temperatures, need to measure high temperature, low temperature, room temperature respectively
Etc. the relevant parameter under various temperature conditionss.Such as, first pass through manually-operated mode and measure optical signal at the first temperature
Relevant parameter, then, then measures optical signal relevant parameter at the second temperature by way of manual operation, and the rest may be inferred,
Needing manual operation the most just can complete measurement process, measure inefficiency, labor intensive is relatively costly.And, when once surveying
During amount multipath light signal, it is susceptible to crosstalk phenomenon between the optical signal of each road, thus affects the accuracy of measurement.
Summary of the invention
The invention provides a kind of laser test system, in order to solve the measurement existing for test system of the prior art
Inefficiency and the highest problem of test accuracy.
The invention provides a kind of laser test system, including: light source generator, the first beam splitter, multiple first
Measured device and test control device；Wherein, light source generator, it is used for producing LASER Light Source；First beam splitter, with light
Source generating means is connected, for LASER Light Source is divided into multiple first laser beam；The input of each the first measured device divides
Not Dui Zhun first laser beam, and, the power end of each the first measured device by multiple power supplies switch with power supply electricity
Source is connected, and the outfan of each the first measured device is connected with test control device by multi-channel rf switch；Further, Laser Measuring
Test system farther includes: for the high-low temperature chamber being adjusted the temperature inside the box according to the control of test control device, and the
One beam splitter and the first measured device are placed in high-low temperature chamber.
Alternatively, farther include: the first test circuit board and test fixture；Wherein, the first test circuit board includes using
In the test zone of fixing multiple first measured devices, the most multiple first measured devices are fixed on test zone by test fixture
In.
Alternatively, the first test circuit board farther includes the filter field for arranging filter circuit, filter field
Inside be provided with multiple and the first measured device filter circuit one to one, then the outfan of each the first measured device is by many
Road radio-frequency (RF) switch and the filter circuit corresponding with this first measured device are connected with test control device, wherein, and each filtering
Circuit is for being filtered the output signal of the first measured device being connected with this filter circuit.
Alternatively, each way switch in multiple power supplies switch corresponds respectively to the power end of first measured device,
Each way switch in multi-channel rf switch corresponds respectively to the outfan of first measured device.
Alternatively, farther include: the light power meter being connected with beam splitter, export at least for monitoring beam splitter
The performance number of one the first laser beam.
Alternatively, light source generator farther includes: optical table and the light source being positioned on optical table and light decay
Subtract device.
Alternatively, test control device farther includes: computer and oscillograph, and wherein, oscillographic input passes through
Multi-channel rf switch is connected with the outfan of each the first measured device, for the phase of the output signal of display the first measured device
Related parameter；Computer is respectively connected with oscillograph and multiple first measured device, defeated for multiple first measured devices
Go out signal be controlled and calculate.
Alternatively, farther include: the second beam splitter and multiple second measured device, wherein, the second beam splitter
It is connected with light source generator, for the LASER Light Source that light source generator produces is divided into multiple second laser beam；Each
The input of the second measured device is respectively aligned to each the second laser beam, the power end of each the second measured device and power supply electricity
Source is connected, and the outfan of each the second measured device is connected with test control device.
Alternatively, farther include: control switch, be used for controlling light source generator and the connection of the first beam splitter, and
Disconnect with the second beam splitter；Or, control light source generator and the connection of the second beam splitter, and break with the first beam splitter
Open.
Alternatively, the first measured device is photo-detector.
In the laser test system that the present invention provides, on the one hand, be multiple by beam splitter by LASER Light Source beam splitting
Laser beam, and by test control device, temperature, the break-make of multipath light signal are controlled, it is achieved thereby that automatization surveys
The effect of amount multipath light signal, improves measurement efficiency.On the other hand, switched by multiple power supplies and multi-channel rf switch divides
Do not control power on/off and the signal break-make of each measured device, due to each measured device can independent break-make, Shi Ge road light
The signal of telecommunication can transmit respectively, and multiple power supplies switch and multi-channel rf switch itself have the effect isolating each road signal,
Thus it is possible to the crosstalk phenomenon significantly reduced between signal, improve the capacity of resisting disturbance of whole test system, add test
Accuracy.
Accompanying drawing explanation
Fig. 1 shows a kind of structural representation of the laser test system that the embodiment of the present invention provides；
Fig. 2 shows the structure chart of the laser test system of one specific embodiment offer of the present invention；
Fig. 3 shows the schematic diagram of the section components in the laser test system that one specific embodiment of the present invention provides；
Fig. 4 shows the workflow schematic diagram of the laser test system that the embodiment of the present invention provides；
Fig. 5 shows that schematic diagram is demarcated in the system delay in the laser test system that the embodiment of the present invention provides；
Fig. 6 shows the software interface figure of the laser test system that the embodiment of the present invention provides.
Detailed description of the invention
For being fully understood by the purpose of the present invention, feature and effect, by following specific embodiment, the present invention is done in detail
Describe in detail bright, but the present invention is not restricted to this.
The invention provides a kind of laser test system, the measurement existing for test system of the prior art can be solved
Inefficiency and the highest problem of test accuracy.
Fig. 1 shows a kind of structural representation of the laser test system that the embodiment of the present invention provides.As it is shown in figure 1, should
Laser test system includes: light source generator the 10, first beam splitter 20, multiple first measured device 30 and testing and control
Device 40.Wherein, light source generator 10, it is used for producing LASER Light Source；First beam splitter 20, with light source generator 10 phase
Even, for LASER Light Source being divided into multiple first laser beam；The input of each the first measured device 30 is respectively aligned to one
First laser beam, and, the power end of each the first measured device 30 is by multiple power supplies switch 50 and power supply 60 phase
Even, the outfan of each the first measured device 30 is connected with test control device 40 by multi-channel rf switch 70；Further, laser
Test system farther includes: for the high-low temperature chamber 80 being adjusted the temperature inside the box according to the control of test control device,
And first beam splitter 20 and the first measured device 30 be placed in high-low temperature chamber 80.
As can be seen here, in the laser test system that the present invention provides, on the one hand, by beam splitter, LASER Light Source is divided
Bundle is multiple laser beams, and is controlled temperature, the break-make of multipath light signal by test control device, it is achieved thereby that
The effect of automatic measurement multipath light signal, improves measurement efficiency.On the other hand, switched by multiple power supplies and multichannel is penetrated
Frequency switch controls power on/off and the signal break-make of each measured device respectively, due to each measured device can independent break-make,
Shi Ge road photosignal can transmit respectively, and multiple power supplies switch and multi-channel rf switch itself have isolation each road signal
Effect, thus it is possible to the crosstalk phenomenon significantly reduced between signal, improve the capacity of resisting disturbance of whole test system, increase
The accuracy of test.
Fig. 2 shows the structure chart of the laser test system of one specific embodiment offer of the present invention.As in figure 2 it is shown, light
Source 101 and optical attenuator 102 collectively form light source generator mentioned above.In the specific implementation, can be by light source 101 He
Optical attenuator 102 is placed on above the optical table of customization, to reduce the vibration impact on light quality, as shown in Figure 3.Specifically,
Light source 101 is used for producing LASER Light Source, and optical attenuator 102 carries out attenuation processing for the LASER Light Source producing light source 101, with
Just the watt level of input optical signal is accurately controlled, make the power of the input optical signal being ultimately incident upon in measured device
Size meets test request.
From figure 2 it can be seen that the input optical signal sent from optical attenuator 102 both can be input to room temperature test component
In carry out optical signal under room temperature and measure, it is also possible to the optical signal being input in high/low temperature test component carry out under high/low temperature is surveyed
Amount.Specifically, can select to carry out room temperature measurement by control switch or high/low temperature is measured.Such as, it is positioned at when control switch
Room temperature measurement can be carried out during side；When controlling can to carry out high/low temperature measurement when switch is positioned at lower section.It addition, the present invention other
In embodiment, it is also possible to being not provided with controlling switch, the optical signal part sent from optical attenuator 102 is input to room temperature test department
Carrying out the optical signal under room temperature in part to measure, another part is input in high/low temperature test component the optical signal carrying out under high/low temperature
Measure, thus realize the test of room temperature and high/low temperature simultaneously.
The most first introduce the specific works principle of room temperature test component.Room temperature test component specifically includes: the second light
Beam splitter 91, small light spot system the 93, second measured device 94 and room temperature test fixture 95.The light sent from optical attenuator 102
Signal is input to the second beam splitter 91, the second beam splitter 91 be split process, thus by LASER Light Source mean allocation
For multiple laser beams, the laser signal being made up of laser beam sends into the second measured device 94 via small light spot system 93.The
Two measured devices 94 are arranged in room temperature test fixture 95.Wherein, room temperature test fixture 95 mainly include test circuit board and
Test fixtures etc., in order to realize the fixing of measured device and electrical connection.As can be seen here, the input of the second measured device 94 is used
In receiving input optical signal, outfan is connected with oscillograph 402, joins for the output signal of telecommunication is transferred to oscillograph 402
Number monitoring.
It follows that introduce the specific works principle of high/low temperature test component again.High/low temperature test component includes: just
Incubator 80 and be positioned at first beam splitter the 20, first measured device 30 within high-low temperature chamber 80, high/low temperature test fixture 301
Deng.The optical signals optical fiber sent from optical attenuator 102 is introduced high-low temperature chamber 80 and is fixed by particular jig, in order to be transferred to
First beam splitter 20, is split process by the first beam splitter 20, thus LASER Light Source is equally assigned into multiple laser
Light beam.Multiple first measured devices 30 are arranged on high/low temperature test fixture 301.Specifically, high/low temperature test fixture 301 is main
Including test circuit board and test fixture etc., in order to realize the fixing of the first measured device 30 and electrical connection.Wherein, just
Test circuit board in temperature test fixture 301 includes the test zone for fixing multiple first measured device 30, and multiple the
One measured device 30 is fixed in this test zone by test fixture.When implementing, this test zone could be arranged to many
Individual depression can be inserted into region, in order to each measured device is inserted respectively at one can be inserted in region of depression, and passes through light
Fine bonder reliably couples, so that each measured device is respectively aligned to beam of laser light beam, thus realizes measured device and enters
Penetrate the Registration of luminous power.
It addition, in order to respectively each measured device is controlled, wrap further in the test system shown in Fig. 2
Include multiple power supplies switch 50.Wherein, multiple power supplies switch 50 includes multiple the most independently opening with the first measured device 30
Closing, each independent switch can individually control first measured device 30.When implementing, each independent on and off switch
One end is connected with power supply 60, and the power end of the other end and first measured device is connected and (can pass through when implementing
Test circuit board and the first measured device in high/low temperature test fixture are connected).Can be the most right by multiple power supplies switch 50
Each first measured device carries out independently-powered.In addition, in the test system shown in Fig. 2, still further comprise multichannel to penetrate
Frequency switch 70.Wherein, multi-channel rf switch 70 includes multiple and measured device independent switch one to one, each independent switch
Can individually control a measured device.When implementing, one end of each independent radio-frequency (RF) switch and the output of measured device
End is connected, and the other end is connected with oscillograph, thus controls whether the output signal of corresponding measured device transmission to oscillograph, with
Realize amplitude output signal, time isoparametric accurate measurement.Can be controlled each respectively tested by multi-channel rf switch 70
Device realizes independent signal transmission.When being embodied as, for the ease of operation, can be directly by the test section on test circuit board
Territory is set to be respectively connected with multiple power supplies switch 50 and multi-channel rf switch 70, so that after measured device inserts test zone
Can realize and multiple power supplies switch 50 and the electrical connection of multi-channel rf switch 70, thus simplify operating process.
As can be seen here, each measured device institute can be made by above-mentioned multiple power supplies switch 50 and multi-channel rf switch 70
Each corresponding light electric pathway is mutually isolated and independently controls, thus at utmost avoids interchannel signal cross-talk phenomenon,
Improve test accuracy.It addition, in order to promote test accuracy further, in the present invention, it is also possible to further in test
Filter field is set on circuit board, in this filter field, is provided with multiple and the first measured device 30 filtered electrical one to one
Road, then the outfan of each the first measured device 30 is switched by multi-channel rf and the filtering corresponding with this first measured device
Circuit is connected with oscillograph, and wherein, each filter circuit is for the output to the first measured device being connected with this filter circuit
Signal is filtered.When implementing, each measured device can be first coupled to multi-channel rf switch, is penetrated by multichannel the most again
Frequency switch is connected to the filter circuit of correspondence, and then is connected with oscillograph by filter circuit；Each measured device can also first connect
Receive correspondence filter circuit, the most again by filter circuit be connected to multi-channel rf switch, and then by multi-channel rf switch and
Oscillograph is connected.In a word, detail is not construed as limiting by the present invention, as long as being capable of output to each measured device respectively
Signal carries out the effect of Filtering Processing individually.For the ease of operation, can be in advance by test section on test circuit board
Territory is set to switch with filter circuit and multi-channel rf be connected, so that measured device can realize passing through after inserting test zone
The purpose that multi-channel rf switch 70 and filter circuit are connected with oscillograph, thus simplify operating process.
By arranging single filter circuit for each road output signal, it is possible to the interchannel crosstalk of significantly more efficient minimizing
Problem.
It addition, in order to eliminate the parasitic effects that RF cable exports in high-low temperature chamber, also can be according to the reality of measured device
Border situation, is driven Compensation Design on test circuit board.And, test circuit board on be generally also devised with installing hole with
And fiber-optic fixing-hole etc., to ensure the stability of optic path.When implementing, test circuit board can pass through PCB
Various ways such as (Printed Circuit Board, printed circuit board (PCB)s) realizes.
After having introduced room temperature test component and high/low temperature test component, next introduce test control device, by surveying
Examination control device the signal of telecommunication that room temperature test component and/or high/low temperature test component export can be controlled, measure and
Calculating etc. process, in order to draw test result.Specifically, the oscillograph 402 during test control device includes Fig. 2, computer 401
And operating case 403.Wherein, oscillograph 402 is connected with the outfan of each measured device respectively, is used for receiving each tested device
The signal of telecommunication of part output, and show waveform and the parameter of correspondence.Computer 401 divides with oscillograph 402 and each measured device
It is the most connected, for oscillograph and measured device are controlled, calculate.Operating case 403 is connected with computer 401, mainly uses
In accommodating associated external equipment.
Fig. 3 shows the schematic diagram of the section components in above-mentioned test system.As it is shown on figure 3, place on optical table
There are light source and optical attenuator.The optical signal of optical attenuator output is by fiber-optic transfer to high-low temperature chamber.Enter in high-low temperature chamber
One step is provided with high/low temperature test fixture, and is positioned at the measured device (representing in figure) on high/low temperature test fixture with DUT.
Measured device is connected with the beam splitter being placed on light fixed mount by 100 road optical fiber (representing with multi-channel optical fibre in figure).
Measured device is connected with rack by cable, comprises computer, oscillograph, variable connector and electricity further at interior of equipment cabinet
Source.
In this test system, oscillograph, light source, optical attenuator, power supply, high-low temperature chamber all use programmable device real
Existing, therefore, whole test system can be automatically controlled by computer and upper computer software, completes the response of measured device
The automatic test of the indexs such as degree, response time, noise, saturated light power.
It addition, still further comprise light power meter 92 in a test system, this light power meter 92 and second beam splitter 91
Being connected, whether the luminous power for monitoring the second beam splitter 91 meets preset value.Certainly, this light power meter 92 can also enter one
Step is connected with the first beam splitter 20, and whether the luminous power for monitoring the first beam splitter 20 meets preset value.Light power meter
The performance number of at least light beam that beam splitter sends can be monitored, to realize stability of layout monitoring, thus be effectively improved defeated
Enter light accuracy of detection.
After having introduced the concrete structure of test system, next introduce the specific works flow process of test system.Carry out
The preparatory work needed before test is as follows: first, and measured device inserts test circuit board, and by fiber coupler
Reliably couple with measured device, then, connect socket for power switch, and be sequentially connected with the high speed signal output lead of measured device
Cable.Fig. 4 shows the workflow schematic diagram of the laser test system that the embodiment of the present invention provides.As shown in Figure 4, preparatory
After having worked, first, system electrification first carries out self-inspection, first carries out failture evacuation until self-inspection is normal if faulty.So
After, relevant parameter is set, specifically includes: channel oscilloscope parameter, the pulsewidth of laser instrument are surveyed with repetition, supply voltage, high/low temperature
Examination parameter (includes device number, the test parameter such as temperature, temperature retention time)；It follows that laser light source stable and high/low temperature by the time
When case reaches design temperature and keeps the stipulated time, hit testing software is tested, in test process, by host computer
Control, when test system is sequentially completed the responsiveness of measured device according to power supply order, the signal output order of design, responds
Between, the parameter testing such as noise, saturated light power, and complete related data output and form test report, until this batch of device detection
Terminate, power cut-off；Finally, next group device is changed until all batches are all completed.
The automatic test of measured device can be realized by said process, and farthest eliminate between each paths
Crosstalk phenomenon, promotes test accuracy.Measured device therein can be photo-detector.
Further, since all there is certain lag characteristic in any electronic devices and components, therefore, in order to reduce system delay to survey
The impact of amount result.The inherent delay of system can also be demarcated by the present invention, in order to consider when computation and measurement result
The impact of inherent delay, so that measurement result is the most accurate.Fig. 5 shows that schematic diagram is demarcated in system delay.By
In light path and the loss of circuit, the system delay time includes that light delay and point postpone two parts.Light source is produced
Optical synchronous signal access oscillographic CH1 passage, then, light source produce light pulse by the quick photosensitive tube of standard output
Signal accesses oscillograph CH2 passage.The system delay time is obtained by reading the time delay between CH1 and CH2.Pass through
The system delay time is measured the accuracy that can promote test result further.
Fig. 6 shows the software interface figure of high/low temperature test system.Wherein, including parameter setting, system mode, tested device
Part index shows in real time, test result and 5 modules of control button.Parameter setting module can arrange test temperature, device supplies
The parameters such as piezoelectric voltage, laser pulse width and repetition；System state module can show current Temperature of Warm Case, current TCH test channel in real time
And the information such as working state of system；The real-time display module of measured device index can show the delay of current measured device in real time
The parameters such as time, response time, voltage response degree, NEP, saturated input optical power and operation wavelength；Test result module is permissible
Device populations and qualified and underproof device count have been surveyed in display in real time；Control key-press module be mainly used in system beginning,
Suspend/continue, stop, returning and check the control of the functions such as this result.
To sum up, the present invention by Fixture Design cleverly and reasonably the collocation of photoelectricity test equipment can complete unit,
The height of quadrant class laser detector, normal, low temperature photoelectric properties parameter (response time, time delay, voltage response degree, NEP etc.)
Test, and realize testing automatically the gathering of data, process, preserve.The present invention uses beam splitter, multi-channel rf switch and multichannel
On and off switch carries out independent isolating to the optical electrical signal between TCH test channel, reduces interchannel high speed signal cross-interference issue, and can
Multiple laser detectors are carried out photoelectric parameter and automatically test by controlling computer upper computer software simultaneously.Finally this system
It is applicable to high-volume photoelectric device field tests, and is effectively improved measuring accuracy, efficiency, reduce workload.
In the photoelectric test system of traditional centrally connected power supply formula, when many devices are tested simultaneously, by high speed signal from height
In cryostat when outer transmission, easily produce interchannel test cross-interference issue, reduce test accuracy.And, in tradition side
In formula, the operation of test process, data acquisition and record, by being accomplished manually, cause test result relatively big, not only by artificial affecting
Time-consumingly and easily make a fault.Test system in the present invention is that the test of multichannel anti-interference high-rate laser detector high/low temperature is
System, it is possible to respectively LASER Light Source, power supply and output signal are carried out independent isolating process, and to each on test fixture
Road signal all carries out single circuit filtering and is effectively reduced interchannel cross-interference issue, and upper computer software can automatically control
The equipment such as light source, beam splitter, optical attenuator, oscillograph, variable connector are automatically to test.Both many devices can have been avoided same
Time crosstalk when measuring, the problem such as interference, error that is artificial and that avoid manual operation to cause can be saved greatly simultaneously.Separately
Outward, operation stability and the data reliability of whole system are higher.
Although it will be understood by those skilled in the art that in described above, for ease of understanding, the step of method be have employed suitable
Sequence describes, it should be understood that the order for above-mentioned steps the most strictly limits.
One of ordinary skill in the art will appreciate that all or part of step realizing in above-described embodiment method is permissible
Instructing relevant hardware by program to complete, this program can be stored in a computer read/write memory medium, such as:
ROM/RAM, magnetic disc, CD etc..
Will also be appreciated that the apparatus structure shown in accompanying drawing or embodiment is only schematically, represent logic knot
Structure.The module wherein shown as separating component is probably or is not likely to be portion that is physically separate, that show as module
Part is probably or is not likely to be physical module.
Obviously, those skilled in the art can carry out various change and the modification essence without deviating from the present invention to the present invention
God and scope.So, if these amendments of the present invention and modification belong to the scope of the claims in the present invention and equivalent technologies thereof
Within, then the present invention is also intended to comprise these change and modification.
Claims (10)
1. a laser test system, it is characterised in that including: light source generator, the first beam splitter, multiple first tested
Device and test control device；Wherein,
Light source generator, is used for producing LASER Light Source；
First beam splitter, is connected with light source generator, for LASER Light Source is divided into multiple first laser beam；
The input of each the first measured device is respectively aligned to first laser beam, and, each the first measured device
Power end is connected with power supply by multiple power supplies switch, and the outfan of each the first measured device is switched by multi-channel rf
It is connected with test control device；
Further, laser test system farther includes: for being adjusted the temperature inside the box according to the control of test control device
High-low temperature chamber, and the first beam splitter and the first measured device be placed in high-low temperature chamber.
Laser test system the most according to claim 1, it is characterised in that farther include: the first test circuit board and test
Fixture；
Wherein, the first test circuit board includes the test zone for fixing multiple first measured device, the most multiple first tested
Device is fixed in test zone by test fixture.
Laser test system the most according to claim 2, it is characterised in that farther include for setting on the first test circuit board
Put the filter field of filter circuit, be provided with multiple and the first measured device filter circuit one to one in filter field, then
The outfan of each the first measured device switched by multi-channel rf and the filter circuit corresponding with this first measured device with
Test control device is connected, and wherein, each filter circuit is for the output to the first measured device being connected with this filter circuit
Signal is filtered.
4. according to the laser test system that claim 1-3 is arbitrary, it is characterised in that each way switch in multiple power supplies switch
Corresponding respectively to the power end of first measured device, each way switch in multi-channel rf switch corresponds respectively to one the
The outfan of one measured device.
Laser test system the most according to claim 1, it is characterised in that farther include: the light merit being connected with beam splitter
Rate meter, for monitoring the performance number of at least one the first laser beam of beam splitter output.
Laser test system the most according to claim 1, it is characterised in that light source generator farther includes: optical table
And the light source that is positioned on optical table and optical attenuator.
Laser test system the most according to claim 1, it is characterised in that test control device farther includes: computer and
Oscillograph, wherein,
Oscillographic input is connected with the outfan of each the first measured device, for display first by multi-channel rf switch
The relevant parameter of the output signal of measured device；
Computer is respectively connected with oscillograph and multiple first measured device, for believing the output of multiple first measured devices
Number it is controlled and calculates.
Laser test system the most according to claim 1, it is characterised in that farther include: the second beam splitter and multiple
Second measured device, wherein,
Second beam splitter is connected with light source generator, for the LASER Light Source that light source generator produces is divided into multiple the
Dual-laser light beam；
The input of each the second measured device is respectively aligned to each the second laser beam, the power end of each the second measured device
Being connected with power supply, the outfan of each the second measured device is connected with test control device.
Laser test system the most according to claim 8, it is characterised in that farther include: control switch, be used for controlling light source
Generating means and the connection of the first beam splitter, and disconnect with the second beam splitter；Or, control light source generator and the second light
Beam splitter connects, and disconnects with the first beam splitter.
Laser test system the most according to claim 1, it is characterised in that the first measured device is photo-detector.
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| CN201610383976.0A CN106092510A (en) | 2016-06-02 | 2016-06-02 | Laser test system |
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| CN111122124A (en) * | 2019-12-14 | 2020-05-08 | 杭州电子科技大学 | Multi-channel synchronous characterization device and method based on semiconductor laser beams |
| CN112985487A (en) * | 2021-02-08 | 2021-06-18 | 中国科学院半导体研究所 | Array type photoelectric detector test system |
| CN113639873A (en) * | 2021-08-16 | 2021-11-12 | 北京京东乾石科技有限公司 | Thermal infrared camera test method, device, test equipment, test system and medium |
| CN114207464A (en) * | 2020-06-29 | 2022-03-18 | 深圳市速腾聚创科技有限公司 | Laser receiving device and laser radar |
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