CN216751765U - Device for evaluating transceiving performance parameters of optical module through multi-channel test - Google Patents

Abstract

The device for testing and evaluating the transceiving performance parameters of the optical module through multiple channels is convenient and quick and has high flexibility. The utility model is realized by the following technical scheme: one of the two evaluation boards is used as an evaluation test board, the other evaluation board is used as a light source board, the evaluation test board is connected with the light source board, a USB-HUB chip directly integrates at least 4 paths of access microcontrollers and optical module interfaces in the evaluation test board, optical module originating signals are transmitted to an optical switch input interface through optical fibers, an optical switch transmits optical signals to an optical input interface of an oscilloscope through a unified output COM port through optical fibers, performance parameters of optical module originating eye diagrams can be tested, the output end of an adjustable attenuator group is transmitted to the receiving end of the optical module through the optical fibers to form a loop for testing the sensitivity performance of the receiving end of the optical module, the output end of the optical switch is connected with an optical input port of the oscilloscope, and a PC upper computer is connected with a channel for switching the optical switch through serial ports to realize the round-robin test of the originating eye diagram parameters of at least 4 optical modules.

Description

Device for evaluating transceiving performance parameters of optical module through multi-channel test

Technical Field

The utility model relates to a multi-channel and multi-rate integrated evaluation board in the field of optical communication, in particular to a 1.25-10.3125G optical module which is used in large quantity and is a multi-channel and multi-rate integrated evaluation board used in production or research and development tests.

Background

In the field of optical communication, an optical module is one of important components in optical fiber communication, the optical module has many types, and from the packaging aspect, the optical module has SFP, SFP +, SFF, GBIC, XFP and QSFP, and from the speed aspect, the SFP speed can reach 4Gbps, the XFP speed can reach 10Gbps, and the QSFP speed can reach 100 Gbps. However, SFP & SFP + are still common products in the market as far as this is concerned. To be precise, an optical module is a general term for various module categories, and specifically includes: the optical transceiver module comprises an optical receiving module, an optical transmitting module, an optical receiving and transmitting integrated module, an optical forwarding module and the like. The optical module is generally referred to as an optical transceiver module. The optical module with higher transmission rate has more complex structure according to the encapsulation classification. The switch is suitable for the encapsulation types as follows: SFP, eSFP, SFP +, XFP, SFP28, QSFP +, CXP, CFP, QSFP 28. All optical modules support hot plugging. The optical module is a standard photoelectric converter, and is a connection module with photoelectric conversion function, wherein a sending end converts an electric signal into an optical signal, and after the optical signal is transmitted through an optical fiber, a receiving end converts the optical signal into the electric signal. The optical module is composed of a photoelectronic device, a functional circuit, an optical interface and the like. The optoelectronic device comprises a Transmit (TX) and a Receive (RX) part. An emission part: the method comprises the steps that an electric signal with a certain code rate is input, the electric signal is processed by an internal driving chip and then drives a semiconductor Laser (LD) or a Light Emitting Diode (LED) to emit a modulated optical signal with a corresponding rate, and an automatic optical power control circuit (APC) is arranged in the semiconductor laser or the light emitting diode to enable the power of the output optical signal to be stable; a receiving section: the optical signal with a certain code rate is converted into an electric signal by the optical detection diode after being input into the module, and the electric signal with the corresponding code rate is output after passing through the preamplifier. When converting an electrical signal into an optical signal, a laser of a transmitting part of an optical module converts the electrical signal into the optical signal according to a code rate of the input electrical signal. When the transmitter is connected to the receiver by an optical fiber, it is a problem with the transmitter or with the receiver, and perhaps with both the transmitter and the receiver, if the error rate of the overall system does not achieve the desired effect. In fact, the transmitter and receiver of an optical module will interact, and therefore the standard that an optical module is qualified is that any receiver can receive an optical signal from the worst-performing transmitter, and any transmitter can transmit an optical signal that can be received by the worst-performing receiver. It is a complicated task to accurately define the worst performance of a transmitter or receiver, and if the receiver needs to receive a certain power to meet the error rate requirement of the system, the power is the minimum transmission power of the transmitter. Furthermore, the quality of the electrical measurement must also be confirmed by jitter measurements and eye pattern measurements. Eye diagram measurement is a common method of examining the output waveform of a transmitter because the eye diagram contains rich information that reflects the overall performance of the transmitter. The output optical signal of the transmitter must be measured using optical quality metrics such as eye diagram measurements, optical modulation amplitude and extinction ratio. There are three main categories of testing of the electronic output signal of a receiver: eye pattern testing, which can ensure that the 'eyes' of the eye pattern are in an open state. Eye diagram testing generally implements jitter testing from the depth of bit error rate, tests different types of jitter tracking and tolerance, and tests the tracking of jitter by internal clock recovery circuits. In summary, testing optical modules is a complex task, but is also an indispensable step to ensure their good performance. Eye pattern measurement is a widely used measurement method, and can effectively test the transmitter of the optical module. The receiver test of the optical module is more complicated, and more test methods are also needed.

In order to improve the prediction accuracy of optical power in an optical fiber communication system, the performance parameter test of an optical transceiver module is an important process for inspecting finished products, and an evaluation board is an important device which can supply power to an optical module, provide an access interface for an internal register of the optical module and test the transceiver performance parameters of the optical module during the production process of the optical module and the verification test of research and development products. Of the most important optical properties are the eye diagram, extinction ratio, jitter, rise and fall time, margin value, spectrum, OSNR, RMS spectral width, center wavelength, OMA. The electrical properties include electrical eye diagram, receiver sensitivity, LOS, etc. The performance indexes affecting the optical module mainly include average emitted optical power, extinction ratio, optical signal center wavelength, overload optical power, receiving sensitivity and received optical power, and the performance of the optical module can be judged by detecting whether the values are within a normal range value. The extinction ratio is the minimum value of the ratio of the average optical power of the laser emitting all '1' codes to the average optical power of the laser emitting all '0' codes under the condition of full modulation, and the unit is dB. In the emission spectrum, the wavelengths corresponding to the midpoints of the line segments connecting the 50% maximum amplitude values. Different types of lasers or two lasers of the same type may have a difference in center wavelength due to process, production, etc., and even the same laser may have a different center wavelength under different conditions. The most important performance parameters of the optical module are as follows: bit Error Rate (BER), after all, optical modules are used in data communications, and transmitting data is its most important purpose. The most important test of the optical module is also around the test, like in a test case, the module on the test board passes through the optical fiber but the error rate of the optical fiber, and the module under high and low temperature passes through the optical fiber but the error rate of the optical fiber; the bit error rate of the over-fiber and the under-fiber while running on the system. Many performance tests of optical modules are tested around bit error rates. Generally, the higher the rate is, the worse the receiving sensitivity is, that is, the larger the minimum received optical power is, the higher the requirement for the optical module receiving end device is. In summary, when the received optical power is less than the receiving sensitivity, the signal may not be received normally because the optical power is too weak. When the received optical power is greater than the overload optical power, the signal may not be received normally because of the error phenomenon. The manual test requires that a tester has high professional technical requirements, the test efficiency is low, errors are easy, and the misoperation of the instrument is easy to damage.

With the rapid development of optical communication technology, the demand of optical modules in optical communication systems is increasing day by day. Because the test indexes of the optical module are various, different test instruments are required to be used for testing different indexes, and different test platforms are correspondingly built, so that a large amount of labor cost is caused by frequent work such as optical fiber connection, equipment replacement and the like, and the production mode cannot meet the production requirement along with the increase of the product mass production and the test workload. In the current production test process, the optical module test based on multiple channels mainly tests the optical module sending-end eye pattern: the evaluation board of a single channel is connected with an external signal generator through a copper axis, and then the transmitting end of the optical module is connected to the optical input interface of the oscilloscope; the evaluation board of a single channel is connected with an eye pattern of a test receiving end of an external independent signal generator through a copper axis, and then the receiving end of the optical module is connected to an electric signal input interface of an oscilloscope; the evaluation board of a single channel is connected with an external independent signal generator through a copper axis, and then the transmitting end of the optical module is connected to the optical input interface of the spectrometer for spectrum test; the receiving and transmitting ends of the two single-channel evaluation boards are connected with the receiving and transmitting end of an external signal generator through copper axes to carry out receiving end sensitivity test, after the signals are switched by the coaxial cables and the SMA adapter for many times, the signal quality is poor, and especially when the coaxial cables are long, the signal quality is reduced obviously; after the signals are switched by the SMA connector for many times or one path of modulation signal is divided into multiple paths of modulation signals by 1C (Instrument Chip), the signal quality can be influenced to different degrees. Meanwhile, the traditional external USB shunt needs to use four USB wires and a complete test platform, the built effect is messy, and a plurality of cables can exist on the table board. The stations required by the assembly line operation are relatively numerous, and the requirements on the number of equipment and the number of personnel are correspondingly improved.

SUMMERY OF THE UTILITY MODEL

The utility model aims to overcome the defects of the existing test platform in the production process, provides a multi-channel and multi-rate optical module integrated evaluation board which is more convenient, faster, highly flexible and tidier, and can increase the single-day productivity of operators by about one time in efficiency.

The above object of the present invention can be achieved by the following technical solutions: an apparatus for evaluating the transceiving performance parameters of an optical module by multi-channel test comprises: the evaluation board of two the same multi-rate multichannel optical modules, the optical module socket, the electric signal chip selector, signal source module, USB-HUB chip and the status indicator lamp of integrated at least 4 SFP & SFP + interfaces on every evaluation board, its characterized in that: one of the two evaluation boards is used as an evaluation test board, the other evaluation test board is used as a light source board, the evaluation test board is connected with the light source board through an SMA connector, a USB-HUB chip directly integrates at least 4 paths of USB buses accessing a microcontroller MCU and an optical module interface in the evaluation test board, at least 4 optical module transmitting end signals are transmitted to an optical switch input interface through optical fibers, an optical switch transmits optical signals to an optical input interface of an oscilloscope through a unified output COM port through optical fibers, performance parameters of an optical module transmitting end eye diagram can be tested, the output end of an adjustable attenuator group is transmitted to the receiving end of an optical module through the optical fibers to form a loop for testing the sensitivity performance of the receiving end of the optical module, the output end of the optical switch is connected with an optical input port of the oscilloscope, and a PC upper computer is connected with a serial port to switch channels of the optical switch. And realizing the transmitting end eye pattern parameters of at least 4 optical modules in the round-robin test.

Compared with the prior art, the utility model has the following beneficial effects:

the integration is more, and the test station is more succinct. The evaluation board and the signal source are integrated together, and the optical module test board realizes the communication between the test control host and the optical module to be tested in an in-board wiring mode, so that the test control host can respectively read the electrical parameters of a plurality of optical modules to be tested in an electrical communication mode. The optical module can be connected with the receiving end of the SFP/SFP + optical module through an electric signal chip selector, and one of the four SFP & SFP + optical module interfaces is switched on or off through the on or off of an internal channel. And the receiving end electrooculogram performance parameters of the SFP/SFP + optical module can be tested by connecting the receiving end electrooculogram interface with an oscilloscope. The performance of the module can be tested only by one plate, and the test station is simpler. Meanwhile, because the signal source chip is integrated in the board, a tester does not need to use a copper axis to externally connect a signal source when testing the optical module, and a testing station is cleaner and more concise. The status indicator light on the evaluation board also enables a tester to visually judge the current status of the module. The integrated test board can double the productivity of the staff per day and has obvious effect on the simplification of the stations.

The flexibility is high. The utility model adopts the transmitting end signal generated by the signal generator to connect the SFP & SFP + optical module interface, and then connects the signal with the oscilloscope through the oscilloscope Trigger interface, so as to test the performance parameter of the module transmitting end. The receiving end signals generated by 8 signal generators and the receiving end signals converted by 8 optical modules can form 16 SMA joints, and two identical evaluation plate SMA joints are connected to form a loop for testing the performance of the receiving end of the module. The USB one-to-four chip is used for directly integrating the USB buses of the 4-channel access MCU and the SFP & SFP + interfaces in the board, and the function of independently accessing a certain interface can be realized more conveniently and quickly only by connecting an external USB wire to a computer. The USB-HUB chip integrated in the board enables an operator to access 4 SFP & SFP + optical modules in the board under the condition of using one USB line only by selecting different ports on the upper computer. The defect that four USB lines are needed in the traditional external USB shunt is overcome.

The utility model can be connected to an optical input interface of an oscilloscope through a 4-path optical switch to communicate with 4 SFP/SFP + optical modules, any one optical module in at least 4 SFP/SFP + optical modules needing to test the originating eye diagram can be tested by selecting 4-path optical switch channels, and the cyclic test of the originating eye diagram of the 4 SFP/SFP + optical modules can also be realized through the programming of an upper computer. The transmitting end of 4 SFP/SFP + optical modules is connected to the input end of 4 adjustable attenuators, the output end of the adjustable attenuator is connected to the receiving end of 4 SFP/SFP + optical modules, the receiving end performance test of any one optical module in the 4 SFP/SFP + optical modules can be realized, and the receiving end performance test of the 4 SFP/SFP + optical modules can also be realized simultaneously in a multi-thread operation mode. Thereby effectively avoiding the error of the test result caused by the internal abrasion of the copper axis.

The utility model can realize the test of the receiving end electric eye diagrams of 4 SFP & SFP + optical modules on one oscilloscope by arranging the uniform electric signal output interface in the board, unifying the output electric signals of the 4 SFP & SFP + optical modules to one output interface through 3 electric switch chips, and appointing and testing the input optical parameters of the optical channel by selecting the channel of the electric switch. The signal generating chip supports 1.25G to 12.8G speed, can support different channels and different speeds for use, can simultaneously use two evaluation boards, one light source board and one test board, the luminescence of 4 SFP & SFP + optical modules on the light source board is accessed to the receiving ends of 4 SFP & SFP + optical modules on the test board through a multi-channel attenuator, the luminescence of 4 SFP & SFP + optical modules on the test board is accessed to an oscilloscope through a 1-to-4 optical switch, and all basic performance parameters of the sending ends and the receiving ends of the 4 modules can be realized. The low-speed and high-speed optical modules can be tested on the same evaluation board, and the time for replacing equipment is greatly saved.

Drawings

FIG. 1 is a schematic block diagram of the multi-channel multi-rate integrated evaluation board of the present invention.

Detailed Description

See fig. 1. In the exemplary preferred embodiment described below, an apparatus for evaluating transceiver performance parameters of an optical module by multi-channel testing includes: the evaluation board of two the same multi-rate multichannel optical modules, the optical module socket, the electric signal chip selector, signal source module, USB-HUB chip and the status indicator lamp of integrated at least 4 SFP & SFP + interfaces on every evaluation board, its characterized in that: one of the two evaluation boards is used as an evaluation test board, the other evaluation test board is used as a light source board, the evaluation test board is connected with the light source board through an SMA connector, a USB-HUB chip directly integrates at least 4 paths of USB buses accessing a microcontroller MCU and an optical module interface in the evaluation test board, at least 4 optical module transmitting end signals are transmitted to an optical switch input interface through optical fibers, an optical switch transmits optical signals to an optical input interface of an oscilloscope through a unified output COM port through optical fibers, performance parameters of an optical module transmitting end eye diagram can be tested, the output end of an adjustable attenuator group is transmitted to the receiving end of an optical module through the optical fibers to form a loop for testing the sensitivity performance of the receiving end of the optical module, the output end of the optical switch is connected with an optical input port of the oscilloscope, and a PC upper computer is connected with a serial port to switch channels of the optical switch. And realizing the transmitting end eye pattern parameters of at least 4 optical modules in a round-robin test.

The evaluation test board is provided with a clock interface Trigger connected with an input interface of the oscilloscope and an optical output COM port of the optical switch 1 connected with an optical input optical port of the oscilloscope. The optical switch 1 is provided with Tx ports corresponding to the evaluation test board, T1, T2, T3 and T4 ports, and T1, T2, T3 and T4 ports are respectively connected with the Tx ports of the evaluation test board. The first Rx port of the evaluation test board is connected with the output end OUT of the attenuator 1, the second Rx port of the evaluation test board is connected with the output end OUT of the attenuator 2, the third Rx port of the evaluation test board is connected with the output end OUT of the attenuator 3, and the fourth Rx port of the evaluation test board is connected with the output end OUT of the attenuator 4. The first, second, third and fourth Tx of the light source board are connected to the input ends IN of the attenuator 1, the attenuator 2, the attenuator 3 and the attenuator 4, respectively. T1, T2, T3 and T4 on the evaluation test board and the light source board are respectively connected with T1, T2, T3 and T4 of the respective signal sources

The optical module converts received optical signals into electric signals, then the electric signals are converted into two groups by the electric signal chip selector, one group of the electric signals is used for testing the sensitivity of the optical module, the other group of the electric signals is used for testing the electric eye diagram of the optical module, different channels are switched by the PC upper computer, and the purpose of synchronously testing the sensitivity or the performance parameters of the electric eye diagram of at least 4 optical modules is achieved.

At least 4 micro-controllers MCU are used as a main control chip, a clock signal output interface on the evaluation test board is in butt joint with a clock signal input interface of the oscilloscope, the optical switch is switched to control an optical module interface, a power supply chip, a signal source module and a state indicator lamp on multiple channels, the optical path loss of each optical path of the multi-channel optical switch is tested in a multi-thread mode, and at least 4 groups of optical module receiving end electric eye pattern performance parameters or optical module transmitting end optical eye pattern performance parameters to be tested are tested and recorded in a configuration file.

The PC host computer is a PC test control host computer, the optical switch is a multi-path optical switch, the optical module to be tested is an optical module needing to test performance parameters, the output of the optical module to be tested is connected to the multi-path optical switch, the output end of the attenuator is connected with the input end Rt of the optical module to be tested, and under the control of the PC test control host computer, the multi-path optical switch selectively conducts any one of the plurality of test optical channels, so that the optical module to be tested in the test optical channel which is selectively conducted is tested.

The PC upper computer appoints input optical parameters of an optical module to be tested in the test optical channel to enable the input optical parameters to reach a target value Rn1, the receiving power Rti of the optical module to be tested is synchronously read by gradually adjusting the attenuation value of the adjustable attenuator group, and when the power of the Rti is equal to the target power Rt, the adjustment of the input optical power of the optical module to be tested is completed. The adjustable attenuator group adjusts the intensity of an optical signal output to the optical module to be detected by the light source module, and the adjustment range is 0-50dB linear adjustment; a fixed 10dB attenuator can be arranged between the optical module to be tested and the light source to prevent the optical module to be tested from being overloaded and causing damage to a receiving end device.

In the adjustment of the optical power, the PC upper computer simultaneously reads the optical power P1 detected by the input optical parameter testing device, and when P1 ═ Rn1+ L1, the purpose of adjusting the input optical power of the first optical module to be tested is achieved, where L1 is the optical path loss of the first optical path of the first multi-path optical switch.

The multi-path optical switch can be an 8-in 1-output optical switch, and at least one test optical channel is provided with an input interface of an optical module to be tested, so that a plurality of test optical channels which can be selectively conducted by a PC test control host are formed. The multi-path optical switch gates a test optical signal output from a test optical channel to be tested on an optical input interface of the oscilloscope under the control of the PC test control host, and performs power and eye pattern parameter test on the corresponding optical module to be tested on the test optical channel; the adjustable attenuator is used for adjusting the intensity of an optical signal output to the optical module to be tested by the light source module, and the 4 micro-controllers MCU control the signal source module through an I2C communication interface; the host computer controls the 1 × 8 optical switch through the serial port line, controls the optical module test board through the USB line, and the optical module test board realizes the communication to the optical module to be tested through an I2C bus.

Preferably, the PC upper computer defines a test flow through the evaluation software, and the evaluation software data stream controls and reads data of the optical module chip connected to the evaluation test board through the USB port, thereby automatically completing the test flow of the optical module product to be tested, and the test method specifically includes the following steps:

(1) the PC upper computer is connected with all the using equipment, and all the using equipment comprises: serial communication equipment and USB equipment, serial communication equipment contains: an optical switch, a plurality of provided GPIB interfaces; the USB device includes: the test board and the adjustable attenuator are evaluated, and the PC test control host establishes GPIB communication connection with the spectrometer and the oscilloscope by sending GPIB instructions; the evaluation software is used for leading out a rule of a GPIB command format meeting SCPI standards through a GPIB interface in combination with a data structure of a GPIB command, generating a GPIB command tree, judging whether the format of the transmitted GPIB command is correct or not, whether the transmission is successful or not and whether the data reception is successful or not based on the characteristics of the GPIB command tree, and analyzing the GPIB command to obtain a GPIB command query result if the GPIB command is successful;

(2) the PC upper computer controls to switch the multi-path optical switch to a specified test optical channel through the serial port, for example, the test control host switches the optical switch to a second test optical channel. As shown in fig. 1, an optical switch is connected to transmitting optical signals of 4 optical modules to be tested, and the purpose of automatically testing a specified optical module to be tested is achieved by switching channels of a multi-channel optical switch, for a first optical module to be tested, the multi-channel optical switch needs to be switched to an optical path 1, and eye diagram parameters (such as power, extinction ratio, jitter, Margin and the like) displayed by an oscilloscope are read through GPIB communication between an upper computer and the oscilloscope, and the read parameters are compared with indexes configured in a database to determine whether the optical module parameters are normal. The optical index test of the optical module can be realized;

(3) the PC upper computer adjusts the attenuation gain of each adjustable attenuator through the USB, so that the input light of the optical module to be tested reaches the target value Rn1, as can be seen from the optical path structure diagram shown in fig. 1, the optical power P1 detected by the PC upper computer tests the optical path loss L1 of the first optical path of the multi-path optical switch in advance, and obtains the attenuation gain according to the input optical power Rn1 of the first optical module to be tested: the optical power P1 is Rn1+ L1, and so on, the optical power of P2 and P3 … Pn is obtained and stored in the configuration file. In order to achieve the input optical power Rn1 of the optical module 1 to be tested, an implementation method is adopted, the test control host computer gradually adjusts the adjustable attenuator and simultaneously reads the optical power P1 detected by the power meter, and when P1 is Rn1+ L1, the purpose of adjusting the input optical power of the first optical module to be tested is achieved;

(4) the PC upper computer reads input optical power of an optical module to be tested through a power meter, reads output spectrum data of the optical module to be tested through a spectrometer, reads output eye pattern data of the optical module to be tested through an oscilloscope, obtains test data through error code number read by a signal source, judges the test data to be qualified, switches channels of an electric signal switch through 4 micro-controllers (MCU), realizes sensitivity test or electric eye pattern test of at least 4 optical modules through different channel on-off combinations, and stores the data to a database.

What has been described above is merely a preferred embodiment of the utility model. It should be noted that variations and modifications can be made by those skilled in the art without departing from the principle of the present invention, and these variations and modifications should be construed as falling within the scope of the present invention.

Claims (8)

1. An apparatus for evaluating the transceiving performance parameters of an optical module by multi-channel test comprises: the evaluation board of two the same multi-rate multichannel optical modules, the optical module socket, the electric signal chip selector, signal source module, USB-HUB chip and the status indicator lamp of integrated at least 4 SFP & SFP + interfaces on every evaluation board, its characterized in that: one of the two evaluation boards is used as an evaluation test board, the other evaluation test board is used as a light source board, the evaluation test board is connected with the light source board through an SMA connector, a USB-HUB chip directly integrates at least 4 paths of USB buses accessing a microcontroller MCU and an optical module interface in the evaluation test board, at least 4 optical module originating signals are transmitted to an optical switch input interface through optical fibers, the optical switch transmits optical signals to an optical input interface of an oscilloscope through a unified output COM port through the optical fibers, the performance parameters of an optical module originating eye diagram can be tested, the output end of an adjustable attenuator group is transmitted to the receiving end of the optical module through the optical fibers to form a loop for testing the sensitivity performance of the receiving end of the optical module, the output end of the optical switch is connected with an optical input port of the oscilloscope, and a PC upper computer is connected with a channel for switching the optical switch through a serial port to realize the round inspection test of the originating eye diagram parameters of at least 4 optical modules.

2. The apparatus for multi-channel testing and evaluating transceiver performance parameters of optical modules according to claim 1, wherein: the receiving end signals are divided into two groups by the electric signal chip selector, one group is used for testing the sensitivity of the optical module, the other group is used for testing the electric eye diagram of the optical module, and different channels are switched by the PC upper computer, so that the sensitivity or the electric eye diagram performance parameters of at least 4 optical modules are synchronously tested.

3. The apparatus for multi-channel testing and evaluating transceiver performance parameters of optical modules according to claim 1, wherein: and at least 4 micro-controllers MCU are used as a main control chip to control the power supply chip, the optical module interface, the signal source module and the status indicator lamp, the clock signal output interface is connected with the clock signal input interface of the oscilloscope, and at least 4 groups of optical module receiving end electric eye pattern performance parameters or optical module transmitting end optical eye pattern performance parameters to be tested are tested simultaneously in a multithreading mode.

4. The apparatus for multi-channel testing and evaluating transceiver performance parameters of optical modules according to claim 1, wherein: the evaluation test board is provided with a clock interface Trigger connected with an input interface of the oscilloscope and an optical output COM port of the optical switch 1 connected with an optical input optical port of the oscilloscope.

5. The apparatus for multi-channel testing and evaluating transceiver performance parameters of optical modules according to claim 1, wherein: the optical switch 1 is provided with Tx ports corresponding to the evaluation test board, T1, T2, T3 and T4 ports, and T1, T2, T3 and T4 ports are respectively connected with the Tx ports of the evaluation test board.

6. The apparatus for multi-channel testing and evaluating transceiver performance parameters of optical modules according to claim 1, wherein: a first Rx port of the evaluation test board is connected with an output end OUT of the attenuator 1, a second Rx port of the evaluation test board is connected with an output end OUT of the attenuator 2, a third Rx port of the evaluation test board is connected with an output end OUT of the attenuator 3, and a fourth Rx port of the evaluation test board is connected with an output end OUT of the attenuator 4.

7. The apparatus for multi-channel testing and evaluating transceiver performance parameters of optical modules according to claim 1, wherein: the first, second, third and fourth Tx of the light source board are connected to the input ends IN of the attenuator 1, the attenuator 2, the attenuator 3 and the attenuator 4, respectively.

8. The apparatus for multi-channel testing and evaluating transceiver performance parameters of optical modules according to claim 1, wherein: t1, T2, T3 and T4 on the evaluation test board and the light source board are respectively connected with T1, T2, T3 and T4 of the respective signal sources.

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