CN115333617A

CN115333617A - Multichannel optical module evaluation board and optical module test system

Info

Publication number: CN115333617A
Application number: CN202210860947.4A
Authority: CN
Inventors: 贺俊; 朱都; 贺海诚; 庞龙; 廖伟; 罗宣平
Original assignee: Trixon Communication Technology Corp ltd
Current assignee: Trixon Communication Technology Corp ltd
Priority date: 2022-07-21
Filing date: 2022-07-21
Publication date: 2022-11-11

Abstract

The invention discloses a multi-channel optical module evaluation board and an optical module test system, wherein the multi-channel optical module evaluation board comprises: a signal generator having a plurality of emitting ends for generating an electrical signal; the optical module comprises a plurality of optical module sockets, a plurality of optical module sockets and a control module, wherein the electric signal receiving end of each optical module socket is connected with the sending end of a signal generator and is used for accessing an optical module and outputting an electric signal to the optical module so as to drive the optical module to output the optical signal or receive the electric signal obtained by the optical module through photoelectric conversion; the electrical output interface is used for connecting the oscilloscope; the electric signal chip selector is provided with a first output end and a plurality of receiving ends, the receiving end of each electric signal chip selector is connected with the electric signal transmitting end of one optical module socket, and the first output end of each electric signal chip selector is connected with the electric output interface and used for controlling the first output end to be communicated with the corresponding receiving end, so that the electric signal transmitting end of the corresponding optical module socket is electrically connected with the electric output interface. The invention can solve the problems of few test channels and low integration degree of optical module test.

Description

Multi-channel optical module evaluation board and optical module test system

Technical Field

The invention relates to the technical field of optical modules, in particular to a multi-channel optical module evaluation board and an optical module test system.

Background

With the rapid development of optical communication technology, the demand of optical modules in optical communication systems is increasing. Because the test indexes of the optical module are various, different test instruments are required to be used for testing different indexes, and different test platforms are correspondingly built, so that a large amount of labor cost is caused by frequent work such as optical fiber connection, equipment replacement and the like, and the production mode cannot meet the production requirement along with the increase of the product mass production and the test workload. At present, the effect of putting up out is in disorder for one set of complete test platform now, can have a lot of cables on the mesa, and the station that assembly line work needs is also relatively numerous, also can correspondingly promote to the requirement of equipment quantity and personnel quantity. Simultaneously, current test platform uses the test panel of a plurality of single channels to realize the test of multichannel usually, leads to the cable more in disorder.

Disclosure of Invention

The invention mainly aims to provide a multi-channel optical module evaluation board, and aims to solve the problems of few test channels and low integration degree of optical module tests.

In order to achieve the above object, the multi-channel optical module evaluation board provided by the present invention comprises:

the signal generator is provided with a plurality of transmitting ends and is used for generating and outputting an electric signal;

the optical module socket is used for accessing an optical module and outputting the electrical signal to the optical module so as to drive the optical module to output the optical signal or receive the electrical signal obtained by the optical module through photoelectric conversion;

the electric output interface is used for connecting an oscilloscope;

the electric signal chip selector is provided with a first output end and a plurality of receiving ends, the receiving end of each electric signal chip selector is connected with the electric signal transmitting end of one optical module socket, the first output end of each electric signal chip selector is connected with the electric output interface, and the electric signal chip selector is used for controlling the first output end to be communicated with the corresponding receiving end so as to enable the electric signal transmitting end of the corresponding optical module socket to be electrically connected with the electric output interface.

Optionally, the signal generator further has a plurality of receiving ends, and the number of the receiving ends of the signal generator is the same as the number of the sending ends of the signal generator;

the electric signal chip selector is also provided with a plurality of second output ends, and the number of the second output ends of the electric signal chip selector is the same as that of the receiving ends of the electric signal chip selector.

Optionally, the multi-channel optical module evaluation board further includes an SMA connector, the SMA connector has a plurality of connection terminals, and the connection terminals are respectively connected to the receiving ends of the signal generators and the second output ends of the electrical signal chip selectors in a one-to-one correspondence manner;

the SMA connector is used for being connected with the SMA connector of the other multi-channel optical module evaluation board through a connecting cable.

Optionally, the multi-channel light module evaluation board further includes:

the communication interface is used for accessing terminal equipment;

the communication processor is respectively connected with the communication interface, the signal generator and the optical module sockets, and is used for establishing communication connection with the signal generator, establishing communication connection with terminal equipment when the communication interface is connected into the terminal equipment, and establishing communication connection with an optical module to be tested when the optical module to be tested is connected into the optical module sockets.

Optionally, the multi-channel light module evaluation board further includes:

the clock interface is used for accessing a clock signal input interface of the oscilloscope;

the microprocessors are respectively in communication connection with the communication processor; wherein the content of the first and second substances,

the microprocessor is also connected with a plurality of optical module sockets and is used for controlling the optical module sockets to work;

the microprocessor is also connected with the signal generator and is used for controlling the signal generator to generate and output an electric signal;

and the microprocessor is also connected with the electric signal chip selector and is used for controlling the electric signal chip selector to control the electric signal sending end of the corresponding optical module socket to be electrically connected with the electric output interface.

The invention also provides an optical module testing system, which comprises:

a terminal device;

an oscilloscope;

a multi-path optical switch; and (c) a second step of,

the test board is the multi-channel optical module evaluation board, and an optical module socket on the test board is used for accessing an optical module to be tested;

the multi-path optical switch is provided with a total output end and a plurality of input ends, the total output end of the multi-path optical switch is connected with an optical input interface of the oscilloscope, the input end of each multi-path optical switch is connected with an optical signal transmitting end of an optical module to be tested, which is connected to the test board, and the multi-path optical switch is used for controlling the total input end to be communicated with the corresponding input end so that the corresponding optical module to be tested outputs an optical signal to the oscilloscope;

the light input interface of the oscilloscope is connected with the total output end of the multi-path optical switch, the clock signal input interface of the oscilloscope is connected with the clock interface of the test board, and the oscilloscope is used for outputting corresponding optical eye pattern information when receiving optical signals;

the terminal equipment is respectively in communication connection with the oscilloscope, the multi-path optical switch and the test board, and is used for outputting a corresponding control instruction to the multi-path optical switch and the test board when being triggered by a user and acquiring the optical eye pattern information output by the oscilloscope.

The invention also provides an optical module testing system, which comprises:

a terminal device;

an oscilloscope;

the test board is the multi-channel optical module evaluation board, and an optical module socket on the test board is used for accessing an optical module to be tested; and (c) a second step of,

the light source board is the multi-channel optical module evaluation board, and an optical module socket on the light source board is used for accessing a standard optical module;

the optical signal receiving end of the optical module to be tested, which is accessed on each test board, is connected with the optical signal transmitting end of the standard optical module, which is accessed on one light source board, so that the optical signal output by the standard optical module is converted into an electrical signal and output by the optical module to be tested;

an electrical input interface of the oscilloscope is connected with an electrical output interface of the test board, a clock signal input interface of the oscilloscope is connected with a clock interface of the light source board, and the oscilloscope is used for outputting corresponding electrical eye pattern information when receiving electrical signals;

the terminal equipment is respectively in communication connection with the oscilloscope, the test board and the light source board, and is used for outputting a corresponding control instruction to the test board and the light source board when triggered by a user and acquiring the electric eye pattern information output by the oscilloscope.

The invention also provides an optical module testing system, which comprises:

a terminal device;

the light source board is the multi-channel optical module evaluation board as above, and an optical module socket on the light source board is used for accessing a standard optical module;

the optical signal receiving end of the optical module to be tested, which is accessed on each test board, is connected with the optical signal transmitting end of the standard optical module, which is accessed on one light source board, so that the optical module to be tested converts the optical signal output by the standard optical module into an electrical signal and outputs the electrical signal;

a plurality of second output ends of the electric signal chip selector on the test board are correspondingly connected with a plurality of receiving ends of the signal generator on the light source board one by one through the SMA connector, so that the optical module to be tested outputs electric signals to the signal generator on the light source board;

the terminal equipment is respectively in communication connection with the test board and the light source board, and is used for outputting a corresponding control instruction to the test board and the light source board when triggered by a user, and determining error code information of the optical module to be tested according to an electric signal generated by a signal generator on the light source board and an received electric signal.

The invention also provides an optical module testing system, which comprises:

a terminal device;

an oscilloscope;

a multi-path optical switch;

the multi-path optical switches are provided with a total output end and a plurality of input ends, the total output end of each multi-path optical switch is connected with an optical input interface of the oscilloscope, the input end of each multi-path optical switch is connected with an optical signal transmitting end of an optical module to be tested, which is accessed on one test board, and the multi-path optical switches are used for controlling the total input ends to be communicated with the corresponding input ends;

the optical input interface of the oscilloscope is connected with the total output end of the multi-path optical switch, the electrical input interface of the oscilloscope is connected with the electrical output interface of the test board, and the clock signal input interface of the oscilloscope is connected with the clock interface of the test board;

the optical signal receiving end of the optical module to be tested connected to each test board is connected with the optical signal transmitting end of the standard optical module connected to the light source board, and a plurality of second output ends of the electric signal chip selector on the test board are correspondingly connected with a plurality of receiving ends of the signal generator on the light source board one by one through the SMA connector;

the terminal equipment is respectively in communication connection with the oscilloscope, the multi-path optical switch, the test board and the light source board, and has three test modes, namely a first test mode, a second test mode and a third test mode; wherein the content of the first and second substances,

in the first test mode, the terminal device controls a signal generator on the test board to generate an electrical signal, so that an optical module to be tested accessed on the test board converts the electrical signal into an optical signal and outputs the optical signal;

the terminal equipment also controls the multi-path optical switch to control the total input end to be communicated with the corresponding input end so that the corresponding optical module to be tested outputs optical signals to the oscilloscope, and the oscilloscope outputs corresponding optical eye pattern information to the terminal equipment;

in the second test mode, the terminal device controls the signal generator on the light source board to generate an electrical signal, so that the standard optical module connected to the light source board converts the electrical signal into an optical signal and outputs the optical signal to be tested, and the optical module to be tested is driven to convert the optical signal into the electrical signal and output the electrical signal;

the terminal equipment also controls an electric signal chip selector on the test board to control the first output end to be communicated with the corresponding receiving end so that the corresponding optical module to be tested outputs an electric signal to the oscilloscope, and the oscilloscope outputs corresponding electric eye pattern information to the terminal equipment;

in the third test mode, the terminal device controls the signal generator on the light source board to generate an electrical signal, so that the standard optical module connected to the light source board converts the electrical signal into an optical signal and outputs the optical signal to be tested, and the optical module to be tested is driven to convert the optical signal into the electrical signal and output the electrical signal;

the terminal equipment also controls the electric signal chip selector on the test board to control the corresponding second output end to be communicated with the corresponding receiving end so that the corresponding optical module to be tested outputs an electric signal to the signal generator on the light source board;

and the terminal equipment is used for determining the error code information of the optical module to be detected according to the electric signal generated by the signal generator on the light source board and the received electric signal.

Optionally, the optical module testing system further includes:

the input end of each adjustable attenuator is connected with the transmitting end of a standard optical module accessed on a light source board, the output end of each adjustable attenuator is connected with the receiving end of an optical module to be tested accessed on a test board, each adjustable attenuator is also in communication connection with the terminal equipment, and the adjustable attenuators are used for adjusting the intensity of optical signals output by the standard optical module to the optical module to be tested when receiving control instructions;

the optical power meter is in communication connection with the terminal equipment and is used for detecting input optical power and output optical power of an optical module to be detected and outputting corresponding optical power information to the terminal equipment;

and the spectrometer is in communication connection with the terminal equipment and is used for detecting the output spectrum of the optical module to be detected and outputting corresponding spectrum data to the terminal equipment.

The invention integrates the signal generator, the plurality of optical module sockets, the electric signal chip selector and the electric output interface together, can realize the performance test of the optical module by only one board, and provides the integrated evaluation board for the multi-channel and multi-rate optical modules, which is more convenient, quicker, highly flexible and tidier. When the optical module testing device is used for testing, the testing station is simpler, and meanwhile, the signal generator is integrated, so that a tester does not need to use a copper axis to externally connect a signal source when testing the optical module, thereby effectively avoiding the testing result error caused by the internal abrasion of the copper axis, and enabling the testing station to be cleaner and more simplified. The invention can increase the single-day productivity of the staff, has obvious effect on the simplification of the station, and solves the problems of few test channels and low integration degree of the optical module test.

Drawings

In order to more clearly illustrate the embodiments or technical solutions of the present invention, the drawings used in the embodiments or technical solutions of the prior art will be briefly described below, it is obvious that the drawings in the following description are only some embodiments of the present invention, and for those skilled in the art, other drawings can be obtained according to the structures shown in the drawings without creative efforts.

Fig. 1 is a schematic diagram of a functional module of an embodiment of a multi-channel optical module evaluation board according to the present invention;

fig. 2 is a functional module diagram of an optical module testing system according to an embodiment of the present invention.

The reference numbers illustrate:

reference numerals	Name (R)	Reference numerals	Name (R)
				A1～A4	Signal generator transmitting terminal	Tx	Optical module sending end
B1～B4	Receiving end of signal generator	Rx	Receiving end of optical module
				C1～C4	Receiving end of electric signal chip selector	R1～R4	Electric signal receiving terminal of optical module socket
D1～D4	Second output end of electric signal chip selector	T1～T4	Electric signal transmitting terminal of optical module socket
				E1	First output end of electric signal chip selector	S1～S8	Connecting terminal of SMA connector
G1～G4	Input end of multi-path optical switch	IN	Input terminal of adjustable attenuator
				COM	General output end of multi-path optical switch	OUT	Output end of adjustable attenuator

The implementation, functional features and advantages of the objects of the present invention will be further explained with reference to the accompanying drawings.

Detailed Description

The technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only a part of the embodiments of the present invention, and not all of the embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.

It should be noted that, if directional indications (such as up, down, left, right, front, back, 8230; etc.) are involved in the embodiment of the present invention, the directional indications are only used for explaining the relative positional relationship between the components, the motion situation, etc. in a specific posture (as shown in the figure), and if the specific posture is changed, the directional indications are correspondingly changed.

In addition, if there is a description of "first", "second", etc. in an embodiment of the present invention, the description of "first", "second", etc. is for descriptive purposes only and is not to be construed as indicating or implying relative importance or implicitly indicating the number of technical features indicated. Thus, a feature defined as "first" or "second" may explicitly or implicitly include at least one of the feature. In addition, technical solutions between various embodiments may be combined with each other, but must be realized by a person skilled in the art, and when the technical solutions are contradictory or cannot be realized, such a combination should not be considered to exist, and is not within the protection scope of the present invention.

The optical module consists of photoelectronic devices, functional circuits, optical interfaces and the like. The optoelectronic device comprises a Transmit (TX) and a Receive (RX) part. An emission part: the method comprises the steps that an electric signal with a certain code rate is input, the electric signal is processed by an internal driving chip and then drives a semiconductor Laser (LD) or a Light Emitting Diode (LED) to emit a modulated optical signal with a corresponding rate, and an automatic optical power control circuit (APC) is arranged in the semiconductor laser or the light emitting diode to enable the power of the output optical signal to be stable; a receiving section: the optical signal with a certain code rate is converted into an electric signal by the optical detection diode after being input into the module, and the electric signal with the corresponding code rate is output after passing through the preamplifier. When converting an electrical signal into an optical signal, a laser of a transmitting part of an optical module converts the electrical signal into the optical signal according to a code rate of the input electrical signal. When the transmitter is connected to the receiver by an optical fiber, it is a problem with the transmitter or with the receiver, and perhaps with both the transmitter and the receiver, if the error rate of the overall system does not achieve the desired effect. In fact, the transmitter and receiver of an optical module will interact, and therefore the standard that an optical module is qualified is that any receiver can receive an optical signal from the worst-performing transmitter, and any transmitter can transmit an optical signal that can be received by the worst-performing receiver. It is a complicated task to accurately define the worst performance of a transmitter or receiver, and if the receiver needs to receive a certain power to meet the bit error rate requirement of the system, the power is the minimum transmission power of the transmitter. Furthermore, the quality of the electrical measurement must also be confirmed by jitter measurements and eye pattern measurements. Eye diagram measurements are a common method of examining the output waveform of a transmitter because the eye diagram contains a wealth of information that reflects the overall performance of the transmitter. The output optical signal of the transmitter must be measured using optical quality metrics such as eye diagram measurements, optical modulation amplitude and extinction ratio. There are three main categories of testing of the electronic output signal of a receiver: eye pattern testing, which can ensure that the 'eyes' of the eye pattern are in an open state. Eye diagram testing typically implements jitter testing from the depth of the bit error rate, tests different types of jitter tracking and tolerance, and tests the tracking of jitter by internal clock recovery circuits. In summary, testing optical modules is a complex task, but is also an indispensable step to ensure their good performance.

At present, the effect of putting up is in disorder for a set of complete test platform that has now, can have a lot of cables on the mesa, and the station that assembly line operation needs is also relatively numerous, also can correspondingly promote to the requirement of equipment quantity and personnel quantity. Simultaneously, current test platform uses the test panel of a plurality of single channels to realize the test of multichannel usually, leads to the cable more in disorder. In the current production test process, an evaluation board of a single channel is usually connected with an external signal generator through a copper axis, and then an optical module transmitting end is connected to an optical input interface of an oscilloscope; the evaluation board of a single channel is connected with an eye pattern of a test receiving end of an external independent signal generator through a copper axis, and then the receiving end of an optical module is connected to an electric signal input interface of an oscilloscope; the evaluation board of a single channel is connected with an external independent signal generator through a copper axis, and then the light module sending end is connected to the light input interface of the spectrometer for spectrum test; the receiving and transmitting ends of the two single-channel evaluation boards are connected with the receiving and transmitting end of an external signal generator through copper axes to carry out receiving end sensitivity test, after the signals are switched by the coaxial cables and the SMA adapter for many times, the signal quality is poor, and especially when the coaxial cables are long, the signal quality is reduced obviously; after the signals are switched by the SMA connector for many times or one modulation signal is divided into multiple modulation signals by 1C (Instrument Chip), the signal quality can be influenced to different degrees.

To this end, the present invention provides a multi-channel optical module evaluation board, referring to fig. 1 and fig. 2, in an embodiment, the multi-channel optical module evaluation board includes:

the electric output interface is used for connecting an oscilloscope;

In this embodiment, the plurality of optical module sockets are used for accessing optical modules, and when the test board is used as the test board, the optical module sockets can be used for accessing optical modules to be tested, and when the test board is used as the light source board, the optical module sockets can be used for accessing standard optical modules. The number of the optical module sockets can be set according to actual test requirements, and the optical module sockets can be realized by SFP & SFP + optical module sockets or other types of optical module sockets.

The signal generator can be used for being in communication connection with the external terminal equipment and generating a corresponding electric signal or outputting corresponding electric signal information to the external terminal equipment based on a control instruction of the external terminal equipment. The signal generator can generate an electric signal and send the generated electric signal to an optical module connected to the optical module socket through the sending end, so that the connected optical module converts the electric signal into an optical signal. When the optical module is used as a test board for testing, the transmitting end of the accessed optical module can be connected with the optical input interface of the oscilloscope, so that the accessed optical module converts the electric signal generated by the signal generator into an optical signal and outputs the optical signal to the oscilloscope, and the oscilloscope generates corresponding optical eye pattern information when receiving the optical signal, thereby completing the optical eye pattern test of the optical module. Furthermore, a multi-path optical switch can be used, so that a plurality of input ends of the multi-path optical switch are connected with optical modules connected to a plurality of optical module sockets, the total output end of the multi-path optical switch is connected with an oscilloscope, the multi-path optical switch is communicated with corresponding optical channels based on the control of an external terminal, the optical eye diagram test of the optical modules is sequentially completed, and the multi-path test is realized. In addition, the signal generator can be formed by selecting signal generating chips supporting 1.25G to 12.8G rates, and the signal generator can support different channels to be used at different rates, so that the low-speed and high-speed optical modules can be tested on the same evaluation board, and the time for replacing equipment is greatly saved.

The electric signal chip selector is provided with a first output end and a plurality of receiving ends, wherein the receiving ends are connected with the optical module sockets in a one-to-one correspondence mode, and the first output end is connected with an electric output interface, namely the electric output interface is used for being connected with an electric input interface of the oscilloscope. The electric signal chip selector can be internally connected with a plurality of receiving ends and a first output end through a plurality of electric switch chips, so that output electric signals of a plurality of optical modules are unified to an output interface, optical parameters input by an optical channel are appointed to be tested through selecting channels of an electric switch, and the receiving end electric eye pattern of the plurality of optical modules can be tested on one oscilloscope. Specifically, when the test board is used for testing, an external light source can be connected with an optical module connected to each optical module socket, so that the connected optical module converts an external optical signal into an electrical signal and outputs the electrical signal to the oscilloscope through the electrical signal chip selector, and the oscilloscope generates corresponding electrical eye pattern information when receiving the electrical signal, thereby completing the electrical eye pattern test of the optical module.

Furthermore, two multi-channel optical module evaluation boards of the invention can be used to form a complete set of test system for performing various tests. For example, when performing an electrical eye diagram test, one evaluation board is used as a test board, the other evaluation board is used as a light source board, an optical module socket on the test board is connected to an optical module to be tested, and a socket on the light source board is connected to a standard optical module, and a transmitting end of the standard optical module is connected to a receiving end of the optical module to be tested. And the signal generator on the light source board is controlled to generate an electric signal, so that the standard optical module converts the electric signal into an optical signal and then sends the optical signal to the corresponding optical module to be tested, and the optical module to be tested converts the received optical signal into an electric signal and then sends the electric signal to the oscilloscope through the electric signal chip selector, thereby completing the test of the electric eye diagram. The electric signal chip selector can be sequentially communicated with different optical modules to be tested, so that a plurality of optical modules to be tested can sequentially complete the electric eye diagram test.

The invention integrates the signal generator, the plurality of optical module sockets, the electric signal chip selector and the electric output interface together, can realize the performance test of the optical module by only one board, and provides the integrated evaluation board for the multi-channel and multi-rate optical modules, which is more convenient, quicker, highly flexible and tidier. When the optical module testing device is used for testing, the testing station is simpler, and meanwhile, the signal generator is integrated, so that a tester does not need to use a copper axis to externally connect a signal source when testing the optical module, thereby effectively avoiding the testing result error caused by the internal abrasion of the copper axis, and enabling the testing station to be cleaner and more simplified. The invention can increase the single-day productivity of the staff and has obvious effect on the simplification of the work station.

Referring to fig. 1 and 2, in an embodiment, the signal generator further has a plurality of receiving ends, and the number of the receiving ends of the signal generator is the same as the number of the sending ends of the signal generator;

In this embodiment, the signal generator further has a plurality of receiving ends, the number of the receiving ends of the signal generator is the same as that of the sending ends, that is, the plurality of receiving ends correspond to the plurality of sending ends one to one, and correspondingly, the electric signal chip selector also has a plurality of second output ends, the number of which is the same as that of the receiving ends. By arranging the receiving ends of the signal generators and the second output ends of the electric signal chip selectors, a tester can test the error rate of the optical module by using the multi-channel optical module evaluation board, and the error rate test of the optical module, namely the sensitivity test of the optical module.

Specifically, two multi-channel optical module evaluation boards of the invention can be used to form a complete set of test system for performing the bit error rate test. One evaluation board is used as a test board, the other evaluation board is used as a light source board, an optical module socket on the test board is connected with an optical module to be tested, a socket on the light source board is connected with a standard optical module, and the sending end of the standard optical module is connected with the receiving end of the optical module to be tested. Meanwhile, a plurality of second output ends of the electric signal chip selector on the test board are connected with a plurality of receiving ends of the signal generator on the light source board in a one-to-one correspondence mode. When the test is carried out, the signal generator on the light source board is controlled to generate an electric signal, so that the standard optical module converts the electric signal into an optical signal and sends the optical signal to the corresponding optical module to be tested, and the optical module to be tested converts the received optical signal into the electric signal and sends the electric signal back to the signal generator of the light source board through the electric signal chip selector. The electric signal chip selector can be sequentially communicated with different optical modules to be tested, so that the plurality of optical modules to be tested can sequentially complete the error rate test. The signal generator on the light source board can be connected with external terminal equipment, so that the external terminal equipment can acquire the information of the electric signals sent by the signal generator and the received electric signals, and judge the error rate of the corresponding optical module according to the electric signals before and after the signal generator.

The multi-channel optical module evaluation board is provided with the plurality of receiving ends and the plurality of second output ends, so that the multi-channel optical module evaluation board can be used for realizing the error rate test of the optical module, and the test station is simpler during the test. The invention can increase the single-day productivity of the staff and has obvious effect on the simplification of the stations.

Referring to fig. 1 and 2, in an embodiment, the multi-channel optical module evaluation board further includes an SMA connector, where the SMA connector has a plurality of connection terminals, and the connection terminals are respectively connected to the receiving ends of the signal generators and the second output ends of the electrical signal chip selectors in a one-to-one correspondence;

In this embodiment, the multi-channel optical module evaluation board is further provided with an SMA connector, and a plurality of connection terminals of the SMA connector are respectively connected with the receiving ends of the plurality of signal generators and the second output ends of the plurality of electrical signal chip selectors in a one-to-one correspondence manner. By the arrangement, the multi-channel optical module evaluation board can be connected with another multi-channel optical module evaluation board through the SMA connector, and a loop can be formed by connecting two identical evaluation boards through the SMA connectors to test the performance of the receiving end of the module, so that a tester can make a test station more concise when testing the error rate of the optical module by using the multi-channel optical module evaluation board. Simultaneously, owing to set up the SMA connector and realize the connection of two boards to and the multichannel of aassessment board, the advantage of multirate, can guarantee that the circuit can not lead to the platform to change because of switching rate after having connect, can effectively reduce and frequently move the influence of external circuit to signal quality, and two aassessment boards can overlap together and use, can greatly shorten the length of connecting wire, thereby improve the integration of multichannel optical module aassessment board, retrench to the station and have apparent effect.

Referring to fig. 1 and 2, in an embodiment, the multi-channel light module evaluation board further includes:

the communication interface is used for accessing terminal equipment;

the communication processor is respectively connected with the communication interface, the signal generator and the optical module sockets, and is used for establishing communication connection with the signal generator, establishing communication connection with terminal equipment when the communication interface is connected with the terminal equipment, and establishing communication connection with an optical module to be tested when the optical module to be tested is connected with the optical module sockets.

In this embodiment, the multi-channel optical module evaluation board includes a communication processor for establishing communication connection with the signal generator, the terminal device and the plurality of optical modules, the communication processor may select a USB-HUB chip to integrate a USB bus of the multiple access optical module in the board, and only one external USB cable is connected to the terminal device to realize independent access to an optical module accessed to a certain optical module socket, so that the communication function is more convenient and faster. According to the invention, the communication processor is integrated in the board, so that an operator can access a plurality of optical modules accessed in the board under the condition of using one USB cable only by selecting different ports on the upper computer, the defect that a plurality of USB cables need to be used in a traditional external USB shunt is avoided, and a test station is cleaner and more simplified.

and the microprocessor is also connected with the electric signal chip selector and is used for controlling the electric signal chip selector to control the corresponding electric signal transmitting end of the optical module socket to be electrically connected with the electric output interface.

In this embodiment, the multi-channel optical module evaluation board further includes a clock interface and a plurality of microprocessors, where the clock interface is used to connect to a clock signal input interface of the oscilloscope to provide a clock signal for the oscilloscope, so that the oscilloscope can output a corresponding optical eye diagram according to the received optical signal, or output a corresponding electrical eye diagram according to the received electrical signal. The microprocessors are in communication connection with the communication processor through circuits integrated in the board, and access to a certain microprocessor and corresponding control can be achieved only by connecting an external USB (universal serial bus) line to the terminal equipment. The microprocessors and the communication modules are communicated by an I2C bus.

In addition, the multi-channel optical module evaluation board is also provided with a state indicator lamp, and the microprocessor is used for controlling the state indicator lamp to display a corresponding test state. It is understood that the above-mentioned functions may be implemented by one microprocessor, or different functions may be implemented by a plurality of microprocessors. The multi-channel optical module evaluation board can perform different tests in a multi-thread mode by arranging the plurality of microprocessors, namely, a plurality of tests can be performed simultaneously, for example, one microprocessor controls the signal generator to generate an electric signal to perform an optical eye diagram test, and the other microprocessor controls the electric signal chip selector to perform an electric eye diagram test. According to the invention, the plurality of microprocessors are integrated in the board and connected with the communication processor, so that an operator can access the plurality of microprocessors in the board under the condition of using one USB wire by only selecting different ports on the upper computer, multiple controls are synchronously realized, the defects that a plurality of USB wires are required for using a traditional external USB shunt are avoided, and a test station is cleaner and more simplified. Meanwhile, the invention can simultaneously carry out different tests in a multi-thread mode, improves the test efficiency of the multi-channel optical module, can increase the single-day productivity of workers and has obvious effect on the simplification of stations.

In order to improve the optical power prediction accuracy in the optical fiber communication system, the performance parameter test of the optical transceiver module is an important process for inspecting a finished product, the most important of the optical performance is an optical eye diagram, and a tester can obtain various performance parameters of the optical module from the optical eye diagram, such as extinction ratio, jitter, rise-fall time, margin value, spectrum, OSNR, RMS spectral width, center wavelength, OMA, and the like.

Therefore, the invention also provides an optical module testing system, which comprises:

a terminal device;

an oscilloscope;

a multi-path optical switch; and (c) a second step of,

a test board, the test board is the multi-channel optical module evaluation board as claimed in any one of claims 1 to 5, and an optical module socket on the test board is used for accessing an optical module to be tested;

the multi-path optical switch is provided with a main output end and a plurality of input ends, the main output end of the multi-path optical switch is connected with an optical input interface of the oscilloscope, the input end of each multi-path optical switch is connected with an optical signal transmitting end of an optical module to be tested, which is connected to the test board, and the multi-path optical switch is used for controlling the main input end to be communicated with the corresponding input end so that the corresponding optical module to be tested outputs an optical signal to the oscilloscope;

In this embodiment, the optical module testing system includes a terminal device, an oscilloscope, a multi-channel optical switch, and a testing board, where the testing board is the multi-channel optical module evaluation board, and the specific structure of the multi-channel optical module evaluation board refers to the above embodiments.

In this embodiment, the optical module socket on the test board is connected to the optical module to be tested, the plurality of connected optical modules to be tested are respectively connected to the input ends of the multiple optical switches in a one-to-one correspondence manner, and the total output end of the multiple optical switches is connected to the optical input interface of the oscilloscope.

Specifically, during testing, the signal generator generates a corresponding electrical signal based on a control instruction of the external terminal device, and sends the generated electrical signal to the optical module connected to the optical module socket through the transmitting terminal, so that the connected optical module to be tested converts the electrical signal into an optical signal, and the optical signal is transmitted to the optical input interface of the oscilloscope through the optical fiber by the optical module through the unified general output terminal (COM port) of the multi-path optical switch, so that the oscilloscope generates corresponding optical eye diagram information when receiving the optical signal, and the performance parameter test of the optical module transmitting terminal eye diagram is completed. Meanwhile, the terminal equipment can control the multi-path optical switch to selectively conduct any one of the plurality of testing optical channels, so that the optical module to be tested in the testing optical channel which is conducted selectively is tested, the optical eye pattern test of the plurality of optical modules is completed in sequence, and the multi-channel test is realized. The terminal equipment can also compare the read parameters with indexes configured by the database, and judge whether the optical module parameters are normal.

According to the technical scheme, the optical eye diagram test of the optical module to be tested is realized and the multi-channel test of the optical module to be tested is realized by arranging the terminal equipment, the oscilloscope, the multi-path optical switch and the multi-channel optical module evaluation board as the test board, so that the efficiency of the multi-channel optical module test is improved, the single-day productivity of workers can be increased, and the method has a remarkable effect on the simplification of stations.

In order to improve the prediction accuracy of optical power in an optical fiber communication system, the performance parameter test of an optical transceiver module is an important process for inspecting a finished product, the most important of electrical performance is an electrical eye diagram, and a tester can obtain various performance parameters of an optical module from the electrical eye diagram, such as average emitted optical power, extinction ratio, optical signal center wavelength, overload optical power, receiving sensitivity, received optical power and the like.

a terminal device;

an oscilloscope;

a test board, the test board being the multi-channel optical module evaluation board as claimed in any one of claims 1 to 5, wherein the optical module socket on the test board is used for accessing an optical module to be tested; and the number of the first and second groups,

a light source board, the light source board being a multi-channel optical module evaluation board as claimed in any one of claims 1 to 5, optical module sockets on the light source board for accessing standard optical modules;

the electrical input interface of the oscilloscope is connected with the electrical output interface of the test board, the clock signal input interface of the oscilloscope is connected with the clock interface of the light source board, and the oscilloscope is used for outputting corresponding electrical eye pattern information when receiving electrical signals;

the terminal equipment is respectively in communication connection with the oscilloscope, the test board and the light source board, and is used for outputting a corresponding control instruction to the test board and the light source board when being triggered by a user and acquiring the electric eye pattern information output by the oscilloscope.

In this embodiment, the optical module testing system includes a terminal device, an oscilloscope, a testing board and a light source board, where the testing board and the light source board are both the multi-channel optical module evaluation board, and the specific structure of the multi-channel optical module evaluation board refers to the above embodiments.

In this embodiment, the clock signal input interface of the oscilloscope is connected to the clock interface of the light source board, and it can be understood that, when the optical module is tested, which signal generator of the evaluation board is used, the clock signal input interface of the oscilloscope should be connected to the clock interface of the corresponding evaluation board, that is, the clock interface of the test board is connected to the clock interface of the oscilloscope when testing the optical eye diagram, and the clock interface of the light source board is connected to the clock interface of the light source board when testing the optical eye diagram. Further, the channel switching of the two connection relations can be realized by using a single-pole double-throw electrical switch device, that is, the clock interface connection between the oscilloscope and the test board or the clock interface connection between the oscilloscope and the light source board can be realized by using the electrical switch. The optical module socket on the test board is connected with the optical module to be tested, the optical module socket on the light source board is connected with the standard optical module, the sending ends of the standard optical modules are connected with the receiving ends of the optical modules to be tested in a one-to-one correspondence mode, the first output end of the electric signal chip selector of the test board is connected with the electric input interface of the oscilloscope, and therefore a tester can utilize the test system to complete optical eye pattern test of the optical modules.

Specifically, during testing, a signal generator on the light source board generates a corresponding electrical signal based on a control instruction of external terminal equipment, and sends the generated electrical signal to a standard optical module connected to an optical module socket through a transmitting end, so that the connected standard optical module converts the electrical signal into an optical signal, the standard optical module sends the optical signal to an optical module to be tested through an optical fiber, the optical signal received by the optical module to be tested is converted into the electrical signal, and the electrical signal is output to an electrical input interface of an oscilloscope through an electrical signal chip selector, so that the oscilloscope generates corresponding electric eye pattern information when receiving the electrical signal, and the performance parameter test of an eye pattern at the transmitting end of the optical module is completed. Meanwhile, the terminal equipment can control the electric signal chip selector to selectively conduct any one of the plurality of test channels through the communication processor and the microprocessor, so that the optical modules to be tested in the test channels which are conducted selectively are tested, the electric eye pattern test of the optical modules is completed in sequence, and the multi-channel test is realized. The terminal equipment can also compare the read parameters with indexes configured by the database, and judge whether the optical module parameters are normal.

According to the technical scheme, the terminal equipment, the oscilloscope, the test board and the light source board are arranged, so that the electrooculogram test of the optical module to be tested is realized, the multi-channel test of the optical module to be tested is realized, the efficiency of the multi-channel optical module test is improved, the single-day productivity of workers can be increased, and the device has a remarkable effect on the simplification of stations.

The most important performance parameters of the optical module are as follows: bit Error Rate (BER), after all, optical modules are used in data communication, and transmitting data is its most important purpose. The most important test of the optical module is also around the test, like in a test case, the module on the test board passes through the optical fiber but the error rate of the optical fiber, and the module under high and low temperature passes through the optical fiber but the error rate of the optical fiber; the bit error rate of the over and under fiber while running on the system. Many performance tests of optical modules are tested around bit error rates. Generally, the higher the rate is, the worse the receiving sensitivity is, that is, the larger the minimum received optical power is, the higher the requirement for the optical module receiving end device is. In summary, when the received optical power is less than the receiving sensitivity, the signal may not be received normally because the optical power is too weak. When the received optical power is greater than the overload optical power, the signal may not be received normally because of the error phenomenon. The manual test requires that a tester has high professional technical requirements, the test efficiency is low, errors are easy, and the misoperation of the instrument is easy to damage.

a terminal device;

In this embodiment, the optical module testing system includes a terminal device, a testing board and a light source board, where the testing board and the light source board are both the multi-channel optical module evaluation board, and the specific structure of the multi-channel optical module evaluation board refers to the above embodiments.

In this embodiment, the optical module socket on the test board is connected to the optical module to be tested, the optical module socket on the light source board is connected to the standard optical module, the transmitting ends of the plurality of standard optical modules are connected to the receiving ends of the plurality of optical modules to be tested in a one-to-one correspondence manner, and the plurality of second output ends of the electrical signal chip selector of the test board are connected to the plurality of receiving ends of the signal generator on the light source board in a one-to-one correspondence manner.

Specifically, during testing, a signal generator on a light source board generates a corresponding electrical signal based on a control instruction of external terminal equipment, the generated electrical signal is sent to a standard optical module connected to an optical module socket through a sending end, the connected standard optical module converts the electrical signal into an optical signal, the standard optical module sends the optical signal to an optical module to be tested through an optical fiber, the optical signal received by the optical module to be tested is converted into the electrical signal by the optical module to be tested, the electrical signal is sent back to the signal generator on the light source board through an electrical signal chip selector, the terminal equipment can obtain the electrical signal sent by the signal generator on the light source board and information of the received electrical signal, and the error rate of the corresponding optical module is judged according to the electrical signals before and after the signal generator, namely the obtained error code information, so that the performance parameter testing of an eye diagram of the sending end of the optical module is completed. Meanwhile, the terminal equipment can control the electric signal chip selector to selectively conduct any one of the plurality of test channels through the communication processor and the microprocessor, so that the optical module to be tested in the test channel which is conducted selectively is tested, the error rate test of the plurality of optical modules is completed in sequence, and the multi-channel test is realized. The terminal equipment can also compare the read parameters with indexes configured by the database, and judge whether the optical module parameters are normal.

According to the technical scheme, the error rate test of the optical module to be tested is realized by arranging the terminal equipment, the test board and the light source board, the error rate test performed by the method is simple to operate, high in test efficiency, high in result accuracy and high in equipment integration degree, and damage caused by misoperation can be avoided. The invention also realizes the multi-channel test of the optical module to be tested, improves the efficiency of the multi-channel optical module test, can increase the single-day productivity of staff, and has remarkable effect on the simplification of stations.

The invention also provides an optical module testing system, which comprises:

a terminal device;

an oscilloscope;

a multi-path optical switch;

the multi-path optical switch is provided with a main output end and a plurality of input ends, the main output end of the multi-path optical switch is connected with an optical input interface of the oscilloscope, the input end of each multi-path optical switch is connected with an optical signal transmitting end of an optical module to be tested, which is connected to the test board, and the multi-path optical switch is used for controlling the main input end to be communicated with the corresponding input end;

an optical input interface of the oscilloscope is connected with the total output end of the multi-path optical switch, an electrical input interface of the oscilloscope is connected with an electrical output interface of the test board, and a clock signal input interface of the oscilloscope is connected with a clock interface of the test board;

in the third test mode, the terminal device controls a signal generator on the light source board to generate an electrical signal, so that a standard optical module connected to the light source board converts the electrical signal into an optical signal and outputs an optical module to be tested, and the optical module to be tested is driven to convert the optical signal into the electrical signal and output the electrical signal;

and the terminal equipment is used for determining the error rate of the optical module to be tested according to the electric signal generated by the signal generator on the light source board and the received electric signal.

In this embodiment, the optical module testing system includes a terminal device, a multi-channel optical switch, an oscilloscope, a testing board and a light source board, where the testing board and the light source board are both the multi-channel optical module evaluation board, and a specific structure of the multi-channel optical module evaluation board refers to the above embodiments.

In this embodiment, there are three test modes, which are a first test mode, a second test mode and a third test mode, respectively, and the three test modes correspond to three performance parameters of the optical module, i.e., an optical eye diagram, an electrical eye diagram and an error rate, respectively.

Specifically, in a first test mode, a signal generator on a light source board generates a corresponding electrical signal based on a control instruction of an external terminal device, and sends the generated electrical signal to a standard optical module connected to an optical module socket through a transmitting end, so that the connected standard optical module converts the electrical signal into an optical signal, the standard optical module sends the optical signal to an optical module to be tested through an optical fiber, the optical signal received by the optical module to be tested is converted into the electrical signal, the electrical signal is output to an electrical input interface of an oscilloscope through an electrical signal chip selector, and the oscilloscope generates corresponding electric eye pattern information when receiving the electrical signal, thereby completing a performance parameter test of an eye pattern transmitted by the optical module. Meanwhile, the terminal equipment can control the electric signal chip selector to selectively conduct any one of the plurality of test channels through the communication processor and the microprocessor, so that the optical modules to be tested in the test channels which are conducted selectively are tested, the electric eye pattern test of the optical modules is completed in sequence, and the multi-channel test is realized.

In a second test mode, a signal generator on the light source board generates a corresponding electrical signal based on a control instruction of external terminal equipment, and sends the generated electrical signal to a standard optical module connected to an optical module socket through a transmitting end, so that the connected standard optical module converts the electrical signal into an optical signal, the standard optical module sends the optical signal to an optical module to be tested through an optical fiber, the optical signal received by the optical module to be tested is converted into the electrical signal, the electrical signal is output to an electrical input interface of the oscilloscope through an electrical signal chip selector, and the oscilloscope generates corresponding electric eye pattern information when receiving the electrical signal, thereby completing the performance parameter test of an eye pattern at the transmitting end of the optical module. Meanwhile, the terminal equipment can control the electric signal chip selector to selectively conduct any one of the plurality of test channels through the communication processor and the microprocessor, so that the optical modules to be tested in the test channels which are conducted selectively are tested, the electric eye pattern test of the optical modules is completed in sequence, and the multi-channel test is realized.

In a third test mode, a signal generator on the light source board generates a corresponding electrical signal based on a control instruction of external terminal equipment, the generated electrical signal is sent to a standard optical module connected to an optical module socket through a sending end, the connected standard optical module converts the electrical signal into an optical signal, the standard optical module sends the optical signal to an optical module to be tested through an optical fiber, the optical signal received by the optical module to be tested is converted into the electrical signal by the optical module to be tested, the electrical signal is sent back to the signal generator on the light source board through an electrical signal chip selector, the terminal equipment can obtain the electrical signal sent by the signal generator on the light source board and the information of the received electrical signal, and the error rate of the corresponding optical module is judged according to the electrical signals before and after the signal generator, namely the obtained error code information, so that the performance parameter test of an eye diagram of the sending end of the optical module is completed. Meanwhile, the terminal equipment can control the electric signal chip selector to selectively conduct any one of the plurality of test channels through the communication processor and the microprocessor, so that the optical module to be tested in the test channel which is conducted selectively is tested, the error rate of the plurality of optical modules is sequentially finished, and multi-channel testing is achieved.

In addition, the terminal equipment can also compare the read parameters with indexes configured by a database to judge whether the parameters of the optical module are normal, and further, the terminal equipment can also simultaneously carry out any two or three of the three test modes to realize multi-thread and multi-channel optical module test, so that the efficiency of the multi-channel optical module test is improved, and the single-day capacity is increased. According to the optical module testing device, the terminal equipment, the multi-path optical switch, the oscilloscope, the testing board and the light source board are arranged, so that the multi-thread, multi-channel and multi-performance optical module testing is realized, the performance testing of the optical module can be realized only by two boards, the time for replacing the equipment is greatly saved, and a tester does not need to use a copper axis external signal source when testing the optical module, so that the testing result error caused by the internal abrasion of the copper axis is effectively avoided, and the testing station is cleaner and more simplified.

Referring to fig. 1 and fig. 2, in an embodiment, the optical module testing system further includes:

In this embodiment, the optical module testing system further includes a plurality of adjustable attenuators, the adjustable attenuators can adjust the intensity of an optical signal output by the standard optical module to the optical module to be tested, the adjustment range of the adjustable attenuators can be selected to be 0-50dB linearly adjustable, and when testing is performed, the adjustable attenuator between the optical module to be tested and the standard optical module can be set to be fixed by 10dB first, so as to prevent the optical module to be tested from being overloaded, which causes damage to a terminating device.

In this embodiment, an optical power meter is further configured to detect input optical power and output optical power of the optical module to be tested, so that the input optical power of the optical module to be tested reaches a preset value, and therefore the terminal device can determine whether parameters of the optical module are normal according to the output optical power obtained by the optical power meter. A tester can synchronously read the input optical power of the optical module to be tested by gradually adjusting the attenuation value of the adjustable attenuator group, and when the input optical power is equal to a preset value, the input optical power of the optical module to be tested is adjusted. When the output optical power of the photometric module is measured, the optical power meter can be connected with the total output end of the multi-path optical switch, so that the output optical power of a plurality of optical modules to be tested can be measured, at this time, the optical path loss of the multi-path optical switch needs to be tested in advance, and then the output optical power of the multi-path optical switch is measured by using the optical power meter, wherein at this time, the sum of the output optical power of the multi-path optical switch and the optical path loss of the multi-path optical switch is the output optical power of the corresponding optical module to be tested.

In this embodiment, the spectrometer is used to obtain output spectrum data of the optical module to be measured, and similar to the optical power meter, the spectrometer may be connected to the total output end of the multi-path optical switch, so that output spectrum data of a plurality of optical modules to be measured may be measured.

According to the invention, the input optical power of the optical module to be tested can be adjusted to the preset value by arranging the adjustable attenuator and the optical power meter, so that the terminal equipment can judge whether the performance parameters of the optical module to be tested are normal or not according to the input optical power of the optical module to be tested, and the accuracy of performance judgment after the optical module is tested is improved. Meanwhile, the optical power meter is arranged for detecting the output optical power of the optical module, and the spectrometer is arranged for detecting the output spectrum data of the optical module, so that the optical module testing items are increased, and the comprehensiveness and the integration degree of the optical module testing system are improved.

Optionally, the terminal device defines a test flow through the evaluation software, and the evaluation software data stream controls and reads data of the optical module chip connected to the evaluation test board through the USB port, so as to automatically complete the test flow of the optical module product to be tested, in the above embodiments, the terminal device is connected to all the user devices, and all the user devices include: serial communication equipment and USB equipment, serial communication equipment contains: the system comprises a multipath optical switch and a plurality of GPIB interfaces connected with an oscilloscope and a spectrometer; the USB device includes: the system comprises a test board, a light source board and an adjustable attenuator, wherein a PC test control host computer establishes GPIB communication connection with a spectrometer and an oscilloscope by sending a GPIB instruction; the evaluation software is used for leading out a rule of a GPIB command format meeting SCPI standards through a GPIB interface and in combination with a data structure of the GPIB command, generating a GPIB command tree, judging whether the format of the transmitted GPIB command is correct or not, whether the transmission is successful or not and whether the data reception is successful or not based on the characteristics of the GPIB command tree, and analyzing the GPIB command to obtain a GPIB command query result if the GPIB command is successful.

The invention further provides an optical module testing system, which includes the multi-channel optical module evaluation board, and the specific structure of the multi-channel optical module evaluation board refers to the above embodiments.

The above description is only a preferred embodiment of the present invention, and is not intended to limit the scope of the present invention, and all modifications and equivalents of the present invention, which are made by the contents of the present specification and the accompanying drawings, or directly/indirectly applied to other related technical fields, are included in the scope of the present invention.

Claims

1. A multi-channel light module evaluation board, comprising:

the electric output interface is used for connecting an oscilloscope;

2. The multi-channel optical module evaluation board of claim 1, wherein the signal generator further has a number of receive ends, the number of receive ends of the signal generator being the same as the number of transmit ends of the signal generator;

3. The multi-channel optical module evaluation board of claim 2, further comprising an SMA connector having a plurality of connection terminals, wherein the connection terminals are respectively connected to the receiving terminals of the signal generators and the second output terminals of the electrical signal chip selectors in a one-to-one correspondence;

4. The multi-channel light module evaluation board of claim 1, wherein the multi-channel light module evaluation board further comprises:

the communication interface is used for accessing terminal equipment;

5. The multi-channel light module evaluation board of claim 4, wherein the multi-channel light module evaluation board further comprises:

6. An optical module testing system, comprising:

a terminal device;

an oscilloscope;

a multi-path optical switch; and the number of the first and second groups,

a test board, the test board being the multi-channel optical module evaluation board as claimed in any one of claims 1 to 5, wherein the optical module socket on the test board is used for accessing an optical module to be tested;

7. A light module testing system, comprising:

a terminal device;

an oscilloscope;

a test board, the test board is the multi-channel optical module evaluation board as claimed in any one of claims 1 to 5, and an optical module socket on the test board is used for accessing an optical module to be tested; and the number of the first and second groups,

a light source board, the light source board being the multi-channel optical module evaluation board of any one of claims 1-5, optical module sockets on the light source board for accessing standard optical modules;

8. An optical module testing system, comprising:

a terminal device;

9. A light module testing system, comprising:

a terminal device;

an oscilloscope;

a multi-path optical switch;

in the first test mode, the terminal device controls a signal generator on the test board to generate an electrical signal, so that an optical module to be tested, which is accessed on the test board, converts the electrical signal into an optical signal and outputs the optical signal;

10. The light module testing system of any of claims 7-9, further comprising:

the input end of each adjustable attenuator is connected with the transmitting end of a standard optical module accessed on one light source board, the output end of each adjustable attenuator is connected with the receiving end of an optical module to be tested accessed on one test board, each adjustable attenuator is also in communication connection with the terminal equipment, and the adjustable attenuators are used for adjusting the intensity of optical signals output to the optical module to be tested by the standard optical module when receiving control instructions;