CN117375710A - Performance test method of receiving optical device - Google Patents

Performance test method of receiving optical device Download PDF

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Publication number
CN117375710A
CN117375710A CN202311667249.3A CN202311667249A CN117375710A CN 117375710 A CN117375710 A CN 117375710A CN 202311667249 A CN202311667249 A CN 202311667249A CN 117375710 A CN117375710 A CN 117375710A
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test
light source
lambda
qualified
under
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CN117375710B (en
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聂岸飞
许远忠
张强
王东
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Chengdu Eugenlight Technologies Co ltd
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Chengdu Eugenlight Technologies Co ltd
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    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04B—TRANSMISSION
    • H04B10/00—Transmission systems employing electromagnetic waves other than radio-waves, e.g. infrared, visible or ultraviolet light, or employing corpuscular radiation, e.g. quantum communication
    • H04B10/07—Arrangements for monitoring or testing transmission systems; Arrangements for fault measurement of transmission systems
    • H04B10/073—Arrangements for monitoring or testing transmission systems; Arrangements for fault measurement of transmission systems using an out-of-service signal
    • H04B10/0731—Testing or characterisation of optical devices, e.g. amplifiers

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  • Physics & Mathematics (AREA)
  • Electromagnetism (AREA)
  • Engineering & Computer Science (AREA)
  • Computer Networks & Wireless Communication (AREA)
  • Signal Processing (AREA)
  • Optical Communication System (AREA)

Abstract

The invention relates to the technical field of optical fiber communication, in particular to a performance test method of a receiving optical device, wherein the receiving optical device is a single-channel receiving optical device, and the performance test method comprises the following steps: s1, setting the wavelengths of the tested light receiving device under ideal conditions, long-wave limit conditions and short-wave limit conditions to be lambda and lambda respectively H 、λ L Wherein lambda is H =λ+△λ，λ L The value of [ lambda ] - [ delta ] - [ lambda ] is determined by a standard protocol of the tested receiving optical device, and the wavelength temperature drift coefficient is alpha; s2, performing performance test on the tested light receiving device under ideal conditions, long-wave limit conditions and short-wave limit conditions respectively, ending the test if the test is not qualified under any condition, and recording the TEC temperature corresponding to the qualified light source quality under each condition if the test is qualified under all conditions. The invention can realize performance test under the limit condition, so that the qualified product can meet the use requirement of users.

Description

Performance test method of receiving optical device
Technical Field
The invention relates to the technical field of optical fiber communication, in particular to a performance test method of a receiving optical device.
Background
The optical device is subjected to performance test before delivery, and only products which are qualified in test can be delivered. The optical signals provided by the existing test system are all subjected to performance test and evaluation on the multichannel optical receiving device under ideal conditions, the difference between the ideal conditions and real conditions is ignored, whether the performance of the optical device meets the requirements in the non-ideal environment of practical application cannot be really evaluated, and when the conditions used by a customer are far from the ideal conditions and are within the standard range of a protocol, the conditions that the performance of the optical device is unqualified and the use of the customer is influenced cannot be avoided.
Disclosure of Invention
The invention aims to provide a performance test method for a light receiving device, so that the qualified product is tested by the method, and the requirements of users can be met in actual use.
In order to achieve the above object, the embodiment of the present invention provides the following technical solutions:
a performance test method of a receiving optical device, wherein the receiving optical device is a single-channel receiving optical device, comprises the following steps:
s1, setting the wavelengths of the tested light receiving device under ideal conditions, long-wave limit conditions and short-wave limit conditions to be lambda and lambda respectively H 、λ L Wherein lambda is H =λ+△λ，λ L The value of [ lambda ] - [ delta ] - [ lambda ] is determined by a standard protocol of the tested receiving optical device, and the wavelength temperature drift coefficient is alpha;
s2, performing performance test on the tested light receiving device under ideal conditions, long-wave limit conditions and short-wave limit conditions respectively, ending the test if the test is not qualified under any condition, and recording the TEC temperature corresponding to the qualified light source quality under each condition if the test is qualified under all conditions.
S2, under ideal conditions, performing performance test on the tested receiving optical device, wherein the performance test comprises the following steps:
s2-1, inputting an initial TEC temperature T to a light source control system 0 And modulating the current I MOD Turning on a channel output light source of the light module;
s2-2, reading the current light source wavelength lambda from the light source measurement feedback system 0 Comparing the light source quality with lambda, if the absolute value of the difference value between the two is smaller than or equal to a set value, indicating that the light source quality is qualified, entering S2-4, otherwise entering S2-3;
s2-3, represented by the formula DeltaT= (lambda-lambda) 0 ) Calculating a temperature compensation value according to alpha, and re-writing a new TEC temperature T into the light source control system i =T i-1 Returning to S2-2, wherein i is an integer greater than or equal to 1, and represents the temperature compensation times;
s2-4, switching the optical switch to an attenuator end, simultaneously carrying out optical power attenuation according to the test optical power requirement, starting a performance test system of the receiving device to carry out performance test, ending the test if the test is not qualified, and continuing the test under the long-wave limit condition or the short-wave limit condition if the test is qualified.
S2, under the limit condition of long waves, performing performance test on the tested receiving optical device, wherein the performance test comprises the following steps:
s2-5 according to (lambda) H -λ 0 ) Calculating TEC temperature compensation value delta T by alpha H Writing TEC temperature T under long-wave limit condition into light source control system H =T 0 +△T H Modulated current holding I MOD Unchanged;
s2-6, reading the current light source wavelength lambda from the light source measurement feedback system H ′ And is connected with lambda H Comparing, if the absolute value of the difference value between the two is smaller than or equal to the set value, the light source quality is qualified, and then S2-8 is carried out, otherwise S2-7 is carried out;
s2-7, represented by the formula DeltaT H ′ =（λ H -λ H ′ ) Calculating a temperature compensation value according to alpha, and re-writing a new TEC temperature T into the light source control system Hj ′ =T H（j-1） +△T H ′ Returning S2-6,j to be an integer greater than or equal to 1, and representing the temperature compensation times;
s2-8, switching the optical switch to an attenuator end, simultaneously carrying out optical power attenuation according to the test optical power requirement, starting a performance test system of the receiving device to carry out performance test, ending the test if the test is unqualified, and continuing the test under the short wave limit condition if the test is qualified.
S2, under the shortwave limit condition, performing performance test on the tested receiving optical device, wherein the performance test comprises the following steps:
s2-9 according to (lambda) L -λ 0 ) Calculating TEC temperature compensation value delta T by alpha L Writing TEC temperature T under short wave limit condition into light source control system L =T 0 +△T L Modulated current holding I MOD Unchanged;
s2-10, reading the current light source wavelength lambda from the light source measurement feedback system L ′ And is connected with lambda L Comparing, if the absolute value of the difference value between the two is smaller than or equal to the set value, the light source quality is qualified, and then S2-12 is entered, otherwise S2-11 is entered;
s2-11, represented by the formula DeltaT L ′ =（λ L -λ L ′ ) Calculating a temperature compensation value according to alpha, and re-writing a new TEC temperature T into the light source control system Lk ′ =T L（k-1） +△T L ′ Returning to S2-10, wherein k is an integer greater than or equal to 1, and represents the temperature compensation times;
s2-12, switching the optical switch to an attenuator end, simultaneously carrying out optical power attenuation according to the test optical power requirement, starting a receiving device performance test system to carry out performance test, ending the test if the test is unqualified, and indicating that the performance of the tested optical device is qualified if the test is qualified.
A performance test method of a receiving optical device, wherein the receiving optical device is a multichannel receiving optical device, comprises the following steps:
s10, setting the wavelength of each channel of the tested light receiving device to be lambda under ideal conditions, long-wave limit conditions and short-wave limit conditions respectively n 、λ Hn 、λ Ln Wherein lambda is Hn =λ n +△λ，λ Ln =λ n The delta lambda value is determined by a standard protocol of the tested receiving optical device, and the wavelength temperature drift coefficient is alpha; lambda (lambda) n N is an integer greater than 1, which is the ideal center wavelength of the nth channel;
s20, performing performance test on the tested receiving optical device under ideal conditions, long-wave limit conditions and short-wave limit conditions respectively aiming at any one channel of the tested receiving optical device, ending the test if the test is not qualified under any condition, and recording the TEC temperature corresponding to the qualified light source quality under each condition if the test is qualified under all conditions;
s30, testing all channels of the tested optical device in sequence according to the same processing mode of S20, ending the test if any channel is not qualified, and entering S40 if all channels are qualified;
and S40, performing performance test on all channels of the tested light receiving device under ideal conditions, long-wave limit conditions and short-wave limit conditions respectively, ending the test if the test is failed, and indicating that the performance of the tested light receiving device is qualified if the test is passed.
In S20, under ideal conditions, performance testing is performed on the nth channel of the tested receiving optical device, including:
s20-1, inputting an initial TEC temperature T to a light source control system 0 And modulating the current I MOD Turning on a channel output light source of the light module;
s20-2, reading the current light source wavelength lambda from the light source measurement feedback system 0 And is connected with lambda n Comparing, if the absolute value of the difference value between the two is smaller than or equal to the set value, the quality of the light source is qualified, and entering S20-4, otherwise entering S20-3;
s20-3, represented by the formula DeltaT= (lambda) n -λ 0 ) Calculating a temperature compensation value according to alpha, and re-writing a new TEC temperature T into the light source control system i =T i-1 Returning to S20-2, wherein i is an integer greater than or equal to 1, and represents the temperature compensation times;
s20-4, switching the optical switch to an attenuator end, simultaneously carrying out optical power attenuation according to the test optical power requirement, starting a performance test system of the receiving device to carry out performance test, ending the test if the test is not qualified, and continuing the test under the long-wave limit condition or the short-wave limit condition if the test is qualified.
In S20, under the condition of the long wave limit, performance test is performed on the nth channel of the tested receiving optical device, including:
s20-5 according to (lambda) Hn -λ 0 ) Calculating TEC temperature compensation value delta T by alpha H Writing TEC temperature T under long-wave limit condition into light source control system H =T 0 +△T H Modulated current holding I MOD Unchanged;
s20-6, reading the current light source wavelength lambda from the light source measurement feedback system Hn ′ And is connected with lambda Hn Comparing, if the absolute value of the difference value between the two is smaller than or equal to the set value, the light source quality is qualified, and then S20-8 is carried out, otherwise S20-7 is carried out;
s20-7, represented by the formula DeltaT H ′ =（λ Hn -λ Hn ′ ) Calculating a temperature compensation value according to alpha, and re-writing a new TEC temperature T into the light source control system Hj ′ =T H（j-1） +△T H ′ Returning to S20-6,j to be an integer greater than or equal to 1, and representing the temperature compensation times;
s20-8, switching the optical switch to an attenuator end, simultaneously carrying out optical power attenuation according to the test optical power requirement, starting a performance test system of the receiving device to carry out performance test, ending the test if the test is unqualified, and continuing the test under the short wave limit condition if the test is qualified.
In S20, under the short-wave limit condition, performance testing is performed on the nth channel of the tested receiving optical device, including:
s20-9 according to (lambda) Ln -λ 0 ) Calculating TEC temperature compensation value delta T by alpha L Writing TEC temperature T under short wave limit condition into light source control system L =T 0 +△T L Modulated current holding I MOD Unchanged;
s20-10, reading the current light source wavelength lambda from the light source measurement feedback system Ln ′ And is connected with lambda Ln Comparing, if the absolute value of the difference value between the two is smaller than or equal to the set value, the light source quality is qualified, and then S20-12 is carried out, otherwise S20-11 is carried out;
s20-11, represented by the formula DeltaT L ′ =（λ Ln -λ Ln ′ ) Calculating a temperature compensation value according to alpha, and re-writing a new TEC temperature T into the light source control system Lk ′ =T L（k-1） +△T L ′ And returning to S20-10, wherein k is 1 or moreA number representing the number of temperature compensations;
s20-12, switching the optical switch to an attenuator end, simultaneously attenuating the optical power according to the test optical power requirement, starting a performance test system of the receiving device to perform performance test, ending the test if the test is not qualified, and recording the corresponding TEC temperature T, T when the quality of the light source is qualified if the test is qualified H 、T L 。
The step S40 specifically includes:
s40-1, writing TEC temperatures T corresponding to each channel recorded when a single channel is qualified under ideal conditions into N optical modules in a light source control system 1 、T 2 ……T N And modulating the current I MOD The method comprises the steps of carrying out a first treatment on the surface of the N is the number of channels of the received optical device;
s40-2, respectively turning on the light sources of one channel of the N light modules;
s40-3, respectively confirming the light source wavelength lambda of each channel read from the light source quality measurement feedback system one by one n ′ And lambda is n If the absolute value of the difference value is smaller than or equal to the set value, the light source quality is qualified, S40-5 is carried out, otherwise S40-4 is carried out;
s40-4 according to (lambda) n ′ -λ n) Calculating a temperature compensation value by alpha, re-writing the TEC temperature after temperature compensation into a light source control system, and returning to S40-3;
s40-5, switching the optical switch to an attenuator end, simultaneously carrying out optical power attenuation according to test requirements, starting a performance test system of a receiving device, completing the simultaneous working performance test of N channels, entering S40-6 if the test is qualified, and ending the test if the test is unqualified;
s40-6, writing TEC temperatures T corresponding to each channel recorded when the single channel is qualified under the long-wave limit condition into N optical modules in the light source control system respectively H1 、T H2 ……T HN ；
S40-7, respectively confirming the light source wavelength lambda of each channel read from the light source quality measurement feedback system one by one H ′ And lambda is Hn Whether the absolute value of the difference is smaller than or equal to the set value, if so, the light is representedS40-9 is carried out after the source quality is qualified, and S40-8 is carried out otherwise;
s40-8 according to (lambda) Hn ′ -λ Hn) Calculating a temperature compensation value by alpha, re-writing the TEC temperature after temperature compensation into a light source control system, and returning to S40-7;
s40-9, switching an optical switch to an attenuator end, simultaneously carrying out optical power attenuation according to test requirements, starting a performance test system of a receiving device, completing simultaneous working performance test of N channels under a long-wave limit condition, entering S40-10 if the test is qualified, and ending the test if the test is unqualified;
s40-10, writing TEC temperatures T corresponding to each channel recorded when a single channel is qualified under a short-wave limit condition into N optical modules in a light source control system L1 、T L2 ……T LN ；
S40-11, respectively confirming the light source wavelength lambda of each channel read from the light source quality measurement feedback system L ′ And lambda is Ln If the absolute value of the difference value is smaller than or equal to the set value, the light source quality is qualified, S40-13 is carried out, otherwise S40-12 is carried out;
s40-12 according to (lambda) Ln ′ -λ Ln) Calculating a temperature compensation value by alpha, re-writing the TEC temperature after temperature compensation into a light source control system, and returning to S40-11;
s40-13, switching the optical switch to an attenuator end, simultaneously carrying out optical power attenuation according to test requirements, starting a performance test system of the receiving device, completing simultaneous working performance test of N channels under low-temperature limit working conditions, wherein the test qualification indicates that the performance of the multichannel receiving optical device is qualified, and ending the test when the test is failed.
Compared with the prior art, the invention has the following beneficial effects:
and accurately evaluating whether the product performance meets the requirements under ideal conditions, long-wave limit conditions and short-wave limit conditions when each channel of the single-channel receiving optical device and each channel of the multi-channel receiving optical device independently work.
And accurately evaluating whether the product performance meets the requirements under ideal conditions, long-wave limit conditions and short-wave limit conditions when all channels of the multichannel light receiving device work simultaneously.
The test can ensure that the condition can work normally when the qualified product tested by the test system is used by a client and fluctuates within the protocol range, and the use abnormality of the whole light receiving system when the light source fluctuates is avoided.
Drawings
In order to more clearly illustrate the technical solutions of the embodiments of the present invention, the drawings that are needed in the embodiments will be briefly described below, it being understood that the following drawings only illustrate some embodiments of the present invention and therefore should not be considered as limiting the scope, and other related drawings may be obtained according to these drawings without inventive effort for a person skilled in the art.
Fig. 1 is a block diagram of a performance testing system for a receiving optical device.
Fig. 2 is a flow chart of a performance test method (without wavelength settings) suitable for single channel receiving optics.
Fig. 3 is a flow chart of a performance testing method suitable for a multichannel receiving optical device.
FIG. 4 is a flow chart of a process for simultaneous testing of 4 channels in an embodiment.
Detailed Description
The following description of the embodiments of the present invention will be made clearly and completely with reference to the accompanying drawings, in which it is apparent that the embodiments described are only some embodiments of the present invention, but not all embodiments. The components of the embodiments of the present invention generally described and illustrated in the figures herein may be arranged and designed in a wide variety of different configurations. Thus, the following detailed description of the embodiments of the invention, as presented in the figures, is not intended to limit the scope of the invention, as claimed, but is merely representative of selected embodiments of the invention. All other embodiments, which can be made by a person skilled in the art without making any inventive effort, are intended to be within the scope of the present invention.
In introduction toBefore the performance test method of the receiving optical device, the invention introduces the required test system. As shown in FIG. 1, the test system mainly comprises an industrial control processor, a multi-path light source control system, a light source quality measurement feedback system, a receiving device performance test system, an optical switch, an optical attenuator and a product test board, wherein the light source control system mainly comprises N (determined by the number of channels of the multi-Channel light device to be tested, such as 1,2,4,8, etc.) independent light modules respectively denoted as Module1, module2, module3 … … Module N, each light Module simultaneously has 1 to N lasers with different wavelengths respectively denoted as Channel1, channel2, channel3 … … Channel N, and the temperature and modulation current I of each light Module TEC are adjusted MOD And obtaining the optical power and wavelength parameters required by the corresponding channel light source.
The test method provided by the invention is suitable for a single-channel receiving optical device and a multi-channel receiving optical device, and the method is described by taking single-channel and four-channel receiving optical devices as examples.
The embodiment provides a performance test method of a receiving optical device, wherein the receiving optical device is a single-channel receiving optical device, and the performance test method comprises the following steps:
s1, setting the wavelengths of the tested light receiving device under ideal conditions, long-wave limit conditions and short-wave limit conditions to be lambda and lambda respectively H 、λ L Wherein lambda is H =λ+△λ，λ L The value of [ lambda ] - [ delta ] - [ lambda ] is determined by a standard protocol of the tested receiving optical device, and the wavelength temperature drift coefficient is alpha;
s1, performing performance test on the tested light receiving device under ideal conditions, long-wave limit conditions and short-wave limit conditions respectively, ending the test if the test is not qualified under any condition, and recording the TEC temperature corresponding to the qualified light source quality under each condition if the test is qualified under all conditions.
Referring to fig. 2, the step S2 includes the following steps:
s2-1, inputting an initial TEC temperature T to a light source control system 0 And modulating the current I MOD And opening a first Channel1 of the optical Module1, and outputting a light source.
S2-2, controlling the optical switch to be switched to the light source measurement feedback system, and reading the current light source parameter, namely wavelength lambda, from the light source measurement feedback system by the industrial control processor 0And optical power P 0 . Comparison lambda 0 The difference from lambda, when lambda 0 When lambda is less than or equal to 0.01 (mainly determined by TEC precision, the current TEC precision can reach 0.1 ℃, and the temperature coefficient is generally 0.1 nm/DEG C, so that the temperature coefficient can reach 0.01), the quality of the light source is qualified, S2-4 is carried out, if lambda is the 0 -λ|>And if 0.01, the quality of the light source is unqualified, and S2-3 is performed.
S2-3, calculating a TEC temperature compensation value according to a formula, wherein DeltaT= (lambda-lambda) 0 ) Calculating new TEC temperature T 1, T 1 =T 0 Re-writing a new TEC temperature T to the light source control system + Δt 1 And returns to S2-2.
By cyclically performing S2-2 and S2-3 until |lambda 0 And the lambda is less than or equal to 0.01, so that the quality of the light source is qualified, and inaccurate performance test results of the optical device caused by unqualified quality of the light source are avoided. The temperature of the new write per cycle can be expressed as T i =T i-1 The + [ delta ] T, i is an integer of 1 or more, and represents the number of temperature compensation or the number of cycles.
It will be readily appreciated here that each time the temperature is rewritten to the light source control system, the light source measurement feedback system will obtain a new lambda value, which is collectively denoted as lambda for simplicity of description 0 Thus, for the case of temperature compensation, λ is calculated for each comparison in S2-2 and each calculation of the temperature compensation value in S2-3 0 That is, a new wavelength value is read after the compensation temperature is added.
S2-4, switching the optical switch to the attenuator end, simultaneously carrying out optical power attenuation according to the test optical power requirement, and starting the performance test system of the receiving device to carry out performance test. And (3) judging according to the performance test result, if the performance test result is qualified, performing S2-5, and if the performance test result is unqualified, ending the test.
S2-5 according to (lambda) H -λ 0 ) Calculating TEC temperature compensation value delta T of long-wave limit condition H Writing TEC temperature T under long-wave limit condition into light source control system H =T 0 +△T H Modulated current holding I MOD Is unchanged.
Here, λ used in this step 0 The wavelength corresponding to the light source requirement, namely the wavelength with qualified light source quality after the latest temperature compensation is met, so that the frequency of repeated compensation can be reduced.
S2-6, controlling the optical switch to be switched to the light source measurement feedback system, and reading the current light source parameter, namely wavelength lambda, from the light source measurement feedback system by the industrial control processor H ′ And optical power P 0 ′ . Comparison lambda H ′ And lambda is H The difference between, when% H ′ -λ H When the I is less than or equal to 0.01, the quality of the light source is qualified, the light source enters S2-8, and if the I lambda is H ′ -λ H |>And if 0.01, the quality of the light source is unqualified, and S2-7 is performed.
S2-7, calculating a TEC temperature compensation value and delta T according to a formula H ′ =（λ H -λ H ′ ) Calculating new TEC temperature T H ′ , T H ′ =T H +△T H ′ Re-writing a new TEC temperature T to the light source control system H ′ And returns to S2-6. The temperature of the new write per cycle can be expressed as T Hj ′ =T H（j-1） +△T H ′ J is an integer of 1 or more and represents the number of temperature compensation times.
By cyclically executing S2-6 and S2-7 until |lambda H ′ -λ H And the end of the process is less than or equal to 0.01, so that the quality of the light source is qualified, and inaccurate performance test results of the optical device caused by unqualified quality of the light source are avoided.
It will be readily appreciated here that each time the temperature is rewritten to the light source control system, the light source measurement feedback system will obtain a new lambda value, which is collectively denoted as lambda for simplicity of description H ′ Thus, for the case of temperature compensation, each comparison in S2-6 is made toAnd lambda for each calculation of the temperature compensation value in S2-7 H ′ That is, a new wavelength value is read after the compensation temperature is added.
S2-8, switching the optical switch to an attenuator end, simultaneously carrying out optical power attenuation according to test requirements, starting a performance test system of the receiving device to carry out performance test, judging according to performance test results, carrying out S2-9 if the test performance results are qualified, and ending the test if the test performance results are unqualified.
S2-9, according to DeltaT L =(λ L -λ 0 ) Calculating TEC temperature compensation value delta T of short wave limit condition by alpha L Writing TEC temperature T under short wave limit condition into light source control system L =T 0 -△T L 。
Here, λ used in this step 0 The wavelength lambda corresponding to the requirements of the light source is met, namely the wavelength with qualified light source quality after the latest temperature compensation.
S2-10, controlling the optical switch to be switched to a light source measurement feedback system, and reading current light source parameters, namely wavelength lambda, from the light source measurement feedback system by the industrial control processor L ′ And optical power P 0 ′′ . Comparison lambda L ′ And lambda is L The difference between, when% L ′ -λ L When the I is less than or equal to 0.01, the light source quality is qualified, the light source enters S2-12, if I lambda is L ′ -λ L |>And if 0.01, the quality of the light source is unqualified, and S2-11 is carried out.
S2-11, calculating a TEC temperature compensation value and delta T according to a formula L ′ =（λ L -λ L ′ ) Calculating new TEC temperature T L ′ , T L ′ =T L +△T L ′ Re-writing a new TEC temperature T to the light source control system L ′ And returns to S2-10. The temperature of the new write per cycle can be expressed as T Lk ′ =T L（k-1） +△T L ′ K is an integer of 1 or more and represents the number of temperature compensation times.
By cyclic executionLines S2-10 and S2-11 up to |lambda L ′ -λ L And the end of the process is less than or equal to 0.01, so that the quality of the light source is qualified, and inaccurate performance test results of the optical device caused by unqualified quality of the light source are avoided.
It will be readily appreciated here that each time the temperature is rewritten to the light source control system, the light source measurement feedback system will obtain a new lambda value, which is collectively denoted as lambda for simplicity of description L ′ Thus, for the case of temperature compensation, λ is calculated for each comparison in S2-10 and each calculation of the temperature compensation value in S2-11 L ′ That is, a new wavelength value is read after the compensation temperature is added.
S2-12, switching the optical switch to an attenuator end, simultaneously carrying out optical power attenuation according to test requirements, starting a performance test system of the receiving device to carry out performance test, judging according to performance test results, if the test results are qualified, indicating that the current test channel of the receiving optical device is qualified, and recording the corresponding TEC temperature T, T when the quality of a light source is qualified by a test software system H 、T L And if the performance test of the receiving optical device is disqualified, ending the test.
S2-13, closing the TEC temperature and the modulation current input by the Module 1.
Referring to fig. 3, the performance testing method applicable to the multichannel light receiving device provided in the present embodiment includes the following steps:
s10, setting the wavelength of each channel of the tested light receiving device to be lambda under ideal conditions, long-wave limit conditions and short-wave limit conditions respectively n 、λ Hn 、λ Ln Wherein lambda is Hn =λ n +△λ，λ Ln =λ n The delta lambda value is determined by a standard protocol of the tested receiving optical device, and the wavelength temperature drift coefficient is alpha; lambda (lambda) n N is an integer greater than 1, which is the ideal center wavelength of the nth channel.
S20, performing performance test on the tested receiving optical device under ideal conditions, long-wave limit conditions and short-wave limit conditions respectively aiming at any one channel of the tested receiving optical device, ending the test if the test is not qualified under any condition, and recording the TEC temperature corresponding to the qualified light source quality under each condition if the test is qualified under all conditions.
And S30, testing all channels of the tested optical device in sequence according to the same processing mode of S20, ending the test if any channel is not qualified, and entering S40 if all channels are qualified.
And S40, performing performance test on all channels of the tested light receiving device under ideal conditions, long-wave limit conditions and short-wave limit conditions respectively, ending the test if the test is failed, and indicating that the performance of the tested light receiving device is qualified if the test is passed.
Taking a four-channel receiving optical device as an example, S10 specifically sets a wavelength λ of each channel of the four-channel receiving optical device under test under ideal conditions to be λ respectively according to a protocol standard 1 、λ 2 、λ 3 、λ 4 Wavelength lambda under the limit of long wave Hn Wavelength lambda under short wave limit Ln Wherein lambda is Hn =λ n +△λ，λ Ln =λ n - Δλ, where n=1, 2,3,4.
In S20, the steps shown in fig. 2 are performed for each channel. That is, for the nth channel, the test flow is as follows:
s20-1, inputting an initial TEC temperature T to a light source control system 0 And modulating the current I MOD And opening a channel of the optical module to output the light source.
S20-2, reading the current light source wavelength lambda from the light source measurement feedback system 0 And is connected with lambda n And comparing, if the absolute value of the difference value between the two is smaller than or equal to a set value, the light source quality is qualified, and entering S20-4, otherwise entering S20-3.
S20-3, represented by the formula DeltaT= (lambda) n -λ 0 ) Calculating a temperature compensation value according to alpha, and re-writing a new TEC temperature T into the light source control system i =T i-1 And returning to S20-2, wherein i is an integer greater than or equal to 1, and represents the temperature compensation times.
S20-4, switching the optical switch to an attenuator end, simultaneously carrying out optical power attenuation according to the test optical power requirement, starting a performance test system of the receiving device to carry out performance test, ending the test if the test is unqualified, and entering a step S20-5 under the limit condition of long waves if the test is qualified.
S20-5 according to (lambda) Hn -λ 0 ) Calculating TEC temperature compensation value delta T by alpha H Writing TEC temperature T under long-wave limit condition into light source control system H =T 0 +△T H Modulated current holding I MOD Is unchanged.
S20-6, reading the current light source wavelength lambda from the light source measurement feedback system Hn ′ And is connected with lambda Hn And comparing, if the absolute value of the difference value between the two is smaller than or equal to a set value, the light source quality is qualified, and then the process goes to S20-8, otherwise, the process goes to S20-7.
S20-7, represented by the formula DeltaT H ′ =（λ Hn -λ Hn ′ ) Calculating a temperature compensation value according to alpha, and re-writing a new TEC temperature T into the light source control system Hj ′ =T H（j-1） +△T H ′ And returning to S20-6,j to be an integer greater than or equal to 1, wherein the number of temperature compensation times is represented.
S20-8, switching the optical switch to an attenuator end, simultaneously carrying out optical power attenuation according to the test optical power requirement, starting a performance test system of the receiving device to carry out performance test, ending the test if the test is not qualified, and continuing the test under the short wave limit condition if the test is qualified, namely entering the step S20-9.
S20-9 according to (lambda) Ln -λ 0 ) Calculating TEC temperature compensation value delta T by alpha L Writing TEC temperature T under short wave limit condition into light source control system L =T 0 +△T L Modulated current holding I MOD Is unchanged.
S20-10, reading the current light source wavelength lambda from the light source measurement feedback system Ln ′ And is connected with lambda Ln And comparing, if the absolute value of the difference value between the two is smaller than or equal to a set value, the light source quality is qualified, and then the process goes to S20-12, otherwise, the process goes to S20-11.
S20-11, represented by the formula DeltaT L ′ =（λ Ln -λ Ln ′ ) Calculating a temperature compensation value according to alpha, and re-writing a new TEC temperature T into the light source control system Lk ′ =T L（k-1） +△T L ′ And returning to S20-10, wherein k is an integer greater than or equal to 1, and represents the temperature compensation times.
S20-12, switching the optical switch to an attenuator end, simultaneously attenuating the optical power according to the test optical power requirement, starting a performance test system of the receiving device to perform performance test, ending the test if the test is not qualified, and recording the corresponding TEC temperature T, T when the quality of the light source is qualified if the test is qualified H 、T L 。
It is easy to understand that there is no requirement for the test sequence of the channels, as long as all channels are tested individually. In addition, aiming at the test of a single channel, the test is sequentially carried out under ideal conditions, long-wave limit conditions and short-wave limit conditions in the method, in fact, the tests under all conditions can be mutually independent, no sequential division of the execution sequence exists, the test failure under any condition is the product failure, the test is ended, and the product is calculated to be qualified only when the test is qualified under all conditions.
In the test of one channel of the receiving optical device, one of the channels of one optical module is used, but the channel of the receiving optical device is not limited to the specific channel of the optical module, and is not limited to the specific optical module.
In addition, for the four-channel light receiving device, in this embodiment, the test is performed by using 4 four-channel optical modules, and in practice, 4 single-channel optical modules may also be used.
And in the process of completing the performance test of all channels of the optical device, if one of the channel performance tests is failed, ending the test, and after all the channels are tested to be qualified, carrying out the multi-channel synchronous working test.
The test procedure of S40 is similar to that of S20, except that only one channel is tested in S20, and all channels are tested simultaneously in S40. Referring to fig. 4, specifically, S40 includes the following steps:
s40-1, writing T recorded when single channel is qualified into 4 optical modules in the light source control system respectively 1 、T 2 、T 3 、T 4 And modulating the current I MOD I.e. one optical module corresponds to one temperature, but the modulation currents are all I MOD 。
S40-2, respectively turning on the light sources of the channels 1,2,3 and 4 corresponding to the 4 optical modules Module1, module2, module3 and Module 4.
It is to be understood that the present invention is not limited to opening Channel1 of Module1, channel2 of Module2, channel3 of Module3, and Channel4 of Module4, and any Channel of an optical Module may be opened.
S40-3, respectively switching 4 light switches to the light source quality measurement feedback systems, and one-to-one confirming the light source wavelength lambda of each channel read from the light source quality measurement feedback systems ′ And lambda is 1 、λ 2 、λ 3 、λ 4 Whether the difference between them satisfies |lambda ′ -lambda < 0.01, if meeting lambda ′ And S25 if lambda is less than or equal to 0.01. It will be readily appreciated that where lambda has the value lambda respectively 1 、λ 2 、λ 3 、λ 4 Read lambda for different channels ′ The values of (2) may be different and may be expressed as lambda respectively 1 ′ 、λ 2 ′ 、λ 3 ′ 、λ 4 ′ The corresponding channels are compared independently, i.e. lambda 1 ′ And lambda is 1 Comparison, lambda 2 ′ And lambda is 2 Comparison, and so forth.
S40-4, when the wavelength of the light source does not meet the requirement of |lambda ′ When λ is not more than 0.01, the method is carried out according to (λ) ′ -λ) And (3) calculating a temperature compensation value by the alpha, re-writing the TEC temperature after temperature compensation into the light source control system, and returning to S40-3. The temperature compensation values for the different channels may be different, so the temperature compensation values may be expressed as (lambda) n ′ -λ n) Alpha. Temperature compensation is carried out so that the final 4 channels all meet the requirement of lambda ′ -lambda < 0.01, and then S40-5.
It will be readily appreciated that this step does not compensate for temperature for all channels, but only for light source wavelengths that do not satisfy |lambda ′ Compensating for channels of lambda < 0.01 to finally meet the requirement, where lambda is the value corresponding to the channel for which the wavelength of the light source does not meet the requirement, e.g. the first channel does not meet the requirement, lambda takes the value lambda 1 . S40-8 and S40-12.
S40-5, switching the optical switch to an attenuator end, simultaneously carrying out optical power attenuation according to test requirements, starting a performance test system of the receiving device, completing the 4-channel simultaneous working performance test, carrying out subsequent steps if the test is qualified, and ending the test if the test is unqualified.
S40-6, writing T recorded when single channel is qualified into 4 optical modules in the light source control system respectively H1 、T H2 、T H3 、T H4 ，One light module corresponds to one temperature.
S40-7, respectively switching 4 light switches to the light source quality measurement feedback systems, and one-to-one confirming the light source wavelength lambda of each channel read from the light source quality measurement feedback systems H ′ And lambda is H1 、λ H2 、 λ H3 、λ H4 Whether the difference between them satisfies |lambda H ′ -λ H The I is less than or equal to 0.01. If |lambda is satisfied H ′ -λ H And S40-9 is carried out if the I is less than or equal to 0.01. It is easy to understand that here lambda H Respectively of lambda H1 、λ H2 、λ H3 、λ H4 Read lambda for different channels H ′ May be different.
S40-8, when the wavelength of the light source does not meet |lambda H ′ -λ H When the content is not more than 0.01, the method is carried out according to (lambda) H ′ -λ H) And (5) calculating a temperature compensation value by the alpha, re-writing the TEC temperature after temperature compensation into the light source control system, and returning to S40-7. The final 4 channels after temperature compensation all meet the requirement of |lambda H ′ -λ H And S40-9 is carried out after the I is less than or equal to 0.01.
S40-9, switching the optical switch to an attenuator end, simultaneously carrying out optical power attenuation according to test requirements, starting a performance test system of a receiving device, completing the simultaneous working performance test of the 4 channels under the long-wave limit condition, carrying out subsequent S40-10 if the test is qualified, and ending the test if the test is unqualified.
S40-10, writing T recorded when single channel is qualified into 4 optical modules in the light source control system respectively L1 、T L2 、T L3 、T L4 ，One light module corresponds to one temperature.
S40-11, respectively switching 4 light switches to the light source quality measurement feedback systems, and one-to-one confirming the light source wavelength lambda of each channel read from the light source quality measurement feedback systems L ′ And lambda is L1 、λ L2 、λ L3 、λ L4 Whether the difference between them satisfies |lambda L ′ -λ L I is less than or equal to 0.01, if meeting I lambda L ′ -λ L And S40-13 if the I is less than or equal to 0.01. It is easy to understand that here lambda L Respectively of lambda L1 、λ L2 、λ L3 、λ L4 Read lambda for different channels L ′ May be different.
S40-12, when the wavelength of the light source does not meet the requirement of |lambda L ′ -λ L When the content is not more than 0.01, the method is carried out according to (lambda) L ′ -λ L) And (5) calculating a temperature compensation value according to the alpha, re-writing the TEC temperature subjected to temperature compensation into the light source control system, and returning to S40-11. The final 4 channels after temperature compensation all meet the requirement of |lambda L ′ -λ L And (5) the I is less than or equal to 0.01, and then the process enters S40-13.
S40-13, switching the optical switch to an attenuator end, simultaneously carrying out optical power attenuation according to test requirements, starting a performance test system of the receiving device, completing the simultaneous working performance test of 4 channels under the shortwave limit condition, wherein the test qualification indicates that the performance of the multichannel receiving optical device is qualified, and ending the test when the test is failed.
The foregoing is merely illustrative of the present invention, and the present invention is not limited thereto, and any person skilled in the art will readily appreciate variations or alternatives within the scope of the present invention. Therefore, the protection scope of the present invention shall be subject to the protection scope of the claims.

Claims (9)

1. The performance test method of the receiving optical device, the receiving optical device is a single-channel receiving optical device, is characterized by comprising the following steps:
s1, setting the wavelengths of the tested light receiving device under ideal conditions, long-wave limit conditions and short-wave limit conditions to be lambda and lambda respectively H 、λ L Wherein lambda is H =λ+△λ，λ L The value of [ lambda ] - [ delta ] - [ lambda ] is determined by a standard protocol of the tested receiving optical device, and the wavelength temperature drift coefficient is alpha;
s2, performing performance test on the tested light receiving device under ideal conditions, long-wave limit conditions and short-wave limit conditions respectively, ending the test if the test is not qualified under any condition, and recording the TEC temperature corresponding to the qualified light source quality under each condition if the test is qualified under all conditions.
2. The method for testing the performance of a receiving optical device according to claim 1, wherein in S2, the performance test is performed on the receiving optical device under test under ideal conditions, comprising:
s2-1, inputting an initial TEC temperature T to a light source control system 0 And modulating the current I MOD Turning on a channel output light source of the light module;
s2-2, reading the current light source wavelength lambda from the light source measurement feedback system 0 Comparing the light source quality with lambda, if the absolute value of the difference value between the two is smaller than or equal to a set value, indicating that the light source quality is qualified, entering S2-4, otherwise entering S2-3;
s2-3, represented by the formula DeltaT= (lambda-lambda) 0 ) Calculating a temperature compensation value according to alpha, and re-writing a new TEC temperature T into the light source control system i =T i-1 Returning to S2-2, wherein i is an integer greater than or equal to 1, and represents the temperature compensation times;
s2-4, switching the optical switch to an attenuator end, simultaneously carrying out optical power attenuation according to the test optical power requirement, starting a performance test system of the receiving device to carry out performance test, ending the test if the test is not qualified, and continuing the test under the long-wave limit condition or the short-wave limit condition if the test is qualified.
3. The method for testing the performance of a receiving optical device according to claim 2, wherein in S2, the performance test is performed on the receiving optical device under test under the long-wave limit condition, comprising:
s2-5 according to (lambda) H -λ 0 ) Calculating TEC temperature compensation value delta T by alpha H Writing TEC temperature T under long-wave limit condition into light source control system H =T 0 +△T H Modulated current holding I MOD Unchanged;
s2-6, reading the current light source wavelength lambda from the light source measurement feedback system H ′ And is connected with lambda H Comparing, if the absolute value of the difference value between the two is smaller than or equal to the set value, the light source quality is qualified, and then S2-8 is carried out, otherwise S2-7 is carried out;
s2-7, represented by the formula DeltaT H ′ =（λ H -λ H ′ ) Calculating a temperature compensation value according to alpha, and re-writing a new TEC temperature T into the light source control system Hj ′ =T H（j-1） +△T H ′ Returning S2-6,j to be an integer greater than or equal to 1, and representing the temperature compensation times;
s2-8, switching the optical switch to an attenuator end, simultaneously carrying out optical power attenuation according to the test optical power requirement, starting a performance test system of the receiving device to carry out performance test, ending the test if the test is unqualified, and continuing the test under the short wave limit condition if the test is qualified.
4. A performance testing method of a receiving optical device according to claim 3, wherein in S2, the performance testing of the receiving optical device under test is performed under a shortwave limit condition, comprising:
s2-9 according to (lambda) L -λ 0 ) Calculating TEC temperature compensation value delta T by alpha L Writing TEC temperature T under short wave limit condition into light source control system L =T 0 +△T L Modulated current holding I MOD Unchanged;
s2-10, reading the current light source wavelength lambda from the light source measurement feedback system L ′ And is connected with lambda L Comparing, if the absolute value of the difference value between the two is smaller than or equal to the set value, the light source quality is qualified, and then S2-12 is entered, otherwise S2-11 is entered;
s2-11, represented by the formula DeltaT L ′ =（λ L -λ L ′ ) Calculating a temperature compensation value according to alpha, and re-writing a new TEC temperature T into the light source control system Lk ′ =T L（k-1） +△T L ′ Returning to S2-10, wherein k is an integer greater than or equal to 1, and represents the temperature compensation times;
s2-12, switching the optical switch to an attenuator end, simultaneously carrying out optical power attenuation according to the test optical power requirement, starting a receiving device performance test system to carry out performance test, ending the test if the test is unqualified, and indicating that the performance of the tested optical device is qualified if the test is qualified.
5. A performance test method of a receiving optical device, the receiving optical device being a multichannel receiving optical device, characterized by comprising the steps of:
s10, setting the wavelength of each channel of the tested light receiving device to be lambda under ideal conditions, long-wave limit conditions and short-wave limit conditions respectively n 、λ Hn 、λ Ln Wherein lambda is Hn =λ n +△λ，λ Ln =λ n The delta lambda value is determined by a standard protocol of the tested receiving optical device, and the wavelength temperature drift coefficient is alpha; lambda (lambda) n N is an integer greater than 1, which is the ideal center wavelength of the nth channel;
s20, performing performance test on the tested receiving optical device under ideal conditions, long-wave limit conditions and short-wave limit conditions respectively aiming at any one channel of the tested receiving optical device, ending the test if the test is not qualified under any condition, and recording the TEC temperature corresponding to the qualified light source quality under each condition if the test is qualified under all conditions;
s30, testing all channels of the tested optical device in sequence according to the same processing mode of S20, ending the test if any channel is not qualified, and entering S40 if all channels are qualified;
and S40, performing performance test on all channels of the tested light receiving device under ideal conditions, long-wave limit conditions and short-wave limit conditions respectively, ending the test if the test is failed, and indicating that the performance of the tested light receiving device is qualified if the test is passed.
6. The method for testing the performance of a receiving optical device according to claim 5, wherein in S20, the performance test is performed on the nth channel of the receiving optical device under test under ideal conditions, comprising:
s20-1, inputting an initial TEC temperature T to a light source control system 0 And modulating the current I MOD Turning on a channel output light source of the light module;
s20-2, reading the current light source wavelength lambda from the light source measurement feedback system 0 And is connected with lambda n Comparing, if the absolute value of the difference value between the two is smaller than or equal to the set value, the quality of the light source is qualified, and entering S20-4, otherwise entering S20-3;
s20-3, represented by the formula DeltaT= (lambda) n -λ 0 ) Calculating a temperature compensation value according to alpha, and re-writing a new TEC temperature T into the light source control system i =T i-1 Returning to S20-2, wherein i is an integer greater than or equal to 1, and represents the temperature compensation times;
s20-4, switching the optical switch to an attenuator end, simultaneously carrying out optical power attenuation according to the test optical power requirement, starting a performance test system of the receiving device to carry out performance test, ending the test if the test is not qualified, and continuing the test under the long-wave limit condition or the short-wave limit condition if the test is qualified.
7. The method according to claim 6, wherein in S20, the performance test is performed on the nth channel of the receiving optical device under test under the long-wave limit condition, comprising:
s20-5 according to (lambda) Hn -λ 0 ) Calculating TEC temperature compensation value delta T by alpha H Writing TEC temperature T under long-wave limit condition into light source control system H =T 0 +△T H Modulated current holding I MOD Unchanged;
s20-6, reading the current light source wavelength lambda from the light source measurement feedback system Hn ′ And is connected with lambda Hn Comparing, if the absolute value of the difference value between the two is smaller than or equal to the set value, the light source quality is qualified, and then S20-8 is carried out, otherwise S20-7 is carried out;
s20-7, represented by the formula DeltaT H ′ =（λ Hn -λ Hn ′ ) Calculating a temperature compensation value according to alpha, and re-writing a new TEC temperature T into the light source control system Hj ′ =T H（j-1） +△T H ′ Returning to S20-6,j to be an integer greater than or equal to 1, and representing the temperature compensation times;
s20-8, switching the optical switch to an attenuator end, simultaneously carrying out optical power attenuation according to the test optical power requirement, starting a performance test system of the receiving device to carry out performance test, ending the test if the test is unqualified, and continuing the test under the short wave limit condition if the test is qualified.
8. The method for testing the performance of a receiving optical device according to claim 7, wherein in S20, the performance test is performed on the nth channel of the receiving optical device under test under the short wave limit condition, comprising:
s20-9 according to (lambda) Ln -λ 0 ) Calculating TEC temperature compensation value delta T by alpha L Writing TEC temperature T under short wave limit condition into light source control system L =T 0 +△T L Modulated current holding I MOD Unchanged;
s20-10, measuring feedback from the light sourceThe system reads the current light source wavelength lambda Ln ′ And is connected with lambda Ln Comparing, if the absolute value of the difference value between the two is smaller than or equal to the set value, the light source quality is qualified, and then S20-12 is carried out, otherwise S20-11 is carried out;
s20-11, represented by the formula DeltaT L ′ =（λ Ln -λ Ln ′ ) Calculating a temperature compensation value according to alpha, and re-writing a new TEC temperature T into the light source control system Lk ′ =T L（k-1） +△T L ′ Returning to S20-10, wherein k is an integer greater than or equal to 1, and represents the temperature compensation times;
s20-12, switching the optical switch to an attenuator end, simultaneously attenuating the optical power according to the test optical power requirement, starting a performance test system of the receiving device to perform performance test, ending the test if the test is not qualified, and recording the corresponding TEC temperature T, T when the quality of the light source is qualified if the test is qualified H 、T L 。
9. The method for testing the performance of a receiving optical device according to claim 8, wherein S40 specifically comprises:
s40-1, writing TEC temperatures T corresponding to each channel recorded when a single channel is qualified under ideal conditions into N optical modules in a light source control system 1 、T 2 ……T N And modulating the current I MOD The method comprises the steps of carrying out a first treatment on the surface of the N is the number of channels of the received optical device;
s40-2, respectively turning on the light sources of one channel of the N light modules;
s40-3, respectively confirming the light source wavelength lambda of each channel read from the light source quality measurement feedback system one by one n ′ And lambda is n If the absolute value of the difference value is smaller than or equal to the set value, the light source quality is qualified, S40-5 is carried out, otherwise S40-4 is carried out;
s40-4 according to (lambda) n ′ -λ n ) Calculating a temperature compensation value by alpha, re-writing the TEC temperature after temperature compensation into a light source control system, and returning to S40-3;
s40-5, switching the optical switch to an attenuator end, simultaneously carrying out optical power attenuation according to test requirements, starting a performance test system of a receiving device, completing the simultaneous working performance test of N channels, entering S40-6 if the test is qualified, and ending the test if the test is unqualified;
s40-6, writing TEC temperatures T corresponding to each channel recorded when the single channel is qualified under the long-wave limit condition into N optical modules in the light source control system respectively H1 、T H2 ……T HN ；
S40-7, respectively confirming the light source wavelength lambda of each channel read from the light source quality measurement feedback system one by one H ′ And lambda is Hn If the absolute value of the difference value is smaller than or equal to the set value, the light source quality is qualified, S40-9 is then carried out, otherwise S40-8 is carried out;
s40-8 according to (lambda) Hn ′ -λ Hn ) Calculating a temperature compensation value by alpha, re-writing the TEC temperature after temperature compensation into a light source control system, and returning to S40-7;
s40-9, switching an optical switch to an attenuator end, simultaneously carrying out optical power attenuation according to test requirements, starting a performance test system of a receiving device, completing simultaneous working performance test of N channels under a long-wave limit condition, entering S40-10 if the test is qualified, and ending the test if the test is unqualified;
s40-10, writing TEC temperatures T corresponding to each channel recorded when a single channel is qualified under a short-wave limit condition into N optical modules in a light source control system L1 、T L2 ……T LN ；
S40-11, respectively confirming the light source wavelength lambda of each channel read from the light source quality measurement feedback system L ′ And lambda is Ln If the absolute value of the difference value is smaller than or equal to the set value, the light source quality is qualified, S40-13 is carried out, otherwise S40-12 is carried out;
s40-12 according to (lambda) Ln ′ -λ Ln ) Calculating a temperature compensation value by alpha, re-writing the TEC temperature after temperature compensation into a light source control system, and returning to S40-11;
s40-13, switching the optical switch to an attenuator end, simultaneously carrying out optical power attenuation according to test requirements, starting a performance test system of the receiving device, completing simultaneous working performance test of N channels under low-temperature limit working conditions, wherein the test qualification indicates that the performance of the multichannel receiving optical device is qualified, and ending the test when the test is failed.
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熊青松;张武平;陈晋敏;: "用于以太网的40Gbit/s CFP光模块设计", 光通信研究, no. 04, 10 August 2012 (2012-08-10) *

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